ATE437527T1 - Sensorelementanordnung - Google Patents

Sensorelementanordnung

Info

Publication number
ATE437527T1
ATE437527T1 AT04701403T AT04701403T ATE437527T1 AT E437527 T1 ATE437527 T1 AT E437527T1 AT 04701403 T AT04701403 T AT 04701403T AT 04701403 T AT04701403 T AT 04701403T AT E437527 T1 ATE437527 T1 AT E437527T1
Authority
AT
Austria
Prior art keywords
sensor elements
radiation
array
group
dose
Prior art date
Application number
AT04701403T
Other languages
English (en)
Inventor
Augusto Nascetti
Michael Overdick
Hans-Aloys Wischmann
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of ATE437527T1 publication Critical patent/ATE437527T1/de

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/1506—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation with addressing of the image-sensor elements
    • H04N3/1512—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation with addressing of the image-sensor elements for MOS image-sensors, e.g. MOS-CCD
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/41—Extracting pixel data from a plurality of image sensors simultaneously picking up an image, e.g. for increasing the field of view by combining the outputs of a plurality of sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/767—Horizontal readout lines, multiplexers or registers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/779—Circuitry for scanning or addressing the pixel array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/7795—Circuitry for generating timing or clock signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
    • H04N3/1562—Control of the image-sensor operation, e.g. image processing within the image-sensor for selective scanning, e.g. windowing, zooming

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measuring Fluid Pressure (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
AT04701403T 2003-01-16 2004-01-12 Sensorelementanordnung ATE437527T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP03100074 2003-01-16
PCT/IB2004/000031 WO2004064385A1 (en) 2003-01-16 2004-01-12 Array of sensor elements

Publications (1)

Publication Number Publication Date
ATE437527T1 true ATE437527T1 (de) 2009-08-15

Family

ID=32695652

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04701403T ATE437527T1 (de) 2003-01-16 2004-01-12 Sensorelementanordnung

Country Status (7)

Country Link
US (1) US7161154B2 (de)
EP (1) EP1588551B1 (de)
JP (1) JP4621653B2 (de)
CN (1) CN100531294C (de)
AT (1) ATE437527T1 (de)
DE (1) DE602004022131D1 (de)
WO (1) WO2004064385A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0201260D0 (en) * 2002-01-21 2002-03-06 Europ Org For Nuclear Research A sensing and imaging device
JP4773768B2 (ja) * 2005-08-16 2011-09-14 キヤノン株式会社 放射線撮像装置、その制御方法及び放射線撮像システム
US8437526B2 (en) * 2007-12-05 2013-05-07 Siemens Medical Solutions Usa, Inc. System for adaptively processing medical image data
US8269730B2 (en) * 2008-04-03 2012-09-18 Integrated Digital Technologies, Inc. Wiring structures for panels
JP5101402B2 (ja) * 2008-06-18 2012-12-19 浜松ホトニクス株式会社 固体撮像装置
US9195877B2 (en) * 2011-12-23 2015-11-24 Synaptics Incorporated Methods and devices for capacitive image sensing
JP5914404B2 (ja) * 2012-04-12 2016-05-11 富士フイルム株式会社 Ｘ線露出制御装置、ｘ線画像検出装置及びｘ線画像撮影システム
US9818182B2 (en) * 2012-06-20 2017-11-14 Hitachi, Ltd. X-ray CT device
JP6559250B2 (ja) * 2014-12-21 2019-08-14 イオンビーム アプリケーションズ， エス．エー． 放射線センサおよび放射線イメージセンサを構成する方法
DE102015213911B4 (de) * 2015-07-23 2019-03-07 Siemens Healthcare Gmbh Verfahren zum Erzeugen eines Röntgenbildes und Datenverarbeitungseinrichtung zum Ausführen des Verfahrens
US11438528B2 (en) 2017-05-14 2022-09-06 Trieye Ltd. System and method for short-wave-infra-red (SWIR) sensing and imaging
EP3435048A1 (de) * 2017-07-25 2019-01-30 Heraeus Sensor Technology GmbH Sensor zur erfassung eines räumlichen temperaturprofils und verfahren zur herstellung einer sensoreinheit

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5853830B2 (ja) * 1977-07-13 1983-12-01 株式会社日立製作所 カラ−固体撮像装置
JP2606207B2 (ja) * 1987-03-25 1997-04-30 株式会社島津製作所 画像撮影装置
JP2594950B2 (ja) * 1987-06-22 1997-03-26 株式会社日立製作所 固体撮像装置
EP0303819B1 (de) * 1987-08-21 1994-09-28 Heimann Optoelectronics GmbH Integrierte Schaltung zum Auslesen eines optoelektronischen Bildsensors
US5262871A (en) * 1989-11-13 1993-11-16 Rutgers, The State University Multiple resolution image sensor
DE4036163A1 (de) * 1990-11-14 1992-05-21 Philips Patentverwaltung Roentgenuntersuchungsgeraet
US5841833A (en) * 1991-02-13 1998-11-24 Lunar Corporation Dual-energy x-ray detector providing spatial and temporal interpolation
US5453611A (en) * 1993-01-01 1995-09-26 Canon Kabushiki Kaisha Solid-state image pickup device with a plurality of photoelectric conversion elements on a common semiconductor chip
WO1994030004A1 (en) * 1993-06-16 1994-12-22 Cambridge Imaging Limited Improved imaging system
DE19524857C2 (de) * 1995-07-07 1998-04-09 Siemens Ag Bilddetektor
US6359967B1 (en) * 1998-11-25 2002-03-19 General Electric Company Method and apparatus for scan charge compensation in a digital detector
US6437338B1 (en) 1999-09-29 2002-08-20 General Electric Company Method and apparatus for scanning a detector array in an x-ray imaging system

Also Published As

Publication number Publication date
WO2004064385A1 (en) 2004-07-29
EP1588551A1 (de) 2005-10-26
US7161154B2 (en) 2007-01-09
JP4621653B2 (ja) 2011-01-26
CN100531294C (zh) 2009-08-19
JP2006521716A (ja) 2006-09-21
EP1588551B1 (de) 2009-07-22
US20060138333A1 (en) 2006-06-29
CN1739286A (zh) 2006-02-22
WO2004064385B1 (en) 2004-08-26
DE602004022131D1 (de) 2009-09-03

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties