DE602004000375T2 - Bildsensor mit aktiver Rücksetzung und wahlfreien Pixeln - Google Patents

Bildsensor mit aktiver Rücksetzung und wahlfreien Pixeln Download PDF

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Publication number
DE602004000375T2
DE602004000375T2 DE602004000375T DE602004000375T DE602004000375T2 DE 602004000375 T2 DE602004000375 T2 DE 602004000375T2 DE 602004000375 T DE602004000375 T DE 602004000375T DE 602004000375 T DE602004000375 T DE 602004000375T DE 602004000375 T2 DE602004000375 T2 DE 602004000375T2
Authority
DE
Germany
Prior art keywords
reset
column
operational amplifier
line
gain
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004000375T
Other languages
German (de)
English (en)
Other versions
DE602004000375D1 (de
Inventor
Dr. Boyd Fowler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aptina Imaging Corp
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE602004000375D1 publication Critical patent/DE602004000375D1/de
Application granted granted Critical
Publication of DE602004000375T2 publication Critical patent/DE602004000375T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/65—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
DE602004000375T 2003-08-11 2004-03-11 Bildsensor mit aktiver Rücksetzung und wahlfreien Pixeln Expired - Lifetime DE602004000375T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US639227 1984-08-09
US10/639,227 US7274397B2 (en) 2003-08-11 2003-08-11 Image sensor with active reset and randomly addressable pixels

Publications (2)

Publication Number Publication Date
DE602004000375D1 DE602004000375D1 (de) 2006-04-20
DE602004000375T2 true DE602004000375T2 (de) 2006-10-19

Family

ID=33565227

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004000375T Expired - Lifetime DE602004000375T2 (de) 2003-08-11 2004-03-11 Bildsensor mit aktiver Rücksetzung und wahlfreien Pixeln

Country Status (6)

Country Link
US (1) US7274397B2 (enExample)
EP (1) EP1507406B1 (enExample)
JP (1) JP4487248B2 (enExample)
CN (1) CN100546337C (enExample)
DE (1) DE602004000375T2 (enExample)
TW (1) TWI341122B (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060102827A1 (en) * 2004-11-17 2006-05-18 Matsushita Electric Industrial Co., Ltd. Solid-state imaging device
US7728896B2 (en) * 2005-07-12 2010-06-01 Micron Technology, Inc. Dual conversion gain gate and capacitor and HDR combination
US20070024713A1 (en) * 2005-07-28 2007-02-01 Baer Richard L Imaging parallel interface RAM
US7750960B2 (en) * 2006-03-15 2010-07-06 Honeywell International Inc. System and apparatus for high dynamic range sensor
US20090040351A1 (en) * 2007-08-09 2009-02-12 Micron Technology, Inc. Method and apparatus for reducing noise in a pixel array
CN101877758B (zh) * 2009-04-28 2013-04-03 英属开曼群岛商恒景科技股份有限公司 影像传感器的读出系统及方法
JP5470181B2 (ja) * 2010-07-09 2014-04-16 パナソニック株式会社 固体撮像装置
JP5530277B2 (ja) 2010-07-09 2014-06-25 パナソニック株式会社 固体撮像装置およびその駆動方法
US8390712B2 (en) 2010-12-08 2013-03-05 Aptina Imaging Corporation Image sensing pixels with feedback loops for imaging systems
US20120242621A1 (en) * 2011-03-24 2012-09-27 Christopher James Brown Image sensor and display device incorporating the same
US8952729B2 (en) 2013-04-03 2015-02-10 BAE Systems Imaging Solutions Inc. Sample and hold circuit with reduced noise
US10079988B2 (en) * 2015-07-07 2018-09-18 Panasonic Intellectual Property Management Co., Ltd. Imaging device including pixel
US10789450B2 (en) 2017-10-20 2020-09-29 Synaptics Incorporated Optical biometric sensor with automatic gain and exposure control
US10531035B1 (en) 2018-07-17 2020-01-07 Semiconductor Components Industries, Llc Image sensors with predictive pre-charging circuitry
JP7660551B2 (ja) 2020-02-18 2025-04-11 ヌヴォトンテクノロジージャパン株式会社 固体撮像装置、及びそれを用いる撮像装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6469740B1 (en) * 1997-02-04 2002-10-22 Matsushita Electric Industrial Co., Ltd. Physical quantity distribution sensor and method for driving the same
US6697111B1 (en) * 1998-04-08 2004-02-24 Ess Technology, Inc. Compact low-noise active pixel sensor with progressive row reset
US6587142B1 (en) * 1998-09-09 2003-07-01 Pictos Technologies, Inc. Low-noise active-pixel sensor for imaging arrays with high speed row reset
US6424375B1 (en) * 1999-09-21 2002-07-23 Pixel Devices, International Low noise active reset readout for image sensors
JP3984808B2 (ja) * 2000-09-07 2007-10-03 キヤノン株式会社 信号処理装置及びそれを用いた撮像装置並びに放射線撮像システム
US7019345B2 (en) * 2000-11-16 2006-03-28 California Institute Of Technology Photodiode CMOS imager with column-feedback soft-reset for imaging under ultra-low illumination and with high dynamic range
FR2825219B1 (fr) * 2001-05-28 2003-09-05 St Microelectronics Sa Pixel actif cmos a bruit reduit
US20030076431A1 (en) * 2001-10-24 2003-04-24 Krymski Alexander I. Image sensor with pixels having multiple capacitive storage elements
US6777660B1 (en) * 2002-02-04 2004-08-17 Smal Technologies CMOS active pixel with reset noise reduction
JP4132850B2 (ja) * 2002-02-06 2008-08-13 富士通株式会社 Ｃｍｏｓイメージセンサおよびその制御方法
US6919551B2 (en) * 2002-08-29 2005-07-19 Micron Technology Inc. Differential column readout scheme for CMOS APS pixels
US7215369B2 (en) * 2003-04-02 2007-05-08 Micron Technology, Inc. Compact pixel reset circuits using reversed current readout
US7280143B2 (en) * 2003-04-14 2007-10-09 Micron Technology, Inc. CMOS image sensor with active reset and 4-transistor pixels
US7525586B2 (en) * 2003-05-12 2009-04-28 Altasens, Inc. Image sensor and method with multiple scanning modes
US20040227832A1 (en) * 2003-05-12 2004-11-18 Innovative Technology Licensing, Llc. Imaging system with individual pixel reset

Also Published As

Publication number Publication date
CN100546337C (zh) 2009-09-30
JP4487248B2 (ja) 2010-06-23
DE602004000375D1 (de) 2006-04-20
JP2005065270A (ja) 2005-03-10
EP1507406B1 (en) 2006-02-08
US20050036048A1 (en) 2005-02-17
TW200507631A (en) 2005-02-16
US7274397B2 (en) 2007-09-25
CN1581929A (zh) 2005-02-16
TWI341122B (en) 2011-04-21
EP1507406A1 (en) 2005-02-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AVAGO TECHNOLOGIES ECBU IP (SINGAPORE) PTE. LT, SG

8327 Change in the person/name/address of the patent owner

Owner name: MICRON TECHNOLOGY, INC., BOISE, ID., US

8327 Change in the person/name/address of the patent owner

Owner name: APTINA IMAGING CORP., GRAND CAYMAN, CAYMAN ISL, KY