DE60034791D1 - Mikrobauelement und dessen herstellungsverfahren - Google Patents

Mikrobauelement und dessen herstellungsverfahren

Info

Publication number
DE60034791D1
DE60034791D1 DE60034791T DE60034791T DE60034791D1 DE 60034791 D1 DE60034791 D1 DE 60034791D1 DE 60034791 T DE60034791 T DE 60034791T DE 60034791 T DE60034791 T DE 60034791T DE 60034791 D1 DE60034791 D1 DE 60034791D1
Authority
DE
Germany
Prior art keywords
micropower
manufacturing
micropower element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60034791T
Other languages
English (en)
Other versions
DE60034791T2 (de
Inventor
Yukihisa Yoshida
Martial Chabloz
Jiwei Jiao
Tsukasa Matsuura
Kazuhiko Tsutsumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of DE60034791D1 publication Critical patent/DE60034791D1/de
Application granted granted Critical
Publication of DE60034791T2 publication Critical patent/DE60034791T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
    • B81C1/00134—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems comprising flexible or deformable structures
    • B81C1/0015—Cantilevers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00436—Shaping materials, i.e. techniques for structuring the substrate or the layers on the substrate
    • B81C1/00555—Achieving a desired geometry, i.e. controlling etch rates, anisotropy or selectivity
    • B81C1/00563—Avoid or control over-etching
    • B81C1/00579—Avoid charge built-up
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P1/00—Details of instruments
    • G01P1/02—Housings
    • G01P1/023—Housings for acceleration measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/0802—Details
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2201/00—Specific applications of microelectromechanical systems
    • B81B2201/02—Sensors
    • B81B2201/0228—Inertial sensors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2203/00—Basic microelectromechanical structures
    • B81B2203/01—Suspended structures, i.e. structures allowing a movement
    • B81B2203/0136—Comb structures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
    • G01P2015/0808—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate
    • G01P2015/0811—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass
    • G01P2015/0814—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass for translational movement of the mass, e.g. shuttle type
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
DE60034791T 2000-01-19 2000-01-19 Mikrobauelement und dessen herstellungsverfahren Expired - Lifetime DE60034791T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2000/000222 WO2001053194A1 (en) 2000-01-19 2000-01-19 Microdevice and its production method

Publications (2)

Publication Number Publication Date
DE60034791D1 true DE60034791D1 (de) 2007-06-21
DE60034791T2 DE60034791T2 (de) 2008-01-17

Family

ID=11735587

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60034791T Expired - Lifetime DE60034791T2 (de) 2000-01-19 2000-01-19 Mikrobauelement und dessen herstellungsverfahren

Country Status (5)

Country Link
US (1) US6528724B1 (de)
EP (1) EP1203748B1 (de)
KR (1) KR100450804B1 (de)
DE (1) DE60034791T2 (de)
WO (1) WO2001053194A1 (de)

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JP4306149B2 (ja) * 2001-05-28 2009-07-29 株式会社デンソー 半導体装置の製造方法
WO2002103368A1 (en) * 2001-06-13 2002-12-27 Mitsubishi Denki Kabushiki Kaisha Silicon device
CA2463900C (en) 2001-10-19 2011-01-11 Input/Output, Inc. Digital optical switch apparatus and process for manufacturing same
EP1890181B1 (de) * 2001-10-19 2012-07-04 ION Geophysical Corporation Digitale optische Schaltvorrichtung und Verfahren zu ihrer Herstellung
JP2003344445A (ja) 2002-05-24 2003-12-03 Mitsubishi Electric Corp 慣性力センサ
KR100447851B1 (ko) * 2002-11-14 2004-09-08 삼성전자주식회사 반도체장치의 플립칩 방식 측면 접합 본딩 방법 및 이를이용한 ｍｅｍｓ 소자 패키지 및 패키지 방법
KR100512971B1 (ko) * 2003-02-24 2005-09-07 삼성전자주식회사 솔더볼을 이용한 마이크로 전자 기계 시스템의 제조 방법
JP4455831B2 (ja) * 2003-03-28 2010-04-21 株式会社デンソー 加速度センサの製造方法
US7422928B2 (en) 2003-09-22 2008-09-09 Matsushita Electric Works, Ltd. Process for fabricating a micro-electro-mechanical system with movable components
US6992250B2 (en) * 2004-02-26 2006-01-31 Kyocera Corporation Electronic component housing package and electronic apparatus
JP4556454B2 (ja) * 2004-03-15 2010-10-06 パナソニック電工株式会社 半導体装置の製造方法
US7118991B2 (en) * 2004-04-01 2006-10-10 Delphi Technologies, Inc. Encapsulation wafer process
WO2005102307A2 (en) * 2004-04-19 2005-11-03 Strategic Science & Technologies, Llc Beneficial effects of increasing local blood flow
FR2865201A1 (fr) * 2004-06-18 2005-07-22 Commissariat Energie Atomique Technique de realisation de structures a forte topologie auto-alignees
US7250322B2 (en) * 2005-03-16 2007-07-31 Delphi Technologies, Inc. Method of making microsensor
DE102005015584B4 (de) 2005-04-05 2010-09-02 Litef Gmbh Verfahren zur Herstellung eines mikromechanischen Bauteils
JP4766932B2 (ja) * 2005-06-21 2011-09-07 株式会社ワコー 容量素子を用いたセンサの製造方法
JP4839747B2 (ja) * 2005-09-20 2011-12-21 三菱電機株式会社 静電容量型加速度センサ
WO2008012846A1 (en) * 2006-07-26 2008-01-31 Stmicroelectronics S.R.L. Planar microelectromechanical device having a stopper structure for out-of-plane movements
DE102007030121A1 (de) * 2007-06-29 2009-01-02 Litef Gmbh Verfahren zur Herstellung eines Bauteils und Bauteil
JP2009214231A (ja) * 2008-03-10 2009-09-24 Ricoh Co Ltd 振動素子、振動素子の製造方法、光走査装置及び画像形成装置
DE102008042347B4 (de) * 2008-09-25 2016-11-10 Robert Bosch Gmbh Mikromechanischer Sensor und Verfahren zu seiner Herstellung
JP5062146B2 (ja) * 2008-11-21 2012-10-31 大日本印刷株式会社 物理量センサおよびその製造方法、ならびに電子機器
EP2399863A1 (de) * 2010-06-22 2011-12-28 Valtion Teknillinen Tutkimuskeskus Mehrschichtige Substratstruktur und Herstellungsverfahren dafür
JP2012178710A (ja) * 2011-02-25 2012-09-13 Sanyo Electric Co Ltd Ｍｅｍｓデバイスおよびその製造方法
JP5811634B2 (ja) * 2011-06-30 2015-11-11 セイコーエプソン株式会社 物理量センサー、電子機器
JP5696686B2 (ja) * 2011-08-30 2015-04-08 株式会社豊田中央研究所 半導体装置
CN103842830B (zh) * 2011-11-14 2016-10-05 富士电机株式会社 加速度传感器
WO2013141013A1 (ja) * 2012-03-22 2013-09-26 京セラ株式会社 素子収納用パッケージ
US10023459B2 (en) * 2013-03-11 2018-07-17 Taiwan Semiconductor Manufacturing Company, Ltd. MEMS and method for forming the same
CN104370273B (zh) * 2014-11-17 2016-11-23 广东万事泰集团有限公司 一种基于高分子材料可动悬空结构的制作方法
JP2017053742A (ja) * 2015-09-10 2017-03-16 セイコーエプソン株式会社 電子デバイスの製造方法、電子デバイス、電子機器、および移動体
CN111453694B (zh) * 2020-03-06 2023-07-21 深迪半导体(绍兴)有限公司 Mems器件及其制造方法

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DE4241045C1 (de) 1992-12-05 1994-05-26 Bosch Gmbh Robert Verfahren zum anisotropen Ätzen von Silicium
US5738731A (en) * 1993-11-19 1998-04-14 Mega Chips Corporation Photovoltaic device
US5698112A (en) * 1994-11-24 1997-12-16 Siemens Aktiengesellschaft Corrosion protection for micromechanical metal layers
JPH1047966A (ja) * 1996-07-31 1998-02-20 Aisin Seiki Co Ltd 角速度センサ
US5905241A (en) * 1997-05-30 1999-05-18 Hyundai Motor Company Threshold microswitch and a manufacturing method thereof
JPH11118826A (ja) * 1997-10-08 1999-04-30 Aisin Seiki Co Ltd マイクロマシンセンサ

Also Published As

Publication number Publication date
WO2001053194A1 (en) 2001-07-26
EP1203748B1 (de) 2007-05-09
EP1203748A4 (de) 2005-06-01
EP1203748A1 (de) 2002-05-08
KR20020003213A (ko) 2002-01-10
DE60034791T2 (de) 2008-01-17
US6528724B1 (en) 2003-03-04
KR100450804B1 (ko) 2004-10-01

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