DE3720732A1 - Vorrichtung zur spektroskopie mit einer metall-halogenidlampe als lichtquelle - Google Patents

Vorrichtung zur spektroskopie mit einer metall-halogenidlampe als lichtquelle

Info

Publication number
DE3720732A1
DE3720732A1 DE19873720732 DE3720732A DE3720732A1 DE 3720732 A1 DE3720732 A1 DE 3720732A1 DE 19873720732 DE19873720732 DE 19873720732 DE 3720732 A DE3720732 A DE 3720732A DE 3720732 A1 DE3720732 A1 DE 3720732A1
Authority
DE
Germany
Prior art keywords
light
light source
lamp
spectroscopy
wavelength range
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19873720732
Other languages
German (de)
English (en)
Other versions
DE3720732C2 (cg-RX-API-DMAC10.html
Inventor
Makoto Yasuda
Tsune Miyashita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of DE3720732A1 publication Critical patent/DE3720732A1/de
Application granted granted Critical
Publication of DE3720732C2 publication Critical patent/DE3720732C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J61/00—Gas-discharge or vapour-discharge lamps
    • H01J61/02—Details
    • H01J61/12—Selection of substances for gas fillings; Specified operating pressure or temperature
    • H01J61/18—Selection of substances for gas fillings; Specified operating pressure or temperature having a metallic vapour as the principal constituent
    • H01J61/20—Selection of substances for gas fillings; Specified operating pressure or temperature having a metallic vapour as the principal constituent mercury vapour
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
DE19873720732 1986-06-23 1987-06-23 Vorrichtung zur spektroskopie mit einer metall-halogenidlampe als lichtquelle Granted DE3720732A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61144936A JPS631937A (ja) 1986-06-23 1986-06-23 分光分析装置

Publications (2)

Publication Number Publication Date
DE3720732A1 true DE3720732A1 (de) 1988-01-14
DE3720732C2 DE3720732C2 (cg-RX-API-DMAC10.html) 1991-11-14

Family

ID=15373637

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19873720732 Granted DE3720732A1 (de) 1986-06-23 1987-06-23 Vorrichtung zur spektroskopie mit einer metall-halogenidlampe als lichtquelle

Country Status (3)

Country Link
US (1) US4755056A (cg-RX-API-DMAC10.html)
JP (1) JPS631937A (cg-RX-API-DMAC10.html)
DE (1) DE3720732A1 (cg-RX-API-DMAC10.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19544481A1 (de) * 1995-11-29 1997-06-05 Laser Sorter Gmbh Beleuchtungseinrichtung mit Halogen-Metalldampflampen

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62103529A (ja) * 1985-10-31 1987-05-14 Toshiba Corp 複合管
US5050991A (en) * 1989-09-29 1991-09-24 The United States Of America As Represented By The Secretary Of The Navy High optical density measuring spectrometer
JPH04132939A (ja) * 1990-09-25 1992-05-07 Kubota Corp 光学式穀粒分析装置
DE4118168A1 (de) * 1991-06-03 1993-01-21 Zeiss Carl Jena Gmbh Anordnung zur bestimmung von fett und eiweiss
DE4226884C1 (de) * 1992-08-13 1994-03-10 Meinrad Maechler Spektroskopisches System zur Durchführung der Mikroanalytik
WO1994004892A1 (de) * 1992-08-13 1994-03-03 Maechler Meinrad Spektroskopische systeme zur analyse von kleinen und kleinsten substanzmengen
US5483335A (en) * 1993-03-18 1996-01-09 Tobias; Reginald Multiplex spectroscopy
EP0634780B1 (en) * 1993-07-13 1997-01-08 Matsushita Electric Industrial Co., Ltd. Metal halide discharge lamp, illumination optical apparatus, and image display system
US6905641B2 (en) * 2000-09-26 2005-06-14 Calhoun Vision, Inc. Delivery system for post-operative power adjustment of adjustable lens
WO2003034032A2 (en) 2001-10-18 2003-04-24 Cargill Robert L Method and apparatus for quantifying an 'integrated index' of a material medium
JP4861042B2 (ja) * 2006-04-17 2012-01-25 株式会社日立ハイテクマニファクチャ&サービス 分光光度計
US11266495B2 (en) 2019-10-20 2022-03-08 Rxsight, Inc. Light adjustable intraocular lens with a modulable absorption front protection layer

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1572703A1 (de) * 1967-04-06 1970-03-12 Howaldtswerke Deutsche Werft Vorrichtung zur schnellen Aufnahme von Absorptions-und Extinktionsspektren
DE2936544A1 (de) * 1978-09-11 1980-03-20 Gte Laboratories Inc Elektrodenlose lampenanordnung
DE3207377A1 (de) * 1981-03-04 1982-11-11 Instrumentation Laboratory, Inc., 02173 Lexington, Mass. Vorrichtung zur durchfuehrung einer spektralanalyse
DD159565A1 (de) * 1981-05-25 1983-03-16 Joachim Mohr Verfahren und anordnung zur durchfuehrung einer spektralanalyse
DE3347603A1 (de) * 1983-06-14 1984-12-20 Shimadzu Corp., Kyoto Spektrofotometrischer detektor mit fotodiodenanordnung
DE3427280A1 (de) * 1984-07-24 1986-02-06 Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH, 8000 München Metallhalogenid-hochdruckentladungslampe

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3452238A (en) * 1966-12-05 1969-06-24 Westinghouse Electric Corp Metal vapor discharge lamp
US3842307A (en) * 1971-02-11 1974-10-15 Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh High pressure mercury vapor discharge lamp with metal halide additives
DE2519377A1 (de) * 1975-04-30 1976-11-11 Patra Patent Treuhand Quecksilberdampf-hochdruckentladungslampe
DE2616893A1 (de) * 1976-04-15 1977-11-03 Patra Patent Treuhand Bestrahlungslampe
US4229673A (en) * 1979-01-18 1980-10-21 Westinghouse Electric Corp. Mercury metal-halide lamp including neodymium iodide, cesium and sodium iodide
JPS59215654A (ja) * 1983-05-24 1984-12-05 Hamamatsu Photonics Kk 改良された複合光源ランプ
US4692883A (en) * 1985-02-21 1987-09-08 The Perkin-Elmer Corporation Automatic digital wavelength calibration system for a spectrophotometer

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1572703A1 (de) * 1967-04-06 1970-03-12 Howaldtswerke Deutsche Werft Vorrichtung zur schnellen Aufnahme von Absorptions-und Extinktionsspektren
DE2936544A1 (de) * 1978-09-11 1980-03-20 Gte Laboratories Inc Elektrodenlose lampenanordnung
DE3207377A1 (de) * 1981-03-04 1982-11-11 Instrumentation Laboratory, Inc., 02173 Lexington, Mass. Vorrichtung zur durchfuehrung einer spektralanalyse
DD159565A1 (de) * 1981-05-25 1983-03-16 Joachim Mohr Verfahren und anordnung zur durchfuehrung einer spektralanalyse
DE3347603A1 (de) * 1983-06-14 1984-12-20 Shimadzu Corp., Kyoto Spektrofotometrischer detektor mit fotodiodenanordnung
DE3427280A1 (de) * 1984-07-24 1986-02-06 Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH, 8000 München Metallhalogenid-hochdruckentladungslampe

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Z.: Der Elektromeister + Deutsches ElektrohandwerkJg. 48, 1973, H. 7, S. 438-441 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19544481A1 (de) * 1995-11-29 1997-06-05 Laser Sorter Gmbh Beleuchtungseinrichtung mit Halogen-Metalldampflampen

Also Published As

Publication number Publication date
DE3720732C2 (cg-RX-API-DMAC10.html) 1991-11-14
JPS631937A (ja) 1988-01-06
US4755056A (en) 1988-07-05

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee