DE60042970D1 - Verfahren und vorrichtung zur reinigung von einem halbleiterwafer - Google Patents
Verfahren und vorrichtung zur reinigung von einem halbleiterwaferInfo
- Publication number
- DE60042970D1 DE60042970D1 DE60042970T DE60042970T DE60042970D1 DE 60042970 D1 DE60042970 D1 DE 60042970D1 DE 60042970 T DE60042970 T DE 60042970T DE 60042970 T DE60042970 T DE 60042970T DE 60042970 D1 DE60042970 D1 DE 60042970D1
- Authority
- DE
- Germany
- Prior art keywords
- brush
- wafer
- cleaning
- cleaning brush
- scrubbing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004140 cleaning Methods 0.000 title abstract 8
- 238000000034 method Methods 0.000 title abstract 4
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000126 substance Substances 0.000 abstract 4
- 238000005201 scrubbing Methods 0.000 abstract 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract 2
- 244000185238 Lophostemon confertus Species 0.000 abstract 1
- 239000008367 deionised water Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/329,207 US6711775B2 (en) | 1999-06-10 | 1999-06-10 | System for cleaning a semiconductor wafer |
PCT/US2000/014849 WO2000077835A1 (en) | 1999-06-10 | 2000-05-30 | Method and system for cleaning a semiconductor wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60042970D1 true DE60042970D1 (de) | 2009-10-29 |
Family
ID=23284347
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60042970T Expired - Fee Related DE60042970D1 (de) | 1999-06-10 | 2000-05-30 | Verfahren und vorrichtung zur reinigung von einem halbleiterwafer |
Country Status (10)
Country | Link |
---|---|
US (2) | US6711775B2 (de) |
EP (1) | EP1186006B1 (de) |
JP (1) | JP2003502840A (de) |
KR (1) | KR100750545B1 (de) |
CN (1) | CN1156890C (de) |
AT (1) | ATE443343T1 (de) |
AU (1) | AU5304600A (de) |
DE (1) | DE60042970D1 (de) |
TW (1) | TW457533B (de) |
WO (1) | WO2000077835A1 (de) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6711775B2 (en) * | 1999-06-10 | 2004-03-30 | Lam Research Corporation | System for cleaning a semiconductor wafer |
JP4484339B2 (ja) * | 1999-08-14 | 2010-06-16 | アプライド マテリアルズ インコーポレイテッド | スクラバにおける背面エッチング |
US7007333B1 (en) | 2002-06-28 | 2006-03-07 | Lam Research Corporation | System and method for a combined contact and non-contact wafer cleaning module |
US7067016B1 (en) * | 2003-03-31 | 2006-06-27 | Lam Research Corporation | Chemically assisted mechanical cleaning of MRAM structures |
CN100502722C (zh) * | 2004-01-29 | 2009-06-24 | 应用材料公司 | 在心轴上安装洗涤器刷子的方法和设备 |
CN1933759B (zh) * | 2004-03-31 | 2010-12-15 | 兰姆研究有限公司 | 利用相容化学品的基板刷子擦洗和接近清洗干燥程序、接近基板制备程序和实施前述程序的方法、设备和系统 |
US20050252547A1 (en) * | 2004-05-11 | 2005-11-17 | Applied Materials, Inc. | Methods and apparatus for liquid chemical delivery |
JP4537826B2 (ja) * | 2004-10-22 | 2010-09-08 | 芝浦メカトロニクス株式会社 | 基板の処理装置 |
US20070093406A1 (en) * | 2005-10-24 | 2007-04-26 | Omoregie Henryson | Novel cleaning process for masks and mask blanks |
CN101421054B (zh) * | 2006-02-10 | 2012-10-17 | 坦能公司 | 电化学活化的阳极电解液和阴极电解液液体 |
KR20080113479A (ko) * | 2007-06-25 | 2008-12-31 | 엘지이노텍 주식회사 | 웨이퍼 재활용 방법 |
CN101610641B (zh) * | 2008-06-19 | 2011-06-29 | 富葵精密组件(深圳)有限公司 | 湿处理系统及湿处理方法 |
JP2011165751A (ja) * | 2010-02-05 | 2011-08-25 | Toshiba Corp | 洗浄装置及び半導体装置の製造方法 |
CN101935883B (zh) * | 2010-09-10 | 2012-05-02 | 北京工业大学 | 超高真空离子源晶片清洗系统 |
US20130255721A1 (en) * | 2012-04-03 | 2013-10-03 | Illinois Tool Works Inc. | Concave nodule sponge brush |
KR102108084B1 (ko) * | 2012-09-28 | 2020-05-11 | 엔테그리스, 아이엔씨. | Cmp 브러시 팩키징 |
US9211568B2 (en) | 2013-03-12 | 2015-12-15 | Taiwan Semiconductor Manufacturing Company Limited | Clean function for semiconductor wafer scrubber |
CN103230884B (zh) * | 2013-04-24 | 2016-06-08 | 清华大学 | 用于晶圆的刷洗装置 |
KR102121238B1 (ko) * | 2013-11-25 | 2020-06-10 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
KR101600774B1 (ko) * | 2014-12-01 | 2016-03-08 | 주식회사 케이씨텍 | 브러쉬 세정 장치 |
US9748090B2 (en) * | 2015-01-22 | 2017-08-29 | Toshiba Memory Corporation | Semiconductor manufacturing apparatus and manufacturing method of semiconductor device |
KR102626035B1 (ko) * | 2016-08-31 | 2024-01-17 | 주식회사 케이씨텍 | 기판 스피닝 장치 및 그 제어방법 |
US11923208B2 (en) * | 2017-05-19 | 2024-03-05 | Illinois Tool Works Inc. | Methods and apparatuses for chemical delivery for brush conditioning |
US10410936B2 (en) * | 2017-05-19 | 2019-09-10 | Illinois Tool Works Inc. | Methods and apparatuses for effluent monitoring for brush conditioning |
US10149135B1 (en) * | 2017-05-30 | 2018-12-04 | Illinois Tool Works Inc. | Methods and apparatuses for wireless communication with a brush |
KR102573572B1 (ko) * | 2017-12-20 | 2023-09-01 | 삼성전자주식회사 | 웨이퍼 세정 장치 |
CN113967888B (zh) * | 2020-07-23 | 2022-06-24 | 长鑫存储技术有限公司 | 海绵刷的更换工具和安装方法、半导体化学机械抛光设备 |
WO2023235424A1 (en) * | 2022-05-31 | 2023-12-07 | Entegris, Inc. | Cleaning brush for semiconductor fabrication process |
CN116631849B (zh) * | 2023-07-21 | 2024-05-07 | 山东有研艾斯半导体材料有限公司 | 一种硅片的清洗方法 |
Family Cites Families (41)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3970471A (en) * | 1975-04-23 | 1976-07-20 | Western Electric Co., Inc. | Methods and apparatus for treating wafer-like articles |
US4062463A (en) | 1976-05-11 | 1977-12-13 | Machine Technology, Inc. | Automated single cassette load mechanism for scrubber |
US4202071A (en) | 1978-03-20 | 1980-05-13 | Scharpf Mike A | Apparatus for washing and drying phonograph records |
US4382308A (en) | 1981-02-18 | 1983-05-10 | Chemcut Corporation | Scrubbing torque monitoring and control system |
JPS60143634A (ja) * | 1983-12-29 | 1985-07-29 | Fujitsu Ltd | ウエ−ハ処理方法及び装置 |
JPS634617A (ja) | 1986-06-24 | 1988-01-09 | Mitsubishi Electric Corp | 洗浄方法 |
JPH07109680B2 (ja) * | 1987-06-25 | 1995-11-22 | 株式会社日立製作所 | 磁気記録再生装置のテ−プロ−ディング機構 |
US5129955A (en) | 1989-01-11 | 1992-07-14 | Dainippon Screen Mfg. Co., Ltd. | Wafer cleaning method |
US5357645A (en) | 1989-04-09 | 1994-10-25 | System Seiko Co., Ltd. | Apparatus for cleaning and drying hard disk substrates |
JP2887408B2 (ja) * | 1990-08-10 | 1999-04-26 | 株式会社荏原製作所 | ウエハ洗浄装置 |
JPH04213826A (ja) * | 1990-12-11 | 1992-08-04 | Nec Yamagata Ltd | 半導体製造用ウェーハ洗浄装置 |
US5144711A (en) * | 1991-03-25 | 1992-09-08 | Westech Systems, Inc. | Cleaning brush for semiconductor wafer |
JPH04363022A (ja) * | 1991-06-06 | 1992-12-15 | Enya Syst:Kk | 貼付板洗浄装置 |
JPH053184A (ja) * | 1991-06-24 | 1993-01-08 | Sony Corp | ウエハの洗浄方法 |
US5317778A (en) | 1991-07-31 | 1994-06-07 | Shin-Etsu Handotai Co., Ltd. | Automatic cleaning apparatus for wafers |
US5486134A (en) | 1992-02-27 | 1996-01-23 | Oliver Design, Inc. | System and method for texturing magnetic data storage disks |
KR100230694B1 (ko) * | 1992-05-18 | 1999-11-15 | 다카시마 히로시 | 기판세정처리장치 |
JPH06120192A (ja) * | 1992-10-01 | 1994-04-28 | Sumitomo Precision Prod Co Ltd | 両面スクラブ洗浄装置 |
JP2877216B2 (ja) | 1992-10-02 | 1999-03-31 | 東京エレクトロン株式会社 | 洗浄装置 |
JPH0817772A (ja) * | 1994-06-30 | 1996-01-19 | Dainippon Screen Mfg Co Ltd | 回転式基板洗浄装置 |
JP2888412B2 (ja) | 1994-07-04 | 1999-05-10 | 信越半導体株式会社 | ブラシ洗浄装置及びワーク洗浄システム |
DE19525521B4 (de) | 1994-07-15 | 2007-04-26 | Lam Research Corp.(N.D.Ges.D.Staates Delaware), Fremont | Verfahren zum Reinigen von Substraten |
US5723019A (en) * | 1994-07-15 | 1998-03-03 | Ontrak Systems, Incorporated | Drip chemical delivery method and apparatus |
TW316995B (de) | 1995-01-19 | 1997-10-01 | Tokyo Electron Co Ltd | |
JPH08238463A (ja) * | 1995-03-03 | 1996-09-17 | Ebara Corp | 洗浄方法及び洗浄装置 |
US5639311A (en) | 1995-06-07 | 1997-06-17 | International Business Machines Corporation | Method of cleaning brushes used in post CMP semiconductor wafer cleaning operations |
US5624501A (en) | 1995-09-26 | 1997-04-29 | Gill, Jr.; Gerald L. | Apparatus for cleaning semiconductor wafers |
DE69631258T2 (de) * | 1995-10-13 | 2004-11-18 | Lam Research Corp., Fremont | Verfahren zum Entfernen von Verunreinigungen durch Bürsten |
US5693148A (en) | 1995-11-08 | 1997-12-02 | Ontrak Systems, Incorporated | Process for brush cleaning |
US5675856A (en) | 1996-06-14 | 1997-10-14 | Solid State Equipment Corp. | Wafer scrubbing device |
US5778554A (en) | 1996-07-15 | 1998-07-14 | Oliver Design, Inc. | Wafer spin dryer and method of drying a wafer |
US5875507A (en) | 1996-07-15 | 1999-03-02 | Oliver Design, Inc. | Wafer cleaning apparatus |
US5709755A (en) | 1996-08-09 | 1998-01-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method for CMP cleaning improvement |
US5862560A (en) * | 1996-08-29 | 1999-01-26 | Ontrak Systems, Inc. | Roller with treading and system including the same |
JPH1126408A (ja) * | 1997-07-08 | 1999-01-29 | Matsushita Electric Ind Co Ltd | 基板の洗浄方法及び装置 |
JP3320640B2 (ja) * | 1997-07-23 | 2002-09-03 | 東京エレクトロン株式会社 | 洗浄装置 |
US6196896B1 (en) | 1997-10-31 | 2001-03-06 | Obsidian, Inc. | Chemical mechanical polisher |
JPH11179646A (ja) * | 1997-12-19 | 1999-07-06 | Speedfam Co Ltd | 洗浄装置 |
US6093254A (en) * | 1998-10-30 | 2000-07-25 | Lam Research Corporation | Method of HF-HF Cleaning |
US6711775B2 (en) * | 1999-06-10 | 2004-03-30 | Lam Research Corporation | System for cleaning a semiconductor wafer |
JP5675856B2 (ja) * | 2013-01-15 | 2015-02-25 | キヤノン株式会社 | 画像処理装置及び方法、及びプログラムを記録した記憶媒体 |
-
1999
- 1999-06-10 US US09/329,207 patent/US6711775B2/en not_active Expired - Fee Related
-
2000
- 2000-05-30 WO PCT/US2000/014849 patent/WO2000077835A1/en not_active Application Discontinuation
- 2000-05-30 KR KR1020017015789A patent/KR100750545B1/ko not_active IP Right Cessation
- 2000-05-30 EP EP00937934A patent/EP1186006B1/de not_active Expired - Lifetime
- 2000-05-30 DE DE60042970T patent/DE60042970D1/de not_active Expired - Fee Related
- 2000-05-30 JP JP2001503217A patent/JP2003502840A/ja active Pending
- 2000-05-30 CN CNB008087334A patent/CN1156890C/zh not_active Expired - Fee Related
- 2000-05-30 AT AT00937934T patent/ATE443343T1/de not_active IP Right Cessation
- 2000-05-30 AU AU53046/00A patent/AU5304600A/en not_active Abandoned
- 2000-07-21 TW TW089111375A patent/TW457533B/zh not_active IP Right Cessation
-
2004
- 2004-01-27 US US10/766,733 patent/US20040216764A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
TW457533B (en) | 2001-10-01 |
ATE443343T1 (de) | 2009-10-15 |
KR100750545B1 (ko) | 2007-08-20 |
WO2000077835A1 (en) | 2000-12-21 |
EP1186006B1 (de) | 2009-09-16 |
CN1355929A (zh) | 2002-06-26 |
US20020062842A1 (en) | 2002-05-30 |
US6711775B2 (en) | 2004-03-30 |
KR20020008413A (ko) | 2002-01-30 |
US20040216764A1 (en) | 2004-11-04 |
JP2003502840A (ja) | 2003-01-21 |
EP1186006A1 (de) | 2002-03-13 |
AU5304600A (en) | 2001-01-02 |
CN1156890C (zh) | 2004-07-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |