DE3518626A1 - Pruefsonde zur kontrolle von leiterplatten - Google Patents

Pruefsonde zur kontrolle von leiterplatten

Info

Publication number
DE3518626A1
DE3518626A1 DE19853518626 DE3518626A DE3518626A1 DE 3518626 A1 DE3518626 A1 DE 3518626A1 DE 19853518626 DE19853518626 DE 19853518626 DE 3518626 A DE3518626 A DE 3518626A DE 3518626 A1 DE3518626 A1 DE 3518626A1
Authority
DE
Germany
Prior art keywords
test probe
needle
leg
guide part
needle bearing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19853518626
Other languages
German (de)
English (en)
Other versions
DE3518626C2 (enrdf_load_stackoverflow
Inventor
Gábor Dipl.-Ing. Budapest Kelety
Botond Dipl.-Ing. Kiss
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BHG Hiradastechnikai Vallalat
Original Assignee
BHG Hiradastechnikai Vallalat
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BHG Hiradastechnikai Vallalat filed Critical BHG Hiradastechnikai Vallalat
Publication of DE3518626A1 publication Critical patent/DE3518626A1/de
Application granted granted Critical
Publication of DE3518626C2 publication Critical patent/DE3518626C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/50—Fixed connections
    • H01R12/51—Fixed connections for rigid printed circuits or like structures
    • H01R12/55—Fixed connections for rigid printed circuits or like structures characterised by the terminals
    • H01R12/58—Fixed connections for rigid printed circuits or like structures characterised by the terminals terminals for insertion into holes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
DE19853518626 1984-11-29 1985-05-23 Pruefsonde zur kontrolle von leiterplatten Granted DE3518626A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HU844408A HU192083B (en) 1984-11-29 1984-11-29 Testing probe for testing printed wiring and printed circuit panels

Publications (2)

Publication Number Publication Date
DE3518626A1 true DE3518626A1 (de) 1986-05-28
DE3518626C2 DE3518626C2 (enrdf_load_stackoverflow) 1991-07-18

Family

ID=10967886

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19853518626 Granted DE3518626A1 (de) 1984-11-29 1985-05-23 Pruefsonde zur kontrolle von leiterplatten

Country Status (2)

Country Link
DE (1) DE3518626A1 (enrdf_load_stackoverflow)
HU (1) HU192083B (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2621701A1 (fr) * 1987-10-09 1989-04-14 Feinmetall Gmbh Dispositif de contact pour appareils d'essai
EP0508561A1 (en) * 1991-04-11 1992-10-14 METHODE ELECTRONICS, Inc. Apparatus for electronically testing printed circuit boards or the like
DE29519141U1 (de) * 1995-03-29 1996-08-14 atg test systems GmbH, 97877 Wertheim Nadel für einen Prüfadapter
CN106645830A (zh) * 2016-11-30 2017-05-10 青岛元启智能机器人科技有限公司 一种偏心头定位探针针板装置
CN109188033A (zh) * 2018-10-15 2019-01-11 东莞市盈之宝电子科技有限公司 一种新式探针
WO2022083925A1 (de) * 2020-10-21 2022-04-28 Leoni Bordnetz-Systeme Gmbh Elektroverbindung, isoliergehäuse für eine solche, verfahren und werkzeug für ein solches

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3434095A (en) * 1967-04-17 1969-03-18 Itt Programming switch
US3753103A (en) * 1971-11-17 1973-08-14 Crystal Protronics Ass Electrical circuit test probe having spring biased probe assembly
US3805006A (en) * 1972-10-13 1974-04-16 Gen Motors Corp Resilient electrical contact assembly
DE3136896A1 (de) * 1981-09-17 1983-04-14 Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz Vorrichtung zum pruefen einer elektronischen leiterplatte
US4463310A (en) * 1980-07-11 1984-07-31 Rca Corporation Apparatus for detecting the presence of components on a printed circuit board

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3434095A (en) * 1967-04-17 1969-03-18 Itt Programming switch
US3753103A (en) * 1971-11-17 1973-08-14 Crystal Protronics Ass Electrical circuit test probe having spring biased probe assembly
US3805006A (en) * 1972-10-13 1974-04-16 Gen Motors Corp Resilient electrical contact assembly
US4463310A (en) * 1980-07-11 1984-07-31 Rca Corporation Apparatus for detecting the presence of components on a printed circuit board
DE3136896A1 (de) * 1981-09-17 1983-04-14 Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz Vorrichtung zum pruefen einer elektronischen leiterplatte

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2621701A1 (fr) * 1987-10-09 1989-04-14 Feinmetall Gmbh Dispositif de contact pour appareils d'essai
EP0508561A1 (en) * 1991-04-11 1992-10-14 METHODE ELECTRONICS, Inc. Apparatus for electronically testing printed circuit boards or the like
DE29519141U1 (de) * 1995-03-29 1996-08-14 atg test systems GmbH, 97877 Wertheim Nadel für einen Prüfadapter
CN106645830A (zh) * 2016-11-30 2017-05-10 青岛元启智能机器人科技有限公司 一种偏心头定位探针针板装置
CN106645830B (zh) * 2016-11-30 2023-07-14 元启工业技术有限公司 一种偏心头定位探针针板装置
CN109188033A (zh) * 2018-10-15 2019-01-11 东莞市盈之宝电子科技有限公司 一种新式探针
WO2022083925A1 (de) * 2020-10-21 2022-04-28 Leoni Bordnetz-Systeme Gmbh Elektroverbindung, isoliergehäuse für eine solche, verfahren und werkzeug für ein solches

Also Published As

Publication number Publication date
HUT38731A (en) 1986-06-30
HU192083B (en) 1987-05-28
DE3518626C2 (enrdf_load_stackoverflow) 1991-07-18

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee