DE60036376D1 - Verfahren und vorrichtung zur sekundärionenausbeuteerhöhung - Google Patents
Verfahren und vorrichtung zur sekundärionenausbeuteerhöhungInfo
- Publication number
- DE60036376D1 DE60036376D1 DE60036376T DE60036376T DE60036376D1 DE 60036376 D1 DE60036376 D1 DE 60036376D1 DE 60036376 T DE60036376 T DE 60036376T DE 60036376 T DE60036376 T DE 60036376T DE 60036376 D1 DE60036376 D1 DE 60036376D1
- Authority
- DE
- Germany
- Prior art keywords
- secondary land
- land exploitation
- exploitation
- land
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
- H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/25—Tubes for localised analysis using electron or ion beams
- H01J2237/2505—Tubes for localised analysis using electron or ion beams characterised by their application
- H01J2237/2516—Secondary particles mass or energy spectrometry
- H01J2237/2527—Ions [SIMS]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/317—Processing objects on a microscale
- H01J2237/3174—Etching microareas
- H01J2237/31742—Etching microareas for repairing masks
- H01J2237/31744—Etching microareas for repairing masks introducing gas in vicinity of workpiece
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/842—Manufacture, treatment, or detection of nanostructure for carbon nanotubes or fullerenes
- Y10S977/843—Gas phase catalytic growth, i.e. chemical vapor deposition
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/88—Manufacture, treatment, or detection of nanostructure with arrangement, process, or apparatus for testing
- Y10S977/881—Microscopy or spectroscopy, e.g. sem, tem
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/89—Deposition of materials, e.g. coating, cvd, or ald
- Y10S977/891—Vapor phase deposition
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/895—Manufacture, treatment, or detection of nanostructure having step or means utilizing chemical property
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/949—Radiation emitter using nanostructure
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Sources, Ion Sources (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/350,718 US6414307B1 (en) | 1999-07-09 | 1999-07-09 | Method and apparatus for enhancing yield of secondary ions |
US350718 | 1999-07-09 | ||
PCT/EP2000/006364 WO2001004611A2 (en) | 1999-07-09 | 2000-07-05 | Method and apparatus for enhancing yield of secondary ions |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60036376D1 true DE60036376D1 (de) | 2007-10-25 |
DE60036376T2 DE60036376T2 (de) | 2008-01-17 |
Family
ID=23377894
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60036376T Expired - Lifetime DE60036376T2 (de) | 1999-07-09 | 2000-07-05 | Verfahren und vorrichtung zur sekundärionenausbeuteerhöhung |
Country Status (5)
Country | Link |
---|---|
US (1) | US6414307B1 (de) |
EP (1) | EP1185857B1 (de) |
JP (2) | JP4863593B2 (de) |
DE (1) | DE60036376T2 (de) |
WO (1) | WO2001004611A2 (de) |
Families Citing this family (72)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6414307B1 (en) * | 1999-07-09 | 2002-07-02 | Fei Company | Method and apparatus for enhancing yield of secondary ions |
WO2001054163A1 (en) * | 2000-01-21 | 2001-07-26 | Koninklijke Philips Electronics N.V. | Shaped and low density focused ion beams |
FR2806527B1 (fr) | 2000-03-20 | 2002-10-25 | Schlumberger Technologies Inc | Colonne a focalisation simultanee d'un faisceau de particules et d'un faisceau optique |
US7246111B1 (en) | 2000-06-30 | 2007-07-17 | Ncr Corporation | Capturing database system information |
US6738756B1 (en) | 2000-06-30 | 2004-05-18 | Ncr Corporation | Analysis method and apparatus for a parallel system |
US7185000B1 (en) | 2000-06-30 | 2007-02-27 | Ncr Corp. | Method and apparatus for presenting query plans |
US6514866B2 (en) * | 2001-01-12 | 2003-02-04 | North Carolina State University | Chemically enhanced focused ion beam micro-machining of copper |
US6977386B2 (en) * | 2001-01-19 | 2005-12-20 | Fei Company | Angular aperture shaped beam system and method |
US6670610B2 (en) * | 2001-11-26 | 2003-12-30 | Applied Materials, Inc. | System and method for directing a miller |
AU2003211027A1 (en) * | 2002-03-27 | 2003-10-13 | Nanoink, Inc. | Method and apparatus for aligning patterns on a substrate |
AU2003226331A1 (en) * | 2002-04-10 | 2003-10-27 | Johns Hopkins University | Miniaturized sample scanning mass analyzer |
US8202440B1 (en) | 2002-08-27 | 2012-06-19 | Kla-Tencor Corporation | Methods and apparatus for electron beam assisted etching at low temperatures |
JP4205992B2 (ja) * | 2003-06-19 | 2009-01-07 | 株式会社日立ハイテクノロジーズ | イオンビームによる試料加工方法、イオンビーム加工装置、イオンビーム加工システム、及びそれを用いた電子部品の製造方法 |
EP1501115B1 (de) * | 2003-07-14 | 2009-07-01 | FEI Company | Zweistrahlsystem |
US8110814B2 (en) | 2003-10-16 | 2012-02-07 | Alis Corporation | Ion sources, systems and methods |
US7786451B2 (en) * | 2003-10-16 | 2010-08-31 | Alis Corporation | Ion sources, systems and methods |
US7504639B2 (en) * | 2003-10-16 | 2009-03-17 | Alis Corporation | Ion sources, systems and methods |
US7321118B2 (en) * | 2005-06-07 | 2008-01-22 | Alis Corporation | Scanning transmission ion microscope |
US7557360B2 (en) * | 2003-10-16 | 2009-07-07 | Alis Corporation | Ion sources, systems and methods |
US7495232B2 (en) * | 2003-10-16 | 2009-02-24 | Alis Corporation | Ion sources, systems and methods |
US7557358B2 (en) | 2003-10-16 | 2009-07-07 | Alis Corporation | Ion sources, systems and methods |
US7521693B2 (en) * | 2003-10-16 | 2009-04-21 | Alis Corporation | Ion sources, systems and methods |
US7601953B2 (en) * | 2006-03-20 | 2009-10-13 | Alis Corporation | Systems and methods for a gas field ion microscope |
US7554097B2 (en) * | 2003-10-16 | 2009-06-30 | Alis Corporation | Ion sources, systems and methods |
US7488952B2 (en) * | 2003-10-16 | 2009-02-10 | Alis Corporation | Ion sources, systems and methods |
US7557359B2 (en) * | 2003-10-16 | 2009-07-07 | Alis Corporation | Ion sources, systems and methods |
US7554096B2 (en) * | 2003-10-16 | 2009-06-30 | Alis Corporation | Ion sources, systems and methods |
US7485873B2 (en) * | 2003-10-16 | 2009-02-03 | Alis Corporation | Ion sources, systems and methods |
US9159527B2 (en) * | 2003-10-16 | 2015-10-13 | Carl Zeiss Microscopy, Llc | Systems and methods for a gas field ionization source |
US7368727B2 (en) * | 2003-10-16 | 2008-05-06 | Alis Technology Corporation | Atomic level ion source and method of manufacture and operation |
US7511280B2 (en) * | 2003-10-16 | 2009-03-31 | Alis Corporation | Ion sources, systems and methods |
US7414243B2 (en) * | 2005-06-07 | 2008-08-19 | Alis Corporation | Transmission ion microscope |
US7518122B2 (en) | 2003-10-16 | 2009-04-14 | Alis Corporation | Ion sources, systems and methods |
US7557361B2 (en) * | 2003-10-16 | 2009-07-07 | Alis Corporation | Ion sources, systems and methods |
US7786452B2 (en) * | 2003-10-16 | 2010-08-31 | Alis Corporation | Ion sources, systems and methods |
US7511279B2 (en) * | 2003-10-16 | 2009-03-31 | Alis Corporation | Ion sources, systems and methods |
US7659109B2 (en) * | 2004-05-17 | 2010-02-09 | Applied Biosystems, Llc | Pasting edge heater |
US20060022136A1 (en) * | 2004-07-29 | 2006-02-02 | Moore Thomas M | Multiple gas injection system for charged particle beam instruments |
JP4300168B2 (ja) * | 2004-09-10 | 2009-07-22 | 株式会社日立ハイテクノロジーズ | 集束イオンビーム装置、及びそれに用いる絞り |
DE102004049518B3 (de) * | 2004-10-11 | 2006-02-02 | Infineon Technologies Ag | Verfahren zum tiefenaufgelösten Charakterisieren einer Schicht eines Trägers |
US7388218B2 (en) * | 2005-04-04 | 2008-06-17 | Fei Company | Subsurface imaging using an electron beam |
WO2006116752A2 (en) | 2005-04-28 | 2006-11-02 | The Regents Of The University Of California | Compositions comprising nanostructures for cell, tissue and artificial organ growth, and methods for making and using same |
JP4845468B2 (ja) * | 2005-10-06 | 2011-12-28 | オリンパス株式会社 | 観察装置 |
US20070116373A1 (en) * | 2005-11-23 | 2007-05-24 | Sonosite, Inc. | Multi-resolution adaptive filtering |
WO2007067296A2 (en) * | 2005-12-02 | 2007-06-14 | Alis Corporation | Ion sources, systems and methods |
WO2007089124A1 (en) * | 2006-02-02 | 2007-08-09 | Cebt Co. Ltd. | Device for sustaining differential vacuum degrees for electron column |
CN100511431C (zh) | 2006-02-22 | 2009-07-08 | Tdk股份有限公司 | 磁记录介质的制造方法 |
JP4626611B2 (ja) * | 2006-02-22 | 2011-02-09 | Tdk株式会社 | 磁気記録媒体の製造方法 |
US20070227883A1 (en) * | 2006-03-20 | 2007-10-04 | Ward Billy W | Systems and methods for a helium ion pump |
US7804068B2 (en) * | 2006-11-15 | 2010-09-28 | Alis Corporation | Determining dopant information |
DE102008009640A1 (de) * | 2008-02-18 | 2009-08-27 | Carl Zeiss Nts Gmbh | Prozessierungssystem |
DE102008042179B9 (de) * | 2008-09-17 | 2013-10-10 | Carl Zeiss Microscopy Gmbh | Verfahren zur Analyse einer Probe |
US9244793B1 (en) | 2008-11-04 | 2016-01-26 | Teradata Us, Inc. | Using target database system statistics in emulation |
JP5702552B2 (ja) * | 2009-05-28 | 2015-04-15 | エフ イー アイ カンパニFei Company | デュアルビームシステムの制御方法 |
US20110085968A1 (en) * | 2009-10-13 | 2011-04-14 | The Regents Of The University Of California | Articles comprising nano-materials for geometry-guided stem cell differentiation and enhanced bone growth |
DE102010001347A1 (de) | 2010-01-28 | 2011-08-18 | Carl Zeiss NTS GmbH, 73447 | Vorrichtung zur Übertragung von Energie und/oder zum Transport eines Ions sowie Teilchenstrahlgerät mit einer solchen Vorrichtung |
DE102010001349B9 (de) | 2010-01-28 | 2014-08-28 | Carl Zeiss Microscopy Gmbh | Vorrichtung zum Fokussieren sowie zum Speichern von Ionen |
KR101161956B1 (ko) * | 2010-05-03 | 2012-07-04 | 삼성전기주식회사 | 화학성분 분석 방법 및 화학성분 분석 장치 |
CN102095619B (zh) * | 2010-12-23 | 2012-11-28 | 中国原子能科学研究院 | 一种以阿皮松为载体的擦拭样品微粒的回收方法 |
US9275823B2 (en) | 2012-03-21 | 2016-03-01 | Fei Company | Multiple gas injection system |
JP6230282B2 (ja) * | 2012-07-12 | 2017-11-15 | キヤノン株式会社 | 質量分析装置 |
JP6070383B2 (ja) * | 2013-04-17 | 2017-02-01 | 新日鐵住金株式会社 | 水素分布観察装置及び水素分布観察方法 |
US9245722B2 (en) * | 2013-09-16 | 2016-01-26 | Georgia Tech Research Corporation | SMS probe and SEM imaging system and methods of use |
CN105103265B (zh) * | 2013-12-13 | 2017-05-10 | 中国科学院地质与地球物理研究所 | 使用二次离子质谱仪分析气体样品的系统和方法 |
WO2016120579A1 (en) * | 2015-01-27 | 2016-08-04 | Nanoscope Services Limited | Charged particle instruments |
EP3477682B1 (de) * | 2017-10-30 | 2020-03-11 | FEI Company | Verbesserte sekundärionen-massenspektrometrie-technik |
US11440151B2 (en) | 2019-06-07 | 2022-09-13 | Applied Materials Israel Ltd. | Milling a multi-layered object |
US10971618B2 (en) | 2019-08-02 | 2021-04-06 | Applied Materials Israel Ltd. | Generating milled structural elements with a flat upper surface |
US11276557B2 (en) | 2019-09-17 | 2022-03-15 | Applied Materials Israel Ltd. | Forming a vertical surface |
DE102020112220B9 (de) | 2020-05-06 | 2022-05-25 | Carl Zeiss Microscopy Gmbh | Teilchenstrahlgerät zum Abtragen mindestens eines Materials von einer Materialeinheit und Anordnen des Materials an einem Objekt |
CN112863979B (zh) * | 2021-01-14 | 2022-02-08 | 西安交通大学 | 一种微纳尺度离子束外束引出装置 |
CN113035674A (zh) * | 2021-02-07 | 2021-06-25 | 上海精测半导体技术有限公司 | 一种多气源气体注射装置 |
Family Cites Families (24)
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JPH036914Y2 (de) * | 1985-09-10 | 1991-02-21 | ||
WO1989004052A1 (en) | 1987-10-22 | 1989-05-05 | Oxford Instruments Limited | Exposing substrates to ion beams |
JP2650930B2 (ja) | 1987-11-24 | 1997-09-10 | 株式会社日立製作所 | 超格子構作の素子製作方法 |
US4874947A (en) * | 1988-02-26 | 1989-10-17 | Micrion Corporation | Focused ion beam imaging and process control |
JPH0710403Y2 (ja) * | 1988-03-03 | 1995-03-08 | 東洋リビング株式会社 | 中湿庫 |
US5087815A (en) * | 1989-11-08 | 1992-02-11 | Schultz J Albert | High resolution mass spectrometry of recoiled ions for isotopic and trace elemental analysis |
JP2763172B2 (ja) | 1990-03-19 | 1998-06-11 | 株式会社神戸製鋼所 | ダイヤモンド薄膜のエッチング方法 |
DE69130909T2 (de) | 1990-06-26 | 1999-06-24 | Fujitsu Ltd | Plasmabehandlungsverfahren eines Resists unter Verwendung von Wasserstoffgas |
US5149974A (en) * | 1990-10-29 | 1992-09-22 | International Business Machines Corporation | Gas delivery for ion beam deposition and etching |
WO1994013010A1 (en) * | 1991-04-15 | 1994-06-09 | Fei Company | Process of shaping features of semiconductor devices |
US5188705A (en) | 1991-04-15 | 1993-02-23 | Fei Company | Method of semiconductor device manufacture |
US5272338A (en) * | 1992-05-21 | 1993-12-21 | The Pennsylvania Research Corporation | Molecular imaging system |
JP3238550B2 (ja) * | 1992-11-02 | 2001-12-17 | 株式会社東芝 | 構造体の欠陥修正方法 |
JP3153391B2 (ja) | 1993-07-07 | 2001-04-09 | 株式会社日立製作所 | 集束イオンビーム装置 |
US5435850A (en) | 1993-09-17 | 1995-07-25 | Fei Company | Gas injection system |
AU2914095A (en) | 1994-06-28 | 1996-01-25 | Fei Company | Charged particle deposition of electrically insulating films |
JP3455306B2 (ja) * | 1994-10-24 | 2003-10-14 | 三菱電機株式会社 | 異物分析装置及び半導体製造制御装置並びに異物分析方法及び半導体製造制御方法 |
US5958799A (en) * | 1995-04-13 | 1999-09-28 | North Carolina State University | Method for water vapor enhanced charged-particle-beam machining |
US5798529A (en) * | 1996-05-28 | 1998-08-25 | International Business Machines Corporation | Focused ion beam metrology |
JP3081990B2 (ja) | 1996-06-20 | 2000-08-28 | セイコーインスツルメンツ株式会社 | イオンビーム加工装置 |
JPH10223168A (ja) * | 1997-02-12 | 1998-08-21 | Hitachi Ltd | 試料分析装置 |
JPH10282025A (ja) * | 1997-04-11 | 1998-10-23 | Sony Corp | 2次イオン質量分析方法 |
JP3739573B2 (ja) * | 1998-07-27 | 2006-01-25 | エスアイアイ・ナノテクノロジー株式会社 | フォトマスクの欠陥修正方法及びそれに用いる装置 |
US6414307B1 (en) * | 1999-07-09 | 2002-07-02 | Fei Company | Method and apparatus for enhancing yield of secondary ions |
-
1999
- 1999-07-09 US US09/350,718 patent/US6414307B1/en not_active Expired - Lifetime
-
2000
- 2000-07-05 WO PCT/EP2000/006364 patent/WO2001004611A2/en active IP Right Grant
- 2000-07-05 DE DE60036376T patent/DE60036376T2/de not_active Expired - Lifetime
- 2000-07-05 JP JP2001509972A patent/JP4863593B2/ja not_active Expired - Fee Related
- 2000-07-05 EP EP00949267A patent/EP1185857B1/de not_active Expired - Lifetime
-
2011
- 2011-09-27 JP JP2011210846A patent/JP5449286B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2012008145A (ja) | 2012-01-12 |
JP4863593B2 (ja) | 2012-01-25 |
US6414307B1 (en) | 2002-07-02 |
DE60036376T2 (de) | 2008-01-17 |
EP1185857B1 (de) | 2007-09-12 |
JP2003504616A (ja) | 2003-02-04 |
WO2001004611A2 (en) | 2001-01-18 |
WO2001004611A3 (en) | 2001-12-13 |
JP5449286B2 (ja) | 2014-03-19 |
EP1185857A2 (de) | 2002-03-13 |
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