DE10397008A5 - Verbessertes Massenspektrometer und Massenfilter für das Massenspektrometer - Google Patents
Verbessertes Massenspektrometer und Massenfilter für das Massenspektrometer Download PDFInfo
- Publication number
- DE10397008A5 DE10397008A5 DE10397008.8T DE10397008T DE10397008A5 DE 10397008 A5 DE10397008 A5 DE 10397008A5 DE 10397008 T DE10397008 T DE 10397008T DE 10397008 A5 DE10397008 A5 DE 10397008A5
- Authority
- DE
- Germany
- Prior art keywords
- mass
- mass spectrometer
- improved
- filter
- spectrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
- H01J49/4215—Quadrupole mass filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0210930.4 | 2002-05-13 | ||
GBGB0210930.4A GB0210930D0 (en) | 2002-05-13 | 2002-05-13 | Improved mass spectrometer and mass filters therefor |
Publications (1)
Publication Number | Publication Date |
---|---|
DE10397008A5 true DE10397008A5 (de) | 2014-08-28 |
Family
ID=9936568
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10397000.2A Expired - Lifetime DE10397000B4 (de) | 2002-05-13 | 2003-05-13 | Verbessertes Massenspektrometer und Massenfilter für das Massenspektrometer |
DE10392635T Expired - Lifetime DE10392635B4 (de) | 2002-05-13 | 2003-05-13 | Verbessertes Massenspektrometer und Massenfilter für das Massenspektrometer |
DE10397008.8T Ceased DE10397008A5 (de) | 2002-05-13 | 2006-05-13 | Verbessertes Massenspektrometer und Massenfilter für das Massenspektrometer |
Family Applications Before (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10397000.2A Expired - Lifetime DE10397000B4 (de) | 2002-05-13 | 2003-05-13 | Verbessertes Massenspektrometer und Massenfilter für das Massenspektrometer |
DE10392635T Expired - Lifetime DE10392635B4 (de) | 2002-05-13 | 2003-05-13 | Verbessertes Massenspektrometer und Massenfilter für das Massenspektrometer |
Country Status (8)
Country | Link |
---|---|
US (2) | USRE45553E1 (de) |
JP (1) | JP2005534140A (de) |
CN (1) | CN100499016C (de) |
AU (1) | AU2003230017B2 (de) |
CA (1) | CA2485944C (de) |
DE (3) | DE10397000B4 (de) |
GB (2) | GB0210930D0 (de) |
WO (1) | WO2003096376A1 (de) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9820210D0 (en) | 1998-09-16 | 1998-11-11 | Vg Elemental Limited | Means for removing unwanted ions from an ion transport system and mass spectrometer |
GB0210930D0 (en) | 2002-05-13 | 2002-06-19 | Thermo Electron Corp | Improved mass spectrometer and mass filters therefor |
JP4659395B2 (ja) * | 2004-06-08 | 2011-03-30 | 株式会社日立ハイテクノロジーズ | 質量分析装置及び質量分析方法 |
US7675033B2 (en) * | 2005-10-31 | 2010-03-09 | Hitachi, Ltd. | Method of mass spectrometry and mass spectrometer |
US7692142B2 (en) * | 2006-12-13 | 2010-04-06 | Thermo Finnigan Llc | Differential-pressure dual ion trap mass analyzer and methods of use thereof |
US7561770B2 (en) * | 2007-07-30 | 2009-07-14 | Hewlett-Packard Development Company, L.P. | Microresonator systems and methods of fabricating the same |
GB0717146D0 (en) | 2007-09-04 | 2007-10-17 | Micromass Ltd | Mass spectrometer |
US8890059B2 (en) * | 2010-10-11 | 2014-11-18 | Yale University | Use of cryogenic ion chemistry to add a structural characterization capability to mass spectrometry through linear action spectroscopy |
CN102446692B (zh) * | 2011-09-23 | 2014-06-25 | 聚光科技(杭州)股份有限公司 | 具有在线清洗功能的质谱分析仪及工作方法 |
GB2510837B (en) | 2013-02-14 | 2017-09-13 | Thermo Fisher Scient (Bremen) Gmbh | Method of operating a mass filter in mass spectrometry |
US10163617B2 (en) * | 2013-11-07 | 2018-12-25 | Dh Technologies Development Pte. Ltd. | Multiplexing of ions for improved sensitivity |
WO2016157032A1 (en) * | 2015-04-01 | 2016-10-06 | Dh Technologies Development Pte. Ltd. | Rf/dc filter to enhance mass spectrometer robustness |
GB201509243D0 (en) * | 2015-05-29 | 2015-07-15 | Micromass Ltd | Mass filter having extended operational lifetime |
GB201615132D0 (en) * | 2016-09-06 | 2016-10-19 | Micromass Ltd | Quadrupole devices |
GB2583092B (en) | 2019-04-15 | 2021-09-22 | Thermo Fisher Scient Bremen Gmbh | Mass spectrometer having improved quadrupole robustness |
GB201907332D0 (en) * | 2019-05-24 | 2019-07-10 | Micromass Ltd | Mass filter having reduced contamination |
EP4248482A2 (de) * | 2020-11-19 | 2023-09-27 | DH Technologies Development Pte. Ltd. | Verfahren zur durchführung von ms/ms von ionenstrahlen hoher intensität unter verwendung einer bandpassfilterungskollisionszelle zur verbesserung der massenspektrometrierobustheit |
US20240177987A1 (en) * | 2021-03-25 | 2024-05-30 | Dh Technologies Development Pte. Ltd. | Method for Analyzing Samples Including a High M/Z Cutoff |
WO2024084343A1 (en) * | 2022-10-18 | 2024-04-25 | Dh Technologies Development Pte. Ltd. | Park mass over-resolved bandpass to reduce ion path contamination |
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DE2536225A1 (de) * | 1975-08-14 | 1977-03-03 | August Diebold | Fahrbares fussbodenreinigungsgeraet mit waschtrog, abtropfeinrichtung, wasserfilterung sowie spruehvorrichtung |
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US4148196A (en) | 1977-04-25 | 1979-04-10 | Sciex Inc. | Multiple stage cryogenic pump and method of pumping |
EP0004437B2 (de) * | 1978-03-18 | 1987-05-06 | LUCAS INDUSTRIES public limited company | Einrichtung zur Fehleranzeige eines Kraftfahrzeugmotors |
US4234791A (en) | 1978-11-13 | 1980-11-18 | Research Corporation | Tandem quadrupole mass spectrometer for selected ion fragmentation studies and low energy collision induced dissociator therefor |
US4328420A (en) * | 1980-07-28 | 1982-05-04 | French John B | Tandem mass spectrometer with open structure AC-only rod sections, and method of operating a mass spectrometer system |
JPS5960856A (ja) * | 1982-09-29 | 1984-04-06 | Shimadzu Corp | 四重極質量分析装置 |
US4542293A (en) | 1983-04-20 | 1985-09-17 | Yale University | Process and apparatus for changing the energy of charged particles contained in a gaseous medium |
US4535235A (en) * | 1983-05-06 | 1985-08-13 | Finnigan Corporation | Apparatus and method for injection of ions into an ion cyclotron resonance cell |
CA1245778A (en) | 1985-10-24 | 1988-11-29 | John B. French | Mass analyzer system with reduced drift |
EP0237259A3 (de) | 1986-03-07 | 1989-04-05 | Finnigan Corporation | Massenspektrometer |
JPH0821366B2 (ja) * | 1988-01-29 | 1996-03-04 | 株式会社島津製作所 | 質量分析装置 |
JP2753265B2 (ja) | 1988-06-10 | 1998-05-18 | 株式会社日立製作所 | プラズマイオン化質量分析計 |
JP2765890B2 (ja) | 1988-12-09 | 1998-06-18 | 株式会社日立製作所 | プラズマイオン源微量元素質量分析装置 |
CA1307859C (en) * | 1988-12-12 | 1992-09-22 | Donald James Douglas | Mass spectrometer and method with improved ion transmission |
DE3905631A1 (de) * | 1989-02-23 | 1990-08-30 | Finnigan Mat Gmbh | Verfahren zur massenspektroskopischen untersuchung von isotopen sowie isotopenmassenspektrometer |
GB8917570D0 (en) | 1989-08-01 | 1989-09-13 | Vg Instr Group | Plasma source mass spectrometry |
JPH03261062A (ja) | 1990-03-09 | 1991-11-20 | Hitachi Ltd | プラズマ極微量元素質量分析装置 |
US5134286A (en) | 1991-02-28 | 1992-07-28 | Teledyne Cme | Mass spectrometry method using notch filter |
JP3148264B2 (ja) * | 1991-03-01 | 2001-03-19 | 横河電機株式会社 | 四重極質量分析計 |
US5157260A (en) | 1991-05-17 | 1992-10-20 | Finnian Corporation | Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus |
GB9110960D0 (en) | 1991-05-21 | 1991-07-10 | Logicflit Limited | Mass spectrometer |
GB9122598D0 (en) * | 1991-10-24 | 1991-12-04 | Fisons Plc | Power supply for multipolar mass filter |
JPH05248482A (ja) | 1992-03-04 | 1993-09-24 | N O K Megurasuteitsuku Kk | 液体封入式マウント |
US5352892A (en) | 1992-05-29 | 1994-10-04 | Cornell Research Foundation, Inc. | Atmospheric pressure ion interface for a mass analyzer |
GB9219457D0 (en) | 1992-09-15 | 1992-10-28 | Fisons Plc | Reducing interferences in plasma source mass spectrometers |
US5381008A (en) | 1993-05-11 | 1995-01-10 | Mds Health Group Ltd. | Method of plasma mass analysis with reduced space charge effects |
US5565679A (en) | 1993-05-11 | 1996-10-15 | Mds Health Group Limited | Method and apparatus for plasma mass analysis with reduced space charge effects |
US5663560A (en) | 1993-09-20 | 1997-09-02 | Hitachi, Ltd. | Method and apparatus for mass analysis of solution sample |
JP3367719B2 (ja) | 1993-09-20 | 2003-01-20 | 株式会社日立製作所 | 質量分析計および静電レンズ |
ES2331494T3 (es) * | 1994-02-28 | 2010-01-05 | Perkinelmer Health Sciences, Inc. | Guia de iones multipolar para espectrometria de masas. |
GB2301704A (en) | 1995-06-02 | 1996-12-11 | Bruker Franzen Analytik Gmbh | Introducing ions into a high-vacuum chamber, e.g. of a mass spectrometer |
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EP0843887A1 (de) | 1995-08-11 | 1998-05-27 | Mds Health Group Limited | Spektrometer mit axialfeld |
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JPH1097838A (ja) | 1996-07-30 | 1998-04-14 | Yokogawa Analytical Syst Kk | 誘導結合プラズマ質量分析装置 |
US6028308A (en) * | 1996-11-18 | 2000-02-22 | Mds Inc. | Resolving RF mass spectrometer |
JPH10223174A (ja) * | 1997-02-03 | 1998-08-21 | Yokogawa Electric Corp | 四重極形質量分析計 |
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US6140638A (en) * | 1997-06-04 | 2000-10-31 | Mds Inc. | Bandpass reactive collision cell |
JP4463978B2 (ja) * | 1997-12-04 | 2010-05-19 | ユニヴァーシティー オブ マニトバ | 四重極イオンガイド中でイオンを選択的に衝突誘発解離する方法および装置 |
US6753523B1 (en) | 1998-01-23 | 2004-06-22 | Analytica Of Branford, Inc. | Mass spectrometry with multipole ion guides |
CA2318855C (en) | 1998-01-23 | 2006-07-11 | Analytica Of Branford, Inc. | Mass spectrometry with multipole ion guide |
CA2227806C (en) | 1998-01-23 | 2006-07-18 | University Of Manitoba | Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use |
US6331702B1 (en) | 1999-01-25 | 2001-12-18 | University Of Manitoba | Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use |
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US6191417B1 (en) * | 1998-11-10 | 2001-02-20 | University Of British Columbia | Mass spectrometer including multiple mass analysis stages and method of operation, to give improved resolution |
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EP1212778A2 (de) * | 1999-08-26 | 2002-06-12 | University Of New Hampshire | Mehrstufiger massenspektrometer |
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GB0210930D0 (en) * | 2002-05-13 | 2002-06-19 | Thermo Electron Corp | Improved mass spectrometer and mass filters therefor |
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JP5036376B2 (ja) * | 2007-04-06 | 2012-09-26 | 石黒 義久 | 電子線照射装置 |
-
2002
- 2002-05-13 GB GBGB0210930.4A patent/GB0210930D0/en not_active Ceased
-
2003
- 2003-05-13 DE DE10397000.2A patent/DE10397000B4/de not_active Expired - Lifetime
- 2003-05-13 CA CA2485944A patent/CA2485944C/en not_active Expired - Lifetime
- 2003-05-13 AU AU2003230017A patent/AU2003230017B2/en not_active Expired
- 2003-05-13 US US14/032,110 patent/USRE45553E1/en not_active Expired - Lifetime
- 2003-05-13 WO PCT/GB2003/002041 patent/WO2003096376A1/en active Application Filing
- 2003-05-13 DE DE10392635T patent/DE10392635B4/de not_active Expired - Lifetime
- 2003-05-13 CN CNB038110016A patent/CN100499016C/zh not_active Expired - Lifetime
- 2003-05-13 JP JP2004504259A patent/JP2005534140A/ja active Pending
- 2003-05-13 GB GB0311003A patent/GB2388705B/en not_active Expired - Lifetime
- 2003-05-13 US US10/497,396 patent/US7211788B2/en not_active Ceased
-
2006
- 2006-05-13 DE DE10397008.8T patent/DE10397008A5/de not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
US7211788B2 (en) | 2007-05-01 |
JP2005534140A (ja) | 2005-11-10 |
GB2388705A (en) | 2003-11-19 |
USRE45553E1 (en) | 2015-06-09 |
GB0210930D0 (en) | 2002-06-19 |
WO2003096376A1 (en) | 2003-11-20 |
CA2485944A1 (en) | 2003-11-20 |
GB0311003D0 (en) | 2003-06-18 |
DE10392635T5 (de) | 2005-05-25 |
CA2485944C (en) | 2011-10-11 |
GB2388705B (en) | 2004-07-07 |
CN1653582A (zh) | 2005-08-10 |
DE10392635B4 (de) | 2013-04-11 |
AU2003230017B2 (en) | 2009-01-22 |
DE10397000B4 (de) | 2014-08-28 |
US20050127283A1 (en) | 2005-06-16 |
CN100499016C (zh) | 2009-06-10 |
AU2003230017A1 (en) | 2003-11-11 |
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Legal Events
Date | Code | Title | Description |
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R012 | Request for examination validly filed | ||
R129 | Divisional application from |
Ref document number: 10397000 Country of ref document: DE |
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R002 | Refusal decision in examination/registration proceedings | ||
R006 | Appeal filed | ||
R008 | Case pending at federal patent court | ||
R003 | Refusal decision now final | ||
R011 | All appeals rejected, refused or otherwise settled |