HK1047190A1 - 化學機械拋光後半導體表面的清洗溶液 - Google Patents

化學機械拋光後半導體表面的清洗溶液

Info

Publication number
HK1047190A1
HK1047190A1 HK02108762.7A HK02108762A HK1047190A1 HK 1047190 A1 HK1047190 A1 HK 1047190A1 HK 02108762 A HK02108762 A HK 02108762A HK 1047190 A1 HK1047190 A1 HK 1047190A1
Authority
HK
Hong Kong
Prior art keywords
cleaning solution
mechanical polishing
following chemical
semiconductor surfaces
surfaces following
Prior art date
Application number
HK02108762.7A
Other languages
English (en)
Inventor
王淑敏
Original Assignee
卡伯特微電子公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 卡伯特微電子公司 filed Critical 卡伯特微電子公司
Publication of HK1047190A1 publication Critical patent/HK1047190A1/zh

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/26Organic compounds containing oxygen
    • C11D7/265Carboxylic acids or salts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02057Cleaning during device manufacture
    • H01L21/02068Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
    • H01L21/02074Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers the processing being a planarization of conductive layers
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D1/00Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
    • C11D1/38Cationic compounds
    • C11D1/46Esters of carboxylic acids with amino alcohols; Esters of amino carboxylic acids with alcohols
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3209Amines or imines with one to four nitrogen atoms; Quaternized amines
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3218Alkanolamines or alkanolimines
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/36Organic compounds containing phosphorus
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Wood Science & Technology (AREA)
  • Organic Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Emergency Medicine (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Detergent Compositions (AREA)
HK02108762.7A 1999-09-27 2002-12-03 化學機械拋光後半導體表面的清洗溶液 HK1047190A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/405,249 US6395693B1 (en) 1999-09-27 1999-09-27 Cleaning solution for semiconductor surfaces following chemical-mechanical polishing
PCT/US2000/025999 WO2001024242A1 (en) 1999-09-27 2000-09-22 Cleaning solution for semiconductor surfaces following chemical-mechanical polishing

Publications (1)

Publication Number Publication Date
HK1047190A1 true HK1047190A1 (zh) 2003-02-07

Family

ID=23602906

Family Applications (1)

Application Number Title Priority Date Filing Date
HK02108762.7A HK1047190A1 (zh) 1999-09-27 2002-12-03 化學機械拋光後半導體表面的清洗溶液

Country Status (8)

Country Link
US (2) US6395693B1 (zh)
EP (1) EP1218929A1 (zh)
JP (1) JP2003510840A (zh)
KR (1) KR20020035152A (zh)
CN (1) CN1211839C (zh)
AU (1) AU4025701A (zh)
HK (1) HK1047190A1 (zh)
WO (1) WO2001024242A1 (zh)

Families Citing this family (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100867287B1 (ko) * 2000-06-16 2008-11-06 카오카부시키가이샤 세정제 조성물
US6627546B2 (en) * 2001-06-29 2003-09-30 Ashland Inc. Process for removing contaminant from a surface and composition useful therefor
TWI339680B (en) * 2002-02-19 2011-04-01 Kanto Kagaku Washing liquid composition for semiconductor substrate
TWI231523B (en) * 2003-06-18 2005-04-21 Hon Hai Prec Ind Co Ltd Method of cleaning surface of semiconductor wafer
US20050049162A1 (en) * 2003-08-29 2005-03-03 Schlosser Ted M. Petroleum-free, ammonia-free cleaner for firearms and ordnance
TWI362415B (en) * 2003-10-27 2012-04-21 Wako Pure Chem Ind Ltd Novel detergent and method for cleaning
US20050126588A1 (en) * 2003-11-04 2005-06-16 Carter Melvin K. Chemical mechanical polishing slurries and cleaners containing salicylic acid as a corrosion inhibitor
US20050247675A1 (en) * 2004-05-04 2005-11-10 Texas Instruments Incorporated Treatment of dies prior to nickel silicide formation
US7300876B2 (en) * 2004-12-14 2007-11-27 Sandisk 3D Llc Method for cleaning slurry particles from a surface polished by chemical mechanical polishing
SG158920A1 (en) * 2005-01-27 2010-02-26 Advanced Tech Materials Compositions for processing of semiconductor substrates
US7923423B2 (en) * 2005-01-27 2011-04-12 Advanced Technology Materials, Inc. Compositions for processing of semiconductor substrates
WO2008048240A2 (en) * 2005-09-22 2008-04-24 Pantheon Chemical, Inc. Copper chelating agent, composition including the agent, and methods of forming and using the agent and composition
US8480810B2 (en) * 2005-12-30 2013-07-09 Lam Research Corporation Method and apparatus for particle removal
TW200734448A (en) * 2006-02-03 2007-09-16 Advanced Tech Materials Low pH post-CMP residue removal composition and method of use
US20070225186A1 (en) * 2006-03-27 2007-09-27 Matthew Fisher Alkaline solutions for post CMP cleaning processes
US20070232511A1 (en) * 2006-03-28 2007-10-04 Matthew Fisher Cleaning solutions including preservative compounds for post CMP cleaning processes
KR100807024B1 (ko) * 2006-08-24 2008-02-25 동부일렉트로닉스 주식회사 반도체 세정 방법
CN101130876B (zh) * 2006-08-25 2012-02-29 安集微电子(上海)有限公司 用于半导体制程中的金属防腐蚀清洗液
CN101130877B (zh) * 2006-08-25 2011-12-07 安集微电子(上海)有限公司 用于半导体制程中的金属防腐蚀保护液
US20080076688A1 (en) * 2006-09-21 2008-03-27 Barnes Jeffrey A Copper passivating post-chemical mechanical polishing cleaning composition and method of use
US8685909B2 (en) 2006-09-21 2014-04-01 Advanced Technology Materials, Inc. Antioxidants for post-CMP cleaning formulations
WO2008039730A1 (en) * 2006-09-25 2008-04-03 Advanced Technology Materials, Inc. Compositions and methods for the removal of photoresist for a wafer rework application
US20100261632A1 (en) * 2007-08-02 2010-10-14 Advanced Technology Materials, Inc. Non-fluoride containing composition for the removal of residue from a microelectronic device
KR100906043B1 (ko) * 2007-12-04 2009-07-03 주식회사 동부하이텍 반도체 소자의 세정 방법
LT2939538T (lt) 2008-07-03 2019-03-12 Monsanto Technology Llc Sacharidų darinių paviršinio aktyvumo medžiagų ir eterio amino oksidų paviršinio aktyvumo medžiagų deriniai, kaip herbicidų adjuvantai
WO2010024093A1 (ja) * 2008-08-25 2010-03-04 ダイキン工業株式会社 半導体ドライプロセス後の残渣除去液及びそれを用いた残渣除去方法
US9074170B2 (en) 2008-10-21 2015-07-07 Advanced Technology Materials, Inc. Copper cleaning and protection formulations
CN101431021B (zh) * 2008-12-11 2010-09-08 上海合晶硅材料有限公司 一种薄型硅单晶抛光片加工方法
JP5417095B2 (ja) * 2009-09-09 2014-02-12 ライオン株式会社 洗浄剤組成物、およびガラス製ハードディスク基板の洗浄方法
US8431516B2 (en) 2009-10-24 2013-04-30 Wai Mun Lee Composition and method for cleaning semiconductor substrates comprising an alkyl diphosphonic acid
US8148311B2 (en) 2009-10-24 2012-04-03 Wai Mun Lee Composition and method for cleaning semiconductor substrates comprising an alkyl diphosphonic acid
US7947130B2 (en) 2009-10-24 2011-05-24 Wai Mun Lee Troika acid semiconductor cleaning compositions and methods of use
US8148310B2 (en) * 2009-10-24 2012-04-03 Wai Mun Lee Composition and method for cleaning semiconductor substrates comprising an alkyl diphosphonic acid
JP2011205058A (ja) * 2009-12-17 2011-10-13 Rohm & Haas Electronic Materials Llc 半導体基体をテクスチャ化する改良された方法
CN101901782B (zh) * 2010-07-21 2011-12-14 河北工业大学 极大规模集成电路多层布线碱性抛光后防氧化方法
CN101901783B (zh) * 2010-07-21 2012-05-30 河北工业大学 超大规模集成电路铝布线抛光后晶片表面洁净处理方法
CN101908502B (zh) * 2010-07-21 2012-07-04 河北工业大学 极大规模集成电路钨插塞cmp后表面洁净方法
CN102528646A (zh) * 2010-12-31 2012-07-04 中芯国际集成电路制造(上海)有限公司 一种半导体研磨方法
JP5623318B2 (ja) * 2011-03-24 2014-11-12 第一工業製薬株式会社 精密部品用洗浄剤組成物
US20130053291A1 (en) * 2011-08-22 2013-02-28 Atsushi Otake Composition for cleaning substrates post-chemical mechanical polishing
JP6066552B2 (ja) 2011-12-06 2017-01-25 関東化學株式会社 電子デバイス用洗浄液組成物
SG11201406961PA (en) 2012-04-27 2014-11-27 Wako Pure Chem Ind Ltd Cleaning agent for semiconductor substrates and method for processing semiconductor substrate surface
CN103882443A (zh) * 2012-12-19 2014-06-25 安集微电子(上海)有限公司 一种用于金属抛光后的清洗液及其使用方法
US9790456B2 (en) * 2012-12-20 2017-10-17 Ecolab Usa Inc. Citrate salt bathroom cleaners
US9534190B2 (en) 2012-12-20 2017-01-03 Ecolab Usa Inc. Citrate salt bathroom cleaners
JP6203525B2 (ja) 2013-04-19 2017-09-27 関東化學株式会社 洗浄液組成物
KR102399218B1 (ko) * 2014-07-18 2022-05-19 씨엠씨 머티리얼즈, 인코포레이티드 Cmp 후 세정 조성물 및 그와 관련된 방법
CN104388956A (zh) * 2014-10-14 2015-03-04 东莞市四辉表面处理科技有限公司 一种平面研磨清洗剂
CN117625325A (zh) 2015-01-13 2024-03-01 Cmc材料股份有限公司 用于在化学机械抛光后清洁半导体晶片的清洁组合物及方法
US10995422B2 (en) * 2017-05-26 2021-05-04 Sumitomo Electric Industries, Ltd. GaAs substrate and method for manufacturing the same
WO2021111817A1 (ja) * 2019-12-02 2021-06-10 住友電気工業株式会社 炭化珪素基板および炭化珪素基板の製造方法

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3072502A (en) 1961-02-14 1963-01-08 Pfizer & Co C Process for removing copper-containing iron oxide scale from metal surfaces
NL149551B (nl) 1964-08-04 1976-05-17 Dow Chemical Co Werkwijze voor het reinigen en passiveren van ijzerhoudende metaaloppervlakken, waarop metallisch koper is afgezet.
SE400575B (sv) 1974-12-13 1978-04-03 Nordnero Ab Bad for betning av koppar och dess legeringar
US4174290A (en) 1976-12-16 1979-11-13 Custom Research And Development Metal oxide remover containing a strong mineral acid, citric acid and a basic ammonia derivative
US4250048A (en) 1979-07-03 1981-02-10 Custom Research And Development Metal oxide remover containing a strong mineral acid, chelating agent and a basic ammonia derivative
DE3278285D1 (en) * 1981-09-25 1988-05-05 Procter & Gamble Granular detergent compositions containing amino-silanes
SU1210053A1 (ru) 1984-07-05 1986-02-07 Московский Ордена Ленина И Ордена Октябрьской Революции Энергетический Институт Композици дл очистки теплообменной поверхности от отложений
DE3668330D1 (de) * 1985-05-04 1990-02-22 Henkel Kgaa Geruestsalzfreie fluessigwaschmittel mit textilweichmachenden eigenschaften.
US5192460A (en) 1988-02-10 1993-03-09 Colgate-Palmolive Company Safe acidic hard surface cleaner
US6121217A (en) 1990-11-05 2000-09-19 Ekc Technology, Inc. Alkanolamine semiconductor process residue removal composition and process
US5981454A (en) * 1993-06-21 1999-11-09 Ekc Technology, Inc. Post clean treatment composition comprising an organic acid and hydroxylamine
EP0496605B1 (en) * 1991-01-24 2001-08-01 Wako Pure Chemical Industries Ltd Surface treating solutions for semiconductors
US5451335A (en) 1991-05-16 1995-09-19 H.E.R.C. Products Incorporated 1:1 soap compositions of acids and amines or ammonia useful in removal and prevention of scale
US5322635A (en) 1991-05-16 1994-06-21 H.E.R.C. Incorporated Soap compositions of carboxylic acids and amines useful in removal and prevention of scale
TW263531B (zh) * 1992-03-11 1995-11-21 Mitsubishi Gas Chemical Co
EP0583536B1 (en) * 1992-08-14 1997-03-05 The Procter & Gamble Company Liquid detergents containing an alpha-amino boronic acid
DE4338626A1 (de) 1993-11-12 1995-05-18 Henkel Kgaa Additiv für die Glasflaschenreinigung und seine Verwendung zur Verringerung der Glaskorrosion
US5645737A (en) 1996-02-21 1997-07-08 Micron Technology, Inc. Wet clean for a surface having an exposed silicon/silica interface
TW416987B (en) 1996-06-05 2001-01-01 Wako Pure Chem Ind Ltd A composition for cleaning the semiconductor substrate surface
US5935869A (en) * 1997-07-10 1999-08-10 International Business Machines Corporation Method of planarizing semiconductor wafers

Also Published As

Publication number Publication date
AU4025701A (en) 2001-04-30
CN1211839C (zh) 2005-07-20
WO2001024242A1 (en) 2001-04-05
US20020169088A1 (en) 2002-11-14
US6541434B2 (en) 2003-04-01
KR20020035152A (ko) 2002-05-09
US6395693B1 (en) 2002-05-28
JP2003510840A (ja) 2003-03-18
EP1218929A1 (en) 2002-07-03
CN1376307A (zh) 2002-10-23

Similar Documents

Publication Publication Date Title
HK1047190A1 (zh) 化學機械拋光後半導體表面的清洗溶液
EP1472018A4 (en) COPPER POLISH CLEANING SOLUTION
IL151862A0 (en) Integrated chemical-mechanical polishing
IL149987A0 (en) Chemical-mechanical polishing method
IL123235A0 (en) Semiconductor wafer polishing apparatus
SG97909A1 (en) Fixed abrasive polishing tool
GB2349839B (en) Apparatus for polishing wafers
EP1235261A4 (en) PEPTIDE-CONTAINING POLISH FOR SEMICONDUCTORS
EP1313573A4 (en) APPARATUS FOR CLEANING CONTAINERS FOR SEMICONDUCTOR WAFERS
HUP0202631A3 (en) Liquid abrasive cleaning compositions
GB2361447B (en) Wafer polishing apparatus
AU1784001A (en) Abrasives for chemical mechanical polishing
GB2325260B (en) Abrasives for well cleaning
DE60017642D1 (de) Chemische-mechanische Schleifzusammensetzung für Halbleiterverarbeitung
SG82086A1 (en) Submerge chemical-mechanical polishing
HK1033252A1 (en) Brush attachment for cleaning floor surfaces
GB2315365B (en) Semiconductor wafer polishing machine
GB2351462B (en) Apparatus for polishing wafers
GB2366755B (en) Wafer polishing apparatus
GB2361448B (en) Wafer polishing apparatus
GB2345873B (en) Wafer polishing machine
AU2003291153A8 (en) Contour following end effectors for lapping/polishing
GB2335874B (en) Wafer polishing
SG122757A1 (en) Chemical-mechanical polisher hardware design
TW485868U (en) Structure for polishing brush