DE60040371D1 - Verfahren zur Auswertung eines Ladungsträgerstrahls - Google Patents

Verfahren zur Auswertung eines Ladungsträgerstrahls

Info

Publication number
DE60040371D1
DE60040371D1 DE60040371T DE60040371T DE60040371D1 DE 60040371 D1 DE60040371 D1 DE 60040371D1 DE 60040371 T DE60040371 T DE 60040371T DE 60040371 T DE60040371 T DE 60040371T DE 60040371 D1 DE60040371 D1 DE 60040371D1
Authority
DE
Germany
Prior art keywords
evaluating
charge carrier
carrier beam
charge
carrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60040371T
Other languages
English (en)
Inventor
Asher Pearl
Steven R Rodgers
Alexander Libinson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Application granted granted Critical
Publication of DE60040371D1 publication Critical patent/DE60040371D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/282—Determination of microscope properties
    • H01J2237/2823—Resolution

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Tests Of Electronic Circuits (AREA)
DE60040371T 1999-09-03 2000-08-31 Verfahren zur Auswertung eines Ladungsträgerstrahls Expired - Lifetime DE60040371D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/390,002 US6545275B1 (en) 1999-09-03 1999-09-03 Beam evaluation

Publications (1)

Publication Number Publication Date
DE60040371D1 true DE60040371D1 (de) 2008-11-13

Family

ID=23540638

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60040371T Expired - Lifetime DE60040371D1 (de) 1999-09-03 2000-08-31 Verfahren zur Auswertung eines Ladungsträgerstrahls

Country Status (4)

Country Link
US (1) US6545275B1 (de)
EP (1) EP1081742B1 (de)
JP (1) JP5075303B2 (de)
DE (1) DE60040371D1 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6545275B1 (en) * 1999-09-03 2003-04-08 Applied Materials, Inc. Beam evaluation
US6694284B1 (en) 2000-09-20 2004-02-17 Kla-Tencor Technologies Corp. Methods and systems for determining at least four properties of a specimen
US6812045B1 (en) 2000-09-20 2004-11-02 Kla-Tencor, Inc. Methods and systems for determining a characteristic of a specimen prior to, during, or subsequent to ion implantation
US6673637B2 (en) 2000-09-20 2004-01-06 Kla-Tencor Technologies Methods and systems for determining a presence of macro defects and overlay of a specimen
US6806951B2 (en) 2000-09-20 2004-10-19 Kla-Tencor Technologies Corp. Methods and systems for determining at least one characteristic of defects on at least two sides of a specimen
US6782337B2 (en) 2000-09-20 2004-08-24 Kla-Tencor Technologies Corp. Methods and systems for determining a critical dimension an a presence of defects on a specimen
US6891627B1 (en) 2000-09-20 2005-05-10 Kla-Tencor Technologies Corp. Methods and systems for determining a critical dimension and overlay of a specimen
JP4263416B2 (ja) * 2001-08-24 2009-05-13 株式会社日立製作所 荷電粒子顕微鏡評価システム
US7236847B2 (en) 2002-01-16 2007-06-26 Kla-Tencor Technologies Corp. Systems and methods for closed loop defect reduction
US6677586B1 (en) * 2002-08-27 2004-01-13 Kla -Tencor Technologies Corporation Methods and apparatus for electron beam inspection of samples
US6990743B2 (en) * 2002-08-29 2006-01-31 Micron Technology, Inc. Process for monitoring measuring device performance
JP4500099B2 (ja) * 2004-05-06 2010-07-14 株式会社日立ハイテクノロジーズ 電子顕微鏡装置システム及び電子顕微鏡装置システムを用いた寸法計測方法
JP4621098B2 (ja) * 2005-09-14 2011-01-26 株式会社日立ハイテクノロジーズ 走査型電子顕微鏡および画像信号処理方法
JP4922710B2 (ja) * 2006-09-20 2012-04-25 株式会社日立ハイテクノロジーズ 電子顕微鏡の分解能評価用試料及び電子顕微鏡の分解能評価方法並びに電子顕微鏡
DE102007014396A1 (de) * 2007-03-26 2008-10-09 Siemens Ag Abdeckung für ein Sekundärteil eines Linearmotors
US7615747B1 (en) * 2007-09-06 2009-11-10 Kla-Tencor Corporation Sampling feedback system
JP5302595B2 (ja) * 2008-08-06 2013-10-02 株式会社日立ハイテクノロジーズ 傾斜観察方法および観察装置
US9124810B2 (en) * 2010-04-14 2015-09-01 Koh Young Technology Inc. Method of checking an inspection apparatus and method of establishing a measurement variable of the inspection apparatus
KR101343375B1 (ko) 2010-04-14 2013-12-20 주식회사 고영테크놀러지 검사 장치의 진단 및 측정변수 설정 방법
JP2011233466A (ja) * 2010-04-30 2011-11-17 Jeol Ltd 電子顕微鏡の分解能評価方法、プログラム、及び情報記憶媒体
US9702695B2 (en) 2010-05-27 2017-07-11 Hitachi High-Technologies Corporation Image processing device, charged particle beam device, charged particle beam device adjustment sample, and manufacturing method thereof
KR101227116B1 (ko) * 2012-12-04 2013-01-29 주식회사 고영테크놀러지 검사 장치의 진단 및 측정변수 설정 방법
US9002097B1 (en) * 2013-02-26 2015-04-07 Hermes Microvision Inc. Method and system for enhancing image quality
JP2019109960A (ja) * 2016-03-15 2019-07-04 株式会社日立ハイテクノロジーズ 荷電粒子ビームの評価方法、荷電粒子ビームの評価のためのコンピュータープログラム、及び荷電粒子ビームの評価装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3919558A (en) 1974-11-04 1975-11-11 Gen Electric Hot sub-stage for a scanning electron microscope
US4068381A (en) * 1976-10-29 1978-01-17 The United States Of America As Represented By The Secretary Of Commerce Scanning electron microscope micrometer scale and method for fabricating same
JPS59112217A (ja) * 1982-11-29 1984-06-28 Toshiba Corp 寸法測定方法
JPS6358747A (ja) * 1986-08-29 1988-03-14 Agency Of Ind Science & Technol 電子顕微鏡
US5043586A (en) * 1990-10-25 1991-08-27 International Business Machines Corporation Planarized, reusable calibration grids
JPH0545265A (ja) * 1991-08-12 1993-02-23 Jeol Ltd 走査電子顕微鏡の性能評価用試料及びその製作方法
FR2704649B1 (fr) * 1993-04-30 1995-07-21 Centre Nat Rech Scient Machine de traction in situ et eprouvette pour microscope electronique a balayage.
JP2746125B2 (ja) * 1994-06-17 1998-04-28 日本電気株式会社 電子線露光装置の装置較正用基準マーク及び装置較正方法。
JPH09184715A (ja) * 1995-12-28 1997-07-15 Hitachi Ltd パターン形状検査装置
JPH1125898A (ja) * 1997-05-08 1999-01-29 Hitachi Ltd 電子顕微鏡の分解能評価方法および分解能評価用試料
JP3397101B2 (ja) * 1997-10-29 2003-04-14 株式会社日立製作所 欠陥検査方法および装置
US6545275B1 (en) * 1999-09-03 2003-04-08 Applied Materials, Inc. Beam evaluation

Also Published As

Publication number Publication date
JP5075303B2 (ja) 2012-11-21
EP1081742A2 (de) 2001-03-07
EP1081742A3 (de) 2001-06-13
US6545275B1 (en) 2003-04-08
EP1081742B1 (de) 2008-10-01
JP2001202911A (ja) 2001-07-27

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