DE3406958C2 - - Google Patents

Info

Publication number
DE3406958C2
DE3406958C2 DE19843406958 DE3406958A DE3406958C2 DE 3406958 C2 DE3406958 C2 DE 3406958C2 DE 19843406958 DE19843406958 DE 19843406958 DE 3406958 A DE3406958 A DE 3406958A DE 3406958 C2 DE3406958 C2 DE 3406958C2
Authority
DE
Germany
Prior art keywords
logic
current
circuit
transistor
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE19843406958
Other languages
German (de)
English (en)
Other versions
DE3406958A1 (de
Inventor
Karl-Diether 7101 Oedheim De Nutz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Atmel Germany GmbH
Original Assignee
Telefunken Electronic GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Telefunken Electronic GmbH filed Critical Telefunken Electronic GmbH
Priority to DE19843406958 priority Critical patent/DE3406958A1/de
Publication of DE3406958A1 publication Critical patent/DE3406958A1/de
Application granted granted Critical
Publication of DE3406958C2 publication Critical patent/DE3406958C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175—Coupling arrangements; Interface arrangements
    • H03K19/018—Coupling arrangements; Interface arrangements using bipolar transistors only
    • H03K19/01806—Interface arrangements
    • H03K19/01818—Interface arrangements for integrated injection logic (I2L)

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • General Physics & Mathematics (AREA)
  • Computing Systems (AREA)
  • Mathematical Physics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE19843406958 1984-02-25 1984-02-25 Integrierte schaltungsanordnung Granted DE3406958A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19843406958 DE3406958A1 (de) 1984-02-25 1984-02-25 Integrierte schaltungsanordnung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19843406958 DE3406958A1 (de) 1984-02-25 1984-02-25 Integrierte schaltungsanordnung

Publications (2)

Publication Number Publication Date
DE3406958A1 DE3406958A1 (de) 1985-09-12
DE3406958C2 true DE3406958C2 (enrdf_load_stackoverflow) 1991-02-28

Family

ID=6228874

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19843406958 Granted DE3406958A1 (de) 1984-02-25 1984-02-25 Integrierte schaltungsanordnung

Country Status (1)

Country Link
DE (1) DE3406958A1 (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0972207B1 (en) 1998-02-05 2009-08-26 Nxp B.V. Connection test method

Also Published As

Publication number Publication date
DE3406958A1 (de) 1985-09-12

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Legal Events

Date Code Title Description
OM8 Search report available as to paragraph 43 lit. 1 sentence 1 patent law
OP8 Request for examination as to paragraph 44 patent law
8120 Willingness to grant licenses paragraph 23
D2 Grant after examination
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: TEMIC TELEFUNKEN MICROELECTRONIC GMBH, 74072 HEILB

8327 Change in the person/name/address of the patent owner

Owner name: TEMIC SEMICONDUCTOR GMBH, 74072 HEILBRONN, DE

8339 Ceased/non-payment of the annual fee