DE3585048D1 - Verfahren und vorrichtung zur herstellung eines duennfilmes. - Google Patents
Verfahren und vorrichtung zur herstellung eines duennfilmes.Info
- Publication number
- DE3585048D1 DE3585048D1 DE8585302794T DE3585048T DE3585048D1 DE 3585048 D1 DE3585048 D1 DE 3585048D1 DE 8585302794 T DE8585302794 T DE 8585302794T DE 3585048 T DE3585048 T DE 3585048T DE 3585048 D1 DE3585048 D1 DE 3585048D1
- Authority
- DE
- Germany
- Prior art keywords
- producing
- thin film
- thin
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
- H01L21/203—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy using physical deposition, e.g. vacuum deposition, sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
- C23C14/544—Controlling the film thickness or evaporation rate using measurement in the gas phase
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59081121A JPS60225422A (ja) | 1984-04-24 | 1984-04-24 | 薄膜形成方法およびその装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3585048D1 true DE3585048D1 (de) | 1992-02-13 |
Family
ID=13737548
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8585302794T Expired - Lifetime DE3585048D1 (de) | 1984-04-24 | 1985-04-22 | Verfahren und vorrichtung zur herstellung eines duennfilmes. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4639377A (de) |
EP (1) | EP0160479B1 (de) |
JP (1) | JPS60225422A (de) |
KR (1) | KR930010067B1 (de) |
DE (1) | DE3585048D1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2578095B1 (fr) * | 1985-02-28 | 1988-04-15 | Avitaya Francois D | Procede et dispositif de depot par croissance epitaxiale d'un materiau dope |
US4800840A (en) * | 1986-09-24 | 1989-01-31 | Rockwell International Corporation | Method and apparatus for vapor stream discrimination |
JP3214505B2 (ja) * | 1991-09-13 | 2001-10-02 | 株式会社デンソー | 半導体装置の製造方法 |
DE4204650C1 (de) * | 1992-02-15 | 1993-07-08 | Hoffmeister, Helmut, Dr., 4400 Muenster, De | |
US5400739A (en) * | 1992-10-09 | 1995-03-28 | Texas Instruments Incorporated | Method for controlling thin film growth of compound semiconductors using mass spectrometer detectors |
US5330610A (en) * | 1993-05-28 | 1994-07-19 | Martin Marietta Energy Systems, Inc. | Method of digital epilaxy by externally controlled closed-loop feedback |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2341827A (en) * | 1944-02-15 | Optical unit | ||
US3168418A (en) * | 1962-03-27 | 1965-02-02 | Alloyd Electronics | Device for monitoring and controlling evaporation rate in vacuum deposition |
GB1010456A (en) * | 1962-10-02 | 1965-11-17 | G V Planer Ltd | Means for measuring and/or controlling the evaporation rate in vacuum evaporation processes |
US3347701A (en) * | 1963-02-05 | 1967-10-17 | Fujitsu Ltd | Method and apparatus for vapor deposition employing an electron beam |
DE1521247C3 (de) * | 1965-03-10 | 1975-04-30 | Fujitsu Ltd., Communications And Electronics, Tokio | Vakuumbedampfungseinrichking mit einem lonenstrommeßfiihler zur Regelung der Verdampfungsgeschwindigkeit |
US3419718A (en) * | 1965-12-15 | 1968-12-31 | Gulf General Atomic Inc | Apparatus for measuring the flow of electrically neutral particles |
CH490678A (fr) * | 1967-04-21 | 1970-05-15 | Battelle Development Corp | Jauge de mesure de la vitesse d'évaporation sous vide |
JPS5123950B1 (de) * | 1970-01-30 | 1976-07-20 | ||
JPS5141546B2 (de) * | 1972-01-21 | 1976-11-10 | ||
US4024399A (en) * | 1975-01-06 | 1977-05-17 | Jersey Nuclear-Avco Isotopes, Inc. | Method and apparatus for measuring vapor flow in isotope separation |
FR2370320A1 (fr) * | 1976-11-05 | 1978-06-02 | Thomson Csf | Systeme de regulation de flux moleculaires, et son application aux techniques de co-evaporation |
JPS5817607A (ja) * | 1981-07-24 | 1983-02-01 | Hitachi Condenser Co Ltd | イオンプレ−テイング装置 |
JPS58185768A (ja) * | 1982-04-23 | 1983-10-29 | Shinko Seiki Kk | 蒸発速度制御装置 |
CH651592A5 (de) * | 1982-10-26 | 1985-09-30 | Balzers Hochvakuum | Dampfquelle fuer vakuumbedampfungsanlagen. |
-
1984
- 1984-04-24 JP JP59081121A patent/JPS60225422A/ja active Granted
-
1985
- 1985-04-13 KR KR1019850002484A patent/KR930010067B1/ko not_active IP Right Cessation
- 1985-04-22 EP EP85302794A patent/EP0160479B1/de not_active Expired - Lifetime
- 1985-04-22 US US06/725,793 patent/US4639377A/en not_active Expired - Fee Related
- 1985-04-22 DE DE8585302794T patent/DE3585048D1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0160479A2 (de) | 1985-11-06 |
JPS60225422A (ja) | 1985-11-09 |
KR930010067B1 (ko) | 1993-10-14 |
EP0160479B1 (de) | 1992-01-02 |
US4639377A (en) | 1987-01-27 |
KR850007894A (ko) | 1985-12-09 |
EP0160479A3 (en) | 1988-03-30 |
JPH0458684B2 (de) | 1992-09-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |