DE2704266C2 - Verfahren zur Bestückung von Leiterplatten mit IC-Chips und Vorrichtung zur Durchführung des Verfahrens - Google Patents

Verfahren zur Bestückung von Leiterplatten mit IC-Chips und Vorrichtung zur Durchführung des Verfahrens

Info

Publication number
DE2704266C2
DE2704266C2 DE2704266A DE2704266A DE2704266C2 DE 2704266 C2 DE2704266 C2 DE 2704266C2 DE 2704266 A DE2704266 A DE 2704266A DE 2704266 A DE2704266 A DE 2704266A DE 2704266 C2 DE2704266 C2 DE 2704266C2
Authority
DE
Germany
Prior art keywords
circuit board
cutting
axis
tool
cutting tool
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2704266A
Other languages
German (de)
English (en)
Other versions
DE2704266A1 (de
Inventor
Raymond Louis Bagnolet Delorme
Henri Le Plessis Trevise Grosjean
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CII HONEYWELL BULL PARIS FR
Original Assignee
Compagnie Internationale Pour L'informatique Cii-Honeywell Bull, Paris
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Compagnie Internationale Pour L'informatique Cii-Honeywell Bull, Paris filed Critical Compagnie Internationale Pour L'informatique Cii-Honeywell Bull, Paris
Publication of DE2704266A1 publication Critical patent/DE2704266A1/de
Application granted granted Critical
Publication of DE2704266C2 publication Critical patent/DE2704266C2/de
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04—Mounting of components, e.g. of leadless components
    • H05K13/046—Surface mounting
    • H05K13/0465—Surface mounting by soldering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01005—Boron [B]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01006—Carbon [C]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01014—Silicon [Si]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01019—Potassium [K]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01023—Vanadium [V]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01033—Arsenic [As]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01039—Yttrium [Y]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01044—Ruthenium [Ru]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01058—Cerium [Ce]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01073—Tantalum [Ta]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01074—Tungsten [W]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01075—Rhenium [Re]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01087—Francium [Fr]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01088—Radium [Ra]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013—Alloys
    • H01L2924/014—Solder alloys
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/14—Integrated circuits
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49121—Beam lead frame or beam lead device
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/53—Means to assemble or disassemble
    • Y10T29/5313—Means to assemble electrical device
    • Y10T29/53174—Means to fasten electrical component to wiring board, base, or substrate
    • Y10T29/53178—Chip component
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/53—Means to assemble or disassemble
    • Y10T29/5313—Means to assemble electrical device
    • Y10T29/53174—Means to fasten electrical component to wiring board, base, or substrate
    • Y10T29/53183—Multilead component

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Wire Bonding (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
DE2704266A 1976-09-20 1977-02-02 Verfahren zur Bestückung von Leiterplatten mit IC-Chips und Vorrichtung zur Durchführung des Verfahrens Expired DE2704266C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7628170A FR2365209A1 (fr) 1976-09-20 1976-09-20 Procede pour le montage de micro-plaquettes de circuits integres sur un substrat et installation pour sa mise en oeuvre

Publications (2)

Publication Number Publication Date
DE2704266A1 DE2704266A1 (de) 1978-03-23
DE2704266C2 true DE2704266C2 (de) 1985-07-11

Family

ID=9177834

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2704266A Expired DE2704266C2 (de) 1976-09-20 1977-02-02 Verfahren zur Bestückung von Leiterplatten mit IC-Chips und Vorrichtung zur Durchführung des Verfahrens

Country Status (10)

Country Link
US (1) US4116376A (US08124317-20120228-C00060.png)
JP (1) JPS5823935B2 (US08124317-20120228-C00060.png)
BE (1) BE851574A (US08124317-20120228-C00060.png)
CA (1) CA1076711A (US08124317-20120228-C00060.png)
CH (1) CH607328A5 (US08124317-20120228-C00060.png)
DE (1) DE2704266C2 (US08124317-20120228-C00060.png)
FR (1) FR2365209A1 (US08124317-20120228-C00060.png)
GB (1) GB1570406A (US08124317-20120228-C00060.png)
NL (1) NL186125C (US08124317-20120228-C00060.png)
SE (1) SE412682B (US08124317-20120228-C00060.png)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
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FR2404990A1 (fr) * 1977-10-03 1979-04-27 Cii Honeywell Bull Substrat d'interconnexion de composants electroniques a circuits integres, muni d'un dispositif de reparation
DE2836924A1 (de) * 1978-08-24 1980-03-06 Blaupunkt Werke Gmbh Vorrichtung zur automatischen positionierung von elektronischen bauelementen
US4342090A (en) * 1980-06-27 1982-07-27 International Business Machines Corp. Batch chip placement system
DE3138296A1 (de) * 1981-09-25 1983-04-28 Siemens AG, 1000 Berlin und 8000 München Verfahren zum positionieren und fixieren von optischen bauelementen relativ zueinander
NL8201653A (nl) * 1982-04-21 1983-11-16 Philips Nv Werkwijze en inrichting voor het plaatsen van chipvormige electrische en/of electronische onderdelen op een substraat.
DE3235139A1 (de) * 1982-09-23 1984-03-29 Schwarzwälder Elektronik-Werke GmbH, 7730 Villingen-Schwenningen Verfahren zum automatischen bestuecken von leiterplatten mit halbleiterbauteilen mit integrierten schaltungen und vorrichtungen zur durchfuehrung der verfahren
JPS59161040A (ja) * 1983-03-03 1984-09-11 Shinkawa Ltd インナ−リ−ドボンダ−
US4479298A (en) * 1983-07-26 1984-10-30 Storage Technology Partners Alignment apparatus and method for mounting LSI and VLSI packages to a printed circuit board
JPS61168446A (ja) * 1985-01-21 1986-07-30 Fuji Kikai Seizo Kk プリント基板位置決め装置
EP0208916A3 (en) * 1985-06-13 1987-08-12 Matsushita Electric Industrial Co., Ltd. Inner-lead bonding apparatus
JPS6298737A (ja) * 1985-10-25 1987-05-08 Sharp Corp 半導体装置の交換方法
JPS6365891A (ja) * 1986-09-08 1988-03-24 ヤマトミシン製造株式会社 ミシンのシ−ソ−生地送り方法並びにその装置
US4768698A (en) * 1986-10-03 1988-09-06 Pace Incorporated X-Y table with θ rotation
JPH0243339Y2 (US08124317-20120228-C00060.png) * 1987-03-31 1990-11-19
US4832250A (en) * 1987-05-28 1989-05-23 Srtechnologies, Inc. Electronic circuit board rework and repair system
US4972990A (en) * 1988-02-22 1990-11-27 Pace Incorporated Apparatus for removal and installing electronic components with respect to a substrate
US4899920A (en) * 1988-02-22 1990-02-13 Pace Incorporated Apparatus for removal and installing electronic components with respect to a substrate
US4899921A (en) * 1988-10-28 1990-02-13 The American Optical Corporation Aligner bonder
US5031820A (en) * 1990-02-01 1991-07-16 Eldon Industries, Inc. PCB rework station
US5627913A (en) * 1990-08-27 1997-05-06 Sierra Research And Technology, Inc. Placement system using a split imaging system coaxially coupled to a component pickup means
US5251266A (en) * 1990-08-27 1993-10-05 Sierra Research And Technology, Inc. System for placement and mounting of fine pitch integrated circuit devices using a split mirror assembly
US5235407A (en) * 1990-08-27 1993-08-10 Sierra Research And Technology, Inc. System for placement and mounting of fine pitch integrated circuit devices
US5144747A (en) * 1991-03-27 1992-09-08 Integrated System Assemblies Corporation Apparatus and method for positioning an integrated circuit chip within a multichip module
US5152055A (en) * 1991-04-26 1992-10-06 At&T Bell Laboratories Article alignment method
US5317803A (en) * 1991-05-30 1994-06-07 Sierra Research And Technology, Inc. Method of soldering an integrated circuit
US5547537A (en) * 1992-05-20 1996-08-20 Kulicke & Soffa, Investments, Inc. Ceramic carrier transport for die attach equipment
US5862588A (en) * 1995-08-14 1999-01-26 International Business Machines Corporation Method for restraining circuit board warp during area array rework
US5813590A (en) * 1995-12-18 1998-09-29 Micron Technology, Inc. Extended travel wire bonding machine
JP3466394B2 (ja) * 1996-10-31 2003-11-10 太陽誘電株式会社 チップ部品及びその製造方法
KR100242024B1 (ko) * 1997-03-13 2000-03-02 윤종용 집적회로 실장방법
JPH11340695A (ja) * 1998-05-25 1999-12-10 Sony Corp 組立装置
US20030106210A1 (en) * 2000-05-22 2003-06-12 Yoshiyuki Arai Chip-mounting device and method of alignment
SG91870A1 (en) * 2000-05-26 2002-10-15 Casem Asia Pte Ltd Method and device for bleed out control in solder bonding
JP4616514B2 (ja) * 2001-06-07 2011-01-19 富士機械製造株式会社 電気部品装着システムおよびそれにおける位置誤差検出方法
US6667630B2 (en) * 2001-07-26 2003-12-23 Obaida A. Abdulky Universal flying probe fixture
FR2876539B1 (fr) * 2004-10-07 2007-01-12 Cybernetix Microelectronique S Procede de positionnement d'un composant electronique par rapport a plusieurs plots de connexions
WO2014098174A1 (ja) * 2012-12-21 2014-06-26 株式会社新川 フリップチップボンダ及びボンディングステージの平坦度並びに変形量補正方法

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DE1909480C2 (de) * 1968-03-01 1984-10-11 General Electric Co., Schenectady, N.Y. Trägeranordnung und Verfahren zur elektrischen Kontaktierung von Halbleiterchips
US3628717A (en) * 1969-11-12 1971-12-21 Ibm Apparatus for positioning and bonding
US3641648A (en) * 1970-08-20 1972-02-15 Bell Telephone Labor Inc Piece part handling apparatus
US3793710A (en) * 1971-10-12 1974-02-26 Western Electric Co Methods of bonding a beam-lead device to a substrate
FR2205800B1 (US08124317-20120228-C00060.png) * 1972-11-09 1976-08-20 Honeywell Bull Soc Ind
US3838984A (en) * 1973-04-16 1974-10-01 Sperry Rand Corp Flexible carrier and interconnect for uncased ic chips
US3946931A (en) * 1974-11-27 1976-03-30 Western Electric Company, Inc. Methods of and apparatus for bonding an article to a substrate

Also Published As

Publication number Publication date
NL186125B (nl) 1990-04-17
GB1570406A (en) 1980-07-02
SE7701706L (sv) 1978-03-21
FR2365209B1 (US08124317-20120228-C00060.png) 1979-01-12
CH607328A5 (US08124317-20120228-C00060.png) 1978-12-15
SE412682B (sv) 1980-03-10
CA1076711A (fr) 1980-04-29
NL7705373A (nl) 1978-03-22
DE2704266A1 (de) 1978-03-23
JPS5338977A (en) 1978-04-10
BE851574A (fr) 1977-06-16
US4116376A (en) 1978-09-26
NL186125C (nl) 1990-09-17
FR2365209A1 (fr) 1978-04-14
JPS5823935B2 (ja) 1983-05-18

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Legal Events

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8110 Request for examination paragraph 44
8125 Change of the main classification

Ipc: H01L 21/98

8126 Change of the secondary classification

Free format text: H01L 21/58 H01L 21/92

D2 Grant after examination
8327 Change in the person/name/address of the patent owner

Owner name: CII HONEYWELL BULL, PARIS, FR

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee