DE3519190C2 - Meßlichtprojektor für ein Spektralmeßgerät - Google Patents
Meßlichtprojektor für ein SpektralmeßgerätInfo
- Publication number
- DE3519190C2 DE3519190C2 DE19853519190 DE3519190A DE3519190C2 DE 3519190 C2 DE3519190 C2 DE 3519190C2 DE 19853519190 DE19853519190 DE 19853519190 DE 3519190 A DE3519190 A DE 3519190A DE 3519190 C2 DE3519190 C2 DE 3519190C2
- Authority
- DE
- Germany
- Prior art keywords
- lamp
- condenser
- concave mirror
- measuring
- light projector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003595 spectral effect Effects 0.000 title claims abstract description 18
- 229910052736 halogen Inorganic materials 0.000 claims abstract description 16
- 150000002367 halogens Chemical class 0.000 claims abstract description 15
- 230000003287 optical effect Effects 0.000 claims description 13
- 239000011521 glass Substances 0.000 claims description 5
- 230000003667 anti-reflective effect Effects 0.000 claims description 4
- 238000011144 upstream manufacturing Methods 0.000 claims description 2
- 230000007812 deficiency Effects 0.000 abstract 1
- 238000005286 illumination Methods 0.000 description 7
- 238000005259 measurement Methods 0.000 description 6
- 230000005855 radiation Effects 0.000 description 6
- 230000035945 sensitivity Effects 0.000 description 4
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 241001148599 Gorgonidium Species 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 239000006117 anti-reflective coating Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 230000005499 meniscus Effects 0.000 description 1
- 238000000386 microscopy Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000005375 photometry Methods 0.000 description 1
- 108091008695 photoreceptors Proteins 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000002798 spectrophotometry method Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
- G02B19/0028—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed refractive and reflective surfaces, e.g. non-imaging catadioptric systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19853519190 DE3519190C2 (de) | 1985-05-29 | 1985-05-29 | Meßlichtprojektor für ein Spektralmeßgerät |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19853519190 DE3519190C2 (de) | 1985-05-29 | 1985-05-29 | Meßlichtprojektor für ein Spektralmeßgerät |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3519190A1 DE3519190A1 (de) | 1986-12-04 |
| DE3519190C2 true DE3519190C2 (de) | 1987-03-12 |
Family
ID=6271881
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19853519190 Expired DE3519190C2 (de) | 1985-05-29 | 1985-05-29 | Meßlichtprojektor für ein Spektralmeßgerät |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE3519190C2 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19734059B4 (de) * | 1996-08-20 | 2007-01-11 | Ims-Ionen Mikrofabrikations Systeme Ges.M.B.H. | Anordnung für Schattenwurflithographie |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2606675C3 (de) * | 1976-02-19 | 1979-02-22 | Vladimir Dipl.-Ing. 5100 Aachen Blazek | Anordnung zur spektralanalytischen Untersuchung des Remissionsvermögens einer Probe |
-
1985
- 1985-05-29 DE DE19853519190 patent/DE3519190C2/de not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19734059B4 (de) * | 1996-08-20 | 2007-01-11 | Ims-Ionen Mikrofabrikations Systeme Ges.M.B.H. | Anordnung für Schattenwurflithographie |
Also Published As
| Publication number | Publication date |
|---|---|
| DE3519190A1 (de) | 1986-12-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |