DE19833131C2 - Anordnung zur Kontaktierung von elektronischen Bauelementen auf flexiblen Substraten - Google Patents
Anordnung zur Kontaktierung von elektronischen Bauelementen auf flexiblen SubstratenInfo
- Publication number
- DE19833131C2 DE19833131C2 DE19833131A DE19833131A DE19833131C2 DE 19833131 C2 DE19833131 C2 DE 19833131C2 DE 19833131 A DE19833131 A DE 19833131A DE 19833131 A DE19833131 A DE 19833131A DE 19833131 C2 DE19833131 C2 DE 19833131C2
- Authority
- DE
- Germany
- Prior art keywords
- arrangement according
- contact
- substrate
- components
- designed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000758 substrate Substances 0.000 title claims description 29
- 239000000463 material Substances 0.000 claims description 12
- 238000005516 engineering process Methods 0.000 claims description 8
- 229920001971 elastomer Polymers 0.000 claims description 7
- 239000000806 elastomer Substances 0.000 claims description 4
- 238000003780 insertion Methods 0.000 claims description 2
- 230000037431 insertion Effects 0.000 claims description 2
- 229920002725 thermoplastic elastomer Polymers 0.000 claims description 2
- 238000005266 casting Methods 0.000 claims 2
- 150000001875 compounds Chemical class 0.000 claims 1
- 239000006260 foam Substances 0.000 claims 1
- 239000003292 glue Substances 0.000 claims 1
- 230000002093 peripheral effect Effects 0.000 claims 1
- 238000000034 method Methods 0.000 description 13
- 239000000853 adhesive Substances 0.000 description 6
- 230000001070 adhesive effect Effects 0.000 description 6
- 239000004020 conductor Substances 0.000 description 6
- 230000000712 assembly Effects 0.000 description 5
- 238000000429 assembly Methods 0.000 description 5
- 238000010276 construction Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000005476 soldering Methods 0.000 description 5
- 239000002699 waste material Substances 0.000 description 5
- 238000009826 distribution Methods 0.000 description 4
- 238000005304 joining Methods 0.000 description 4
- 229910000679 solder Inorganic materials 0.000 description 4
- 238000004026 adhesive bonding Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000011888 foil Substances 0.000 description 3
- 238000004064 recycling Methods 0.000 description 3
- 230000008439 repair process Effects 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 239000011324 bead Substances 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 239000013013 elastic material Substances 0.000 description 2
- 230000005670 electromagnetic radiation Effects 0.000 description 2
- 239000010793 electronic waste Substances 0.000 description 2
- 239000003344 environmental pollutant Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000004377 microelectronic Methods 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 231100000719 pollutant Toxicity 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 229910007116 SnPb Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 229920006351 engineering plastic Polymers 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 238000005194 fractionation Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000003673 groundwater Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 229910001385 heavy metal Inorganic materials 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000010329 laser etching Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 231100000572 poisoning Toxicity 0.000 description 1
- 230000000607 poisoning effect Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 239000004945 silicone rubber Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 229920006259 thermoplastic polyimide Polymers 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- 238000012549 training Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/325—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor
- H05K3/326—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor the printed circuit having integral resilient or deformable parts, e.g. tabs or parts of flexible circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/563—Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/16237—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bonding area disposed in a recess of the surface of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73253—Bump and layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01046—Palladium [Pd]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Metallurgy (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Combinations Of Printed Boards (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Description
- - Weichlöten mit Pb-freien Loten, beispielsweise SnBi- Lotlegierungen,
- - Kleben, zum Beispiel isotropisches oder anisotropi sches Leitkleben,
- - Schweißen, wie Widerstands- und Laserschweißen sowie TC/TS und US-Bonden,
- - kraftschlüssiges Fügen, insbesondere durch Federkon
takte oder Einpress- bzw. Klemmtechniken,
die beispielsweise in Werner, W.; Kriebel, F.; Hopf, P.; Seidowski, T.; Drescher, K.: Umweltgerechte alternative Verbindungsverfahren in der Elektronik, Wissenschaftliche Zeitschrift der TU Dresden 44 (1995) Heft 4, S. 27-31 oder auch in Erni Elektroapparate GmbH: Einpreßtechnik nicht nur bei High-end- Anwendungen, Productronic 18 (1998) Heft 4/5, S. 38- 42 sowie in Dage Electronic Europa-Vertriebs GmbH: Kleben statt Löten, Productronic 13 (1993) Heft 11, S. 16-20 beschrieben werden.
- - geringe Material-, Herstellungs- und Prüfkosten,
- - geringe Wartungs- und Reparaturkosten,
- - geringe Recycling- und Entsorgungskosten,
- - hohe Fertigungsausbeute und Fertigungszuverlässigkeit,
- - Vermeidung von thermischen Belastungen beim Kontak tiervorgang,
- - Vereinfachung und wesentliche Reduzierung von Prozess schritten,
- - Vermeidung von Umwelt belastenden Prozessschritten, d. h. es ist ein emissionsarmes sowie Ressourcen schonendes Kontaktieren möglich,
- - Anstieg des Spektrums möglicher ökologisch günstiger Werkstoffpaarungen,
- - Eliminierung von Schadstoffen im Kontaktsystem,
- - Minimierung des Aufwandes für Prüfung und Reparatur,
- - Verwendung von Ausrüstungen aus der klassischen Löt montage,
- - Unbeeinflussbarkeit der Kontaktstabilität auch bei unterschiedlichen thermischen Ausdehnungskoeffizienten des flexiblen Substrates und der Bauelemente sowie bei Schock und Vibration,
- - Optimierung des thermischen Managements, d. h. homogene Wärmeverteilung und optimale Wärmeableitung durch den Einsatz thermisch leitfähiger Materialien.
T = Anzugs- bzw. Drehmoment in Ncm
N = Anzahl der Befestigungspunkte
D = Befestigungselement-Durchmesser in cm
A = Auflage- bzw. Kontaktoberfläche in cm2
µ = mittlerer Reibungskoeffizient (0,2 wird als Näherungswert verwendet, der je nach der spezifischen Anwendung bis zu 50% variieren kann).
Claims (13)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19833131A DE19833131C2 (de) | 1998-07-23 | 1998-07-23 | Anordnung zur Kontaktierung von elektronischen Bauelementen auf flexiblen Substraten |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19833131A DE19833131C2 (de) | 1998-07-23 | 1998-07-23 | Anordnung zur Kontaktierung von elektronischen Bauelementen auf flexiblen Substraten |
Publications (2)
Publication Number | Publication Date |
---|---|
DE19833131A1 DE19833131A1 (de) | 2000-04-13 |
DE19833131C2 true DE19833131C2 (de) | 2003-08-07 |
Family
ID=7875030
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19833131A Expired - Fee Related DE19833131C2 (de) | 1998-07-23 | 1998-07-23 | Anordnung zur Kontaktierung von elektronischen Bauelementen auf flexiblen Substraten |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE19833131C2 (de) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004001661A1 (de) * | 2004-01-12 | 2005-08-11 | Infineon Technologies Ag | Verfahren zum elektrischen Verbinden eines elektrischen Leiters mit einem elektronischen Bauelement und Vorrichtung |
DE102004039565A1 (de) * | 2004-08-13 | 2006-02-23 | Kerafol Keramische Folien Gmbh | Mehrlagige Wärmeleitfolie |
DE102007041419A1 (de) * | 2007-08-31 | 2009-03-12 | Sew-Eurodrive Gmbh & Co. Kg | Vorrichtung, insbesondere Elektrogerät, und Verfahren |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10121480A1 (de) * | 2001-05-03 | 2002-11-14 | Bosch Gmbh Robert | Verstelleinrichtung und Verfahren zum Umschalten eines Kraftfahrzeugscheinwerfers |
DE10343255B4 (de) | 2003-09-17 | 2006-10-12 | Infineon Technologies Ag | Verfahren zum Herstellen elektrischer Verbindungen zwischen einem Halbleiterchip in einem BGA-Gehäuse und einer Leiterplatte |
DE10343256B4 (de) | 2003-09-17 | 2006-08-10 | Infineon Technologies Ag | Anordnung zur Herstellung einer elektrischen Verbindung zwischen einem BGA-Package und einer Signalquelle, sowie Verfahren zum Herstellen einer solchen Verbindung |
DE102006021095B4 (de) * | 2006-05-05 | 2008-09-04 | Continental Automotive Gmbh | Leiterbahnträgervorrichtung |
DE102006062485A1 (de) * | 2006-12-28 | 2008-07-03 | Robert Bosch Gmbh | Elektrische Kontaktiervorrichtung, insbesondere für elektronische Schaltungen, und elektrische/elektronische Schaltung |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DD214275A1 (de) * | 1983-03-11 | 1984-10-03 | Werk Fernsehelektronik Veb | Kontaktverbindung |
DE3641353A1 (de) * | 1986-12-03 | 1988-06-09 | Schoeller & Co Elektrotech | Einrichtung zur kontaktierung von anschluessen |
-
1998
- 1998-07-23 DE DE19833131A patent/DE19833131C2/de not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DD214275A1 (de) * | 1983-03-11 | 1984-10-03 | Werk Fernsehelektronik Veb | Kontaktverbindung |
DE3641353A1 (de) * | 1986-12-03 | 1988-06-09 | Schoeller & Co Elektrotech | Einrichtung zur kontaktierung von anschluessen |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004001661A1 (de) * | 2004-01-12 | 2005-08-11 | Infineon Technologies Ag | Verfahren zum elektrischen Verbinden eines elektrischen Leiters mit einem elektronischen Bauelement und Vorrichtung |
DE102004039565A1 (de) * | 2004-08-13 | 2006-02-23 | Kerafol Keramische Folien Gmbh | Mehrlagige Wärmeleitfolie |
DE102007041419A1 (de) * | 2007-08-31 | 2009-03-12 | Sew-Eurodrive Gmbh & Co. Kg | Vorrichtung, insbesondere Elektrogerät, und Verfahren |
DE102007041419B4 (de) | 2007-08-31 | 2022-03-31 | Sew-Eurodrive Gmbh & Co Kg | Anordnung zum Kühlen von elektrischen Bauelementen sowie Umrichter und Kompaktantrieb damit |
Also Published As
Publication number | Publication date |
---|---|
DE19833131A1 (de) | 2000-04-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2007147750A1 (de) | Verfahren zur fixierung eines elektrischen oder elektronischen bauteils, insbesondere einer leiterplatte, in einem gehäuse sowie fixierelement dafür | |
DE112004002395B4 (de) | Elektronische Kontrolleinheit für Kraftfahrzeugbremssysteme | |
DE102005044867B4 (de) | Kombiniertes Befestigungs- und Kontaktierungssystem für elektrische Bauelemente auf übereinander angeordneten Leiterplatten | |
DE112015003987B4 (de) | Schaltungsbaugruppe, elektrischer Verteiler und Herstellungsverfahren für eine Schaltungsbaugruppe | |
DE112015002430T5 (de) | Schaltungsbaugruppe und elektrischer Verteiler | |
DE19833131C2 (de) | Anordnung zur Kontaktierung von elektronischen Bauelementen auf flexiblen Substraten | |
DE4220966C2 (de) | Verfahren zum Herstellen einer Trägerplatte für elektrische Bauteile | |
EP2695499B1 (de) | Gehäuseseitige trennschicht zur stressentkopplung von vergossenen elektroniken | |
DE102015214311A1 (de) | Elektronikmodul mit über Sockelelement flexibel platzierbarem Bauelement und Verfahren zum Fertigen desselben | |
WO2011107348A1 (de) | Vorrichtung zur abschirmung eines elektronikmoduls | |
DE102011085170A1 (de) | Steuermodul mit verklebter Trägerplatte | |
DE112015004789T5 (de) | Schaltungsbaugruppe und Verfahren zum Herstellen einer Schaltungsbaugruppe | |
DE3627372C2 (de) | ||
EP0902611B1 (de) | Recyclingfähige Leiterplatte bestehend aus einem Folien- und Trägersystem | |
DE102014101024B3 (de) | Leistungshalbleitereinrichtung | |
DE10210041B4 (de) | Wärmeableitvorrichtung zum Ableiten von Wärme, die von einem elektrischen Bauelement erzeugt wird und Verfahren zum Herstellen einer derartigen Wärmeableitvorrichtung | |
DE102007041419B4 (de) | Anordnung zum Kühlen von elektrischen Bauelementen sowie Umrichter und Kompaktantrieb damit | |
DE10233641B4 (de) | Verfahren zur Verbindung einer integrierten Schaltung mit einem Substrat und entsprechende Schaltungsanordnung | |
WO2020064350A1 (de) | Verfahren für eine montage eines elektrischen geräts und zugehöriges elektrisches gerät | |
EP1659837B1 (de) | Kontaktierung eines Bauelementes auf einem Stanzgitter | |
EP2288246B1 (de) | Leistungshalbleitermodul und Verfahren zur Montage eines Leistungshalbleitermoduls | |
DE102013226097B4 (de) | Mehrschichtig ausgebildeter Schaltungsträger | |
DE102006032441A1 (de) | Vorrichtung aufweisend eine Leiterplatte und ein Modul sowie Verfahren zum Aufbau einer derartigen Vorrichtung | |
DE10142975B4 (de) | Wärmeableitelement für elktronische Bauteile und Verfahren zum Anbringen desselben | |
DE10117797C2 (de) | Montagevorrichtung und Verfahren zum Aufbau eines elektronischen Bauteils |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8127 | New person/name/address of the applicant |
Owner name: INFINEON TECHNOLOGIES AG, 81669 MUENCHEN, DE |
|
8181 | Inventor (new situation) |
Free format text: HANKE, ANDRE, 15344 STRAUSBERG, DE |
|
8304 | Grant after examination procedure | ||
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: QIMONDA AG, 81739 MUENCHEN, DE |
|
R081 | Change of applicant/patentee |
Owner name: INFINEON TECHNOLOGIES AG, DE Free format text: FORMER OWNER: QIMONDA AG, 81739 MUENCHEN, DE Owner name: POLARIS INNOVATIONS LTD., IE Free format text: FORMER OWNER: QIMONDA AG, 81739 MUENCHEN, DE |
|
R081 | Change of applicant/patentee |
Owner name: POLARIS INNOVATIONS LTD., IE Free format text: FORMER OWNER: INFINEON TECHNOLOGIES AG, 85579 NEUBIBERG, DE |
|
R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |