DE3140073C2 - Spektralanalysator - Google Patents

Spektralanalysator

Info

Publication number
DE3140073C2
DE3140073C2 DE3140073A DE3140073A DE3140073C2 DE 3140073 C2 DE3140073 C2 DE 3140073C2 DE 3140073 A DE3140073 A DE 3140073A DE 3140073 A DE3140073 A DE 3140073A DE 3140073 C2 DE3140073 C2 DE 3140073C2
Authority
DE
Germany
Prior art keywords
phase
frequency
signal
measuring device
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3140073A
Other languages
German (de)
English (en)
Other versions
DE3140073A1 (de
Inventor
Hitoshi Higashimatsuyama Saitama Ashida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Takeda Riken Industries Co Ltd filed Critical Takeda Riken Industries Co Ltd
Publication of DE3140073A1 publication Critical patent/DE3140073A1/de
Application granted granted Critical
Publication of DE3140073C2 publication Critical patent/DE3140073C2/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/173—Wobbulating devices similar to swept panoramic receivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measuring Phase Differences (AREA)
DE3140073A 1980-10-08 1981-10-08 Spektralanalysator Expired DE3140073C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55141035A JPS5764171A (en) 1980-10-08 1980-10-08 Spectrum analyzer

Publications (2)

Publication Number Publication Date
DE3140073A1 DE3140073A1 (de) 1982-04-22
DE3140073C2 true DE3140073C2 (de) 1987-02-19

Family

ID=15282705

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3140073A Expired DE3140073C2 (de) 1980-10-08 1981-10-08 Spektralanalysator

Country Status (4)

Country Link
US (1) US4451782A (US20100012521A1-20100121-C00001.png)
JP (1) JPS5764171A (US20100012521A1-20100121-C00001.png)
DE (1) DE3140073C2 (US20100012521A1-20100121-C00001.png)
GB (1) GB2085601B (US20100012521A1-20100121-C00001.png)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3220462C1 (de) * 1982-05-29 1983-12-22 Rohde & Schwarz GmbH & Co KG, 8000 München Spektrumanalysator
US4641246A (en) * 1983-10-20 1987-02-03 Burr-Brown Corporation Sampling waveform digitizer for dynamic testing of high speed data conversion components
US4654886A (en) * 1985-04-25 1987-03-31 Ifr, Inc. Local oscillator null circuit and method
US4780667A (en) * 1985-06-25 1988-10-25 Hewlett-Packard Company Magnetostatic wave delay line discriminator with automatic quadrature setting and automatic calibration
US4736351A (en) * 1986-08-28 1988-04-05 Oliver Douglas E Precision semiconductor device timer
US4771232A (en) * 1988-01-04 1988-09-13 Paradyne Corporation Non-interruptive spectrum analyzer for digital modems
US4852123A (en) * 1988-02-05 1989-07-25 Motorola, Inc. Nearly DC IF phase locked transceiver
US5086512A (en) * 1988-04-20 1992-02-04 Hewlett-Packard Company Compensation system for dynamically tracking and nulling local oscillator feedthrough
US4918382A (en) * 1989-03-20 1990-04-17 Tektronix, Inc. Method for distinguishing between real and spurious responses in a spectrum analyzer
DE3917411A1 (de) * 1989-05-29 1990-12-06 Brust Hans Detlef Verfahren und anordnung zur schnellen spektralanalyse eines signals an einem oder mehreren messpunkten
US5099200A (en) * 1990-01-12 1992-03-24 Hewlett-Packard Company I.f. calibration system
DE4009750C2 (de) * 1990-03-27 1993-10-28 Rohde & Schwarz Heterodyner Analysator zum Messen von Pegel- und Phasen-Frequenzcharakteristiken von Vierpolen
JPH04235355A (ja) * 1991-01-10 1992-08-24 Fujita Corp 複数回路における総消費電力量の計量方法及びそれに使用する電流合成型変流器
US5198748A (en) * 1991-10-28 1993-03-30 The United States Of America As Represented By The Secretary Of The Air Force Frequency measurement receiver with bandwidth improvement through synchronized phase shifted sampling
ES2068065B1 (es) * 1992-02-06 1996-08-01 Cesel S A Ceselsa Receptor multicanal de frecuencia intermedia.
US5736845A (en) * 1994-11-11 1998-04-07 Advantest Corp. Spectrum analyzer having image frequency eliminating device
US6229316B1 (en) 1995-09-08 2001-05-08 Advantest Corporation Measuring method by spectrum analyzer
DE69633322T2 (de) * 1995-10-31 2005-09-22 Kyoto Daiichi Kagaku Co. Ltd. Verfahren und Vorrichtung zur optischen Messung durch Polarisationsanalyse
DE19812604C1 (de) * 1998-03-23 1999-09-16 Karlsruhe Forschzent Vektorieller Netzwerkanalysator
JP3338370B2 (ja) * 1998-05-14 2002-10-28 株式会社アドバンテスト 周波数分析方法及びこの方法を用いた掃引型スペクトラム・アナライザ
US6128359A (en) * 1998-10-27 2000-10-03 Intel Corporation Phase difference magnifier
TW555994B (en) * 2002-06-12 2003-10-01 Mediatek Inc Group delay test method and device
US7526701B2 (en) * 2002-10-02 2009-04-28 Mediatek Inc. Method and apparatus for measuring group delay of a device under test
DE10301848B4 (de) * 2003-01-09 2014-10-09 Anton Rodi Messeinrichtung zur Erfassung von Größen, insbesondere von Winkeln oder Wegstrecken
US7116092B2 (en) * 2004-07-28 2006-10-03 International Business Machines Corporation Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics
EP1657558B1 (en) * 2004-11-10 2008-07-23 Advantest Corporation Image cancellation in frequency converters for spectrum analysers
JP4895551B2 (ja) * 2005-08-10 2012-03-14 株式会社アドバンテスト 試験装置および試験方法
WO2007134084A1 (en) * 2006-05-08 2007-11-22 Sunrise Telecom Incorporated Integrated spectrum analyzer and vector network analyzer system
US20080205557A1 (en) * 2007-02-27 2008-08-28 Tektronix, Inc. Systems and Methods for Performing External Correction
JP2009186323A (ja) * 2008-02-06 2009-08-20 Advantest Corp 周波数特性測定装置
US8364430B2 (en) 2008-08-27 2013-01-29 Aerodyne Research, Inc. System and method for precision phase shift measurement
US9658294B2 (en) * 2011-11-04 2017-05-23 Nxp Usa, Inc. Testing a switched mode supply with waveform generator and capture channel
US9134355B2 (en) * 2013-02-25 2015-09-15 Ganesh Ramaswamy Basawapatna Apparatus for very high speed adaptive spectrum analysis
US9178685B1 (en) * 2013-12-27 2015-11-03 Altera Corporation Techniques to determine signal timing
JP6611441B2 (ja) * 2014-02-28 2019-11-27 地方独立行政法人東京都立産業技術研究センター 周波数変換ユニット、計測システム及び計測方法
US11183954B2 (en) * 2018-08-09 2021-11-23 Canon Kabushiki Kaisha Motor driving device and control method thereof

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3986113A (en) * 1973-11-23 1976-10-12 Hewlett-Packard Company Two channel test instrument with active electronicphase shift means
FR2420769A1 (fr) * 1978-03-20 1979-10-19 Rai Radiotelevisione Italiana Procede et dispositif pour mesurer l'amplitude et le retard de groupe sur chaque bande laterale, des bornes d'entree aux bornes de sortie d'un emetteur module en amplitude
DE2914143C2 (de) * 1979-04-07 1981-10-01 Rohde & Schwarz GmbH & Co KG, 8000 München Gerät zum Untersuchen eines nach der Frequenz ausgewählten einzelnen Hochfrequenzsignales eines breiten Frequenzbandes

Also Published As

Publication number Publication date
DE3140073A1 (de) 1982-04-22
JPS6259784B2 (US20100012521A1-20100121-C00001.png) 1987-12-12
GB2085601B (en) 1985-05-15
US4451782A (en) 1984-05-29
JPS5764171A (en) 1982-04-19
GB2085601A (en) 1982-04-28

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8125 Change of the main classification

Ipc: G01R 27/30

D2 Grant after examination
8363 Opposition against the patent
8339 Ceased/non-payment of the annual fee