DE3712665C2 - Teilchengrößendetektor mit hoher Empfindlichkeit für Umgebungen mit starker Molekularstreuung - Google Patents
Teilchengrößendetektor mit hoher Empfindlichkeit für Umgebungen mit starker MolekularstreuungInfo
- Publication number
- DE3712665C2 DE3712665C2 DE3712665A DE3712665A DE3712665C2 DE 3712665 C2 DE3712665 C2 DE 3712665C2 DE 3712665 A DE3712665 A DE 3712665A DE 3712665 A DE3712665 A DE 3712665A DE 3712665 C2 DE3712665 C2 DE 3712665C2
- Authority
- DE
- Germany
- Prior art keywords
- particle size
- detector
- particles
- measuring field
- processor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000002245 particle Substances 0.000 title claims description 97
- 230000035945 sensitivity Effects 0.000 title claims description 16
- 238000005259 measurement Methods 0.000 claims description 18
- 238000012545 processing Methods 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 7
- 238000000149 argon plasma sintering Methods 0.000 claims description 5
- 230000008569 process Effects 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 4
- 238000003860 storage Methods 0.000 claims description 3
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 239000007789 gas Substances 0.000 description 12
- 238000004519 manufacturing process Methods 0.000 description 9
- 238000011109 contamination Methods 0.000 description 6
- 238000009826 distribution Methods 0.000 description 5
- 238000011161 development Methods 0.000 description 4
- 230000018109 developmental process Effects 0.000 description 4
- 238000010276 construction Methods 0.000 description 3
- 238000004377 microelectronic Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 239000000443 aerosol Substances 0.000 description 1
- XKRFYHLGVUSROY-UHFFFAOYSA-N argon Substances [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- -1 argon ion Chemical class 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
- G01N2021/391—Intracavity sample
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06851477 US4798465B2 (en) | 1986-04-14 | 1986-04-14 | Particle size detection device having high sensitivity in high molecular scattering environment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3712665A1 DE3712665A1 (de) | 1987-10-15 |
| DE3712665C2 true DE3712665C2 (de) | 2000-02-17 |
Family
ID=25310865
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE3712665A Expired - Lifetime DE3712665C2 (de) | 1986-04-14 | 1987-04-14 | Teilchengrößendetektor mit hoher Empfindlichkeit für Umgebungen mit starker Molekularstreuung |
Country Status (3)
| Country | Link |
|---|---|
| US (2) | US4798465B2 (enExample) |
| JP (1) | JP2786187B2 (enExample) |
| DE (1) | DE3712665C2 (enExample) |
Families Citing this family (85)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2879798B2 (ja) * | 1988-09-13 | 1999-04-05 | パーティクル、メジュアリング、システムズ インコーポレーテッド | 粒子寸法検出装置に使用するための粒子検出装置 |
| US4984889A (en) * | 1989-03-10 | 1991-01-15 | Pacific Scientific Company | Particle size measuring system with coincidence detection |
| US5061065A (en) * | 1989-10-20 | 1991-10-29 | Pacific Scientific Company | Particle contamination detection in fluids through the external section of a laser |
| US5092675A (en) * | 1989-11-14 | 1992-03-03 | Pacific Scientific Company | Vacuum line particle detector with slab laser |
| US5084629A (en) * | 1990-05-07 | 1992-01-28 | Met One, Inc. | Split flow uniform multisensor detection |
| US5282151A (en) * | 1991-02-28 | 1994-01-25 | Particle Measuring Systems, Inc. | Submicron diameter particle detection utilizing high density array |
| JP3318397B2 (ja) * | 1992-08-27 | 2002-08-26 | 興和株式会社 | 微粒子計測装置 |
| US5467189A (en) * | 1993-01-22 | 1995-11-14 | Venturedyne, Ltd. | Improved particle sensor and method for assaying a particle |
| US5459569A (en) * | 1993-04-21 | 1995-10-17 | Particle Measuring Systems, Inc. | Nonintrusive modular particle detecting device |
| JP2529661B2 (ja) * | 1993-08-20 | 1996-08-28 | アネルバ株式会社 | 粒子検出装置 |
| JPH07306133A (ja) * | 1994-03-14 | 1995-11-21 | Hitachi Electron Eng Co Ltd | 微粒子検出器 |
| US5493123A (en) * | 1994-04-28 | 1996-02-20 | Particle Measuring Systems, Inc. | Surface defect inspection system and method |
| US5565984A (en) * | 1995-06-12 | 1996-10-15 | Met One, Inc. | Re-entrant illumination system for particle measuring device |
| US5751422A (en) * | 1996-02-26 | 1998-05-12 | Particle Measuring Systems, Inc. | In-situ particle detection utilizing optical coupling |
| US5726753A (en) * | 1996-02-26 | 1998-03-10 | Research Electro-Optics, Inc. | Intracavity particle detection using optically pumped laser media |
| US5642193A (en) * | 1996-03-08 | 1997-06-24 | Met One, Inc. | Particle counter employing a solid-state laser with an intracavity view volume |
| US5671046A (en) * | 1996-07-01 | 1997-09-23 | Particle Measuring Systems, Inc. | Device and method for optically detecting particles in a free liquid stream |
| US5920388A (en) * | 1996-10-15 | 1999-07-06 | Research Electro-Optics, Inc. | Small particle characteristic determination |
| JP2956653B2 (ja) * | 1996-12-16 | 1999-10-04 | 日本電気株式会社 | パーティクルモニター装置 |
| US5805281A (en) * | 1997-04-21 | 1998-09-08 | Particle Measuring Systems | Noise reduction utilizing signal multiplication |
| US6031610A (en) * | 1997-10-06 | 2000-02-29 | Pacific Scientific Instruments Company | Multi-lobe pump for particle counters |
| DE19752033A1 (de) * | 1997-11-24 | 1999-06-10 | Andreas Trampe | Vorrichtung zur Detektion von Partikeln mit nicht abbildenden optischen Strukturen |
| US6346983B1 (en) | 1998-01-29 | 2002-02-12 | Aleksandr L. Yufa | Methods and wireless communicating particle counting and measuring apparatus |
| US6137572A (en) * | 1998-02-27 | 2000-10-24 | Pacific Scientific Instruments Company | High sensitivity optical fluid-borne particle detection |
| US5946092A (en) * | 1998-02-27 | 1999-08-31 | Pacific Scientific Instruments Company | Dual laser heterodyne optical particle detection technique |
| US6061132A (en) * | 1998-07-20 | 2000-05-09 | Pacific Scientific Instruments Company | Dual detector array with noise cancellation for a particle size detection device |
| EP0992829A1 (en) * | 1998-10-07 | 2000-04-12 | Scott R. Johnson | Image projection system |
| US7006682B1 (en) * | 1999-09-09 | 2006-02-28 | Nec Corporation | Apparatus for monitoring particles and method of doing the same |
| JP3818867B2 (ja) * | 2000-05-12 | 2006-09-06 | リオン株式会社 | 光散乱式粒子検出器 |
| US6723975B2 (en) * | 2001-02-07 | 2004-04-20 | Honeywell International Inc. | Scanner for airborne laser system |
| US6696362B2 (en) * | 2001-02-08 | 2004-02-24 | Applied Materials Inc. | Method for using an in situ particle sensor for monitoring particle performance in plasma deposition processes |
| EP1432972A1 (en) * | 2001-09-07 | 2004-06-30 | Inficon, Inc. | Signal processing method for in-situ, scanned-beam particle monitoring |
| US6639671B1 (en) | 2002-03-01 | 2003-10-28 | Msp Corporation | Wide-range particle counter |
| US6879398B2 (en) * | 2002-05-22 | 2005-04-12 | Lockheed Martin Corporation | Distributed contaminant optical monitoring system |
| WO2004007017A2 (en) * | 2002-07-16 | 2004-01-22 | Research Electro-Optics, Inc. | Method of noise cancellation in an unpolarized-laser instrument |
| AU2003253942A1 (en) * | 2002-07-16 | 2004-02-02 | Research Electro-Optics, Inc. | Method for noise cancellation by spectral flattening of laser output in a multi-line-laser instrument |
| US7576857B2 (en) * | 2002-08-27 | 2009-08-18 | Particle Measuring Systems, Inc. | Particle counter with laser diode |
| US6936828B2 (en) * | 2003-02-14 | 2005-08-30 | Honeywell International Inc. | Particle detection system and method |
| US7023620B1 (en) | 2003-07-03 | 2006-04-04 | Research Electro-Optics, Inc. | Beam array pitch controller |
| US6909102B1 (en) | 2004-01-21 | 2005-06-21 | Varian Semiconductor Equipment Associates, Inc. | Ion implanter system, method and program product including particle detection |
| GB2411002B (en) * | 2004-02-11 | 2006-12-20 | Facility Monitoring Systems Lt | Particle counter for liquids |
| US20060014300A1 (en) * | 2004-07-15 | 2006-01-19 | Maurer Scott M | Sensor for detection and identification of biological particles |
| US7030980B1 (en) | 2004-12-29 | 2006-04-18 | Particle Measuring Systems, Inc. | Diode pumped intracavity laser particle counter with improved reliability and reduced noise |
| US7456960B2 (en) * | 2005-06-06 | 2008-11-25 | Particle Measuring Systems, Inc. | Particle counter with improved image sensor array |
| WO2008118769A1 (en) * | 2007-03-23 | 2008-10-02 | Particle Measuring Systems, Inc. | Optical particle sensor with exhaust-cooled optical source |
| US7916293B2 (en) * | 2007-12-04 | 2011-03-29 | Particle Measuring Systems, Inc. | Non-orthogonal particle detection systems and methods |
| US20120136584A1 (en) * | 2009-08-04 | 2012-05-31 | Kazuo Ban | Detection apparatus and detection method for detecting microorganisms |
| JP5574250B2 (ja) | 2009-08-24 | 2014-08-20 | パーティクル・メージャーリング・システムズ・インコーポレーテッド | 流量がモニタリングされる粒子センサ |
| DE102011000099A1 (de) * | 2011-01-11 | 2012-07-12 | Universität Duisburg-Essen | Analyseeinrichtung zur Analyse eines Aerosols |
| SG11201402528TA (en) | 2011-12-01 | 2014-10-30 | P M L Particles Monitoring Technologies Ltd | Detection scheme for particle size and concentration measurement |
| US8477307B1 (en) | 2012-01-26 | 2013-07-02 | Ann Rachel Yufa | Methods and apparatus for biomedical agent multi-dimension measuring and analysis |
| US10983040B2 (en) | 2013-03-15 | 2021-04-20 | Particles Plus, Inc. | Particle counter with integrated bootloader |
| US11579072B2 (en) | 2013-03-15 | 2023-02-14 | Particles Plus, Inc. | Personal air quality monitoring system |
| US12044611B2 (en) | 2013-03-15 | 2024-07-23 | Particles Plus, Inc. | Particle counter with integrated bootloader |
| US9677990B2 (en) | 2014-04-30 | 2017-06-13 | Particles Plus, Inc. | Particle counter with advanced features |
| US10352844B2 (en) | 2013-03-15 | 2019-07-16 | Particles Plus, Inc. | Multiple particle sensors in a particle counter |
| ITRM20130128U1 (it) | 2013-07-23 | 2015-01-24 | Particle Measuring Systems S R L | Dispositivo per il campionamento microbico dell'aria |
| US9810558B2 (en) | 2014-03-14 | 2017-11-07 | Particle Measuring Systems, Inc. | Pressure-based airflow sensing in particle impactor systems |
| US9631222B2 (en) | 2014-03-14 | 2017-04-25 | Particle Measuring Systems, Inc. | Filter and blower geometry for particle sampler |
| JP6531528B2 (ja) * | 2015-07-15 | 2019-06-19 | 富士電機株式会社 | 粒子検出装置 |
| US10094755B1 (en) | 2017-10-25 | 2018-10-09 | Venturedyne, Ltd | Environmental sensor and method of operating the same |
| WO2019082186A1 (en) | 2017-10-26 | 2019-05-02 | Particle Measuring Systems, Inc. | SYSTEM AND METHOD FOR MEASURING PARTICLES |
| US10444137B2 (en) * | 2018-01-23 | 2019-10-15 | Cbrn International, Ltd. | Bioaerosol detector having safeguards |
| US10359350B1 (en) * | 2018-01-23 | 2019-07-23 | Hai Lin | Method and system for particle characterization in harsh environments |
| WO2020047457A1 (en) | 2018-08-31 | 2020-03-05 | Particle Measuring Systems, Inc. | Fluid refractive index optimizing particle counter |
| WO2020051131A1 (en) | 2018-09-04 | 2020-03-12 | Particle Measuring Systems, Inc. | Detecting nanoparticles on production equipment and surfaces |
| US11385161B2 (en) | 2018-11-12 | 2022-07-12 | Particle Measuring Systems, Inc. | Calibration verification for optical particle analyzers |
| US11181455B2 (en) | 2018-11-12 | 2021-11-23 | Particle Measuring Systems, Inc. | Calibration verification for optical particle analyzers |
| US10908059B2 (en) | 2018-11-16 | 2021-02-02 | Particle Measuring Systems, Inc. | Slurry monitor coupling bulk size distribution and single particle detection |
| CN113039423B (zh) | 2018-11-16 | 2024-09-06 | 粒子监测系统有限公司 | 用于机器人控制的制造屏障系统的粒子采样系统和方法 |
| JP7504912B2 (ja) | 2019-04-25 | 2024-06-24 | パーティクル・メージャーリング・システムズ・インコーポレーテッド | 軸上粒子検出及び／又は差分検出のための粒子検出システム及び方法 |
| EP4022278A4 (en) | 2019-08-26 | 2023-11-01 | Particle Measuring Systems, Inc. | TRIGGERED SCANNING SYSTEMS AND METHODS |
| KR102843087B1 (ko) | 2019-10-07 | 2025-08-06 | 파티클 머슈어링 시스템즈, 인크. | 원격 알람 모니터링 및 제어를 갖는 입자 검출기 |
| WO2021071793A1 (en) | 2019-10-07 | 2021-04-15 | Particle Measuring Systems, Inc. | Antimicrobial particle detectors |
| IT201900020248A1 (it) | 2019-11-04 | 2021-05-04 | Particle Measuring Systems S R L | Dispositivo di monitoraggio mobile per aree a contaminazione controllata |
| CN114729868A (zh) | 2019-11-22 | 2022-07-08 | 粒子监测系统有限公司 | 先进的用于干涉测量颗粒检测和具有小大小尺寸的颗粒的检测的系统和方法 |
| WO2021150472A1 (en) | 2020-01-21 | 2021-07-29 | Particle Measuring Systems, Inc. | Robotic control for aseptic processing |
| US11988591B2 (en) | 2020-07-01 | 2024-05-21 | Particles Plus, Inc. | Modular optical particle counter sensor and apparatus |
| US11846578B2 (en) * | 2020-09-28 | 2023-12-19 | Lighthouse Worldwide Solutions | Apparatus and method for characterization of particles |
| KR20240019343A (ko) | 2021-06-15 | 2024-02-14 | 파티클 머슈어링 시스템즈, 인크. | 도킹 스테이션을 갖춘 모듈식 입자 계수기 |
| EP4356053A4 (en) | 2021-06-15 | 2025-05-28 | Particle Measuring Systems, Inc. | Condensation particle counter and method of use |
| TW202319725A (zh) | 2021-06-15 | 2023-05-16 | 美商粒子監測系統有限公司 | 緊湊型智慧氣溶膠及流體分歧管 |
| KR20240135793A (ko) | 2022-01-21 | 2024-09-12 | 파티클 머슈어링 시스템즈, 인크. | 향상된 이중 통과 및 다중 통과 입자 검출 |
| TW202536383A (zh) | 2023-11-16 | 2025-09-16 | 美商粒子監測系統有限公司 | 用於減少粒子偵測器中之誤報粒子偵測事件的系統及方法 |
| CN121026889B (zh) * | 2025-10-31 | 2026-01-23 | 雅安宇焜芯材材料科技有限公司 | 一种氮化镓生产用排气粉尘检测装置及处理系统、方法 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3406289A (en) * | 1965-11-10 | 1968-10-15 | Univ Iowa State Res Found Inc | Laser small-particle detector and method |
| US3941982A (en) * | 1974-07-22 | 1976-03-02 | Particle Measuring Systems, Inc. | Method and apparatus for two-dimensional data acquisition |
| DE2558392A1 (de) * | 1975-01-08 | 1976-07-15 | William Guy Rowe | Partikelanalysator |
| DE2820661A1 (de) * | 1977-05-12 | 1978-11-23 | Eisai Co Ltd | Verfahren und vorrichtung zur feststellung von fremdkoerpern in fluessigkeiten |
| US4571079A (en) * | 1983-12-29 | 1986-02-18 | Particle Measuring Systems, Inc. | Aerosol sampling device and method with improved sample flow characteristics |
| US4594715A (en) * | 1983-11-17 | 1986-06-10 | Particle Measuring Systems, Inc. | Laser with stabilized external passive cavity |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3822095A (en) * | 1972-08-14 | 1974-07-02 | Block Engineering | System for differentiating particles |
| US4173415A (en) * | 1976-08-20 | 1979-11-06 | Science Spectrum, Inc. | Apparatus and process for rapidly characterizing and differentiating large organic cells |
| US4429995A (en) * | 1980-07-21 | 1984-02-07 | National Research Development Corporation | Two dimensinal flow analyzer |
| JPS5981536A (ja) * | 1982-11-01 | 1984-05-11 | Japan Spectroscopic Co | 微小粒子分離装置 |
| JPS59160741A (ja) * | 1983-03-03 | 1984-09-11 | Toshiba Corp | 粒径測定装置 |
-
1986
- 1986-04-14 US US06851477 patent/US4798465B2/en not_active Expired - Lifetime
-
1987
- 1987-04-14 DE DE3712665A patent/DE3712665C2/de not_active Expired - Lifetime
- 1987-04-14 JP JP62089987A patent/JP2786187B2/ja not_active Expired - Lifetime
-
1988
- 1988-09-13 US US07/243,988 patent/US4893928A/en not_active Expired - Lifetime
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3406289A (en) * | 1965-11-10 | 1968-10-15 | Univ Iowa State Res Found Inc | Laser small-particle detector and method |
| US3941982A (en) * | 1974-07-22 | 1976-03-02 | Particle Measuring Systems, Inc. | Method and apparatus for two-dimensional data acquisition |
| DE2558392A1 (de) * | 1975-01-08 | 1976-07-15 | William Guy Rowe | Partikelanalysator |
| DE2820661A1 (de) * | 1977-05-12 | 1978-11-23 | Eisai Co Ltd | Verfahren und vorrichtung zur feststellung von fremdkoerpern in fluessigkeiten |
| US4594715A (en) * | 1983-11-17 | 1986-06-10 | Particle Measuring Systems, Inc. | Laser with stabilized external passive cavity |
| US4571079A (en) * | 1983-12-29 | 1986-02-18 | Particle Measuring Systems, Inc. | Aerosol sampling device and method with improved sample flow characteristics |
Non-Patent Citations (2)
| Title |
|---|
| KNOLLENBERG, R.G. "The Measurement of Particle Sizes Below 0.1 Micrometers" in: The Journal of Environmental Sciences, Jan./Feb. 1985, S.1740 bis 1747 * |
| VDI-Richtlinien VDI 2083 "Reinraumtechnik/Ober- flächenreinheit" * |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6311838A (ja) | 1988-01-19 |
| US4893928A (en) | 1990-01-16 |
| JP2786187B2 (ja) | 1998-08-13 |
| US4798465B2 (en) | 1994-08-30 |
| DE3712665A1 (de) | 1987-10-15 |
| US4798465B1 (enExample) | 1991-09-17 |
| US4798465A (en) | 1989-01-17 |
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