DE1811277C3 - Verfahren zum Herstellen von p-dotierten Zonen mit unterschiedlichen Eindringtiefen in einer n-Silicium-Schicht - Google Patents
Verfahren zum Herstellen von p-dotierten Zonen mit unterschiedlichen Eindringtiefen in einer n-Silicium-SchichtInfo
- Publication number
- DE1811277C3 DE1811277C3 DE1811277A DE1811277A DE1811277C3 DE 1811277 C3 DE1811277 C3 DE 1811277C3 DE 1811277 A DE1811277 A DE 1811277A DE 1811277 A DE1811277 A DE 1811277A DE 1811277 C3 DE1811277 C3 DE 1811277C3
- Authority
- DE
- Germany
- Prior art keywords
- layer
- boron oxide
- silicon layer
- glass layer
- doped zones
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/6922—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
- H10P14/6923—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC the material being boron or phosphorus doped silicon oxides, e.g. BPSG, BSG or PSG
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/65—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
- H10P14/6516—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials
- H10P14/6529—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by exposure to a gas or vapour
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/14—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase
- H10P32/1408—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase from or through or into an external applied layer, e.g. photoresist or nitride layers
- H10P32/141—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase from or through or into an external applied layer, e.g. photoresist or nitride layers the applied layer comprising oxides only
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/17—Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material
- H10P32/171—Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material being group IV material
Landscapes
- Thin Film Transistor (AREA)
- Junction Field-Effect Transistors (AREA)
- Formation Of Insulating Films (AREA)
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE1811277A DE1811277C3 (de) | 1968-11-27 | 1968-11-27 | Verfahren zum Herstellen von p-dotierten Zonen mit unterschiedlichen Eindringtiefen in einer n-Silicium-Schicht |
| NL6914784A NL6914784A (https=) | 1968-11-27 | 1969-09-30 | |
| AT1099969A AT320030B (de) | 1968-11-27 | 1969-11-25 | Verfahren zum Herstellen von Feldeffekttransistoren mit p-dotierten Zonen mit unterschiedlichen Eindringtiefen in Silizium |
| FR6940726A FR2024352B1 (https=) | 1968-11-27 | 1969-11-26 | |
| JP44094361A JPS4826662B1 (https=) | 1968-11-27 | 1969-11-26 | |
| CH1762069A CH508275A (de) | 1968-11-27 | 1969-11-26 | Verfahren zum Herstellen von p-dotierten Zonen mit unterschiedlichen Eindringtiefen in einem Siliciumhalbleiterkörper |
| GB1232727D GB1232727A (https=) | 1968-11-27 | 1969-11-26 | |
| SE16362/69A SE344385B (https=) | 1968-11-27 | 1969-11-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE1811277A DE1811277C3 (de) | 1968-11-27 | 1968-11-27 | Verfahren zum Herstellen von p-dotierten Zonen mit unterschiedlichen Eindringtiefen in einer n-Silicium-Schicht |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| DE1811277A1 DE1811277A1 (de) | 1970-06-18 |
| DE1811277B2 DE1811277B2 (de) | 1977-09-08 |
| DE1811277C3 true DE1811277C3 (de) | 1978-06-08 |
Family
ID=5714504
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE1811277A Expired DE1811277C3 (de) | 1968-11-27 | 1968-11-27 | Verfahren zum Herstellen von p-dotierten Zonen mit unterschiedlichen Eindringtiefen in einer n-Silicium-Schicht |
Country Status (8)
| Country | Link |
|---|---|
| JP (1) | JPS4826662B1 (https=) |
| AT (1) | AT320030B (https=) |
| CH (1) | CH508275A (https=) |
| DE (1) | DE1811277C3 (https=) |
| FR (1) | FR2024352B1 (https=) |
| GB (1) | GB1232727A (https=) |
| NL (1) | NL6914784A (https=) |
| SE (1) | SE344385B (https=) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2092730A1 (en) * | 1970-06-12 | 1972-01-28 | Radiotechnique Compelec | Boron diffusion in silicon - from diborane, oxygen nitrogen mixtures |
| JPS51127564U (https=) * | 1975-04-09 | 1976-10-15 | ||
| US4099997A (en) * | 1976-06-21 | 1978-07-11 | Rca Corporation | Method of fabricating a semiconductor device |
| NL8006668A (nl) * | 1980-12-09 | 1982-07-01 | Philips Nv | Werkwijze voor het vervaardigen van een halfgeleiderinrichting. |
| DE102009041546A1 (de) * | 2009-03-27 | 2010-10-14 | Bosch Solar Energy Ag | Verfahren zur Herstellung von Solarzellen mit selektivem Emitter |
-
1968
- 1968-11-27 DE DE1811277A patent/DE1811277C3/de not_active Expired
-
1969
- 1969-09-30 NL NL6914784A patent/NL6914784A/xx unknown
- 1969-11-25 AT AT1099969A patent/AT320030B/de not_active IP Right Cessation
- 1969-11-26 FR FR6940726A patent/FR2024352B1/fr not_active Expired
- 1969-11-26 JP JP44094361A patent/JPS4826662B1/ja active Pending
- 1969-11-26 GB GB1232727D patent/GB1232727A/en not_active Expired
- 1969-11-26 CH CH1762069A patent/CH508275A/de not_active IP Right Cessation
- 1969-11-27 SE SE16362/69A patent/SE344385B/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| DE1811277B2 (de) | 1977-09-08 |
| JPS4826662B1 (https=) | 1973-08-14 |
| FR2024352B1 (https=) | 1974-05-03 |
| AT320030B (de) | 1975-01-27 |
| GB1232727A (https=) | 1971-05-19 |
| DE1811277A1 (de) | 1970-06-18 |
| NL6914784A (https=) | 1970-05-29 |
| SE344385B (https=) | 1972-04-10 |
| FR2024352A1 (https=) | 1970-08-28 |
| CH508275A (de) | 1971-05-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C3 | Grant after two publication steps (3rd publication) | ||
| 8339 | Ceased/non-payment of the annual fee |