DE60101105D1 - Monomere,Polymere,Verfahren zu ihrer Synthese und Photoresistcompositionen - Google Patents
Monomere,Polymere,Verfahren zu ihrer Synthese und PhotoresistcompositionenInfo
- Publication number
- DE60101105D1 DE60101105D1 DE60101105T DE60101105T DE60101105D1 DE 60101105 D1 DE60101105 D1 DE 60101105D1 DE 60101105 T DE60101105 T DE 60101105T DE 60101105 T DE60101105 T DE 60101105T DE 60101105 D1 DE60101105 D1 DE 60101105D1
- Authority
- DE
- Germany
- Prior art keywords
- monomers
- polymers
- synthesis
- processes
- photoresist compositions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C13/00—Cyclic hydrocarbons containing rings other than, or in addition to, six-membered aromatic rings
- C07C13/28—Polycyclic hydrocarbons or acyclic hydrocarbon derivatives thereof
- C07C13/32—Polycyclic hydrocarbons or acyclic hydrocarbon derivatives thereof with condensed rings
- C07C13/39—Polycyclic hydrocarbons or acyclic hydrocarbon derivatives thereof with condensed rings with a bicyclo ring system containing seven carbon atoms
- C07C13/42—Polycyclic hydrocarbons or acyclic hydrocarbon derivatives thereof with condensed rings with a bicyclo ring system containing seven carbon atoms with a bicycloheptene ring structure
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C67/00—Preparation of carboxylic acid esters
- C07C67/14—Preparation of carboxylic acid esters from carboxylic acid halides
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C67/00—Preparation of carboxylic acid esters
- C07C67/30—Preparation of carboxylic acid esters by modifying the acid moiety of the ester, such modification not being an introduction of an ester group
- C07C67/333—Preparation of carboxylic acid esters by modifying the acid moiety of the ester, such modification not being an introduction of an ester group by isomerisation; by change of size of the carbon skeleton
- C07C67/343—Preparation of carboxylic acid esters by modifying the acid moiety of the ester, such modification not being an introduction of an ester group by isomerisation; by change of size of the carbon skeleton by increase in the number of carbon atoms
- C07C67/347—Preparation of carboxylic acid esters by modifying the acid moiety of the ester, such modification not being an introduction of an ester group by isomerisation; by change of size of the carbon skeleton by increase in the number of carbon atoms by addition to unsaturated carbon-to-carbon bonds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C69/00—Esters of carboxylic acids; Esters of carbonic or haloformic acids
- C07C69/74—Esters of carboxylic acids having an esterified carboxyl group bound to a carbon atom of a ring other than a six-membered aromatic ring
- C07C69/753—Esters of carboxylic acids having an esterified carboxyl group bound to a carbon atom of a ring other than a six-membered aromatic ring of polycyclic acids
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0395—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having a backbone with alicyclic moieties
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C2602/00—Systems containing two condensed rings
- C07C2602/36—Systems containing two condensed rings the rings having more than two atoms in common
- C07C2602/42—Systems containing two condensed rings the rings having more than two atoms in common the bicyclo ring system containing seven carbon atoms
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C2603/00—Systems containing at least three condensed rings
- C07C2603/56—Ring systems containing bridged rings
- C07C2603/58—Ring systems containing bridged rings containing three rings
- C07C2603/60—Ring systems containing bridged rings containing three rings containing at least one ring with less than six members
- C07C2603/66—Ring systems containing bridged rings containing three rings containing at least one ring with less than six members containing five-membered rings
- C07C2603/68—Dicyclopentadienes; Hydrogenated dicyclopentadienes
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/106—Binder containing
- Y10S430/109—Polyester
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Materials For Photolithography (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US18533900P | 2000-02-26 | 2000-02-26 | |
US185339P | 2000-02-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60101105D1 true DE60101105D1 (de) | 2003-12-11 |
DE60101105T2 DE60101105T2 (de) | 2004-08-19 |
Family
ID=22680581
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60101105T Expired - Fee Related DE60101105T2 (de) | 2000-02-26 | 2001-02-22 | Monomere,Polymere,Verfahren zu ihrer Synthese und Photoresistcompositionen |
Country Status (5)
Country | Link |
---|---|
US (1) | US7022454B2 (de) |
EP (1) | EP1127870B1 (de) |
JP (1) | JP2002003447A (de) |
KR (1) | KR20010085618A (de) |
DE (1) | DE60101105T2 (de) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20010054851A (ko) * | 1999-12-08 | 2001-07-02 | 윤종용 | 지환식 감광성 폴리머 및 이를 포함하는 레지스트조성물과 그 제조방법 |
JP5411620B2 (ja) * | 2000-04-20 | 2014-02-12 | 三菱レイヨン株式会社 | レジスト用(共)重合体およびレジスト組成物 |
KR100732284B1 (ko) * | 2000-06-15 | 2007-06-25 | 주식회사 하이닉스반도체 | 신규의 포토레지스트용 단량체, 그의 공중합체 및 이를함유하는 포토레지스트 조성물 |
JP3589160B2 (ja) * | 2000-07-07 | 2004-11-17 | 日本電気株式会社 | レジスト用材料、化学増幅型レジスト及びそれを用いたパターン形成方法 |
JP4831278B2 (ja) * | 2000-09-14 | 2011-12-07 | 信越化学工業株式会社 | 高分子化合物、レジスト材料、及びパターン形成方法 |
JP2002338633A (ja) * | 2001-05-21 | 2002-11-27 | Shin Etsu Chem Co Ltd | 高分子化合物、レジスト材料、及びパターン形成方法 |
KR20030095046A (ko) * | 2002-06-11 | 2003-12-18 | 주식회사 이엔에프테크놀로지 | 2-알콕시알킬-2-아다만틸 (메타)아크릴레이트 및 그제조방법 |
US7147986B2 (en) * | 2004-03-31 | 2006-12-12 | Intel Corporation | Resist compounds including acid labile groups attached to polymeric chains at anhydride linkages |
WO2006017035A1 (en) * | 2004-07-07 | 2006-02-16 | Promerus Llc | Photosensitive dielectric resin compositions and their uses |
KR100789247B1 (ko) | 2005-01-05 | 2008-01-02 | 주식회사 엘지화학 | 광반응성 중합체 및 이의 제조 방법 |
WO2009016984A1 (ja) * | 2007-07-27 | 2009-02-05 | Jsr Corporation | 化合物及びその製造方法 |
KR101249681B1 (ko) | 2008-01-23 | 2013-04-05 | 주식회사 엘지화학 | 바인더 수지 및 이를 포함하는 감광성 수지조성물과, 이감광성 수지조성물에 의해 제조된 컬럼스페이서 |
CN103304521B (zh) * | 2012-03-16 | 2015-04-15 | 中国科学院化学研究所 | 以四苯基呋喃、四苯基吡咯、四苯基噻吩和五苯基吡啶为核的分子玻璃光刻胶 |
KR101719686B1 (ko) | 2013-09-30 | 2017-03-24 | 주식회사 엘지화학 | 광반응성 공중합체 및 이를 포함하는 배향막 |
EP3253735B1 (de) | 2015-02-02 | 2021-03-31 | Basf Se | Latente säuren und ihre verwendung |
CN110669207B (zh) * | 2019-11-15 | 2022-09-13 | 无锡阿科力科技股份有限公司 | 一种环烯烃共聚物及其制备方法和应用 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0520419A3 (en) * | 1991-06-26 | 1993-06-16 | Union Carbide Chemicals & Plastics Technology Corporation | Production of unsaturated cycloaliphatic esters and derivatives thereof |
KR100520148B1 (ko) * | 1997-12-31 | 2006-05-12 | 주식회사 하이닉스반도체 | 신규한바이시클로알켄유도체와이를이용한포토레지스트중합체및이중합체를함유한포토레지스트조성물 |
TW457277B (en) * | 1998-05-11 | 2001-10-01 | Shinetsu Chemical Co | Ester compounds, polymers, resist composition and patterning process |
JP3680920B2 (ja) * | 1999-02-25 | 2005-08-10 | 信越化学工業株式会社 | 新規なエステル化合物、高分子化合物、レジスト材料、及びパターン形成方法 |
-
2001
- 2001-02-22 EP EP01301599A patent/EP1127870B1/de not_active Expired - Lifetime
- 2001-02-22 DE DE60101105T patent/DE60101105T2/de not_active Expired - Fee Related
- 2001-02-26 KR KR1020010009757A patent/KR20010085618A/ko active IP Right Grant
- 2001-02-26 US US09/794,301 patent/US7022454B2/en not_active Expired - Fee Related
- 2001-02-26 JP JP2001050311A patent/JP2002003447A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP1127870A1 (de) | 2001-08-29 |
US20020013448A1 (en) | 2002-01-31 |
JP2002003447A (ja) | 2002-01-09 |
EP1127870B1 (de) | 2003-11-05 |
US7022454B2 (en) | 2006-04-04 |
DE60101105T2 (de) | 2004-08-19 |
KR20010085618A (ko) | 2001-09-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |