DE3854992D1 - Vorrichtung und Verfahren zur Feststellung eines Tunnelstroms und einer elektrochemischen Reaktion - Google Patents
Vorrichtung und Verfahren zur Feststellung eines Tunnelstroms und einer elektrochemischen ReaktionInfo
- Publication number
- DE3854992D1 DE3854992D1 DE3854992T DE3854992T DE3854992D1 DE 3854992 D1 DE3854992 D1 DE 3854992D1 DE 3854992 T DE3854992 T DE 3854992T DE 3854992 T DE3854992 T DE 3854992T DE 3854992 D1 DE3854992 D1 DE 3854992D1
- Authority
- DE
- Germany
- Prior art keywords
- determining
- electrochemical reaction
- tunnel current
- tunnel
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
- G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/60—SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Analytical Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Current Or Voltage (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62299548A JPH06105262B2 (ja) | 1987-11-27 | 1987-11-27 | 電気化学測定およびトンネル電流同時測定方法および装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3854992D1 true DE3854992D1 (de) | 1996-03-21 |
DE3854992T2 DE3854992T2 (de) | 1996-06-20 |
Family
ID=17874044
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3854992T Expired - Lifetime DE3854992T2 (de) | 1987-11-27 | 1988-11-24 | Vorrichtung und Verfahren zur Feststellung eines Tunnelstroms und einer elektrochemischen Reaktion |
Country Status (4)
Country | Link |
---|---|
US (1) | US4969978A (de) |
EP (1) | EP0318289B1 (de) |
JP (1) | JPH06105262B2 (de) |
DE (1) | DE3854992T2 (de) |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA2000071C (en) * | 1988-10-04 | 1997-01-28 | Haruki Kawada | Recording and reproducing apparatus and recording and reproducing method and recording medium for the recording and reproducing method |
JP2814256B2 (ja) * | 1989-01-31 | 1998-10-22 | セイコーインスツルメンツ株式会社 | 電気化学測定トンネル電流同時測定装置およびトンネル探針 |
US4924091A (en) * | 1989-02-01 | 1990-05-08 | The Regents Of The University Of California | Scanning ion conductance microscope |
JP2835530B2 (ja) * | 1989-12-12 | 1998-12-14 | セイコーインスツルメンツ株式会社 | 走査型トンネル顕微鏡 |
US5202004A (en) * | 1989-12-20 | 1993-04-13 | Digital Instruments, Inc. | Scanning electrochemical microscopy |
US5155361A (en) * | 1991-07-26 | 1992-10-13 | The Arizona Board Of Regents, A Body Corporate Acting For And On Behalf Of Arizona State University | Potentiostatic preparation of molecular adsorbates for scanning probe microscopy |
DE69216364T2 (de) * | 1991-09-27 | 1997-04-24 | Matsushita Electric Ind Co Ltd | Sonde eines elektrochemischen Rastermikroskopes und Verfahren zur deren Herstellung |
US5348638A (en) * | 1992-01-16 | 1994-09-20 | Matsushita Electric Industrial Co., Ltd. | Method of manufacturing a probe for a scanning tunneling microscope |
US5476006A (en) * | 1992-07-07 | 1995-12-19 | Matsushita Electronics Corporation | Crystal evaluation apparatus and crystal evaluation method |
US5445011A (en) * | 1993-09-21 | 1995-08-29 | Ghislain; Lucien P. | Scanning force microscope using an optical trap |
US5497000A (en) * | 1994-01-27 | 1996-03-05 | The United States Of America As Represented By The Secretary Of The Navy | Method of electrochemical detection/identification of single organic molecules using scanning tunneling microscopy |
US5440920A (en) * | 1994-02-03 | 1995-08-15 | Molecular Imaging Systems | Scanning force microscope with beam tracking lens |
US5866805A (en) * | 1994-05-19 | 1999-02-02 | Molecular Imaging Corporation Arizona Board Of Regents | Cantilevers for a magnetically driven atomic force microscope |
US5513518A (en) * | 1994-05-19 | 1996-05-07 | Molecular Imaging Corporation | Magnetic modulation of force sensor for AC detection in an atomic force microscope |
US5753814A (en) * | 1994-05-19 | 1998-05-19 | Molecular Imaging Corporation | Magnetically-oscillated probe microscope for operation in liquids |
US5515719A (en) * | 1994-05-19 | 1996-05-14 | Molecular Imaging Corporation | Controlled force microscope for operation in liquids |
US5750989A (en) * | 1995-02-10 | 1998-05-12 | Molecular Imaging Corporation | Scanning probe microscope for use in fluids |
US5495109A (en) * | 1995-02-10 | 1996-02-27 | Molecular Imaging Corporation | Electrochemical identification of molecules in a scanning probe microscope |
US5675154A (en) * | 1995-02-10 | 1997-10-07 | Molecular Imaging Corporation | Scanning probe microscope |
US5621210A (en) * | 1995-02-10 | 1997-04-15 | Molecular Imaging Corporation | Microscope for force and tunneling microscopy in liquids |
WO1996028837A1 (en) * | 1995-03-10 | 1996-09-19 | Molecular Imaging Corporation | Hybrid control system for scanning probe microscopes |
US5821545A (en) * | 1995-11-07 | 1998-10-13 | Molecular Imaging Corporation | Heated stage for a scanning probe microscope |
US5654546A (en) * | 1995-11-07 | 1997-08-05 | Molecular Imaging Corporation | Variable temperature scanning probe microscope based on a peltier device |
US6002131A (en) * | 1998-03-25 | 1999-12-14 | The Board Of Trustees Of The Leland Stanford Junior University | Scanning probe potentiometer |
JP4507310B2 (ja) * | 1999-10-18 | 2010-07-21 | 株式会社村田製作所 | 積層セラミック素子の剥離方法及び積層セラミック素子の検査方法 |
AT410845B (de) * | 2000-06-09 | 2003-08-25 | Kranz Christine Dr | Vorrichtung für die gleichzeitige durchführung einer elektrochemischen und einer topographischen nahfeld-mikroskopie |
SE0004334D0 (sv) * | 2000-11-24 | 2000-11-24 | Sahltech Ab | Electron spectroscopy |
CN100543448C (zh) * | 2005-02-05 | 2009-09-23 | 厦门大学 | 扫描隧道显微镜和扫描微电极联用测量系统及其测量技术 |
US7451646B2 (en) * | 2005-07-28 | 2008-11-18 | The Regents Of The University Of California | Device and method for resonant high-speed microscopic impedance probe |
JP4697709B2 (ja) * | 2006-02-01 | 2011-06-08 | セイコーインスツル株式会社 | 電気化学測定装置 |
JP5467473B2 (ja) * | 2009-04-30 | 2014-04-09 | 国立大学法人東北大学 | 走査型電気化学イオンコンダクタンス顕微鏡、その探針及び探針の製造方法。 |
JP2010276488A (ja) * | 2009-05-29 | 2010-12-09 | Hitachi Ltd | プローブ顕微鏡 |
GB201006364D0 (en) * | 2010-04-16 | 2010-06-02 | Univ Warwick | Intermittent control scanning electrochemical microscopy |
JP5526086B2 (ja) * | 2011-08-03 | 2014-06-18 | 株式会社日立製作所 | 走査型プローブ顕微鏡及びそれを用いた溶液中イオン検出方法 |
JP6095105B2 (ja) * | 2012-12-27 | 2017-03-15 | 国立研究開発法人産業技術総合研究所 | マイクロ電極及びマイクロ電極の製造方法 |
CN109000600B (zh) * | 2018-07-25 | 2020-09-18 | 上海纳米技术及应用国家工程研究中心有限公司 | 测量和验证隔膜孔径的装置及其方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2857320A (en) * | 1955-02-25 | 1958-10-21 | Cities Service Res & Dev Co | Evaluation of corrosion inhibitors |
US3098801A (en) * | 1959-06-30 | 1963-07-23 | Pure Oil Co | Apparatus and method for measuring corrosiveness of aqueous liquids |
US3479256A (en) * | 1965-09-08 | 1969-11-18 | Nat Steel Corp | Process for testing the corrosion resistance of a metallic surface |
DE3572030D1 (en) * | 1985-03-07 | 1989-09-07 | Ibm | Scanning tunneling microscope |
-
1987
- 1987-11-27 JP JP62299548A patent/JPH06105262B2/ja not_active Expired - Lifetime
-
1988
- 1988-11-23 US US07/276,227 patent/US4969978A/en not_active Expired - Lifetime
- 1988-11-24 EP EP88311141A patent/EP0318289B1/de not_active Expired - Lifetime
- 1988-11-24 DE DE3854992T patent/DE3854992T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH01141302A (ja) | 1989-06-02 |
JPH06105262B2 (ja) | 1994-12-21 |
US4969978A (en) | 1990-11-13 |
DE3854992T2 (de) | 1996-06-20 |
EP0318289A2 (de) | 1989-05-31 |
EP0318289B1 (de) | 1996-02-07 |
EP0318289A3 (de) | 1993-01-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: SII NANO TECHNOLOGY INC., CHIBA, JP |