DE3629534C2 - - Google Patents
Info
- Publication number
- DE3629534C2 DE3629534C2 DE19863629534 DE3629534A DE3629534C2 DE 3629534 C2 DE3629534 C2 DE 3629534C2 DE 19863629534 DE19863629534 DE 19863629534 DE 3629534 A DE3629534 A DE 3629534A DE 3629534 C2 DE3629534 C2 DE 3629534C2
- Authority
- DE
- Germany
- Prior art keywords
- frequency
- measurement
- time
- sampling
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 72
- 238000005070 sampling Methods 0.000 claims description 69
- 238000000034 method Methods 0.000 claims description 46
- 230000015654 memory Effects 0.000 claims description 14
- 238000012545 processing Methods 0.000 claims description 12
- 238000011156 evaluation Methods 0.000 claims description 11
- 230000001427 coherent effect Effects 0.000 claims description 9
- 238000004422 calculation algorithm Methods 0.000 claims description 8
- 230000006870 function Effects 0.000 claims description 6
- 230000010363 phase shift Effects 0.000 claims description 5
- 238000004364 calculation method Methods 0.000 claims description 4
- 230000003595 spectral effect Effects 0.000 claims description 3
- 238000012360 testing method Methods 0.000 claims description 3
- 238000004590 computer program Methods 0.000 claims 1
- 239000010453 quartz Substances 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 1
- 239000003990 capacitor Substances 0.000 description 14
- 230000000875 corresponding effect Effects 0.000 description 8
- 238000002847 impedance measurement Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 238000001228 spectrum Methods 0.000 description 5
- 238000010183 spectrum analysis Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- 230000009466 transformation Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 238000007493 shaping process Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 108010076504 Protein Sorting Signals Proteins 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000007717 exclusion Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000012432 intermediate storage Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000001208 nuclear magnetic resonance pulse sequence Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000013139 quantization Methods 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
- G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19863629534 DE3629534C3 (de) | 1986-08-29 | 1986-08-29 | Verfahren zur Impedanzmessung eines elektrischen Zweipols durch kohärente Abtastung |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19863629534 DE3629534C3 (de) | 1986-08-29 | 1986-08-29 | Verfahren zur Impedanzmessung eines elektrischen Zweipols durch kohärente Abtastung |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| DE3629534A1 DE3629534A1 (de) | 1988-03-03 |
| DE3629534C2 true DE3629534C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1989-04-06 |
| DE3629534C3 DE3629534C3 (de) | 1997-10-09 |
Family
ID=6308544
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19863629534 Expired - Lifetime DE3629534C3 (de) | 1986-08-29 | 1986-08-29 | Verfahren zur Impedanzmessung eines elektrischen Zweipols durch kohärente Abtastung |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE3629534C3 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2705789B1 (fr) * | 1993-05-27 | 1995-08-18 | Electricite De France | Procédé d'identification d'une impédance de réseau ou de machine tournante. |
| US5508607A (en) * | 1994-08-11 | 1996-04-16 | Fluke Corporation | Electronic test instrument for component test |
| GB9712051D0 (en) * | 1997-06-10 | 1997-08-06 | Bcf Designs Ltd | Method and apparatus for testing frequency-dependent electrical circuits |
| GB2328028B (en) | 1997-06-10 | 1999-12-08 | Bcf Designs Ltd | Method and apparatus for testing low-pass frequency-dependent electrical circuits |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4283713A (en) * | 1979-01-15 | 1981-08-11 | Tektronix, Inc. | Waveform acquisition circuit |
-
1986
- 1986-08-29 DE DE19863629534 patent/DE3629534C3/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| DE3629534C3 (de) | 1997-10-09 |
| DE3629534A1 (de) | 1988-03-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| D2 | Grant after examination | ||
| 8363 | Opposition against the patent | ||
| 8366 | Restricted maintained after opposition proceedings | ||
| 8305 | Restricted maintenance of patent after opposition | ||
| D4 | Patent maintained restricted |