DE3426420A1 - Geraet zum messen von durchschnittsfrequenzen - Google Patents

Geraet zum messen von durchschnittsfrequenzen

Info

Publication number
DE3426420A1
DE3426420A1 DE3426420A DE3426420A DE3426420A1 DE 3426420 A1 DE3426420 A1 DE 3426420A1 DE 3426420 A DE3426420 A DE 3426420A DE 3426420 A DE3426420 A DE 3426420A DE 3426420 A1 DE3426420 A1 DE 3426420A1
Authority
DE
Germany
Prior art keywords
counter
signal
gate
value
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE3426420A
Other languages
German (de)
English (en)
Other versions
DE3426420C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Yohei Gyoda Saitama Hirakoso
Shoji Saitama Niki
Toshiro Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Takeda Riken Industries Co Ltd filed Critical Takeda Riken Industries Co Ltd
Publication of DE3426420A1 publication Critical patent/DE3426420A1/de
Application granted granted Critical
Publication of DE3426420C2 publication Critical patent/DE3426420C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
DE3426420A 1983-07-18 1984-07-18 Geraet zum messen von durchschnittsfrequenzen Granted DE3426420A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58131345A JPS6022672A (ja) 1983-07-18 1983-07-18 平均周波数測定装置

Publications (2)

Publication Number Publication Date
DE3426420A1 true DE3426420A1 (de) 1985-02-07
DE3426420C2 DE3426420C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-11-08

Family

ID=15055763

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3426420A Granted DE3426420A1 (de) 1983-07-18 1984-07-18 Geraet zum messen von durchschnittsfrequenzen

Country Status (3)

Country Link
US (1) US4680540A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS6022672A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE3426420A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62277203A (ja) * 1986-05-23 1987-12-02 Kyocera Corp 酸化アルミニウム質切削工具
CA1274876A (en) * 1986-10-15 1990-10-02 Myles Mcmillan Apparatus for measuring the frequency of microwave signals
JPS63226115A (ja) * 1987-03-16 1988-09-20 Fujitsu Ltd ゼロクロスカウンタ
US4779044A (en) * 1987-09-08 1988-10-18 Zion Educational Foundation Voltage, current and frequency measuring of non-standard waveforms
US4996474A (en) * 1989-07-31 1991-02-26 Hewlett-Packard Company Digital gate generation for a signal measurement instrument
US5319569A (en) * 1989-09-19 1994-06-07 Hewlett-Packard Company Block averaging of time varying signal attribute measurements
WO1992021984A1 (en) * 1991-05-27 1992-12-10 Advantest Corporation Apparatus for measuring average value of impulsive signal
US5748670A (en) * 1995-05-25 1998-05-05 Zilog, Inc. Method of demodulating chirp spread spectrum
WO2004025836A1 (de) * 2002-08-26 2004-03-25 Infineon Technologies Ag Verfahren und vorrichtung zum erfassen von periodendauerschwankungen periodischer signale
US8330497B1 (en) 2010-10-04 2012-12-11 Adtran, Inc. Frequency monitoring systems and methods
CN118330312B (zh) * 2024-06-13 2024-08-20 东方电子股份有限公司 一种fpga晶振频率测量方法及系统

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57192876A (en) * 1981-05-22 1982-11-27 Advantest Corp Measuring device for average frequency
DE3219283A1 (de) * 1981-05-22 1982-12-23 Takeda Riken Kogyo K.K., Tokyo Durchschnittsfrequenz-messgeraet

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3909715A (en) * 1973-10-10 1975-09-30 Mitsubishi Electric Corp Counting-rate meter
US4051433A (en) * 1975-09-11 1977-09-27 California Institute Of Technology Signal responsive burst period timer and counter for laser doppler velocimetry and the like
DE2914072C2 (de) * 1979-04-07 1985-06-20 Kernforschungsanlage Jülich GmbH, 5170 Jülich Schaltungsanordnung zur Ermittlung der Periodendauer und/oder davon abgeleiteten Größen eines im wesentlichen periodischen Signals
US4424482A (en) * 1981-09-14 1984-01-03 Eaton Corporation Adaptive bandwidth signal encoder
US4609990A (en) * 1984-08-06 1986-09-02 General Electric Company Frequency measurement system

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57192876A (en) * 1981-05-22 1982-11-27 Advantest Corp Measuring device for average frequency
DE3219283A1 (de) * 1981-05-22 1982-12-23 Takeda Riken Kogyo K.K., Tokyo Durchschnittsfrequenz-messgeraet
US4468614A (en) * 1981-05-22 1984-08-28 Takeda Riken Kogyo Kabushiki Kaisha Average frequency measuring apparatus

Also Published As

Publication number Publication date
JPS6022672A (ja) 1985-02-05
DE3426420C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-11-08
US4680540A (en) 1987-07-14
JPS6356503B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-11-08

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee