DE3582606D1 - Halbleiterspeicheranordnung. - Google Patents
Halbleiterspeicheranordnung.Info
- Publication number
- DE3582606D1 DE3582606D1 DE8585301816T DE3582606T DE3582606D1 DE 3582606 D1 DE3582606 D1 DE 3582606D1 DE 8585301816 T DE8585301816 T DE 8585301816T DE 3582606 T DE3582606 T DE 3582606T DE 3582606 D1 DE3582606 D1 DE 3582606D1
- Authority
- DE
- Germany
- Prior art keywords
- row decoder
- circuit
- normal row
- output line
- decoder circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
- G11C29/787—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes using a fuse hierarchy
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Dram (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59051861A JPS60195797A (ja) | 1984-03-16 | 1984-03-16 | 半導体記憶装置の冗長回路 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3582606D1 true DE3582606D1 (de) | 1991-05-29 |
Family
ID=12898647
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8585301816T Expired - Lifetime DE3582606D1 (de) | 1984-03-16 | 1985-03-15 | Halbleiterspeicheranordnung. |
Country Status (4)
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0257120B1 (de) * | 1986-08-22 | 1992-06-10 | International Business Machines Corporation | Dekodierverfahren und -Schaltungsanordnung für einen redundanten CMOS-Halbleiterspeicher |
US4855613A (en) * | 1987-05-08 | 1989-08-08 | Mitsubishi Denki Kabushiki Kaisha | Wafer scale integration semiconductor device having improved chip power-supply connection arrangement |
JPH0758599B2 (ja) * | 1987-09-08 | 1995-06-21 | 日本電気株式会社 | 冗長セルを有する半導体記憶装置 |
JP2690489B2 (ja) * | 1988-01-29 | 1997-12-10 | 日本電気アイシーマイコンシステム株式会社 | 半導体メモリ装置 |
JPH073754B2 (ja) * | 1988-03-08 | 1995-01-18 | 三菱電機株式会社 | 半導体記憶装置 |
JPH0235699A (ja) * | 1988-07-26 | 1990-02-06 | Nec Corp | 化合物半導体メモリデバイス |
US5128557A (en) * | 1989-05-22 | 1992-07-07 | Ncr Corporation | Clamping circuit for data transfer bus |
US5321510A (en) * | 1989-11-13 | 1994-06-14 | Texas Instruments Incorporated | Serial video processor |
JP2782948B2 (ja) * | 1990-11-16 | 1998-08-06 | 日本電気株式会社 | 半導体メモリ |
KR0145223B1 (ko) * | 1995-04-24 | 1998-08-17 | 김광호 | 리던던시 기능을 가지는 반도체 메모리 장치 |
EP0953983A3 (en) * | 1996-03-01 | 2005-10-05 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device with clamping circuit for preventing malfunction |
US6275426B1 (en) * | 1999-10-18 | 2001-08-14 | Netlogic Microsystems, Inc. | Row redundancy for content addressable memory |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5685934A (en) * | 1979-12-14 | 1981-07-13 | Nippon Telegr & Teleph Corp <Ntt> | Control signal generating circuit |
DE3028778C2 (de) * | 1980-07-29 | 1983-06-16 | Siemens AG, 1000 Berlin und 8000 München | Decodiereinrichtung |
JPS58155593A (ja) * | 1982-03-10 | 1983-09-16 | Hitachi Ltd | 半導体記憶装置 |
JPS58164099A (ja) * | 1982-03-25 | 1983-09-28 | Toshiba Corp | 半導体メモリ− |
JPS58208998A (ja) * | 1982-05-28 | 1983-12-05 | Toshiba Corp | 半導体cmosメモリ |
JPS59157892A (ja) * | 1983-02-28 | 1984-09-07 | Nec Corp | 冗長回路 |
JPS60130000A (ja) * | 1983-12-15 | 1985-07-11 | Mitsubishi Electric Corp | 半導体記憶装置 |
-
1984
- 1984-03-16 JP JP59051861A patent/JPS60195797A/ja active Granted
-
1985
- 1985-03-06 US US06/709,409 patent/US4694432A/en not_active Expired - Lifetime
- 1985-03-15 EP EP85301816A patent/EP0155829B1/en not_active Expired
- 1985-03-15 DE DE8585301816T patent/DE3582606D1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0155829A3 (en) | 1987-09-30 |
EP0155829A2 (en) | 1985-09-25 |
JPS60195797A (ja) | 1985-10-04 |
EP0155829B1 (en) | 1991-04-24 |
US4694432A (en) | 1987-09-15 |
JPH0348599B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1991-07-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8320 | Willingness to grant licences declared (paragraph 23) | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: PRUFER & PARTNER GBR, 81545 MUENCHEN |