DE60008711D1 - Apparat zur verbesserung der verteilung und leistung eines induktiv gekoppelten plasmas - Google Patents

Apparat zur verbesserung der verteilung und leistung eines induktiv gekoppelten plasmas

Info

Publication number
DE60008711D1
DE60008711D1 DE60008711T DE60008711T DE60008711D1 DE 60008711 D1 DE60008711 D1 DE 60008711D1 DE 60008711 T DE60008711 T DE 60008711T DE 60008711 T DE60008711 T DE 60008711T DE 60008711 D1 DE60008711 D1 DE 60008711D1
Authority
DE
Germany
Prior art keywords
improving
distribution
performance
inductively coupled
coupled plasma
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60008711T
Other languages
English (en)
Other versions
DE60008711T2 (de
Inventor
Jozef Brcka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Application granted granted Critical
Publication of DE60008711D1 publication Critical patent/DE60008711D1/de
Publication of DE60008711T2 publication Critical patent/DE60008711T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H01L21/205
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32192Microwave generated discharge
    • H01J37/32211Means for coupling power to the plasma
    • H01J37/3222Antennas
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)
  • Chemical Vapour Deposition (AREA)
  • Physical Vapour Deposition (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
DE60008711T 1999-03-26 2000-03-23 Apparat zur verbesserung der verteilung und leistung eines induktiven gekoppelten plasmas Expired - Lifetime DE60008711T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US277526 1999-03-26
US09/277,526 US6237526B1 (en) 1999-03-26 1999-03-26 Process apparatus and method for improving plasma distribution and performance in an inductively coupled plasma
PCT/US2000/007902 WO2000058995A2 (en) 1999-03-26 2000-03-23 Apparatus for improving plasma distribution and performance in an inductively coupled plasma

Publications (2)

Publication Number Publication Date
DE60008711D1 true DE60008711D1 (de) 2004-04-08
DE60008711T2 DE60008711T2 (de) 2005-03-17

Family

ID=23061252

Family Applications (2)

Application Number Title Priority Date Filing Date
DE60037684T Expired - Lifetime DE60037684T2 (de) 1999-03-26 2000-03-23 Element zum Einkoppeln von elektrischer Energie in eine Bearbeitungskammer und Bearbeitungssystem mit einem solchen Element
DE60008711T Expired - Lifetime DE60008711T2 (de) 1999-03-26 2000-03-23 Apparat zur verbesserung der verteilung und leistung eines induktiven gekoppelten plasmas

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE60037684T Expired - Lifetime DE60037684T2 (de) 1999-03-26 2000-03-23 Element zum Einkoppeln von elektrischer Energie in eine Bearbeitungskammer und Bearbeitungssystem mit einem solchen Element

Country Status (8)

Country Link
US (1) US6237526B1 (de)
EP (2) EP1166324B1 (de)
JP (2) JP4982010B2 (de)
KR (1) KR100712762B1 (de)
CN (1) CN1201370C (de)
DE (2) DE60037684T2 (de)
TW (1) TW483064B (de)
WO (1) WO2000058995A2 (de)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW403959B (en) * 1996-11-27 2000-09-01 Hitachi Ltd Plasma treatment device
US6523493B1 (en) * 2000-08-01 2003-02-25 Tokyo Electron Limited Ring-shaped high-density plasma source and method
US6474258B2 (en) * 1999-03-26 2002-11-05 Tokyo Electron Limited Apparatus and method for improving plasma distribution and performance in an inductively coupled plasma
US7801775B1 (en) * 1999-03-29 2010-09-21 Amazon.Com, Inc. Method and system for authenticating users when conducting commercial transactions using a computer
US6451161B1 (en) * 2000-04-10 2002-09-17 Nano-Architect Research Corporation Method and apparatus for generating high-density uniform plasma
US6502530B1 (en) * 2000-04-26 2003-01-07 Unaxis Balzers Aktiengesellschaft Design of gas injection for the electrode in a capacitively coupled RF plasma reactor
JP4504511B2 (ja) * 2000-05-26 2010-07-14 忠弘 大見 プラズマ処理装置
US6446572B1 (en) * 2000-08-18 2002-09-10 Tokyo Electron Limited Embedded plasma source for plasma density improvement
US6494998B1 (en) * 2000-08-30 2002-12-17 Tokyo Electron Limited Process apparatus and method for improving plasma distribution and performance in an inductively coupled plasma using an internal inductive element
AU2003245264A1 (en) * 2002-05-08 2003-11-11 Dana Corporation Plasma-assisted joining
US6842147B2 (en) * 2002-07-22 2005-01-11 Lam Research Corporation Method and apparatus for producing uniform processing rates
EP1552727A4 (de) * 2002-07-26 2007-06-06 Plasmart Co Ltd Induktivgekoppelter plasmagenerator mit niedrigerem seitenverhültnis
KR100486724B1 (ko) * 2002-10-15 2005-05-03 삼성전자주식회사 사행 코일 안테나를 구비한 유도결합 플라즈마 발생장치
US7273533B2 (en) * 2003-11-19 2007-09-25 Tokyo Electron Limited Plasma processing system with locally-efficient inductive plasma coupling
US7464662B2 (en) * 2004-01-28 2008-12-16 Tokyo Electron Limited Compact, distributed inductive element for large scale inductively-coupled plasma sources
JP4951501B2 (ja) * 2005-03-01 2012-06-13 株式会社日立国際電気 基板処理装置および半導体デバイスの製造方法
US20070029193A1 (en) * 2005-08-03 2007-02-08 Tokyo Electron Limited Segmented biased peripheral electrode in plasma processing method and apparatus
US20070068795A1 (en) * 2005-09-26 2007-03-29 Jozef Brcka Hollow body plasma uniformity adjustment device and method
US20080023146A1 (en) * 2006-07-26 2008-01-31 Advanced Energy Industries, Inc. Inductively coupled plasma system with internal coil
CN101345114B (zh) * 2007-07-11 2011-09-14 北京北方微电子基地设备工艺研究中心有限责任公司 电感耦合线圈及应用该线圈的电感耦合等离子体装置
US8073094B2 (en) * 2007-10-24 2011-12-06 Nassim Haramein Device and method for simulation of magnetohydrodynamics
US8933595B2 (en) 2007-10-24 2015-01-13 Nassim Haramein Plasma flow interaction simulator
JP2011521735A (ja) 2008-05-30 2011-07-28 コロラド ステート ユニバーシティ リサーチ ファンデーション プラズマを発生させるためのシステム、方法、および装置
US9288886B2 (en) 2008-05-30 2016-03-15 Colorado State University Research Foundation Plasma-based chemical source device and method of use thereof
US8994270B2 (en) 2008-05-30 2015-03-31 Colorado State University Research Foundation System and methods for plasma application
JP2010212321A (ja) * 2009-03-09 2010-09-24 Hitachi Kokusai Electric Inc 半導体製造装置
KR100938782B1 (ko) * 2009-07-06 2010-01-27 주식회사 테스 플라즈마 발생용 전극 및 플라즈마 발생장치
US8222822B2 (en) * 2009-10-27 2012-07-17 Tyco Healthcare Group Lp Inductively-coupled plasma device
CA2794902A1 (en) 2010-03-31 2011-10-06 Colorado State University Research Foundation Liquid-gas interface plasma device
JP2013529352A (ja) 2010-03-31 2013-07-18 コロラド ステート ユニバーシティー リサーチ ファウンデーション 液体−気体界面プラズマデバイス
JP2013134835A (ja) * 2011-12-26 2013-07-08 Nissin Electric Co Ltd プラズマ処理装置
WO2013099372A1 (ja) * 2011-12-27 2013-07-04 キヤノンアネルバ株式会社 放電容器及びプラズマ処理装置
JP6010305B2 (ja) * 2012-02-07 2016-10-19 東京エレクトロン株式会社 誘導結合プラズマ用アンテナユニット、誘導結合プラズマ処理装置および誘導結合プラズマ処理方法
US20140097752A1 (en) * 2012-10-09 2014-04-10 Varian Semiconductor Equipment Associates, Inc. Inductively Coupled Plasma ION Source Chamber with Dopant Material Shield
US9532826B2 (en) 2013-03-06 2017-01-03 Covidien Lp System and method for sinus surgery
US9555145B2 (en) 2013-03-13 2017-01-31 Covidien Lp System and method for biofilm remediation
KR101529498B1 (ko) * 2014-03-31 2015-06-17 에스피피 테크놀로지스 컴퍼니 리미티드 플라즈마 처리 장치 및 이에 이용되는 코일
DE102015003379A1 (de) * 2015-03-17 2016-09-22 Manz Ag Plasmaerzeugungsvorrichtung mit einer Induktionsspule
JP5977853B1 (ja) * 2015-03-20 2016-08-24 株式会社日立国際電気 基板処理装置、半導体装置の製造方法、プログラム及び記録媒体
JP6053881B2 (ja) * 2015-07-15 2016-12-27 東京エレクトロン株式会社 プラズマ処理装置
TWI614780B (zh) * 2015-12-21 2018-02-11 財團法人工業技術研究院 線圈組及無線傳能系統
KR101866210B1 (ko) * 2016-11-04 2018-06-11 인베니아 주식회사 플라즈마 발생용 안테나 구조체
KR101866212B1 (ko) * 2016-11-16 2018-06-12 인베니아 주식회사 플라즈마 처리 장치
US10510515B2 (en) * 2017-06-22 2019-12-17 Applied Materials, Inc. Processing tool with electrically switched electrode assembly
US20240087859A1 (en) * 2022-09-08 2024-03-14 Applied Materials, Inc. Methods and apparatus for toroidal plasma generation

Family Cites Families (67)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4431901A (en) 1982-07-02 1984-02-14 The United States Of America As Represented By The United States Department Of Energy Induction plasma tube
JPH0630463B2 (ja) 1985-05-15 1994-04-20 八重洲無線株式会社 無線通信機
GB8629634D0 (en) 1986-12-11 1987-01-21 Dobson C D Reactive ion & sputter etching
KR920003789B1 (ko) * 1988-02-08 1992-05-14 니뽄 덴신 덴와 가부시끼가이샤 플라즈마 스퍼터링을 이용한 박막 형성 장치 및 이온원
DE3905073A1 (de) 1989-02-18 1990-08-23 Schuler Gmbh L Umsetzeinrichtung in einer transferpresse o. dgl. umformmaschine
US5421891A (en) * 1989-06-13 1995-06-06 Plasma & Materials Technologies, Inc. High density plasma deposition and etching apparatus
US5122251A (en) 1989-06-13 1992-06-16 Plasma & Materials Technologies, Inc. High density plasma deposition and etching apparatus
US4948458A (en) 1989-08-14 1990-08-14 Lam Research Corporation Method and apparatus for producing magnetically-coupled planar plasma
US5304279A (en) 1990-08-10 1994-04-19 International Business Machines Corporation Radio frequency induction/multipole plasma processing tool
US5178739A (en) 1990-10-31 1993-01-12 International Business Machines Corporation Apparatus for depositing material into high aspect ratio holes
US5234529A (en) 1991-10-10 1993-08-10 Johnson Wayne L Plasma generating apparatus employing capacitive shielding and process for using such apparatus
US5280154A (en) 1992-01-30 1994-01-18 International Business Machines Corporation Radio frequency induction plasma processing system utilizing a uniform field coil
US5231334A (en) 1992-04-15 1993-07-27 Texas Instruments Incorporated Plasma source and method of manufacturing
US5226967A (en) 1992-05-14 1993-07-13 Lam Research Corporation Plasma apparatus including dielectric window for inducing a uniform electric field in a plasma chamber
US5277751A (en) 1992-06-18 1994-01-11 Ogle John S Method and apparatus for producing low pressure planar plasma using a coil with its axis parallel to the surface of a coupling window
AU5017293A (en) 1992-09-01 1994-03-29 University Of North Carolina At Chapel Hill, The High pressure magnetically assisted inductively coupled plasma
DE4235064A1 (de) 1992-10-17 1994-04-21 Leybold Ag Vorrichtung zum Erzeugen eines Plasmas mittels Kathodenzerstäubung
US5587226A (en) 1993-01-28 1996-12-24 Regents, University Of California Porcelain-coated antenna for radio-frequency driven plasma source
US5309063A (en) 1993-03-04 1994-05-03 David Sarnoff Research Center, Inc. Inductive coil for inductively coupled plasma production apparatus
US5401350A (en) 1993-03-08 1995-03-28 Lsi Logic Corporation Coil configurations for improved uniformity in inductively coupled plasma systems
US5824158A (en) * 1993-06-30 1998-10-20 Kabushiki Kaisha Kobe Seiko Sho Chemical vapor deposition using inductively coupled plasma and system therefor
US5430355A (en) 1993-07-30 1995-07-04 Texas Instruments Incorporated RF induction plasma source for plasma processing
JP3290777B2 (ja) 1993-09-10 2002-06-10 株式会社東芝 誘導結合型高周波放電方法および誘導結合型高周波放電装置
TW273067B (de) 1993-10-04 1996-03-21 Tokyo Electron Co Ltd
GB9321489D0 (en) 1993-10-19 1993-12-08 Central Research Lab Ltd Plasma processing
US5619103A (en) 1993-11-02 1997-04-08 Wisconsin Alumni Research Foundation Inductively coupled plasma generating devices
US5783492A (en) 1994-03-04 1998-07-21 Tokyo Electron Limited Plasma processing method, plasma processing apparatus, and plasma generating apparatus
JPH07245194A (ja) * 1994-03-07 1995-09-19 Matsushita Electric Ind Co Ltd プラズマ処理方法及び装置
JP3328756B2 (ja) * 1994-03-25 2002-09-30 ▲靖▼浩 堀池 プラズマ処理装置
JP2641390B2 (ja) 1994-05-12 1997-08-13 日本電気株式会社 プラズマ処理装置
EP0685873B1 (de) 1994-06-02 1998-12-16 Applied Materials, Inc. Induktiv gekoppelter Plasmareaktor mit einer Elektrode zur Erleichterung der Plasmazündung
US5587038A (en) 1994-06-16 1996-12-24 Princeton University Apparatus and process for producing high density axially extending plasmas
US5580385A (en) 1994-06-30 1996-12-03 Texas Instruments, Incorporated Structure and method for incorporating an inductively coupled plasma source in a plasma processing chamber
JP3105403B2 (ja) 1994-09-14 2000-10-30 松下電器産業株式会社 プラズマ処理装置
GB9418658D0 (en) * 1994-09-16 1994-11-02 Central Research Lab Ltd An apparatus for generating a glow discharge
US5753044A (en) 1995-02-15 1998-05-19 Applied Materials, Inc. RF plasma reactor with hybrid conductor and multi-radius dome ceiling
US5919382A (en) 1994-10-31 1999-07-06 Applied Materials, Inc. Automatic frequency tuning of an RF power source of an inductively coupled plasma reactor
US5589737A (en) 1994-12-06 1996-12-31 Lam Research Corporation Plasma processor for large workpieces
US5688357A (en) 1995-02-15 1997-11-18 Applied Materials, Inc. Automatic frequency tuning of an RF power source of an inductively coupled plasma reactor
US5688358A (en) 1995-03-08 1997-11-18 Applied Materials, Inc. R.F. plasma reactor with larger-than-wafer pedestal conductor
US5556521A (en) 1995-03-24 1996-09-17 Sony Corporation Sputter etching apparatus with plasma source having a dielectric pocket and contoured plasma source
US5710486A (en) 1995-05-08 1998-01-20 Applied Materials, Inc. Inductively and multi-capacitively coupled plasma reactor
US5888413A (en) 1995-06-06 1999-03-30 Matsushita Electric Industrial Co., Ltd. Plasma processing method and apparatus
US5650032A (en) 1995-06-06 1997-07-22 International Business Machines Corporation Apparatus for producing an inductive plasma for plasma processes
US5874704A (en) 1995-06-30 1999-02-23 Lam Research Corporation Low inductance large area coil for an inductively coupled plasma source
EP0756309A1 (de) 1995-07-26 1997-01-29 Applied Materials, Inc. Plasmavorrichtungen zur Bearbeitung von Substraten
US5907221A (en) 1995-08-16 1999-05-25 Applied Materials, Inc. Inductively coupled plasma reactor with an inductive coil antenna having independent loops
KR100290813B1 (ko) 1995-08-17 2001-06-01 히가시 데쓰로 플라스마 처리장치
JPH0982495A (ja) 1995-09-18 1997-03-28 Toshiba Corp プラズマ生成装置およびプラズマ生成方法
JPH09106899A (ja) 1995-10-11 1997-04-22 Anelva Corp プラズマcvd装置及び方法並びにドライエッチング装置及び方法
US5785878A (en) 1995-11-02 1998-07-28 Applied Materials, Inc. RF antenna having high temperature, oxidation resistant coating
US5763851A (en) 1995-11-27 1998-06-09 Applied Materials, Inc. Slotted RF coil shield for plasma deposition system
US6054013A (en) * 1996-02-02 2000-04-25 Applied Materials, Inc. Parallel plate electrode plasma reactor having an inductive antenna and adjustable radial distribution of plasma ion density
US5669975A (en) 1996-03-27 1997-09-23 Sony Corporation Plasma producing method and apparatus including an inductively-coupled plasma source
US5759280A (en) 1996-06-10 1998-06-02 Lam Research Corporation Inductively coupled source for deriving substantially uniform plasma flux
US5800619A (en) 1996-06-10 1998-09-01 Lam Research Corporation Vacuum plasma processor having coil with minimum magnetic field in its center
CA2207154A1 (en) 1996-06-10 1997-12-10 Lam Research Corporation Inductively coupled source for deriving substantially uniform plasma flux
US5897712A (en) 1996-07-16 1999-04-27 Applied Materials, Inc. Plasma uniformity control for an inductive plasma source
US6254737B1 (en) 1996-10-08 2001-07-03 Applied Materials, Inc. Active shield for generating a plasma for sputtering
US5846154A (en) 1996-10-15 1998-12-08 Handycare Single speed gear assembly for a wheelchair
US5824602A (en) * 1996-10-21 1998-10-20 The United States Of America As Represented By The United States Department Of Energy Helicon wave excitation to produce energetic electrons for manufacturing semiconductors
FR2755294A1 (fr) * 1996-10-25 1998-05-01 Pixtech Sa Procede et dispositif d'assemblage d'un ecran plat de visualisation
JPH10241895A (ja) 1996-11-04 1998-09-11 Applied Materials Inc プラズマシース発生高調波をフィルタリングすることによるプラズマプロセス効率の改善
US5824607A (en) 1997-02-06 1998-10-20 Applied Materials, Inc. Plasma confinement for an inductively coupled plasma reactor
US5800688A (en) 1997-04-21 1998-09-01 Tokyo Electron Limited Apparatus for ionized sputtering
US5976334A (en) * 1997-11-25 1999-11-02 Applied Materials, Inc. Reliable sustained self-sputtering
GB2387023B (en) 1998-12-17 2003-12-03 Trikon Holdings Ltd Inductive coil assembly

Also Published As

Publication number Publication date
WO2000058995B1 (en) 2001-03-01
EP1166324A2 (de) 2002-01-02
CN1353859A (zh) 2002-06-12
CN1201370C (zh) 2005-05-11
TW483064B (en) 2002-04-11
EP1401008A1 (de) 2004-03-24
JP2002540617A (ja) 2002-11-26
DE60037684T2 (de) 2009-01-02
US6237526B1 (en) 2001-05-29
KR100712762B1 (ko) 2007-05-02
DE60008711T2 (de) 2005-03-17
WO2000058995A3 (en) 2001-01-25
WO2000058995A2 (en) 2000-10-05
EP1166324B1 (de) 2004-03-03
KR20010110702A (ko) 2001-12-13
EP1401008B1 (de) 2008-01-02
JP2011018650A (ja) 2011-01-27
DE60037684D1 (de) 2008-02-14
JP4982010B2 (ja) 2012-07-25

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