DE60017642D1 - Chemische-mechanische Schleifzusammensetzung für Halbleiterverarbeitung - Google Patents

Chemische-mechanische Schleifzusammensetzung für Halbleiterverarbeitung

Info

Publication number
DE60017642D1
DE60017642D1 DE60017642T DE60017642T DE60017642D1 DE 60017642 D1 DE60017642 D1 DE 60017642D1 DE 60017642 T DE60017642 T DE 60017642T DE 60017642 T DE60017642 T DE 60017642T DE 60017642 D1 DE60017642 D1 DE 60017642D1
Authority
DE
Germany
Prior art keywords
chemical
semiconductor processing
abrasive composition
mechanical abrasive
mechanical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60017642T
Other languages
English (en)
Other versions
DE60017642T2 (de
Inventor
Tsung-Ho Lee
Kang-Hua Lee
Tsui-Ping Yeh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CMC Materials Taiwan Co Ltd
Original Assignee
Eternal Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eternal Chemical Co Ltd filed Critical Eternal Chemical Co Ltd
Publication of DE60017642D1 publication Critical patent/DE60017642D1/de
Application granted granted Critical
Publication of DE60017642T2 publication Critical patent/DE60017642T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • C09K3/1454Abrasive powders, suspensions and pastes for polishing
    • C09K3/1463Aqueous liquid suspensions
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • C09G1/02Polishing compositions containing abrasives or grinding agents

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
DE2000617642 1999-07-16 2000-05-19 Chemische-mechanische Schleifzusammensetzung für Halbleiterverarbeitung Expired - Lifetime DE60017642T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN99109797A CN1125861C (zh) 1999-07-16 1999-07-16 半导体加工用化学机械研磨组合物
CN99109797 1999-07-16

Publications (2)

Publication Number Publication Date
DE60017642D1 true DE60017642D1 (de) 2005-03-03
DE60017642T2 DE60017642T2 (de) 2006-03-30

Family

ID=5274156

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2000617642 Expired - Lifetime DE60017642T2 (de) 1999-07-16 2000-05-19 Chemische-mechanische Schleifzusammensetzung für Halbleiterverarbeitung

Country Status (4)

Country Link
EP (1) EP1069168B1 (de)
CN (1) CN1125861C (de)
DE (1) DE60017642T2 (de)
SG (1) SG79296A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI282360B (en) * 2002-06-03 2007-06-11 Hitachi Chemical Co Ltd Polishing composition and polishing method thereof
GB2393186B (en) 2002-07-31 2006-02-22 Kao Corp Polishing composition
JP3875156B2 (ja) * 2002-08-07 2007-01-31 花王株式会社 ロールオフ低減剤
GB2393447B (en) * 2002-08-07 2006-04-19 Kao Corp Polishing composition
US7186653B2 (en) 2003-07-30 2007-03-06 Climax Engineered Materials, Llc Polishing slurries and methods for chemical mechanical polishing
CN101153205A (zh) * 2006-09-29 2008-04-02 安集微电子(上海)有限公司 用于抛光低介电材料的化学机械抛光液
SG185262A1 (en) * 2007-09-28 2012-11-29 Nitta Haas Inc Polishing composition
CN102101982A (zh) * 2009-12-18 2011-06-22 安集微电子(上海)有限公司 一种化学机械抛光液
CN102477258B (zh) * 2010-11-26 2015-05-27 安集微电子(上海)有限公司 一种化学机械抛光液
KR101907637B1 (ko) * 2018-02-09 2018-12-05 엘티씨에이엠 주식회사 실리콘질화막의 고선택비 식각 조성물
CN113122147B (zh) * 2019-12-31 2024-03-12 安集微电子科技(上海)股份有限公司 一种化学机械抛光液及其使用方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3850053B2 (ja) * 1995-10-04 2006-11-29 花王株式会社 磁気記録媒体基板製造用研磨材組成物及び磁気記録媒体用基板の製造方法
US6007592A (en) * 1996-11-14 1999-12-28 Nissan Chemical Industries, Ltd. Polishing composition for aluminum disk and polishing process therewith
US6336945B1 (en) * 1996-11-14 2002-01-08 Kao Corporation Abrasive composition for the base of magnetic recording medium and process for producing the base by using the same
WO1998023697A1 (en) * 1996-11-26 1998-06-04 Cabot Corporation Composition and method for polishing rigid disks
US6068787A (en) * 1996-11-26 2000-05-30 Cabot Corporation Composition and slurry useful for metal CMP
SG54606A1 (en) * 1996-12-05 1998-11-16 Fujimi Inc Polishing composition
US5916855A (en) * 1997-03-26 1999-06-29 Advanced Micro Devices, Inc. Chemical-mechanical polishing slurry formulation and method for tungsten and titanium thin films
JPH1121545A (ja) * 1997-06-30 1999-01-26 Fujimi Inkooporeetetsudo:Kk 研磨用組成物
US6083419A (en) * 1997-07-28 2000-07-04 Cabot Corporation Polishing composition including an inhibitor of tungsten etching
JPH1180708A (ja) * 1997-09-09 1999-03-26 Fujimi Inkooporeetetsudo:Kk 研磨用組成物

Also Published As

Publication number Publication date
SG79296A1 (en) 2001-03-20
EP1069168A1 (de) 2001-01-17
DE60017642T2 (de) 2006-03-30
EP1069168B1 (de) 2005-01-26
CN1281023A (zh) 2001-01-24
CN1125861C (zh) 2003-10-29

Similar Documents

Publication Publication Date Title
DE69820355D1 (de) Poliervorrichtung für Halbleiterscheibe
DE60219113D1 (de) Polierkissen für Halbleiter-Wafer
DE69831150D1 (de) Chemische-mechanische Schleifzusammensetzung für Halbleiterverarbeitung
EP1205965A4 (de) Schleifmittel für cmp, methode, ein substrat zu polieren, und methode zur bearbeitung von halbleiteranordnungen unter verwendung desselben, und zusatz zu einem cmp schleifmittel
DE60027505D1 (de) Schleifmittelzusammensetzung
DE60014907D1 (de) Schleifmittelzusammensetzung
HK1047190A1 (zh) 化學機械拋光後半導體表面的清洗溶液
DE69914834D1 (de) Polierkissen
DE60110226D1 (de) Unterlage für polierscheibe
DE69823100D1 (de) Abrichtgerät für chemisch-mechanisches Polierkissen
DE60007642T2 (de) Spindelanordnung für poliervorrichtung
SG116418A1 (en) Semiconductor wafer grinding method.
DE60022356D1 (de) Doppelseitenpolierverfahren für dünne scheibenförmige Werkstücke
GB2349839B (en) Apparatus for polishing wafers
EP1235261A4 (de) Peptide enthaltendes poliermittel für halbleiter
DE10083516T1 (de) Poliermaschine für die Umfangskanten von Halbleiterwafern
DE60017642D1 (de) Chemische-mechanische Schleifzusammensetzung für Halbleiterverarbeitung
ID23146A (id) Komposisi pembersih abrasif
DE59901651D1 (de) Schleifvorrichtung für gebogene flächen
GB0103536D0 (en) Wafer polishing apparatus
DE69823113D1 (de) Halbleiterscheibenpoliermaschine
DE60030829D1 (de) Halbleiterscheibehalter für Poliermaschine
DE59806748D1 (de) Poliermittel für halbleitersubstrate
GB2351462B (en) Apparatus for polishing wafers
DE60038921D1 (de) Oberflächenstabilisierungsverfahren für Halbleiterverbindungen

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: EPOCH MATERIAL CO., LTD., LU-CHUH HSIANG, KAOHSIUN