DE3364979D1 - Process for forming thin film - Google Patents

Process for forming thin film

Info

Publication number
DE3364979D1
DE3364979D1 DE8383109690T DE3364979T DE3364979D1 DE 3364979 D1 DE3364979 D1 DE 3364979D1 DE 8383109690 T DE8383109690 T DE 8383109690T DE 3364979 T DE3364979 T DE 3364979T DE 3364979 D1 DE3364979 D1 DE 3364979D1
Authority
DE
Germany
Prior art keywords
thin film
forming thin
forming
film
thin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383109690T
Other languages
German (de)
English (en)
Inventor
Kazufumi Azuma
Mitsuo Nakatani
Kazuo Nate
Masaaki Okunaka
Hitoshi Yokono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DE3364979D1 publication Critical patent/DE3364979D1/de
Expired legal-status Critical Current

Links

Classifications

    • H10P14/69215
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/24Deposition of silicon only
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/34Nitrides
    • C23C16/345Silicon nitride
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40Oxides
    • C23C16/401Oxides containing silicon
    • C23C16/402Silicon dioxide
    • H10P14/24
    • H10P14/2905
    • H10P14/2922
    • H10P14/2923
    • H10P14/3411
    • H10P14/69433
    • H10P34/42
    • H10P34/422
    • H10P14/6338
    • H10P14/6682
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/093Laser beam treatment in general

Landscapes

  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
  • Formation Of Insulating Films (AREA)
  • Photovoltaic Devices (AREA)
DE8383109690T 1982-09-29 1983-09-28 Process for forming thin film Expired DE3364979D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57168463A JPS5958819A (ja) 1982-09-29 1982-09-29 薄膜形成方法

Publications (1)

Publication Number Publication Date
DE3364979D1 true DE3364979D1 (en) 1986-09-04

Family

ID=15868574

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383109690T Expired DE3364979D1 (en) 1982-09-29 1983-09-28 Process for forming thin film

Country Status (4)

Country Link
US (1) US4495218A (cg-RX-API-DMAC10.html)
EP (1) EP0104658B1 (cg-RX-API-DMAC10.html)
JP (1) JPS5958819A (cg-RX-API-DMAC10.html)
DE (1) DE3364979D1 (cg-RX-API-DMAC10.html)

Families Citing this family (82)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5279448A (en) * 1975-12-25 1977-07-04 Toyota Motor Corp Fixing device for tiltable handwheel
JPS5989407A (ja) * 1982-11-15 1984-05-23 Mitsui Toatsu Chem Inc アモルフアスシリコン膜の形成方法
JPS59147435A (ja) * 1983-02-10 1984-08-23 Mitsui Toatsu Chem Inc 酸化シリコン膜の形成法
JPS59147437A (ja) * 1983-02-10 1984-08-23 Mitsui Toatsu Chem Inc 窒化シリコン膜の形成法
JPS59215732A (ja) * 1983-05-24 1984-12-05 Semiconductor Energy Lab Co Ltd 窒化珪素被膜作製方法
JPS6026664A (ja) * 1983-07-22 1985-02-09 Canon Inc アモルフアスシリコン堆積膜形成法
JPS6094757A (ja) * 1983-10-20 1985-05-27 Fujitsu Ltd 抵抗体
US4544423A (en) * 1984-02-10 1985-10-01 Kanegafuchi Kagaku Kogyo Kabushiki Kaisha Amorphous silicon semiconductor and process for same
US6784033B1 (en) * 1984-02-15 2004-08-31 Semiconductor Energy Laboratory Co., Ltd. Method for the manufacture of an insulated gate field effect semiconductor device
JPS61140175A (ja) * 1984-12-13 1986-06-27 Semiconductor Energy Lab Co Ltd 被膜作製方法
US4704300A (en) * 1984-03-12 1987-11-03 Semiconductor Energy Laboratory Co., Ltd. Method for producing silicon nitride layer
US4717602A (en) * 1984-03-12 1988-01-05 Semiconductor Energy Laboratory Co., Ltd. Method for producing silicon nitride layers
US4782040A (en) * 1984-04-09 1988-11-01 Dow Corning Corporation Porous materials having a dual surface
US4683146A (en) * 1984-04-16 1987-07-28 Canon Kabushiki Kaisha Process for producing deposition films
US4683147A (en) * 1984-04-16 1987-07-28 Canon Kabushiki Kaisha Method of forming deposition film
US4683144A (en) * 1984-04-16 1987-07-28 Canon Kabushiki Kaisha Method for forming a deposited film
US4595601A (en) * 1984-05-25 1986-06-17 Kabushiki Kaisha Toshiba Method of selectively forming an insulation layer
JPS6123344A (ja) * 1984-07-11 1986-01-31 Hitachi Ltd 半導体集積回路の製造方法
JPS6165441A (ja) * 1984-09-07 1986-04-04 Mitsubishi Electric Corp プラズマ窒化シリコン絶縁膜の処理方法
US4702936A (en) * 1984-09-20 1987-10-27 Applied Materials Japan, Inc. Gas-phase growth process
US4811684A (en) * 1984-11-26 1989-03-14 Semiconductor Energy Laboratory Co., Ltd. Photo CVD apparatus, with deposition prevention in light source chamber
US6786997B1 (en) 1984-11-26 2004-09-07 Semiconductor Energy Laboratory Co., Ltd. Plasma processing apparatus
JPH0752718B2 (ja) * 1984-11-26 1995-06-05 株式会社半導体エネルギー研究所 薄膜形成方法
US4699801A (en) * 1985-02-28 1987-10-13 Kabuskiki Kaisha Toshiba Semiconductor device
DE3610401A1 (de) * 1985-03-28 1987-02-12 Sumitomo Electric Industries Halbleiterelement und verfahren zu dessen herstellung und gegenstand, in dem dieses element verwendet wird
JPS61234533A (ja) * 1985-04-11 1986-10-18 Semiconductor Energy Lab Co Ltd 窒化珪素被膜作成方法
JPS61234534A (ja) * 1985-04-11 1986-10-18 Semiconductor Energy Lab Co Ltd 窒化珪素被膜作成方法
US4569855A (en) * 1985-04-11 1986-02-11 Canon Kabushiki Kaisha Method of forming deposition film
US4759993A (en) * 1985-04-25 1988-07-26 Ovonic Synthetic Materials Co., Inc. Plasma chemical vapor deposition SiO2-x coated articles and plasma assisted chemical vapor deposition method of applying the coating
JPS61253870A (ja) * 1985-05-07 1986-11-11 Hitachi Ltd 光起電力素子
JPS61256735A (ja) * 1985-05-10 1986-11-14 Nec Corp 半導体装置及びその製造方法
US4661679A (en) * 1985-06-28 1987-04-28 Eaton Corporation Semiconductor laser processing with mirror mask
EP0227839B1 (en) * 1985-07-02 1991-05-15 Semiconductor Energy Laboratory Co., Ltd. Method of forming a thin film
US4631199A (en) * 1985-07-22 1986-12-23 Hughes Aircraft Company Photochemical vapor deposition process for depositing oxide layers
JPS62226631A (ja) * 1986-03-28 1987-10-05 Agency Of Ind Science & Technol 絶縁膜形成方法
US4918028A (en) * 1986-04-14 1990-04-17 Canon Kabushiki Kaisha Process for photo-assisted epitaxial growth using remote plasma with in-situ etching
JPS62293740A (ja) * 1986-06-13 1987-12-21 Fujitsu Ltd 半導体装置の製造方法
US4681640A (en) * 1986-08-06 1987-07-21 The United States Of America As Represented By The Secretary Of The Army Laser-induced chemical vapor deposition of germanium and doped-germanium films
US4720395A (en) * 1986-08-25 1988-01-19 Anicon, Inc. Low temperature silicon nitride CVD process
KR910003742B1 (ko) 1986-09-09 1991-06-10 세미콘덕터 에너지 라보라터리 캄파니 리미티드 Cvd장치
US4753856A (en) * 1987-01-02 1988-06-28 Dow Corning Corporation Multilayer ceramic coatings from silicate esters and metal oxides
DE3876205T2 (de) * 1987-09-30 1993-05-27 Sumitomo Metal Ind Vorrichtung zur bildung duenner filme.
US4843030A (en) * 1987-11-30 1989-06-27 Eaton Corporation Semiconductor processing by a combination of photolytic, pyrolytic and catalytic processes
US5185179A (en) * 1988-10-11 1993-02-09 Semiconductor Energy Laboratory Co., Ltd. Plasma processing method and products thereof
US4940505A (en) * 1988-12-02 1990-07-10 Eaton Corporation Method for growing single crystalline silicon with intermediate bonding agent and combined thermal and photolytic activation
DE3919538A1 (de) * 1989-06-15 1990-12-20 Asea Brown Boveri Beschichtungsvorrichtung
GB2250751B (en) * 1990-08-24 1995-04-12 Kawasaki Heavy Ind Ltd Process for the production of dielectric thin films
JP3038413B2 (ja) * 1990-12-21 2000-05-08 大阪瓦斯株式会社 光cvd法による膜作成装置
JPH06333857A (ja) * 1993-05-27 1994-12-02 Semiconductor Energy Lab Co Ltd 成膜装置および成膜方法
WO1996009900A1 (en) * 1994-09-28 1996-04-04 Midwest Research Institute Application of optical processing for growth of silicon dioxide
US5686320A (en) * 1995-01-20 1997-11-11 Goldstar Co., Ltd. Method for forming semiconductor layer of thin film transistor by using temperature difference
US5728224A (en) * 1995-09-13 1998-03-17 Tetra Laval Holdings & Finance S.A. Apparatus and method for manufacturing a packaging material using gaseous phase atmospheric photo chemical vapor deposition to apply a barrier layer to a moving web substrate
WO1997015402A1 (en) * 1995-10-24 1997-05-01 Tetra Laval Holdings & Finance S.A. Apparatus and method for manufacturing a packaging material
US5976993A (en) 1996-03-28 1999-11-02 Applied Materials, Inc. Method for reducing the intrinsic stress of high density plasma films
KR19990030660A (ko) * 1997-10-02 1999-05-06 윤종용 전자빔을 이용한 반도체장치의 층간 절연막 형성방법
US6628237B1 (en) * 2000-03-25 2003-09-30 Marconi Communications Inc. Remote communication using slot antenna
JP2002198368A (ja) * 2000-12-26 2002-07-12 Nec Corp 半導体装置の製造方法
KR101050377B1 (ko) 2001-02-12 2011-07-20 에이에스엠 아메리카, 인코포레이티드 반도체 박막 증착을 위한 개선된 공정
US7026219B2 (en) 2001-02-12 2006-04-11 Asm America, Inc. Integration of high k gate dielectric
US6815007B1 (en) 2002-03-04 2004-11-09 Taiwan Semiconductor Manufacturing Company Method to solve IMD-FSG particle and increase Cp yield by using a new tougher UFUN season film
US7294582B2 (en) * 2002-07-19 2007-11-13 Asm International, N.V. Low temperature silicon compound deposition
JP5005170B2 (ja) * 2002-07-19 2012-08-22 エーエスエム アメリカ インコーポレイテッド 超高品質シリコン含有化合物層の形成方法
US7186630B2 (en) 2002-08-14 2007-03-06 Asm America, Inc. Deposition of amorphous silicon-containing films
US7092287B2 (en) * 2002-12-18 2006-08-15 Asm International N.V. Method of fabricating silicon nitride nanodots
US20040259379A1 (en) * 2003-06-23 2004-12-23 Yoshi Ono Low temperature nitridation of silicon
US7629270B2 (en) * 2004-08-27 2009-12-08 Asm America, Inc. Remote plasma activated nitridation
US7253084B2 (en) * 2004-09-03 2007-08-07 Asm America, Inc. Deposition from liquid sources
US7966969B2 (en) * 2004-09-22 2011-06-28 Asm International N.V. Deposition of TiN films in a batch reactor
US7674726B2 (en) * 2004-10-15 2010-03-09 Asm International N.V. Parts for deposition reactors
US7427571B2 (en) * 2004-10-15 2008-09-23 Asm International, N.V. Reactor design for reduced particulate generation
US7629267B2 (en) * 2005-03-07 2009-12-08 Asm International N.V. High stress nitride film and method for formation thereof
US20070054048A1 (en) * 2005-09-07 2007-03-08 Suvi Haukka Extended deposition range by hot spots
US7718518B2 (en) * 2005-12-16 2010-05-18 Asm International N.V. Low temperature doped silicon layer formation
US7553516B2 (en) * 2005-12-16 2009-06-30 Asm International N.V. System and method of reducing particle contamination of semiconductor substrates
US7691757B2 (en) 2006-06-22 2010-04-06 Asm International N.V. Deposition of complex nitride films
DE102006032936B4 (de) * 2006-07-17 2012-01-05 Wolf Gmbh Verwendung einer Schicht aus stark oxidierten Si-Nanokristallen zur Beschichtung von Kunststoffen
US7629256B2 (en) * 2007-05-14 2009-12-08 Asm International N.V. In situ silicon and titanium nitride deposition
US7851307B2 (en) * 2007-08-17 2010-12-14 Micron Technology, Inc. Method of forming complex oxide nanodots for a charge trap
US8012876B2 (en) * 2008-12-02 2011-09-06 Asm International N.V. Delivery of vapor precursor from solid source
US7833906B2 (en) 2008-12-11 2010-11-16 Asm International N.V. Titanium silicon nitride deposition
DE102009040785A1 (de) * 2009-09-09 2011-03-10 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Substrat aus einer Aluminium-Silizium-Legierung oder kristallinem Silizium, Metallspiegel, Verfahren zu dessen Herstellung sowie dessen Verwendung
WO2015069296A1 (en) * 2013-11-11 2015-05-14 Empire Technology Development Llc Strengthened glass substrates

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3200018A (en) * 1962-01-29 1965-08-10 Hughes Aircraft Co Controlled epitaxial crystal growth by focusing electromagnetic radiation
US3271180A (en) * 1962-06-19 1966-09-06 Ibm Photolytic processes for fabricating thin film patterns
US4363828A (en) * 1979-12-12 1982-12-14 International Business Machines Corp. Method for depositing silicon films and related materials by a glow discharge in a disiland or higher order silane gas
JPS5767938A (en) * 1980-10-16 1982-04-24 Canon Inc Production of photoconductive member
JPS5772318A (en) * 1980-10-24 1982-05-06 Seiko Epson Corp Vapor growth method
US4348428A (en) * 1980-12-15 1982-09-07 Board Of Regents For Oklahoma Agriculture And Mechanical Colleges Acting For And On Behalf Of Oklahoma State University Of Agriculture And Applied Sciences Method of depositing doped amorphous semiconductor on a substrate

Also Published As

Publication number Publication date
US4495218A (en) 1985-01-22
EP0104658A1 (en) 1984-04-04
JPH049369B2 (cg-RX-API-DMAC10.html) 1992-02-20
EP0104658B1 (en) 1986-07-30
JPS5958819A (ja) 1984-04-04

Similar Documents

Publication Publication Date Title
DE3364979D1 (en) Process for forming thin film
DE3274262D1 (en) Apparatus for forming thin film
GB8300948D0 (en) Film depositing apparatus
DE3272887D1 (en) Film forming method
GB8308510D0 (en) Film die
DE3174776D1 (en) Process for preparing thin film transistor arrays
GB2129965B (en) Process for composite photography
GB8302743D0 (en) Film
DE3167964D1 (en) Process for producing polyester film
GB8311284D0 (en) Apparatus for forming cakes
DE3361393D1 (en) Photographic registration process
GB8311173D0 (en) Deposition apparatus
DE3375589D1 (en) Process for forming a ferrite film
DE3472574D1 (en) Process for forming an organic thin film
DE3564161D1 (en) Process for forming high contrast negative image
DE3469643D1 (en) Method for forming flattened film
ZA836151B (en) Post-exposure process
DE3375729D1 (en) Composition for forming releasable film
GB8813735D0 (en) Apparatus for forming thin film
DE3365612D1 (en) Process for the manufacture of polyester film
EP0265886A3 (en) Process for forming an ultrafine-particle film
DE3371139D1 (en) Dielectric film and process for producing same
GB2158463B (en) Forming ceramic films
GB2126508B (en) Forming apparatus
ZA817924B (en) Photographic process

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee