DE3406958A1 - Integrierte schaltungsanordnung - Google Patents
Integrierte schaltungsanordnungInfo
- Publication number
- DE3406958A1 DE3406958A1 DE19843406958 DE3406958A DE3406958A1 DE 3406958 A1 DE3406958 A1 DE 3406958A1 DE 19843406958 DE19843406958 DE 19843406958 DE 3406958 A DE3406958 A DE 3406958A DE 3406958 A1 DE3406958 A1 DE 3406958A1
- Authority
- DE
- Germany
- Prior art keywords
- logic
- current
- integrated circuit
- circuit arrangement
- stage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
- H03K19/018—Coupling arrangements; Interface arrangements using bipolar transistors only
- H03K19/01806—Interface arrangements
- H03K19/01818—Interface arrangements for integrated injection logic (I2L)
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- General Physics & Mathematics (AREA)
- Computing Systems (AREA)
- Mathematical Physics (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19843406958 DE3406958A1 (de) | 1984-02-25 | 1984-02-25 | Integrierte schaltungsanordnung |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19843406958 DE3406958A1 (de) | 1984-02-25 | 1984-02-25 | Integrierte schaltungsanordnung |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3406958A1 true DE3406958A1 (de) | 1985-09-12 |
| DE3406958C2 DE3406958C2 (enrdf_load_stackoverflow) | 1991-02-28 |
Family
ID=6228874
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19843406958 Granted DE3406958A1 (de) | 1984-02-25 | 1984-02-25 | Integrierte schaltungsanordnung |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE3406958A1 (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1999040448A1 (en) | 1998-02-05 | 1999-08-12 | Koninklijke Philips Electronics N.V. | Connection test method |
-
1984
- 1984-02-25 DE DE19843406958 patent/DE3406958A1/de active Granted
Non-Patent Citations (1)
| Title |
|---|
| US-Z.: IEEE Journal of Solid State Circuits, Vol. SC-10, No.5, October 1975, S.348-352 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1999040448A1 (en) | 1998-02-05 | 1999-08-12 | Koninklijke Philips Electronics N.V. | Connection test method |
Also Published As
| Publication number | Publication date |
|---|---|
| DE3406958C2 (enrdf_load_stackoverflow) | 1991-02-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE3888863T2 (de) | BIFET-Logik-Schaltung. | |
| DE69016947T2 (de) | Auf einem Substrat integriertes Prüfsystem und Verfahren zur Nutzung dieses Prüfsystems. | |
| DE60019255T2 (de) | Verfahren und Vorrichtung zur Trimmung von elektronischen Schaltungen | |
| DE1762172C3 (de) | Verknüpfungsschaltung mit Stromübernahmeschaltern | |
| DE4017617C2 (de) | Spannungserzeugungsschaltung mit geringer Leistungsaufnahme und stabiler Ausgangsspannung bei kleiner Schaltkreisfläche | |
| DE68925856T2 (de) | Logische Bicmos-Schaltung | |
| DE69814558T2 (de) | Verstärker mit hohem Verstärkungsgrad und begrenzter Ausgangsdynamik | |
| DE69026468T2 (de) | Anpassungsfähige Gate-Entladeschaltung für Leistungs-Fets | |
| DE69025278T2 (de) | Stromdetektionsschaltung für MOS-Leistungstransistor | |
| DE3042323C2 (de) | Schwingkreis | |
| DE19749521C2 (de) | Bistabile Kippstufe | |
| DE2951166C2 (enrdf_load_stackoverflow) | ||
| EP0965169A1 (de) | Strombegrenzungsschaltung | |
| DE10050294A1 (de) | PLL-Schaltung | |
| DE2647569C3 (de) | Impulsgenerator mit umschaltbarer Ausgangsfrequenz | |
| DE3406958A1 (de) | Integrierte schaltungsanordnung | |
| DE2524044A1 (de) | Universelles verknuepfungsglied fuer den subnanosekundenbereich | |
| DE19527384C2 (de) | Schaltungsanordnung zur Analogsignalverarbeitung | |
| DE2805217C3 (de) | Monolithisch integrierte I2 L-Schaltung fur ein Zweiphasen-Schieberegister | |
| DE10038905C2 (de) | Verfahren zur Erhöhung der Grenzfrequenz bei Flip-Flops | |
| DE19827878A1 (de) | Spannungsversorgungsschaltung sowie Spannungsmeßschaltung eines Brennstoffzellenverbundsystem | |
| DE69506920T2 (de) | Störungsunempfindliche Anordnung für Vorspannungsstromerzeugung | |
| DE2626928C2 (de) | Logisch gesteuerte Verriegelungsschaltung | |
| DE3042058C2 (de) | Integrierte Frequenzteilerschaltung | |
| DE3236728C2 (de) | Schaltungsanordnung zum Abtasten und Speichern des Momentanwerts einer veränderlichen Eingangsspannung |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OM8 | Search report available as to paragraph 43 lit. 1 sentence 1 patent law | ||
| OP8 | Request for examination as to paragraph 44 patent law | ||
| 8120 | Willingness to grant licences paragraph 23 | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: TEMIC TELEFUNKEN MICROELECTRONIC GMBH, 74072 HEILB |
|
| 8327 | Change in the person/name/address of the patent owner |
Owner name: TEMIC SEMICONDUCTOR GMBH, 74072 HEILBRONN, DE |
|
| 8339 | Ceased/non-payment of the annual fee |