DE60044580D1 - Mikroskop für Infrarotabbildung - Google Patents

Mikroskop für Infrarotabbildung

Info

Publication number
DE60044580D1
DE60044580D1 DE60044580T DE60044580T DE60044580D1 DE 60044580 D1 DE60044580 D1 DE 60044580D1 DE 60044580 T DE60044580 T DE 60044580T DE 60044580 T DE60044580 T DE 60044580T DE 60044580 D1 DE60044580 D1 DE 60044580D1
Authority
DE
Germany
Prior art keywords
detector
detector elements
multiplexing
small
infrared imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60044580T
Other languages
English (en)
Inventor
Andrew James Turner
Robert Alan Hoult
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PerkinElmer Singapore Pte Ltd
Original Assignee
PerkinElmer Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PerkinElmer Singapore Pte Ltd filed Critical PerkinElmer Singapore Pte Ltd
Application granted granted Critical
Publication of DE60044580D1 publication Critical patent/DE60044580D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
DE60044580T 2000-08-29 2000-08-29 Mikroskop für Infrarotabbildung Expired - Lifetime DE60044580D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP00307372A EP1184703B1 (de) 2000-08-29 2000-08-29 Mikroskop für Infrarotabbildung

Publications (1)

Publication Number Publication Date
DE60044580D1 true DE60044580D1 (de) 2010-08-05

Family

ID=8173225

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60044580T Expired - Lifetime DE60044580D1 (de) 2000-08-29 2000-08-29 Mikroskop für Infrarotabbildung

Country Status (5)

Country Link
US (2) US7378657B2 (de)
EP (1) EP1184703B1 (de)
JP (1) JP2002188958A (de)
AT (1) ATE472119T1 (de)
DE (1) DE60044580D1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0120170D0 (en) 2001-08-17 2001-10-10 Perkin Elmer Int Cv Scanning IR microscope
US7078696B2 (en) * 2004-02-13 2006-07-18 Thermo Electron Scientific Instruments Corporation Microspectrometer system with selectable aperturing
JP4585839B2 (ja) * 2004-12-06 2010-11-24 日本分光株式会社 顕微鏡
DE102006037524A1 (de) * 2006-08-10 2008-02-21 Bruker Optik Gmbh Spektrometersystem mit IR-Mikroskop und elektronisch umschaltbaren Detektoren
JP5507248B2 (ja) * 2006-08-28 2014-05-28 サーモ エレクトロン サイエンティフィック インストルメンツ リミテッド ライアビリティ カンパニー 口径食が減少された分光器
JP6000546B2 (ja) * 2011-06-30 2016-09-28 浜松ホトニクス株式会社 顕微観察用光学装置
JP2016102875A (ja) * 2014-11-27 2016-06-02 株式会社 清原光学 非球面レンズ、非球面レンズの光軸合わせ装置、非球面ミラー及びカセグレン望遠鏡
JP6020849B2 (ja) * 2014-12-18 2016-11-02 株式会社 清原光学 非球面ミラーの光軸合わせ装置
WO2017145422A1 (ja) * 2016-02-23 2017-08-31 株式会社島津製作所 顕微分析装置
JP6863578B2 (ja) 2017-04-19 2021-04-21 日本分光株式会社 赤外顕微鏡
US10641659B2 (en) * 2018-08-14 2020-05-05 Shimadzu Corporation Infrared microscope with adjustable connection optical system
US11067787B2 (en) * 2018-10-23 2021-07-20 Microsanj, LLC Microscope mounted infrared digital thermal image system
DE102019203560A1 (de) * 2019-03-15 2020-09-17 Bruker Optik Gmbh IR-Mikroskop
JP2023502302A (ja) * 2019-10-14 2023-01-24 ライカ バイオシステムズ イメージング インコーポレイテッド サブピクセルラインスキャニング
CN111103592B (zh) * 2019-11-19 2022-04-12 北京空间机电研究所 一种高灵敏度的点元化阵列关联检测激光测深系统

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1602591A (de) * 1968-12-27 1970-12-28
US4845552A (en) * 1987-08-20 1989-07-04 Bruno Jaggi Quantitative light microscope using a solid state detector in the primary image plane
DE68929464T2 (de) * 1988-07-13 2003-11-20 Optiscan Pty Ltd Rastermikroskop
JP2691226B2 (ja) * 1989-07-10 1997-12-17 株式会社ニコン 赤外線撮像光学装置
US5864146A (en) * 1996-11-13 1999-01-26 University Of Massachusetts Medical Center System for quantitative radiographic imaging
US5091646A (en) * 1990-05-29 1992-02-25 Kollmorgen Corporation Integrated thermal imaging system
JPH078735U (ja) * 1993-07-09 1995-02-07 株式会社村田製作所 赤外線センサ装置
IL107763A0 (en) * 1993-11-26 1994-02-27 State Of Isreal Ministery Of D Infrared microscope
CA2135676A1 (en) * 1994-11-14 1996-05-15 Jean Dumas Device to enhance imaging resolution
US5602391A (en) * 1995-02-23 1997-02-11 Hughes Electronics Quincunx sampling grid for staring array
DE69530367T2 (de) * 1995-03-06 2004-02-19 Perkin-Elmer Ltd., Beaconsfield Kontrolle eines Mikroskopprobenträgers
JPH08313640A (ja) * 1995-05-17 1996-11-29 Hitachi Ltd 二次元放射線画像検出器
US5751830A (en) * 1995-05-24 1998-05-12 Lockheed Martin Energy Systems, Inc. Method and apparatus for coherent imaging of infrared energy
DE59703875D1 (de) * 1997-07-07 2001-07-26 Fraunhofer Ges Forschung Vorrichtung und verfahren zum erfassen eines optischen signals
US6274871B1 (en) * 1998-10-22 2001-08-14 Vysis, Inc. Method and system for performing infrared study on a biological sample
JP3436164B2 (ja) * 1999-01-07 2003-08-11 日産自動車株式会社 赤外線ラインセンサ
US6084727A (en) * 1999-04-28 2000-07-04 Raytheon Company All-reflective field-switching optical imaging system
US6483327B1 (en) * 1999-09-30 2002-11-19 Advanced Micro Devices, Inc. Quadrant avalanche photodiode time-resolved detection
US6784428B2 (en) * 2001-10-01 2004-08-31 Ud Technology Corporation Apparatus and method for real time IR spectroscopy

Also Published As

Publication number Publication date
US20020033452A1 (en) 2002-03-21
US20080135763A1 (en) 2008-06-12
EP1184703A1 (de) 2002-03-06
EP1184703B1 (de) 2010-06-23
ATE472119T1 (de) 2010-07-15
US7378657B2 (en) 2008-05-27
JP2002188958A (ja) 2002-07-05

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