DE602004009475D1 - Verzögerungs-fehlertest-schaltkreise und diesbezügliches verfahren - Google Patents

Verzögerungs-fehlertest-schaltkreise und diesbezügliches verfahren

Info

Publication number
DE602004009475D1
DE602004009475D1 DE602004009475T DE602004009475T DE602004009475D1 DE 602004009475 D1 DE602004009475 D1 DE 602004009475D1 DE 602004009475 T DE602004009475 T DE 602004009475T DE 602004009475 T DE602004009475 T DE 602004009475T DE 602004009475 D1 DE602004009475 D1 DE 602004009475D1
Authority
DE
Germany
Prior art keywords
clock pulses
threshold value
count value
fault test
delay fault
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004009475T
Other languages
English (en)
Other versions
DE602004009475T2 (de
Inventor
Aviral Mittal
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
NXP BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NXP BV filed Critical NXP BV
Publication of DE602004009475D1 publication Critical patent/DE602004009475D1/de
Application granted granted Critical
Publication of DE602004009475T2 publication Critical patent/DE602004009475T2/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Pulse Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Emergency Protection Circuit Devices (AREA)
DE602004009475T 2003-12-27 2004-12-17 Verzögerungs-fehlertest-schaltkreise und diesbezügliches verfahren Active DE602004009475T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0330076 2003-12-27
GBGB0330076.1A GB0330076D0 (en) 2003-12-27 2003-12-27 Delay fault test circuitry and related method
PCT/IB2004/052847 WO2005066645A1 (en) 2003-12-27 2004-12-17 Delay fault test circuitry and related method

Publications (2)

Publication Number Publication Date
DE602004009475D1 true DE602004009475D1 (de) 2007-11-22
DE602004009475T2 DE602004009475T2 (de) 2008-07-24

Family

ID=31503217

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004009475T Active DE602004009475T2 (de) 2003-12-27 2004-12-17 Verzögerungs-fehlertest-schaltkreise und diesbezügliches verfahren

Country Status (8)

Country Link
US (1) US7457992B2 (de)
EP (1) EP1702218B1 (de)
JP (1) JP2007518976A (de)
CN (1) CN1902502B (de)
AT (1) ATE375519T1 (de)
DE (1) DE602004009475T2 (de)
GB (1) GB0330076D0 (de)
WO (1) WO2005066645A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7024324B2 (en) * 2004-05-27 2006-04-04 Intel Corporation Delay element calibration
CN100366006C (zh) * 2005-12-26 2008-01-30 北京中星微电子有限公司 通用串行总线物理层收发器嵌入式自我测试的方法及装置
US10795783B2 (en) * 2017-10-16 2020-10-06 Microchip Technology Incorporated Fault tolerant clock monitor system
JP2020072549A (ja) * 2018-10-31 2020-05-07 株式会社豊田中央研究所 電源装置
US11092648B2 (en) 2019-04-15 2021-08-17 Grammatech, Inc. Systems and/or methods for anomaly detection and characterization in integrated circuits
CN112816858B (zh) * 2020-12-31 2022-09-16 成都华微电子科技股份有限公司 数字电路延时测试方法、测试电路和集成电路芯片

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5349587A (en) * 1992-03-26 1994-09-20 Northern Telecom Limited Multiple clock rate test apparatus for testing digital systems
US6081913A (en) * 1997-06-03 2000-06-27 Sun Microsystems, Inc. Method for ensuring mutual exclusivity of selected signals during application of test patterns
JP2953435B2 (ja) * 1997-06-09 1999-09-27 日本電気株式会社 遅延テスト方法および該遅延テスト方法に使用するフリップフロップ
US6966021B2 (en) * 1998-06-16 2005-11-15 Janusz Rajski Method and apparatus for at-speed testing of digital circuits
WO2000065364A1 (fr) * 1999-04-23 2000-11-02 Hitachi, Ltd. Ci a semi-conducteur et son procede d'elaboration
US6510534B1 (en) * 2000-06-29 2003-01-21 Logicvision, Inc. Method and apparatus for testing high performance circuits
US6954887B2 (en) * 2001-03-22 2005-10-11 Syntest Technologies, Inc. Multiple-capture DFT system for scan-based integrated circuits
JP2003043109A (ja) * 2001-07-30 2003-02-13 Nec Corp 半導体集積回路装置及びその試験装置
GB0119300D0 (en) 2001-08-08 2001-10-03 Koninkl Philips Electronics Nv Delay fault test circuitry and related method
US7058866B2 (en) * 2002-04-24 2006-06-06 International Business Machines Corporation Method and system for an on-chip AC self-test controller

Also Published As

Publication number Publication date
WO2005066645A1 (en) 2005-07-21
EP1702218B1 (de) 2007-10-10
CN1902502B (zh) 2010-06-09
US7457992B2 (en) 2008-11-25
GB0330076D0 (en) 2004-02-04
CN1902502A (zh) 2007-01-24
DE602004009475T2 (de) 2008-07-24
ATE375519T1 (de) 2007-10-15
US20070168158A1 (en) 2007-07-19
EP1702218A1 (de) 2006-09-20
JP2007518976A (ja) 2007-07-12

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Legal Events

Date Code Title Description
8381 Inventor (new situation)

Inventor name: MITTAL, AVIRAL, REDHILL, SURREY, GB

8364 No opposition during term of opposition