DE3201297C2 - - Google Patents

Info

Publication number
DE3201297C2
DE3201297C2 DE3201297A DE3201297A DE3201297C2 DE 3201297 C2 DE3201297 C2 DE 3201297C2 DE 3201297 A DE3201297 A DE 3201297A DE 3201297 A DE3201297 A DE 3201297A DE 3201297 C2 DE3201297 C2 DE 3201297C2
Authority
DE
Germany
Prior art keywords
digital
analog
converter
signal
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3201297A
Other languages
German (de)
English (en)
Other versions
DE3201297A1 (de
Inventor
Kazuo Ibaraki Jp Kato
Takeshi Mito Jp Hirayama
Shigeaki Sayama Jp Yoshida
Yoshinori Mitaka Jp Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of DE3201297A1 publication Critical patent/DE3201297A1/de
Application granted granted Critical
Publication of DE3201297C2 publication Critical patent/DE3201297C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/109—Measuring or testing for dc performance, i.e. static testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
    • H03M1/1047—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables using an auxiliary digital/analogue converter for adding the correction values to the analogue signal

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
DE19823201297 1981-01-19 1982-01-18 Pruefverfahren fuer analog/digital-umsetzer und aufbau eines fuer die pruefung geeigneten analog/digital-umsetzers Granted DE3201297A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56005011A JPS57119259A (en) 1981-01-19 1981-01-19 Testing method for a/d converter

Publications (2)

Publication Number Publication Date
DE3201297A1 DE3201297A1 (de) 1982-08-05
DE3201297C2 true DE3201297C2 (US20100268047A1-20101021-C00003.png) 1988-06-01

Family

ID=11599598

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19823201297 Granted DE3201297A1 (de) 1981-01-19 1982-01-18 Pruefverfahren fuer analog/digital-umsetzer und aufbau eines fuer die pruefung geeigneten analog/digital-umsetzers

Country Status (3)

Country Link
US (1) US4580126A (US20100268047A1-20101021-C00003.png)
JP (1) JPS57119259A (US20100268047A1-20101021-C00003.png)
DE (1) DE3201297A1 (US20100268047A1-20101021-C00003.png)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2199711B (en) * 1987-01-08 1990-10-24 Schlumberger Electronics Converter calibration
US4947106A (en) * 1988-03-31 1990-08-07 Hewlett-Packard Company Programmatically generated in-circuit test of analog to digital converters
US4888548A (en) * 1988-03-31 1989-12-19 Hewlett-Packard Company Programmatically generated in-circuit test of digital to analog converters
US4897650A (en) * 1988-04-05 1990-01-30 General Electric Company Self-characterizing analog-to-digital converter
JPH0244817A (ja) * 1988-08-04 1990-02-14 Nec Ic Microcomput Syst Ltd 逐次比較アナログ・ディジタル変換器
JPH0295939U (US20100268047A1-20101021-C00003.png) * 1989-01-20 1990-07-31
EP0447117B1 (en) * 1990-03-15 1997-02-19 AT&T Corp. Built-in self test for analog to digital converters
FI96811C (fi) * 1993-11-30 1996-08-26 Nokia Mobile Phones Ltd Menetelmä ja piirijärjestely D/A-muuntimen DC-erojännitteen kompensoimiseksi
TW356596B (en) * 1996-10-16 1999-04-21 Koninl Philips Electronics Nv Testing control signals in A/D converters the invention relates to an integrated circuit containing an A/D converter and a test circuit
FR2784193B1 (fr) * 1998-10-05 2001-01-05 Texas Instruments France Mecanisme integre permettant une detection de defaillances par test automatique en temps reel pour un convertisseur analogique/numerique
US6917321B1 (en) * 2000-05-21 2005-07-12 Analog Devices, Inc. Method and apparatus for use in switched capacitor systems
US7199740B1 (en) 2000-05-21 2007-04-03 Analog Devices, Inc. Method and apparatus for use in switched capacitor systems
US6703952B2 (en) * 2002-06-10 2004-03-09 Adc Dsl Systems, Inc. Testing analog-to-digital and digital-to-analog converters
WO2006092173A1 (en) * 2005-03-02 2006-09-08 Agilent Technologies, Inc. Analog signal test using a-priori information
US7511645B1 (en) * 2007-03-27 2009-03-31 National Semiconductor Corporation Apparatus and method for auto-zeroing a sampled comparator
JP4435197B2 (ja) * 2007-03-29 2010-03-17 株式会社東芝 半導体集積回路
FR2924226B1 (fr) * 2007-11-26 2010-02-26 Schneider Electric Ind Sas Procede de verification du fonctionnement d'un module d'entrees analogiques et module d'entrees analogiques mettant en oeuvre ce procede
WO2010128541A1 (ja) * 2009-05-07 2010-11-11 パナソニック株式会社 逐次比較型ａ／ｄ変換装置
JP5965290B2 (ja) * 2012-10-31 2016-08-03 ルネサスエレクトロニクス株式会社 アナログ／デジタル変換器及びアナログ／デジタル変換器の自己診断方法
US9344104B1 (en) * 2013-05-18 2016-05-17 S9Estre, Llc Digital to analog converter and analog to digital converter calibration techniques
CN104237661B (zh) * 2013-06-14 2017-06-09 英华达（上海）科技有限公司 可自动切换检测电压的检测系统及其电压校准检测方法
JP7243485B2 (ja) * 2019-06-27 2023-03-22 セイコーエプソン株式会社 物理量検出回路、物理量センサー、電子機器、移動体及び物理量センサーの故障診断方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS554283B2 (US20100268047A1-20101021-C00003.png) * 1973-09-17 1980-01-29

Also Published As

Publication number Publication date
JPH0345581B2 (US20100268047A1-20101021-C00003.png) 1991-07-11
US4580126A (en) 1986-04-01
DE3201297A1 (de) 1982-08-05
JPS57119259A (en) 1982-07-24

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee