DE1614595B2 - Korpuskularstrahlgeraet zur abbildung eines praeparates mittels kokeln insbesondere elektronenmikroskop - Google Patents

Korpuskularstrahlgeraet zur abbildung eines praeparates mittels kokeln insbesondere elektronenmikroskop

Info

Publication number
DE1614595B2
DE1614595B2 DE19671614595 DE1614595A DE1614595B2 DE 1614595 B2 DE1614595 B2 DE 1614595B2 DE 19671614595 DE19671614595 DE 19671614595 DE 1614595 A DE1614595 A DE 1614595A DE 1614595 B2 DE1614595 B2 DE 1614595B2
Authority
DE
Germany
Prior art keywords
preparation
cooling
corpuscular
corpuscular beam
frozen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19671614595
Other languages
German (de)
English (en)
Other versions
DE1614595A1 (de
Inventor
Karl Heinz Dr 1000 Berlin Herrmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE19671614595 priority Critical patent/DE1614595B2/de
Priority to GB1232878D priority patent/GB1232878A/en
Publication of DE1614595A1 publication Critical patent/DE1614595A1/de
Publication of DE1614595B2 publication Critical patent/DE1614595B2/de
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/244Detectors; Associated components or circuits therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244Detection characterized by the detecting means
    • H01J2237/2441Semiconductor detectors, e.g. diodes
    • H01J2237/24415X-ray
    • H01J2237/2442Energy-dispersive (Si-Li type) spectrometer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244Detection characterized by the detecting means
    • H01J2237/2445Photon detectors for X-rays, light, e.g. photomultipliers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244Detection characterized by the detecting means
    • H01J2237/2446Position sensitive detectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245Detection characterised by the variable being measured
    • H01J2237/24507Intensity, dose or other characteristics of particle beams or electromagnetic radiation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245Detection characterised by the variable being measured
    • H01J2237/24571Measurements of non-electric or non-magnetic variables
    • H01J2237/24585Other variables, e.g. energy, mass, velocity, time, temperature

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
DE19671614595 1967-09-01 1967-09-01 Korpuskularstrahlgeraet zur abbildung eines praeparates mittels kokeln insbesondere elektronenmikroskop Withdrawn DE1614595B2 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE19671614595 DE1614595B2 (de) 1967-09-01 1967-09-01 Korpuskularstrahlgeraet zur abbildung eines praeparates mittels kokeln insbesondere elektronenmikroskop
GB1232878D GB1232878A (enrdf_load_stackoverflow) 1967-09-01 1968-08-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19671614595 DE1614595B2 (de) 1967-09-01 1967-09-01 Korpuskularstrahlgeraet zur abbildung eines praeparates mittels kokeln insbesondere elektronenmikroskop

Publications (2)

Publication Number Publication Date
DE1614595A1 DE1614595A1 (de) 1970-10-29
DE1614595B2 true DE1614595B2 (de) 1972-03-30

Family

ID=5682002

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19671614595 Withdrawn DE1614595B2 (de) 1967-09-01 1967-09-01 Korpuskularstrahlgeraet zur abbildung eines praeparates mittels kokeln insbesondere elektronenmikroskop

Country Status (2)

Country Link
DE (1) DE1614595B2 (enrdf_load_stackoverflow)
GB (1) GB1232878A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010056321B9 (de) * 2010-12-27 2018-03-22 Carl Zeiss Microscopy Gmbh Partikelstrahlmikroskop
CN105789004B (zh) * 2016-04-20 2018-01-23 兰州大学 一种全温区热电两场扫描电镜原位物性测量台及测量方法
US9972474B2 (en) 2016-07-31 2018-05-15 Fei Company Electron microscope with multiple types of integrated x-ray detectors arranged in an array

Also Published As

Publication number Publication date
DE1614595A1 (de) 1970-10-29
GB1232878A (enrdf_load_stackoverflow) 1971-05-19

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Legal Events

Date Code Title Description
SH Request for examination between 03.10.1968 and 22.04.1971
E77 Valid patent as to the heymanns-index 1977
EHJ Ceased/non-payment of the annual fee