DE60030178D1 - Herstellungsverfahren für eine optische Nahfeldsonde - Google Patents

Herstellungsverfahren für eine optische Nahfeldsonde

Info

Publication number
DE60030178D1
DE60030178D1 DE60030178T DE60030178T DE60030178D1 DE 60030178 D1 DE60030178 D1 DE 60030178D1 DE 60030178 T DE60030178 T DE 60030178T DE 60030178 T DE60030178 T DE 60030178T DE 60030178 D1 DE60030178 D1 DE 60030178D1
Authority
DE
Germany
Prior art keywords
manufacturing
optical probe
field optical
probe
field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60030178T
Other languages
English (en)
Other versions
DE60030178T2 (de
Inventor
Niwa Takashi
Kenji Kato
Nobuyuki Kasama
Manabu Oumi
Yasuyuki Mitsuoka
Susumu Ichihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Publication of DE60030178D1 publication Critical patent/DE60030178D1/de
Application granted granted Critical
Publication of DE60030178T2 publication Critical patent/DE60030178T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
    • G01Q60/06—SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Biophysics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Optical Head (AREA)
  • Microscoopes, Condenser (AREA)
DE60030178T 1999-12-20 2000-12-20 Herstellungsverfahren für eine optische Nahfeldsonde Expired - Fee Related DE60030178T2 (de)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP36170199 1999-12-20
JP36170199 1999-12-20
JP2000130826 2000-04-28
JP2000130826 2000-04-28
JP2000352778 2000-11-20
JP2000352778A JP4472863B2 (ja) 1999-12-20 2000-11-20 近視野光プローブおよびその近視野光プローブを用いた近視野光装置

Publications (2)

Publication Number Publication Date
DE60030178D1 true DE60030178D1 (de) 2006-09-28
DE60030178T2 DE60030178T2 (de) 2007-07-19

Family

ID=27341656

Family Applications (2)

Application Number Title Priority Date Filing Date
DE60030178T Expired - Fee Related DE60030178T2 (de) 1999-12-20 2000-12-20 Herstellungsverfahren für eine optische Nahfeldsonde
DE60035250T Expired - Fee Related DE60035250T2 (de) 1999-12-20 2000-12-20 Optische Nahfeldsonde und optisches Scanning-Nahfeld-Mikroskop

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE60035250T Expired - Fee Related DE60035250T2 (de) 1999-12-20 2000-12-20 Optische Nahfeldsonde und optisches Scanning-Nahfeld-Mikroskop

Country Status (4)

Country Link
US (1) US6768095B2 (de)
EP (2) EP1111426B1 (de)
JP (1) JP4472863B2 (de)
DE (2) DE60030178T2 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001308002A (ja) * 2000-02-15 2001-11-02 Canon Inc フォトマスクを用いたパターン作製方法、及びパターン作製装置
GB2368675A (en) * 2000-05-02 2002-05-08 Ford Motor Co Online invention disclosure system and docket system
JP2002005810A (ja) * 2000-06-16 2002-01-09 Canon Inc プローブ及びその製造方法、表面観察装置、露光装置、情報処理装置
KR100441894B1 (ko) * 2002-01-26 2004-07-27 한국전자통신연구원 마이크로 집적형 근접장 광기록 헤드 및 이를 이용한광기록 장치
US8288154B2 (en) * 2002-10-21 2012-10-16 Alegis Microsystems Nanomotion sensing system and method
KR100499029B1 (ko) * 2002-10-22 2005-07-01 한국전자통신연구원 광 정보 저장장치의 헤드에 적용 가능한 캔티레버형근접장 탐침 구조 및 그 제작 방법
DE10303961B4 (de) * 2003-01-31 2005-03-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Sonde für ein optisches Nahfeldmikroskop und Verfahren zu deren Herstellung
US7637960B2 (en) * 2005-11-15 2009-12-29 University Of Houston Short and thin silicon cantilever with tip and fabrication thereof
KR100869377B1 (ko) * 2006-05-08 2008-11-19 주식회사 엘지화학 병렬 연결 구조의 중첩식 이차전지
US7975316B2 (en) * 2007-01-17 2011-07-05 Osaka University Atomic force microscope and interaction force measurement method using atomic force microscope
KR100936748B1 (ko) * 2007-05-29 2010-01-21 한양대학교 산학협력단 탐침 현미경의 자동 랜딩 방법 및 이를 이용하는 자동 랜딩장치
JP4949293B2 (ja) * 2008-02-21 2012-06-06 セイコーインスツル株式会社 ティップ型プローブ製造方法、ティップ型プローブ及びティップ型プローブ製造装置
US8151368B2 (en) * 2008-05-12 2012-04-03 Japan Science And Technology Agency Dynamic mode AFM apparatus
US8214916B2 (en) * 2009-01-26 2012-07-03 Nanoink, Inc. Large area, homogeneous array fabrication including leveling with use of bright spots
WO2010096593A2 (en) * 2009-02-18 2010-08-26 Northwestern University Beam pen lithography
CN102221525B (zh) * 2010-04-14 2015-04-15 深圳迈瑞生物医疗电子股份有限公司 一种样本检测光学系统、样本分析装置
DE202010013458U1 (de) 2010-09-23 2010-12-30 Eberhard-Karls-Universität Tübingen Sonde für aperturlose Nahfeldmikroskopie und/oder für Ramanspektroskopie
CN102012439B (zh) * 2010-10-12 2013-08-07 中国科学院苏州纳米技术与纳米仿生研究所 硅基自锐式afm探针的制备方法
WO2013112608A1 (en) 2012-01-23 2013-08-01 The Regents Of The University Of Michigan Photoconductive device with plasmonic electrodes
CN104903793A (zh) 2012-10-29 2015-09-09 西北大学 热启动和投影平版印刷系统和方法
US11300773B2 (en) * 2014-09-29 2022-04-12 Agilent Technologies, Inc. Mid-infrared scanning system
JP6671745B2 (ja) * 2015-09-30 2020-03-25 国立大学法人北陸先端科学技術大学院大学 近接場プローブ構造および走査プローブ顕微鏡
TWI579534B (zh) * 2015-12-16 2017-04-21 和碩聯合科技股份有限公司 壓力感測系統
EP3612812A4 (de) * 2017-04-20 2021-01-06 The Regents of the University of California Systeme und verfahren für hochfrequenznanoskopie
EP3722741A1 (de) * 2019-04-08 2020-10-14 Nokia Technologies Oy Vorrichtung mit einem ausleger
US11906424B2 (en) 2019-10-01 2024-02-20 The Regents Of The University Of California Method for identifying chemical and structural variations through terahertz time-domain spectroscopy
EP4052458A4 (de) 2019-10-31 2023-11-29 The Regents of the University of California Verfahren und systeme zur detektion des wasserstatus bei pflanzen mittels terahertzstrahlung

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5289004A (en) * 1990-03-27 1994-02-22 Olympus Optical Co., Ltd. Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light
JP3268797B2 (ja) 1991-10-09 2002-03-25 オリンパス光学工業株式会社 光導入装置
JP3213436B2 (ja) * 1993-05-24 2001-10-02 シャープ株式会社 光プローブ素子、光プローブ素子を用いた記録再生装置、および光プローブ素子の製造方法
US5354985A (en) 1993-06-03 1994-10-11 Stanford University Near field scanning optical and force microscope including cantilever and optical waveguide
JPH0792173A (ja) * 1993-09-24 1995-04-07 Agency Of Ind Science & Technol 原子間力顕微鏡用カンチレバーとその製造方法
US5633455A (en) * 1993-10-05 1997-05-27 Board Of Trustees Of The Leland Stanford, Jr. University Method of detecting particles of semiconductor wafers
JP3047030B2 (ja) 1993-11-05 2000-05-29 セイコーインスツルメンツ株式会社 走査型近視野原子間力顕微鏡
US5675532A (en) * 1994-07-28 1997-10-07 Kabushiki Kaisha Toshiba Recording medium and recording/reproduction method
US5479024A (en) * 1994-08-11 1995-12-26 The Regents Of The University Of California Method and apparatus for performing near-field optical microscopy
US5489774A (en) 1994-09-20 1996-02-06 The Board Of Trustees Of The Leland Stanford University Combined atomic force and near field scanning optical microscope with photosensitive cantilever
US5581083A (en) * 1995-05-11 1996-12-03 The Regents Of The University Of California Method for fabricating a sensor on a probe tip used for atomic force microscopy and the like
US5838005A (en) 1995-05-11 1998-11-17 The Regents Of The University Of California Use of focused ion and electron beams for fabricating a sensor on a probe tip used for scanning multiprobe microscopy and the like
US5936237A (en) * 1995-07-05 1999-08-10 Van Der Weide; Daniel Warren Combined topography and electromagnetic field scanning probe microscope
JP3618896B2 (ja) 1996-03-29 2005-02-09 キヤノン株式会社 微小開口を有するプローブの作製法とそれによるプローブ、並びに該プローブを用いた走査型近接場光顕微鏡と走査型トンネル顕微鏡との複合装置、および該プローブを用いた記録再生装置
JPH10325840A (ja) 1997-05-23 1998-12-08 Seiko Instr Inc 偏光を利用した走査型近視野顕微鏡
JP4412620B2 (ja) 1997-12-15 2010-02-10 セイコーインスツル株式会社 光導波路プローブ
JP3554233B2 (ja) * 1998-10-28 2004-08-18 キヤノン株式会社 光プローブの製造方法

Also Published As

Publication number Publication date
JP4472863B2 (ja) 2010-06-02
EP1519388A1 (de) 2005-03-30
EP1111426A3 (de) 2003-03-19
US6768095B2 (en) 2004-07-27
US20010011704A1 (en) 2001-08-09
EP1111426A2 (de) 2001-06-27
DE60035250T2 (de) 2007-11-22
JP2002014030A (ja) 2002-01-18
EP1111426B1 (de) 2007-06-20
DE60030178T2 (de) 2007-07-19
DE60035250D1 (de) 2007-08-02
EP1519388B1 (de) 2006-08-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee