DE3524379C2 - - Google Patents

Info

Publication number
DE3524379C2
DE3524379C2 DE3524379A DE3524379A DE3524379C2 DE 3524379 C2 DE3524379 C2 DE 3524379C2 DE 3524379 A DE3524379 A DE 3524379A DE 3524379 A DE3524379 A DE 3524379A DE 3524379 C2 DE3524379 C2 DE 3524379C2
Authority
DE
Germany
Prior art keywords
tubes
spectrometer according
ray spectrometer
ray
tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3524379A
Other languages
German (de)
English (en)
Other versions
DE3524379A1 (de
Inventor
Bruno 7500 Karlsruhe De Mook
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE19853524379 priority Critical patent/DE3524379A1/de
Publication of DE3524379A1 publication Critical patent/DE3524379A1/de
Application granted granted Critical
Publication of DE3524379C2 publication Critical patent/DE3524379C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/70—Circuit arrangements for X-ray tubes with more than one anode; Circuit arrangements for apparatus comprising more than one X ray tube or more than one cathode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE19853524379 1984-08-08 1985-07-08 Roentgenspektrometer Granted DE3524379A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19853524379 DE3524379A1 (de) 1984-08-08 1985-07-08 Roentgenspektrometer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3429230 1984-08-08
DE19853524379 DE3524379A1 (de) 1984-08-08 1985-07-08 Roentgenspektrometer

Publications (2)

Publication Number Publication Date
DE3524379A1 DE3524379A1 (de) 1986-02-20
DE3524379C2 true DE3524379C2 (enExample) 1991-07-18

Family

ID=25823699

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19853524379 Granted DE3524379A1 (de) 1984-08-08 1985-07-08 Roentgenspektrometer

Country Status (1)

Country Link
DE (1) DE3524379A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19737569A1 (de) * 1997-08-28 1998-02-26 Olaf Sommer Inst Fuer Festkoer Verfahren zur zerstörungsfreien Ermittlung der Tiefenverteilung von Partikeln in einer Matrix

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL9000203A (nl) * 1990-01-29 1991-08-16 Philips Nv Eindvenster roentgenbuis.
EP0554935A1 (en) * 1992-02-03 1993-08-11 Koninklijke Philips Electronics N.V. Combined X-ray spectrometer
DE9212265U1 (de) * 1992-09-11 1993-03-04 Siemens AG, 8000 München Röntgenspektrometer
EP0623817B1 (en) * 1993-04-23 1999-01-13 Shimadzu Corporation Local analysis of a specimen in an x-ray fluorescence spectrometer
GB9519771D0 (en) * 1995-09-28 1995-11-29 Oxford Analytical Instr Ltd X-ray fluorescence inspection apparatus and method
DE19536917C2 (de) * 1995-10-04 1999-07-22 Geesthacht Gkss Forschung Röntgenstrahlungsquelle

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE844031C (de) * 1944-08-01 1952-07-14 Koch & Sterzel Ag Roentgeneinrichtung mit zwei gegensinnig parallel an den Hochspannungstransformator angeschlossenen Roentgenroehren
US3114832A (en) * 1960-07-28 1963-12-17 Radiation Counter Lab Inc X-ray spectroscopic system comprising plural sources, filters, fluorescent radiators, and comparative detectors
US3418467A (en) * 1965-02-17 1968-12-24 Philips Corp Method of generating an x-ray beam composed of a plurality of wavelengths
DE7310929U (de) * 1973-03-23 1973-09-06 Hoesch Werke Ag Vorrichtung zur betrieblichen roentgenfluoreszenzanalyse
US4125771A (en) * 1977-11-18 1978-11-14 Net Systems Inc. Apparatus for determining stress in nickel and titanium alloyed materials

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19737569A1 (de) * 1997-08-28 1998-02-26 Olaf Sommer Inst Fuer Festkoer Verfahren zur zerstörungsfreien Ermittlung der Tiefenverteilung von Partikeln in einer Matrix

Also Published As

Publication number Publication date
DE3524379A1 (de) 1986-02-20

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8363 Opposition against the patent
8339 Ceased/non-payment of the annual fee