DE2345096A1 - Verfahren zur herstellung einer feldemissionskatode - Google Patents

Verfahren zur herstellung einer feldemissionskatode

Info

Publication number
DE2345096A1
DE2345096A1 DE19732345096 DE2345096A DE2345096A1 DE 2345096 A1 DE2345096 A1 DE 2345096A1 DE 19732345096 DE19732345096 DE 19732345096 DE 2345096 A DE2345096 A DE 2345096A DE 2345096 A1 DE2345096 A1 DE 2345096A1
Authority
DE
Germany
Prior art keywords
tip
wire
current
temperature
metal wire
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19732345096
Other languages
German (de)
English (en)
Inventor
Lynwood W Swanson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Linfield Research Institute
Original Assignee
Linfield Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Linfield Research Institute filed Critical Linfield Research Institute
Publication of DE2345096A1 publication Critical patent/DE2345096A1/de
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/06Electron sources; Electron guns
    • H01J37/073Electron guns using field emission, photo emission, or secondary emission electron sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/02Manufacture of electrodes or electrode systems
    • H01J9/022Manufacture of electrodes or electrode systems of cold cathodes
    • H01J9/025Manufacture of electrodes or electrode systems of cold cathodes of field emission cathodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/063Electron sources
    • H01J2237/06308Thermionic sources
    • H01J2237/06316Schottky emission

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Cold Cathode And The Manufacture (AREA)
  • Cathode-Ray Tubes And Fluorescent Screens For Display (AREA)
DE19732345096 1972-09-29 1973-09-06 Verfahren zur herstellung einer feldemissionskatode Pending DE2345096A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00293322A US3817592A (en) 1972-09-29 1972-09-29 Method for reproducibly fabricating and using stable thermal-field emission cathodes

Publications (1)

Publication Number Publication Date
DE2345096A1 true DE2345096A1 (de) 1974-04-04

Family

ID=23128615

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19732345096 Pending DE2345096A1 (de) 1972-09-29 1973-09-06 Verfahren zur herstellung einer feldemissionskatode

Country Status (7)

Country Link
US (1) US3817592A (fr)
JP (1) JPS585496B2 (fr)
CA (1) CA1014602A (fr)
DE (1) DE2345096A1 (fr)
FR (1) FR2201533B1 (fr)
GB (1) GB1445695A (fr)
NL (1) NL7313420A (fr)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3947716A (en) * 1973-08-27 1976-03-30 The United States Of America As Represented By The Secretary Of The Army Field emission tip and process for making same
JPS5062766A (fr) * 1973-10-05 1975-05-28
US3919580A (en) * 1974-09-11 1975-11-11 Us Energy Relativistic electron beam generator
US4324999A (en) * 1980-04-30 1982-04-13 Burroughs Corporation Electron-beam cathode having a uniform emission pattern
US4486684A (en) * 1981-05-26 1984-12-04 International Business Machines Corporation Single crystal lanthanum hexaboride electron beam emitter having high brightness
US4588928A (en) * 1983-06-15 1986-05-13 At&T Bell Laboratories Electron emission system
JPS60225345A (ja) * 1984-04-20 1985-11-09 Hitachi Ltd 電界放射方法およびそれに用いる電子線装置
EP0287774A3 (fr) * 1987-04-24 1990-03-07 Balzers Aktiengesellschaft Cathode thermionique en épingle à cheveux
US5012194A (en) * 1989-09-05 1991-04-30 Raytheon Company Method testing electron discharge tubes
US5459296A (en) * 1990-12-15 1995-10-17 Sidmar N.V. Method for the low-maintenance operation of an apparatus for producing a surface structure, and apparatus
FR2707795B1 (fr) * 1993-07-12 1995-08-11 Commissariat Energie Atomique Perfectionnement à un procédé de fabrication d'une source d'électrons à micropointes.
FR2750785B1 (fr) * 1996-07-02 1998-11-06 Pixtech Sa Procede de regeneration de micropointes d'un ecran plat de visualisation
JP2807668B2 (ja) * 1997-03-27 1998-10-08 株式会社日立製作所 電子ビーム欠陥検査方法および装置
US9159527B2 (en) * 2003-10-16 2015-10-13 Carl Zeiss Microscopy, Llc Systems and methods for a gas field ionization source
JP2006059513A (ja) * 2004-07-22 2006-03-02 Kuresutetsuku:Kk 電子ビーム照射装置および描画装置
US7888654B2 (en) * 2007-01-24 2011-02-15 Fei Company Cold field emitter
US8736170B1 (en) 2011-02-22 2014-05-27 Fei Company Stable cold field emission electron source
CN102629538B (zh) 2012-04-13 2014-03-19 吴江炀晟阴极材料有限公司 具有低逸出功和高化学稳定性的电极材料
US9697983B1 (en) * 2016-02-29 2017-07-04 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Thermal field emitter tip, electron beam device including a thermal field emitter tip and method for operating an electron beam device
US11887805B2 (en) 2021-09-30 2024-01-30 Fei Company Filament-less electron source
WO2024018570A1 (fr) * 2022-07-20 2024-01-25 株式会社日立ハイテク Source de particules chargées, canon à particules chargées et dispositif à faisceau de particules chargées

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3374386A (en) * 1964-11-02 1968-03-19 Field Emission Corp Field emission cathode having tungsten miller indices 100 plane coated with zirconium, hafnium or magnesium on oxygen binder
US3356887A (en) * 1965-07-30 1967-12-05 Frederick C W Heil Fe cathode redesign

Also Published As

Publication number Publication date
NL7313420A (fr) 1974-04-02
JPS585496B2 (ja) 1983-01-31
GB1445695A (en) 1976-08-11
FR2201533B1 (fr) 1977-05-13
JPS4973967A (fr) 1974-07-17
US3817592A (en) 1974-06-18
CA1014602A (en) 1977-07-26
FR2201533A1 (fr) 1974-04-26

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Legal Events

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OHA Expiration of time for request for examination