DE1514488A1 - Verfahren zum Herstellen einer Verbundhalbleiteranordnung - Google Patents
Verfahren zum Herstellen einer VerbundhalbleiteranordnungInfo
- Publication number
- DE1514488A1 DE1514488A1 DE19651514488 DE1514488A DE1514488A1 DE 1514488 A1 DE1514488 A1 DE 1514488A1 DE 19651514488 DE19651514488 DE 19651514488 DE 1514488 A DE1514488 A DE 1514488A DE 1514488 A1 DE1514488 A1 DE 1514488A1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor
- insulating
- carrier
- layer
- areas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims description 48
- 238000000034 method Methods 0.000 title claims description 11
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 150000001875 compounds Chemical class 0.000 title claims description 6
- 239000000463 material Substances 0.000 claims description 13
- 239000011810 insulating material Substances 0.000 claims description 9
- 238000000151 deposition Methods 0.000 claims description 8
- 238000009792 diffusion process Methods 0.000 claims description 6
- 239000013078 crystal Substances 0.000 claims description 5
- 239000002019 doping agent Substances 0.000 claims description 2
- 239000010410 layer Substances 0.000 claims 9
- 244000025254 Cannabis sativa Species 0.000 claims 1
- 239000000853 adhesive Substances 0.000 claims 1
- 230000001070 adhesive effect Effects 0.000 claims 1
- 239000002344 surface layer Substances 0.000 claims 1
- 229910052710 silicon Inorganic materials 0.000 description 15
- 239000010703 silicon Substances 0.000 description 15
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 14
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 230000008021 deposition Effects 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 239000012495 reaction gas Substances 0.000 description 4
- 235000012239 silicon dioxide Nutrition 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000000407 epitaxy Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 229910008065 Si-SiO Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- -1 Silicon halides Chemical class 0.000 description 1
- 229910006405 Si—SiO Inorganic materials 0.000 description 1
- 239000012876 carrier material Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000004049 embossing Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 210000003608 fece Anatomy 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 150000003377 silicon compounds Chemical class 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76264—SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/764—Air gaps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76264—SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
- H01L21/76289—Lateral isolation by air gap
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/035—Diffusion through a layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/085—Isolated-integrated
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/977—Thinning or removal of substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Recrystallisation Techniques (AREA)
- Formation Of Insulating Films (AREA)
- Element Separation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DES0097877 | 1965-06-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE1514488A1 true DE1514488A1 (de) | 1969-04-24 |
Family
ID=7521054
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19651514488 Pending DE1514488A1 (de) | 1965-06-29 | 1965-06-29 | Verfahren zum Herstellen einer Verbundhalbleiteranordnung |
Country Status (6)
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60777B2 (ja) * | 1979-05-25 | 1985-01-10 | 株式会社東芝 | Mos半導体集積回路 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3290753A (en) * | 1963-08-19 | 1966-12-13 | Bell Telephone Labor Inc | Method of making semiconductor integrated circuit elements |
US3320485A (en) * | 1964-03-30 | 1967-05-16 | Trw Inc | Dielectric isolation for monolithic circuit |
US3332137A (en) * | 1964-09-28 | 1967-07-25 | Rca Corp | Method of isolating chips of a wafer of semiconductor material |
US3390022A (en) * | 1965-06-30 | 1968-06-25 | North American Rockwell | Semiconductor device and process for producing same |
-
1965
- 1965-06-29 DE DE19651514488 patent/DE1514488A1/de active Pending
-
1966
- 1966-05-26 NL NL6607320A patent/NL6607320A/xx unknown
- 1966-06-27 US US560409A patent/US3445927A/en not_active Expired - Lifetime
- 1966-06-27 CH CH927566A patent/CH455944A/de unknown
- 1966-06-28 SE SE08813/66A patent/SE336846B/xx unknown
- 1966-06-28 GB GB28904/66A patent/GB1129537A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
CH455944A (de) | 1968-05-15 |
GB1129537A (en) | 1968-10-09 |
SE336846B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1971-07-19 |
NL6607320A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1966-12-30 |
US3445927A (en) | 1969-05-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE3850843T2 (de) | Verfahren zur Herstellung von epitaxial abgelagertem fehlerfreien Silizium. | |
DE1764281C3 (de) | Verfahren zum Herstellen einer Halbleitervorrichtung | |
DE1289191B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | ||
EP0600276A2 (de) | Verfahren zur Herstellung eines seitlich begrenzten, einkristallinen Gebietes mittels selektiver Epitaxie und dessen Anwendung zur Herstellung eines Bipolartransistors sowie eines MOS-transistors | |
DE2030805A1 (de) | Verfahren zur Ausbildung epitaxialer Kristalle oder Plattchen in ausgewählten Bereichen von Substraten | |
DE2615754C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | ||
DE1931949A1 (de) | Herstellung von Halbleiteranordnungen | |
DE2626738A1 (de) | Verfahren zur bildung versenkter dielektrischer isolationszonen bei monolithisch integrierten halbleiterschaltungen | |
DE1640500A1 (de) | Verfahren zur Herstellung von Festkoerper-Schaltungsanordnungen | |
DE2500207A1 (de) | Integrierte halbleiteranordnung und verfahren zu ihrer herstellung | |
DE2238450A1 (de) | Halbleiterbaugruppe und verfahren zur herstellung derselben | |
DE2115455A1 (de) | Halbleiterbauteil | |
DE1963162B2 (de) | Verfahren zur Herstellung mehrerer Halbleiterbauelemente aus einer einkristallinen Halbleiterscheibe | |
DE2509585C3 (de) | Halbleiterbauelement mit mehreren epitaktischen Halbleiterschichten, insbesondere Halbleiterlaser oder Feldeffektransistor, sowie Verfahren zu dessen Herstellung | |
DE1965406C3 (de) | Monolithische integrierte Halbleiterschaltung und Verwendung eines an sich bekannten Verfahrens zu ihrer Herstellung | |
DE2401380A1 (de) | Verfahren zur herstellung einer duennen einkristallinen siliciumschicht hoher qualitaet auf einer isolierenden substratschicht sowie halbleiteranordnung mit einer duennen hochqualitativen monokristallinen siliciumschicht | |
DE2643016A1 (de) | Verfahren zur herstellung eines integrierten halbleiterkreises | |
DE2133976B2 (de) | Monolithisch integrierte Halbleiteranordnung | |
DE1965408C3 (de) | Verfahren zum Herstellen eines Halbleiterbauelementes | |
DE2305902A1 (de) | Verfahren zur erzielung eines genau eingestellten hohen widerstandswerts in einem in einer einkristallinen basis gebildeten widerstand | |
DE1514488A1 (de) | Verfahren zum Herstellen einer Verbundhalbleiteranordnung | |
EP0030286B1 (de) | Dielektrisch isoliertes Halbleiterbauelement und Verfahren zur Herstellung | |
DE1210955B (de) | Verfahren zum Maskieren von Kristallen und zum Herstellen von Halbleiterbauelementen | |
DE2106540A1 (de) | Halbleiterschaltung und Verfahren zu ihrer Herstellung | |
DE2216642C3 (de) | Halbleiteranordnung und Verfahren zu ihrer Herstellung |