DE4136061A1 - Leiterplatten-pruefsystem - Google Patents

Leiterplatten-pruefsystem

Info

Publication number
DE4136061A1
DE4136061A1 DE4136061A DE4136061A DE4136061A1 DE 4136061 A1 DE4136061 A1 DE 4136061A1 DE 4136061 A DE4136061 A DE 4136061A DE 4136061 A DE4136061 A DE 4136061A DE 4136061 A1 DE4136061 A1 DE 4136061A1
Authority
DE
Germany
Prior art keywords
network
points
group
circuit board
network paths
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE4136061A
Other languages
German (de)
English (en)
Inventor
Robert E Whitehead
Evan J Evans
Stephen J Foster
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Electronic Packaging Co
Original Assignee
Electronic Packaging Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electronic Packaging Co filed Critical Electronic Packaging Co
Publication of DE4136061A1 publication Critical patent/DE4136061A1/de
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0286—Programmable, customizable or modifiable circuits
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/11—Printed elements for providing electric connections to or between printed circuits
    • H05K1/117—Pads along the edge of rigid circuit boards, e.g. for pluggable connectors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE4136061A 1990-10-30 1991-10-29 Leiterplatten-pruefsystem Ceased DE4136061A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US60592590A 1990-10-30 1990-10-30

Publications (1)

Publication Number Publication Date
DE4136061A1 true DE4136061A1 (de) 1992-05-07

Family

ID=24425785

Family Applications (1)

Application Number Title Priority Date Filing Date
DE4136061A Ceased DE4136061A1 (de) 1990-10-30 1991-10-29 Leiterplatten-pruefsystem

Country Status (3)

Country Link
US (1) US5485081A (ja)
JP (1) JPH055772A (ja)
DE (1) DE4136061A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19748029A1 (de) * 1997-10-30 1999-05-20 Siemens Nixdorf Inf Syst Verfahren zum Testen elektrischer Baugruppen
DE10120066A1 (de) * 2001-04-24 2002-11-14 Siemens Ag Verfahren und Anordnung zum Erkennen von Bestückungsvarianten und Bestückungsfehlern bei Bestückung von Baugruppen mit mehreren gleichen Sub-Modulen

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5631856A (en) * 1995-01-17 1997-05-20 International Business Machines Corporation Test sequence optimization process for a circuit tester
US6201383B1 (en) 1998-01-22 2001-03-13 International Business Machines Corporation Method and apparatus for determining short circuit conditions using a gang probe circuit tester
JP2000009755A (ja) * 1998-06-23 2000-01-14 Jsr Corp プリント基板検査用治具基板およびプリント基板検査方法
TW200540610A (en) * 2004-06-04 2005-12-16 Hon Hai Prec Ind Co Ltd System and method for automatically comparing test points of two different boards
US7353479B2 (en) * 2005-01-31 2008-04-01 Faraday Technology Corp. Method for placing probing pad and computer readable recording medium for storing program thereof
CN102339333B (zh) * 2010-07-19 2013-04-10 鸿富锦精密工业（深圳）有限公司 信号线到隔离孔之间的距离稽查系统及方法
CN106199378B (zh) * 2016-06-28 2018-12-11 国营芜湖机械厂 一种电路板网表快速提取方法
US9980378B1 (en) * 2017-03-10 2018-05-22 Dell Products, Lp Surface mount connector pad
TWI719241B (zh) * 2017-08-18 2021-02-21 景碩科技股份有限公司 可做電性測試的多層電路板及其製法
US10379153B1 (en) 2018-12-04 2019-08-13 Greater Asia Pacific Limited Printed circuit board test coupon for electrical testing during thermal exposure and method of using the same
US10334720B1 (en) * 2018-12-04 2019-06-25 Greater Asia Pacific Limited Printed circuit board test coupon for electrical testing during thermal exposure and method of using the same

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4186338A (en) * 1976-12-16 1980-01-29 Genrad, Inc. Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and similar systems
US4924179A (en) * 1977-12-12 1990-05-08 Sherman Leslie H Method and apparatus for testing electronic devices
US4175253A (en) * 1978-02-22 1979-11-20 Teradyne, Inc. Analyzing electrical circuit boards
US4352165A (en) * 1979-12-17 1982-09-28 The Gerber Scientific Instrument Company Apparatus for storing and retrieving data
US4504782A (en) * 1982-07-06 1985-03-12 Sperry Corporation Detection of catastrophic failure of dielectric, improper connection, and temperature of a printed circuit assembly via one wire
DK291184D0 (da) * 1984-06-13 1984-06-13 Boeegh Petersen Allan Fremgangsmaade og indretning til test af kredsloebsplader
US5006808A (en) * 1989-03-21 1991-04-09 Bath Scientific Limited Testing electrical circuits

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19748029A1 (de) * 1997-10-30 1999-05-20 Siemens Nixdorf Inf Syst Verfahren zum Testen elektrischer Baugruppen
DE19748029C2 (de) * 1997-10-30 2001-02-01 Siemens Nixdorf Inf Syst Verfahren zum Testen von elektrische Bauelemente aufweisenden Baugruppen
US6456089B1 (en) 1997-10-30 2002-09-24 Siemens Aktiengesellschaft Method for testing electrical modules
DE10120066A1 (de) * 2001-04-24 2002-11-14 Siemens Ag Verfahren und Anordnung zum Erkennen von Bestückungsvarianten und Bestückungsfehlern bei Bestückung von Baugruppen mit mehreren gleichen Sub-Modulen
DE10120066B4 (de) * 2001-04-24 2004-09-30 Siemens Ag Elektronisches Modul zum Einbau in eine elektonische Baugruppeneinheit, entsprechendes System, sowie Verfahren zum Test einer elektronischen Baugruppeneinheit

Also Published As

Publication number Publication date
US5485081A (en) 1996-01-16
JPH055772A (ja) 1993-01-14

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Legal Events

Date Code Title Description
8128 New person/name/address of the agent

Representative=s name: STOLBERG-WERNIGERODE, GRAF ZU, U., DIPL.-CHEM. DR.

8110 Request for examination paragraph 44
8131 Rejection