DE405886T1 - Oberflaechenbehandlungsmittel fuer praezisionsoberflaechenbehandlung. - Google Patents

Oberflaechenbehandlungsmittel fuer praezisionsoberflaechenbehandlung.

Info

Publication number
DE405886T1
DE405886T1 DE199090306927T DE90306927T DE405886T1 DE 405886 T1 DE405886 T1 DE 405886T1 DE 199090306927 T DE199090306927 T DE 199090306927T DE 90306927 T DE90306927 T DE 90306927T DE 405886 T1 DE405886 T1 DE 405886T1
Authority
DE
Germany
Prior art keywords
surface treatment
precision
precision surface
treatment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE199090306927T
Other languages
English (en)
Inventor
Tadahiro Sendai-Shi Miyagi-Ken Jp Ohmi
Masahiro Osaka Jp Miki
Hirohisa Nara-Shi Nara-Ken Jp Kikuyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HASHIMOTO CHEMICAL INDUSTRIES Co Ltd SAKAI OSAKA JP
Original Assignee
HASHIMOTO CHEMICAL INDUSTRIES Co Ltd SAKAI OSAKA JP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP1246860A external-priority patent/JP2852355B2/ja
Application filed by HASHIMOTO CHEMICAL INDUSTRIES Co Ltd SAKAI OSAKA JP filed Critical HASHIMOTO CHEMICAL INDUSTRIES Co Ltd SAKAI OSAKA JP
Publication of DE405886T1 publication Critical patent/DE405886T1/de
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105After-treatment
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • C09K13/04Etching, surface-brightening or pickling compositions containing an inorganic acid
    • C09K13/08Etching, surface-brightening or pickling compositions containing an inorganic acid containing a fluorine compound
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02057Cleaning during device manufacture
    • H01L21/0206Cleaning during device manufacture during, before or after processing of insulating layers
    • H01L21/02063Cleaning during device manufacture during, before or after processing of insulating layers the processing being the formation of vias or contact holes

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Inorganic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Weting (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
DE199090306927T 1989-06-26 1990-06-25 Oberflaechenbehandlungsmittel fuer praezisionsoberflaechenbehandlung. Pending DE405886T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP16323089 1989-06-26
JP1246860A JP2852355B2 (ja) 1989-06-26 1989-09-21 微細加工表面処理剤

Publications (1)

Publication Number Publication Date
DE405886T1 true DE405886T1 (de) 1991-08-14

Family

ID=26488740

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69029228T Expired - Lifetime DE69029228T2 (de) 1989-06-26 1990-06-25 Oberflächenbehandlungsmittel für Präzisionsoberflächenbehandlung
DE199090306927T Pending DE405886T1 (de) 1989-06-26 1990-06-25 Oberflaechenbehandlungsmittel fuer praezisionsoberflaechenbehandlung.

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE69029228T Expired - Lifetime DE69029228T2 (de) 1989-06-26 1990-06-25 Oberflächenbehandlungsmittel für Präzisionsoberflächenbehandlung

Country Status (2)

Country Link
EP (1) EP0405886B1 (de)
DE (2) DE69029228T2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4101564A1 (de) * 1991-01-21 1992-07-23 Riedel De Haen Ag Aetzloesung fuer nasschemische prozesse der halbleiterherstellung
DE4104881A1 (de) * 1991-02-18 1992-08-20 Riedel De Haen Ag Aetzloesung fuer nasschemische prozesse der halbleiterherstellung
JP3074634B2 (ja) * 1994-03-28 2000-08-07 三菱瓦斯化学株式会社 フォトレジスト用剥離液及び配線パターンの形成方法
DE19805525C2 (de) * 1998-02-11 2002-06-13 Sez Semiconduct Equip Zubehoer Verfahren zum Naßätzen von Halbleiterscheiben zum Erzeugen eines definierten Randbereichs durch Unterätzen
DE10221075A1 (de) * 2002-05-10 2003-11-27 Toepfer Ct Esser Gmbh Chemische Zusammensetzung zur Oberflächenbehandlung
JP4799843B2 (ja) * 2003-10-17 2011-10-26 三星電子株式会社 高いエッチング選択比を有するエッチング組成物、その製造方法、これを用いた酸化膜の選択的エッチング方法、及び半導体装置の製造方法
DE102007006151B4 (de) 2007-02-07 2008-11-06 Siltronic Ag Verfahren zur Verringerung und Homogenisierung der Dicke einer Halbleiterschicht, die sich auf der Oberfläche eines elektrisch isolierenden Materials befindet
KR20180068591A (ko) 2016-12-14 2018-06-22 삼성전자주식회사 식각용 조성물 및 이를 이용한 반도체 장치 제조 방법
CN112151511A (zh) * 2020-08-17 2020-12-29 中国科学院微电子研究所 一种半导体结构及其制备方法
CN114369460B (zh) * 2021-12-09 2023-07-11 湖北兴福电子材料股份有限公司 一种提高凹型沟槽结构二氧化硅蚀刻均匀性的蚀刻液

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1621662A1 (de) * 1966-02-11 1971-06-03 Telefunken Patent Verfahren zur Reinigung der Oberflaeche eines Halbleiterkoerpers
US3650960A (en) * 1969-05-06 1972-03-21 Allied Chem Etching solutions
FR2393840A1 (fr) * 1977-06-06 1979-01-05 Thomson Csf Solution de gravure des ouvertures de contacts externes pour dispositifs semi-conducteurs
JPS6039176A (ja) * 1983-08-10 1985-02-28 Daikin Ind Ltd エッチング剤組成物
US4517106A (en) * 1984-04-26 1985-05-14 Allied Corporation Soluble surfactant additives for ammonium fluoride/hydrofluoric acid oxide etchant solutions
JPS63283028A (ja) * 1986-09-29 1988-11-18 Hashimoto Kasei Kogyo Kk 微細加工表面処理剤

Also Published As

Publication number Publication date
DE69029228D1 (de) 1997-01-09
EP0405886A3 (de) 1991-03-13
DE69029228T2 (de) 1997-06-12
EP0405886B1 (de) 1996-11-27
EP0405886A2 (de) 1991-01-02

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