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Siemens Corp
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Siemens Corp
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Publication of DE1544270A1publicationCriticalpatent/DE1544270A1/de
C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
C30B31/00—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
C30B31/06—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion material in the gaseous state
H10P32/00—
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Engineering & Computer Science
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Crystallography & Structural Chemistry
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Materials Engineering
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Metallurgy
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Organic Chemistry
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Crystals, And After-Treatments Of Crystals
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DE196515442701965-10-191965-10-19Verfahren zum Dotieren eines Halbleiterkristalls aus der Gasphase im stationaeren System
PendingDE1544270A1
(de)
Verfahren zur Bildung einer Ti- und einer TiN-Schicht auf einem Halbleiterkörper durch eine Sputter-Methode, mit einer zusätzlichen Stufe zur Reinigung des Targets
Verfahren zur Herstellung gasfoermiger chemischer Verbindungen in regelbaren Mengen,Verfahren zur Anwendung dieser Verbindungen und Vorrichtungen zur Durchfuehrung dieser Verfahren