DE3426565C2 - - Google Patents

Info

Publication number
DE3426565C2
DE3426565C2 DE19843426565 DE3426565A DE3426565C2 DE 3426565 C2 DE3426565 C2 DE 3426565C2 DE 19843426565 DE19843426565 DE 19843426565 DE 3426565 A DE3426565 A DE 3426565A DE 3426565 C2 DE3426565 C2 DE 3426565C2
Authority
DE
Germany
Prior art keywords
tongue
line
lines
connection
fin2
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19843426565
Other languages
German (de)
English (en)
Other versions
DE3426565A1 (de
Inventor
Heinrich Dipl.-Ing. 7900 Ulm De Callsen
Wolfgang Dr.-Ing. 7913 Senden De Menzel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Airbus Defence and Space GmbH
Original Assignee
Deutsche Aerospace AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Deutsche Aerospace AG filed Critical Deutsche Aerospace AG
Priority to DE19843426565 priority Critical patent/DE3426565A1/de
Publication of DE3426565A1 publication Critical patent/DE3426565A1/de
Application granted granted Critical
Publication of DE3426565C2 publication Critical patent/DE3426565C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00—Auxiliary devices
    • H01P1/04—Fixed joints
    • H01P1/047—Strip line joints

Landscapes

  • Waveguides (AREA)
DE19843426565 1984-07-19 1984-07-19 Kontaktfreie verbindung fuer planare leitungen Granted DE3426565A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19843426565 DE3426565A1 (de) 1984-07-19 1984-07-19 Kontaktfreie verbindung fuer planare leitungen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19843426565 DE3426565A1 (de) 1984-07-19 1984-07-19 Kontaktfreie verbindung fuer planare leitungen

Publications (2)

Publication Number Publication Date
DE3426565A1 DE3426565A1 (de) 1986-01-23
DE3426565C2 true DE3426565C2 (en, 2012) 1993-07-22

Family

ID=6241007

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19843426565 Granted DE3426565A1 (de) 1984-07-19 1984-07-19 Kontaktfreie verbindung fuer planare leitungen

Country Status (1)

Country Link
DE (1) DE3426565A1 (en, 2012)

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7161363B2 (en) 2002-05-23 2007-01-09 Cascade Microtech, Inc. Probe for testing a device under test
US7233160B2 (en) 2000-12-04 2007-06-19 Cascade Microtech, Inc. Wafer probe
US7285969B2 (en) 2002-11-13 2007-10-23 Cascade Microtech, Inc. Probe for combined signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4891612A (en) * 1988-11-04 1990-01-02 Cascade Microtech, Inc. Overlap interfaces between coplanar transmission lines which are tolerant to transverse and longitudinal misalignment
DE19757892A1 (de) * 1997-12-24 1999-07-01 Bosch Gmbh Robert Anordnung zur frequenzselektiven Unterdrückung von Hochfrequenzsignalen
JP3735510B2 (ja) * 2000-04-18 2006-01-18 株式会社村田製作所 伝送線路接続構造、高周波モジュールおよび通信装置
WO2003081795A2 (en) * 2002-03-18 2003-10-02 Ems Technologies, Inc. Passive intermodulation interference control circuits
DE102008042449A1 (de) 2008-09-29 2010-04-01 Robert Bosch Gmbh Radarsensor mit abgeschirmtem Signalstabilisator
NL2024052B1 (en) * 2019-10-18 2021-06-22 Delft Circuits B V Flexible transmission line for communication with cryogenic circuits

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3771075A (en) * 1971-05-25 1973-11-06 Harris Intertype Corp Microstrip to microstrip transition
DE3133362C2 (de) * 1981-08-22 1983-12-01 Dornier System Gmbh, 7990 Friedrichshafen Choke-Flanschverbindung für Rechteck-Hohlleiter

Cited By (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7761983B2 (en) 2000-12-04 2010-07-27 Cascade Microtech, Inc. Method of assembling a wafer probe
US7233160B2 (en) 2000-12-04 2007-06-19 Cascade Microtech, Inc. Wafer probe
US7688097B2 (en) 2000-12-04 2010-03-30 Cascade Microtech, Inc. Wafer probe
US7495461B2 (en) 2000-12-04 2009-02-24 Cascade Microtech, Inc. Wafer probe
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7436194B2 (en) 2002-05-23 2008-10-14 Cascade Microtech, Inc. Shielded probe with low contact resistance for testing a device under test
US7161363B2 (en) 2002-05-23 2007-01-09 Cascade Microtech, Inc. Probe for testing a device under test
US7482823B2 (en) 2002-05-23 2009-01-27 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7489149B2 (en) 2002-05-23 2009-02-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7518387B2 (en) 2002-05-23 2009-04-14 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7285969B2 (en) 2002-11-13 2007-10-23 Cascade Microtech, Inc. Probe for combined signals
US7453276B2 (en) 2002-11-13 2008-11-18 Cascade Microtech, Inc. Probe for combined signals
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7898273B2 (en) 2003-05-23 2011-03-01 Cascade Microtech, Inc. Probe for testing a device under test
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7501842B2 (en) 2003-05-23 2009-03-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7759953B2 (en) 2003-12-24 2010-07-20 Cascade Microtech, Inc. Active wafer probe
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US8013623B2 (en) 2004-09-13 2011-09-06 Cascade Microtech, Inc. Double sided probing structures
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7940069B2 (en) 2005-01-31 2011-05-10 Cascade Microtech, Inc. System for testing semiconductors
US7898281B2 (en) 2005-01-31 2011-03-01 Cascade Mircotech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7750652B2 (en) 2006-06-12 2010-07-06 Cascade Microtech, Inc. Test structure and probe for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe

Also Published As

Publication number Publication date
DE3426565A1 (de) 1986-01-23

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Legal Events

Date Code Title Description
8127 New person/name/address of the applicant

Owner name: TELEFUNKEN SYSTEMTECHNIK GMBH, 7900 ULM, DE

8110 Request for examination paragraph 44
8120 Willingness to grant licenses paragraph 23
8127 New person/name/address of the applicant

Owner name: DEUTSCHE AEROSPACE AG, 8000 MUENCHEN, DE

D2 Grant after examination
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: DAIMLER-BENZ AEROSPACE AKTIENGESELLSCHAFT, 80804 M

8339 Ceased/non-payment of the annual fee