DE2362560A1 - Doppeltfokussierendes massenspektrometer mit mehreren ionenstrahlen - Google Patents

Doppeltfokussierendes massenspektrometer mit mehreren ionenstrahlen

Info

Publication number
DE2362560A1
DE2362560A1 DE2362560A DE2362560A DE2362560A1 DE 2362560 A1 DE2362560 A1 DE 2362560A1 DE 2362560 A DE2362560 A DE 2362560A DE 2362560 A DE2362560 A DE 2362560A DE 2362560 A1 DE2362560 A1 DE 2362560A1
Authority
DE
Germany
Prior art keywords
electric field
ion beams
mass spectrometer
ion
ion beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE2362560A
Other languages
German (de)
English (en)
Inventor
Motohiro Naito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Publication of DE2362560A1 publication Critical patent/DE2362560A1/de
Ceased legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/32Static spectrometers using double focusing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/022Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE2362560A 1972-12-18 1973-12-17 Doppeltfokussierendes massenspektrometer mit mehreren ionenstrahlen Ceased DE2362560A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP47126947A JPS5222558B2 (enrdf_load_html_response) 1972-12-18 1972-12-18

Publications (1)

Publication Number Publication Date
DE2362560A1 true DE2362560A1 (de) 1974-06-20

Family

ID=14947820

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2362560A Ceased DE2362560A1 (de) 1972-12-18 1973-12-17 Doppeltfokussierendes massenspektrometer mit mehreren ionenstrahlen

Country Status (5)

Country Link
US (1) US3886357A (enrdf_load_html_response)
JP (1) JPS5222558B2 (enrdf_load_html_response)
DE (1) DE2362560A1 (enrdf_load_html_response)
FR (1) FR2210821B3 (enrdf_load_html_response)
GB (1) GB1441290A (enrdf_load_html_response)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3984682A (en) * 1974-07-12 1976-10-05 Nihon Denshi Kabushiki Kaisha Mass spectrometer with superimposed electric and magnetic fields
JPH0273723U (enrdf_load_html_response) * 1988-11-26 1990-06-05
GB9026777D0 (en) * 1990-12-10 1991-01-30 Vg Instr Group Mass spectrometer with electrostatic energy filter
CA2472271A1 (en) * 2002-01-03 2003-07-17 Gary M. Hieftje Simultaneous acquisation of chemical information
US6777670B1 (en) * 2003-03-31 2004-08-17 Beckman Coulter, Inc. Mass analyzer capable of parallel processing one or more analytes
EP1609169A2 (en) * 2003-03-31 2005-12-28 Beckman Coulter, Inc. Mass analyser allowing parallel processing one or more analytes

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2945126A (en) * 1958-06-23 1960-07-12 Bell & Howell Co Mass spectrometer
US3233099A (en) * 1963-09-16 1966-02-01 Cons Electrodynamics Corp Double-focusing mass spectrometer having electrically adjustable electrostatic an alyzer and adjustable electrostatic lens
US3475604A (en) * 1965-09-30 1969-10-28 Hitachi Ltd Mass spectrometer having means for simultaneously detecting single focussing and double focussing mass spectra
GB1149426A (en) * 1966-12-01 1969-04-23 Ass Elect Ind Improvements relating to mass spectrometry
US3796872A (en) * 1970-12-18 1974-03-12 Ass Elect Ind Mass spectrometry

Also Published As

Publication number Publication date
JPS5222558B2 (enrdf_load_html_response) 1977-06-17
FR2210821B3 (enrdf_load_html_response) 1976-10-15
FR2210821A1 (enrdf_load_html_response) 1974-07-12
GB1441290A (en) 1976-06-30
US3886357A (en) 1975-05-27
JPS4984489A (enrdf_load_html_response) 1974-08-14

Similar Documents

Publication Publication Date Title
DE69703624T2 (de) Geschwindigkeitsanalysator geladener teilchen
DE2813948C2 (enrdf_load_html_response)
DE19638577C1 (de) Simultane Fokussierung aller Massen in Flugzeitmassenspektrometern
DE69610158T2 (de) Verfahren zur Verwendung eines Quadrupolionenfallenmassenspektrometers
DE69118492T2 (de) Massenspektrometer mit elektrostatischem Energiefilter
DE102013015046B4 (de) Bildgebendes Massenspektrometer und Verfahren zum Steuern desselben
DE60126048T2 (de) Massenspektrometer und massenspektrometrisches Verfahren
EP0290712B1 (de) Massenspektrometer-Anordnung
DE2362560A1 (de) Doppeltfokussierendes massenspektrometer mit mehreren ionenstrahlen
DE2411841C3 (de) Auger-Elektronenspektrometer
DE1292884B (de) Verfahren und Vorrichtung zum massenspektrometrischen Analysieren eines Gasgemisches
DE10328599B4 (de) Verfahren zur Trennung von Ionen aufgrund ihrer Beweglichkeit
DE3430984A1 (de) Verfahren und vorrichtung zur registrierung von teilchen oder quanten mit hilfe eines detektors
DE1598569C3 (de) Doppelfokussierendes Massenspektrometer
DE102018122960B4 (de) Breitbandig hohe Massenauflösungen in Reflektor-Flugzeitmassenspektrometern
DE2461224C3 (de) Ortsempfindlicher Detektor für den Nachweis von Ionen in der Fokalebene eines Magneten eines Massenspektrometers
DE1034884B (de) Vorrichtung zum Trennen von Ionen verschiedenen Ladungs-Masse-Verhaeltnisses
DE2440120A1 (de) Vorrichtung zur wiedergabe der energieverteilung eines aus geladenen teilchen bestehenden strahles
DE2110220A1 (de) Einrichtung zum Nachweisen von Teilchen
DE2759116A1 (de) Massenspektrometer
DE2142942A1 (de) Verfahren und Vorrichtung zur Massen spektrometrie
DE2719243A1 (de) Verfahren und vorrichtung zur analyse mittels massenspektrographie unter verwendung eines funkenerregten massenspektrographen
DE2313852C3 (de) lonen-Mikroanalysator
DE2224906A1 (de) Verfahren und Vorrichtung zur massenspektrometrischen Analyse von Stoffen
DE3228816A1 (de) Verfahren der roentgen-tomographie zur darstellung eines koerperschnittbildes

Legal Events

Date Code Title Description
OD Request for examination
8131 Rejection