|
JPS5279448A
(en)
*
|
1975-12-25 |
1977-07-04 |
Toyota Motor Corp |
Fixing device for tiltable handwheel
|
|
JPS5989407A
(ja)
*
|
1982-11-15 |
1984-05-23 |
Mitsui Toatsu Chem Inc |
アモルフアスシリコン膜の形成方法
|
|
JPS59147435A
(ja)
*
|
1983-02-10 |
1984-08-23 |
Mitsui Toatsu Chem Inc |
酸化シリコン膜の形成法
|
|
JPS59147437A
(ja)
*
|
1983-02-10 |
1984-08-23 |
Mitsui Toatsu Chem Inc |
窒化シリコン膜の形成法
|
|
JPS59215732A
(ja)
*
|
1983-05-24 |
1984-12-05 |
Semiconductor Energy Lab Co Ltd |
窒化珪素被膜作製方法
|
|
JPS6026664A
(ja)
*
|
1983-07-22 |
1985-02-09 |
Canon Inc |
アモルフアスシリコン堆積膜形成法
|
|
JPS6094757A
(ja)
*
|
1983-10-20 |
1985-05-27 |
Fujitsu Ltd |
抵抗体
|
|
US4544423A
(en)
*
|
1984-02-10 |
1985-10-01 |
Kanegafuchi Kagaku Kogyo Kabushiki Kaisha |
Amorphous silicon semiconductor and process for same
|
|
US6784033B1
(en)
*
|
1984-02-15 |
2004-08-31 |
Semiconductor Energy Laboratory Co., Ltd. |
Method for the manufacture of an insulated gate field effect semiconductor device
|
|
JPS61140175A
(ja)
*
|
1984-12-13 |
1986-06-27 |
Semiconductor Energy Lab Co Ltd |
被膜作製方法
|
|
US4704300A
(en)
*
|
1984-03-12 |
1987-11-03 |
Semiconductor Energy Laboratory Co., Ltd. |
Method for producing silicon nitride layer
|
|
US4717602A
(en)
*
|
1984-03-12 |
1988-01-05 |
Semiconductor Energy Laboratory Co., Ltd. |
Method for producing silicon nitride layers
|
|
US4782040A
(en)
*
|
1984-04-09 |
1988-11-01 |
Dow Corning Corporation |
Porous materials having a dual surface
|
|
US4683146A
(en)
*
|
1984-04-16 |
1987-07-28 |
Canon Kabushiki Kaisha |
Process for producing deposition films
|
|
US4683147A
(en)
*
|
1984-04-16 |
1987-07-28 |
Canon Kabushiki Kaisha |
Method of forming deposition film
|
|
US4683144A
(en)
*
|
1984-04-16 |
1987-07-28 |
Canon Kabushiki Kaisha |
Method for forming a deposited film
|
|
US4595601A
(en)
*
|
1984-05-25 |
1986-06-17 |
Kabushiki Kaisha Toshiba |
Method of selectively forming an insulation layer
|
|
JPS6123344A
(ja)
*
|
1984-07-11 |
1986-01-31 |
Hitachi Ltd |
半導体集積回路の製造方法
|
|
JPS6165441A
(ja)
*
|
1984-09-07 |
1986-04-04 |
Mitsubishi Electric Corp |
プラズマ窒化シリコン絶縁膜の処理方法
|
|
US4702936A
(en)
*
|
1984-09-20 |
1987-10-27 |
Applied Materials Japan, Inc. |
Gas-phase growth process
|
|
US4811684A
(en)
*
|
1984-11-26 |
1989-03-14 |
Semiconductor Energy Laboratory Co., Ltd. |
Photo CVD apparatus, with deposition prevention in light source chamber
|
|
US6786997B1
(en)
|
1984-11-26 |
2004-09-07 |
Semiconductor Energy Laboratory Co., Ltd. |
Plasma processing apparatus
|
|
JPH0752718B2
(ja)
*
|
1984-11-26 |
1995-06-05 |
株式会社半導体エネルギー研究所 |
薄膜形成方法
|
|
US4699801A
(en)
*
|
1985-02-28 |
1987-10-13 |
Kabuskiki Kaisha Toshiba |
Semiconductor device
|
|
DE3610401A1
(de)
*
|
1985-03-28 |
1987-02-12 |
Sumitomo Electric Industries |
Halbleiterelement und verfahren zu dessen herstellung und gegenstand, in dem dieses element verwendet wird
|
|
JPS61234533A
(ja)
*
|
1985-04-11 |
1986-10-18 |
Semiconductor Energy Lab Co Ltd |
窒化珪素被膜作成方法
|
|
JPS61234534A
(ja)
*
|
1985-04-11 |
1986-10-18 |
Semiconductor Energy Lab Co Ltd |
窒化珪素被膜作成方法
|
|
US4569855A
(en)
*
|
1985-04-11 |
1986-02-11 |
Canon Kabushiki Kaisha |
Method of forming deposition film
|
|
US4759993A
(en)
*
|
1985-04-25 |
1988-07-26 |
Ovonic Synthetic Materials Co., Inc. |
Plasma chemical vapor deposition SiO2-x coated articles and plasma assisted chemical vapor deposition method of applying the coating
|
|
JPS61253870A
(ja)
*
|
1985-05-07 |
1986-11-11 |
Hitachi Ltd |
光起電力素子
|
|
JPS61256735A
(ja)
*
|
1985-05-10 |
1986-11-14 |
Nec Corp |
半導体装置及びその製造方法
|
|
US4661679A
(en)
*
|
1985-06-28 |
1987-04-28 |
Eaton Corporation |
Semiconductor laser processing with mirror mask
|
|
EP0227839B1
(en)
*
|
1985-07-02 |
1991-05-15 |
Semiconductor Energy Laboratory Co., Ltd. |
Method of forming a thin film
|
|
US4631199A
(en)
*
|
1985-07-22 |
1986-12-23 |
Hughes Aircraft Company |
Photochemical vapor deposition process for depositing oxide layers
|
|
JPS62226631A
(ja)
*
|
1986-03-28 |
1987-10-05 |
Agency Of Ind Science & Technol |
絶縁膜形成方法
|
|
US4918028A
(en)
*
|
1986-04-14 |
1990-04-17 |
Canon Kabushiki Kaisha |
Process for photo-assisted epitaxial growth using remote plasma with in-situ etching
|
|
JPS62293740A
(ja)
*
|
1986-06-13 |
1987-12-21 |
Fujitsu Ltd |
半導体装置の製造方法
|
|
US4681640A
(en)
*
|
1986-08-06 |
1987-07-21 |
The United States Of America As Represented By The Secretary Of The Army |
Laser-induced chemical vapor deposition of germanium and doped-germanium films
|
|
US4720395A
(en)
*
|
1986-08-25 |
1988-01-19 |
Anicon, Inc. |
Low temperature silicon nitride CVD process
|
|
KR910003742B1
(ko)
|
1986-09-09 |
1991-06-10 |
세미콘덕터 에너지 라보라터리 캄파니 리미티드 |
Cvd장치
|
|
US4753856A
(en)
*
|
1987-01-02 |
1988-06-28 |
Dow Corning Corporation |
Multilayer ceramic coatings from silicate esters and metal oxides
|
|
DE3876205T2
(de)
*
|
1987-09-30 |
1993-05-27 |
Sumitomo Metal Ind |
Vorrichtung zur bildung duenner filme.
|
|
US4843030A
(en)
*
|
1987-11-30 |
1989-06-27 |
Eaton Corporation |
Semiconductor processing by a combination of photolytic, pyrolytic and catalytic processes
|
|
US5185179A
(en)
*
|
1988-10-11 |
1993-02-09 |
Semiconductor Energy Laboratory Co., Ltd. |
Plasma processing method and products thereof
|
|
US4940505A
(en)
*
|
1988-12-02 |
1990-07-10 |
Eaton Corporation |
Method for growing single crystalline silicon with intermediate bonding agent and combined thermal and photolytic activation
|
|
DE3919538A1
(de)
*
|
1989-06-15 |
1990-12-20 |
Asea Brown Boveri |
Beschichtungsvorrichtung
|
|
GB2250751B
(en)
*
|
1990-08-24 |
1995-04-12 |
Kawasaki Heavy Ind Ltd |
Process for the production of dielectric thin films
|
|
JP3038413B2
(ja)
*
|
1990-12-21 |
2000-05-08 |
大阪瓦斯株式会社 |
光cvd法による膜作成装置
|
|
JPH06333857A
(ja)
*
|
1993-05-27 |
1994-12-02 |
Semiconductor Energy Lab Co Ltd |
成膜装置および成膜方法
|
|
WO1996009900A1
(en)
*
|
1994-09-28 |
1996-04-04 |
Midwest Research Institute |
Application of optical processing for growth of silicon dioxide
|
|
US5686320A
(en)
*
|
1995-01-20 |
1997-11-11 |
Goldstar Co., Ltd. |
Method for forming semiconductor layer of thin film transistor by using temperature difference
|
|
US5728224A
(en)
*
|
1995-09-13 |
1998-03-17 |
Tetra Laval Holdings & Finance S.A. |
Apparatus and method for manufacturing a packaging material using gaseous phase atmospheric photo chemical vapor deposition to apply a barrier layer to a moving web substrate
|
|
WO1997015402A1
(en)
*
|
1995-10-24 |
1997-05-01 |
Tetra Laval Holdings & Finance S.A. |
Apparatus and method for manufacturing a packaging material
|
|
US5976993A
(en)
|
1996-03-28 |
1999-11-02 |
Applied Materials, Inc. |
Method for reducing the intrinsic stress of high density plasma films
|
|
KR19990030660A
(ko)
*
|
1997-10-02 |
1999-05-06 |
윤종용 |
전자빔을 이용한 반도체장치의 층간 절연막 형성방법
|
|
US6628237B1
(en)
*
|
2000-03-25 |
2003-09-30 |
Marconi Communications Inc. |
Remote communication using slot antenna
|
|
JP2002198368A
(ja)
*
|
2000-12-26 |
2002-07-12 |
Nec Corp |
半導体装置の製造方法
|
|
KR101050377B1
(ko)
|
2001-02-12 |
2011-07-20 |
에이에스엠 아메리카, 인코포레이티드 |
반도체 박막 증착을 위한 개선된 공정
|
|
US7026219B2
(en)
|
2001-02-12 |
2006-04-11 |
Asm America, Inc. |
Integration of high k gate dielectric
|
|
US6815007B1
(en)
|
2002-03-04 |
2004-11-09 |
Taiwan Semiconductor Manufacturing Company |
Method to solve IMD-FSG particle and increase Cp yield by using a new tougher UFUN season film
|
|
US7294582B2
(en)
*
|
2002-07-19 |
2007-11-13 |
Asm International, N.V. |
Low temperature silicon compound deposition
|
|
JP5005170B2
(ja)
*
|
2002-07-19 |
2012-08-22 |
エーエスエム アメリカ インコーポレイテッド |
超高品質シリコン含有化合物層の形成方法
|
|
US7186630B2
(en)
|
2002-08-14 |
2007-03-06 |
Asm America, Inc. |
Deposition of amorphous silicon-containing films
|
|
US7092287B2
(en)
*
|
2002-12-18 |
2006-08-15 |
Asm International N.V. |
Method of fabricating silicon nitride nanodots
|
|
US20040259379A1
(en)
*
|
2003-06-23 |
2004-12-23 |
Yoshi Ono |
Low temperature nitridation of silicon
|
|
US7629270B2
(en)
*
|
2004-08-27 |
2009-12-08 |
Asm America, Inc. |
Remote plasma activated nitridation
|
|
US7253084B2
(en)
*
|
2004-09-03 |
2007-08-07 |
Asm America, Inc. |
Deposition from liquid sources
|
|
US7966969B2
(en)
*
|
2004-09-22 |
2011-06-28 |
Asm International N.V. |
Deposition of TiN films in a batch reactor
|
|
US7674726B2
(en)
*
|
2004-10-15 |
2010-03-09 |
Asm International N.V. |
Parts for deposition reactors
|
|
US7427571B2
(en)
*
|
2004-10-15 |
2008-09-23 |
Asm International, N.V. |
Reactor design for reduced particulate generation
|
|
US7629267B2
(en)
*
|
2005-03-07 |
2009-12-08 |
Asm International N.V. |
High stress nitride film and method for formation thereof
|
|
US20070054048A1
(en)
*
|
2005-09-07 |
2007-03-08 |
Suvi Haukka |
Extended deposition range by hot spots
|
|
US7718518B2
(en)
*
|
2005-12-16 |
2010-05-18 |
Asm International N.V. |
Low temperature doped silicon layer formation
|
|
US7553516B2
(en)
*
|
2005-12-16 |
2009-06-30 |
Asm International N.V. |
System and method of reducing particle contamination of semiconductor substrates
|
|
US7691757B2
(en)
|
2006-06-22 |
2010-04-06 |
Asm International N.V. |
Deposition of complex nitride films
|
|
DE102006032936B4
(de)
*
|
2006-07-17 |
2012-01-05 |
Wolf Gmbh |
Verwendung einer Schicht aus stark oxidierten Si-Nanokristallen zur Beschichtung von Kunststoffen
|
|
US7629256B2
(en)
*
|
2007-05-14 |
2009-12-08 |
Asm International N.V. |
In situ silicon and titanium nitride deposition
|
|
US7851307B2
(en)
*
|
2007-08-17 |
2010-12-14 |
Micron Technology, Inc. |
Method of forming complex oxide nanodots for a charge trap
|
|
US8012876B2
(en)
*
|
2008-12-02 |
2011-09-06 |
Asm International N.V. |
Delivery of vapor precursor from solid source
|
|
US7833906B2
(en)
|
2008-12-11 |
2010-11-16 |
Asm International N.V. |
Titanium silicon nitride deposition
|
|
DE102009040785A1
(de)
*
|
2009-09-09 |
2011-03-10 |
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. |
Substrat aus einer Aluminium-Silizium-Legierung oder kristallinem Silizium, Metallspiegel, Verfahren zu dessen Herstellung sowie dessen Verwendung
|
|
WO2015069296A1
(en)
*
|
2013-11-11 |
2015-05-14 |
Empire Technology Development Llc |
Strengthened glass substrates
|