DE3140073C2 - Spektralanalysator - Google Patents
SpektralanalysatorInfo
- Publication number
- DE3140073C2 DE3140073C2 DE3140073A DE3140073A DE3140073C2 DE 3140073 C2 DE3140073 C2 DE 3140073C2 DE 3140073 A DE3140073 A DE 3140073A DE 3140073 A DE3140073 A DE 3140073A DE 3140073 C2 DE3140073 C2 DE 3140073C2
- Authority
- DE
- Germany
- Prior art keywords
- phase
- frequency
- signal
- measuring device
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003595 spectral effect Effects 0.000 title 1
- 238000005259 measurement Methods 0.000 claims abstract description 30
- 230000010363 phase shift Effects 0.000 claims description 25
- 230000005540 biological transmission Effects 0.000 claims description 4
- 230000006835 compression Effects 0.000 claims description 3
- 238000007906 compression Methods 0.000 claims description 3
- 230000010354 integration Effects 0.000 claims description 3
- 230000003111 delayed effect Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 claims 8
- 101150087426 Gnal gene Proteins 0.000 claims 1
- 238000011161 development Methods 0.000 claims 1
- 230000018109 developmental process Effects 0.000 claims 1
- 230000001360 synchronised effect Effects 0.000 claims 1
- 238000001228 spectrum Methods 0.000 abstract 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
- G01R23/173—Wobbulating devices similar to swept panoramic receivers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measuring Phase Differences (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55141035A JPS5764171A (en) | 1980-10-08 | 1980-10-08 | Spectrum analyzer |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3140073A1 DE3140073A1 (de) | 1982-04-22 |
DE3140073C2 true DE3140073C2 (de) | 1987-02-19 |
Family
ID=15282705
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3140073A Expired DE3140073C2 (de) | 1980-10-08 | 1981-10-08 | Spektralanalysator |
Country Status (4)
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3220462C1 (de) * | 1982-05-29 | 1983-12-22 | Rohde & Schwarz GmbH & Co KG, 8000 München | Spektrumanalysator |
US4641246A (en) * | 1983-10-20 | 1987-02-03 | Burr-Brown Corporation | Sampling waveform digitizer for dynamic testing of high speed data conversion components |
US4654886A (en) * | 1985-04-25 | 1987-03-31 | Ifr, Inc. | Local oscillator null circuit and method |
US4780667A (en) * | 1985-06-25 | 1988-10-25 | Hewlett-Packard Company | Magnetostatic wave delay line discriminator with automatic quadrature setting and automatic calibration |
US4736351A (en) * | 1986-08-28 | 1988-04-05 | Oliver Douglas E | Precision semiconductor device timer |
US4771232A (en) * | 1988-01-04 | 1988-09-13 | Paradyne Corporation | Non-interruptive spectrum analyzer for digital modems |
US4852123A (en) * | 1988-02-05 | 1989-07-25 | Motorola, Inc. | Nearly DC IF phase locked transceiver |
US5086512A (en) * | 1988-04-20 | 1992-02-04 | Hewlett-Packard Company | Compensation system for dynamically tracking and nulling local oscillator feedthrough |
US4918382A (en) * | 1989-03-20 | 1990-04-17 | Tektronix, Inc. | Method for distinguishing between real and spurious responses in a spectrum analyzer |
DE3917411A1 (de) * | 1989-05-29 | 1990-12-06 | Brust Hans Detlef | Verfahren und anordnung zur schnellen spektralanalyse eines signals an einem oder mehreren messpunkten |
US5099200A (en) * | 1990-01-12 | 1992-03-24 | Hewlett-Packard Company | I.f. calibration system |
DE4009750C2 (de) * | 1990-03-27 | 1993-10-28 | Rohde & Schwarz | Heterodyner Analysator zum Messen von Pegel- und Phasen-Frequenzcharakteristiken von Vierpolen |
JPH04235355A (ja) * | 1991-01-10 | 1992-08-24 | Fujita Corp | 複数回路における総消費電力量の計量方法及びそれに使用する電流合成型変流器 |
US5198748A (en) * | 1991-10-28 | 1993-03-30 | The United States Of America As Represented By The Secretary Of The Air Force | Frequency measurement receiver with bandwidth improvement through synchronized phase shifted sampling |
ES2068065B1 (es) * | 1992-02-06 | 1996-08-01 | Cesel S A Ceselsa | Receptor multicanal de frecuencia intermedia. |
US5736845A (en) * | 1994-11-11 | 1998-04-07 | Advantest Corp. | Spectrum analyzer having image frequency eliminating device |
US6229316B1 (en) | 1995-09-08 | 2001-05-08 | Advantest Corporation | Measuring method by spectrum analyzer |
DE69633322T2 (de) * | 1995-10-31 | 2005-09-22 | Kyoto Daiichi Kagaku Co. Ltd. | Verfahren und Vorrichtung zur optischen Messung durch Polarisationsanalyse |
DE19812604C1 (de) * | 1998-03-23 | 1999-09-16 | Karlsruhe Forschzent | Vektorieller Netzwerkanalysator |
JP3338370B2 (ja) * | 1998-05-14 | 2002-10-28 | 株式会社アドバンテスト | 周波数分析方法及びこの方法を用いた掃引型スペクトラム・アナライザ |
US6128359A (en) * | 1998-10-27 | 2000-10-03 | Intel Corporation | Phase difference magnifier |
TW555994B (en) * | 2002-06-12 | 2003-10-01 | Mediatek Inc | Group delay test method and device |
US7526701B2 (en) * | 2002-10-02 | 2009-04-28 | Mediatek Inc. | Method and apparatus for measuring group delay of a device under test |
DE10301848B4 (de) * | 2003-01-09 | 2014-10-09 | Anton Rodi | Messeinrichtung zur Erfassung von Größen, insbesondere von Winkeln oder Wegstrecken |
US7116092B2 (en) * | 2004-07-28 | 2006-10-03 | International Business Machines Corporation | Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics |
DE602004015302D1 (de) * | 2004-11-10 | 2008-09-04 | Advantest Corp | Beseitigung der Spiegelfrequenz in Frequenzumsetzern für Spektralanalysatoren |
JP4895551B2 (ja) * | 2005-08-10 | 2012-03-14 | 株式会社アドバンテスト | 試験装置および試験方法 |
TW200808023A (en) * | 2006-05-08 | 2008-02-01 | Sunrise Telecom Inc | Integrated spectrum analyzer and vector network analyzer system |
US20080205557A1 (en) * | 2007-02-27 | 2008-08-28 | Tektronix, Inc. | Systems and Methods for Performing External Correction |
JP2009186323A (ja) * | 2008-02-06 | 2009-08-20 | Advantest Corp | 周波数特性測定装置 |
EP2329599B1 (en) | 2008-08-27 | 2015-02-25 | Aerodyne Research, Inc. | System and method for precision phase shift measurement |
US9658294B2 (en) * | 2011-11-04 | 2017-05-23 | Nxp Usa, Inc. | Testing a switched mode supply with waveform generator and capture channel |
US9134355B2 (en) * | 2013-02-25 | 2015-09-15 | Ganesh Ramaswamy Basawapatna | Apparatus for very high speed adaptive spectrum analysis |
US9178685B1 (en) * | 2013-12-27 | 2015-11-03 | Altera Corporation | Techniques to determine signal timing |
JP6611441B2 (ja) * | 2014-02-28 | 2019-11-27 | 地方独立行政法人東京都立産業技術研究センター | 周波数変換ユニット、計測システム及び計測方法 |
US11183954B2 (en) * | 2018-08-09 | 2021-11-23 | Canon Kabushiki Kaisha | Motor driving device and control method thereof |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3986113A (en) * | 1973-11-23 | 1976-10-12 | Hewlett-Packard Company | Two channel test instrument with active electronicphase shift means |
FR2420769A1 (fr) * | 1978-03-20 | 1979-10-19 | Rai Radiotelevisione Italiana | Procede et dispositif pour mesurer l'amplitude et le retard de groupe sur chaque bande laterale, des bornes d'entree aux bornes de sortie d'un emetteur module en amplitude |
DE2914143C2 (de) * | 1979-04-07 | 1981-10-01 | Rohde & Schwarz GmbH & Co KG, 8000 München | Gerät zum Untersuchen eines nach der Frequenz ausgewählten einzelnen Hochfrequenzsignales eines breiten Frequenzbandes |
-
1980
- 1980-10-08 JP JP55141035A patent/JPS5764171A/ja active Granted
-
1981
- 1981-10-06 US US06/309,090 patent/US4451782A/en not_active Expired - Lifetime
- 1981-10-07 GB GB8130341A patent/GB2085601B/en not_active Expired
- 1981-10-08 DE DE3140073A patent/DE3140073C2/de not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB2085601A (en) | 1982-04-28 |
GB2085601B (en) | 1985-05-15 |
US4451782A (en) | 1984-05-29 |
JPS6259784B2 (US20050271598A1-20051208-C00001.png) | 1987-12-12 |
DE3140073A1 (de) | 1982-04-22 |
JPS5764171A (en) | 1982-04-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8125 | Change of the main classification |
Ipc: G01R 27/30 |
|
D2 | Grant after examination | ||
8363 | Opposition against the patent | ||
8339 | Ceased/non-payment of the annual fee |