DE1447254A1 - Interferenz-Polarisationsmikroskop - Google Patents

Interferenz-Polarisationsmikroskop

Info

Publication number
DE1447254A1
DE1447254A1 DE19641447254 DE1447254A DE1447254A1 DE 1447254 A1 DE1447254 A1 DE 1447254A1 DE 19641447254 DE19641447254 DE 19641447254 DE 1447254 A DE1447254 A DE 1447254A DE 1447254 A1 DE1447254 A1 DE 1447254A1
Authority
DE
Germany
Prior art keywords
prism
microscope
interference
angle
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19641447254
Other languages
German (de)
English (en)
Inventor
Pluta Maksymilian
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
POLSKIE ZAKLADY OPTYCZNE
Original Assignee
POLSKIE ZAKLADY OPTYCZNE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from PL103090A external-priority patent/PL53149B1/pl
Application filed by POLSKIE ZAKLADY OPTYCZNE filed Critical POLSKIE ZAKLADY OPTYCZNE
Publication of DE1447254A1 publication Critical patent/DE1447254A1/de
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/14Condensers affording illumination for phase-contrast observation
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE19641447254 1963-11-29 1964-11-24 Interferenz-Polarisationsmikroskop Pending DE1447254A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL103090A PL53149B1 (cg-RX-API-DMAC7.html) 1963-11-29

Publications (1)

Publication Number Publication Date
DE1447254A1 true DE1447254A1 (de) 1968-12-19

Family

ID=19940994

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19641447254 Pending DE1447254A1 (de) 1963-11-29 1964-11-24 Interferenz-Polarisationsmikroskop

Country Status (5)

Country Link
US (1) US3495890A (cg-RX-API-DMAC7.html)
CH (1) CH438780A (cg-RX-API-DMAC7.html)
DE (1) DE1447254A1 (cg-RX-API-DMAC7.html)
GB (1) GB1096995A (cg-RX-API-DMAC7.html)
SE (1) SE324661B (cg-RX-API-DMAC7.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19807649B4 (de) * 1997-02-26 2010-10-14 Instruments S.A. Vorrichtung und Verfahren zur dreidimensionalen Messung und Beobachtung dünner Schichten

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2270774B (en) * 1992-09-10 1995-09-27 Univ Open Polarized light microscopy
JP3708260B2 (ja) * 1996-12-05 2005-10-19 オリンパス株式会社 微分干渉顕微鏡
US6411389B1 (en) * 2000-05-03 2002-06-25 The Regents Of The University Of Claifornia Optical monitor for real time thickness change measurements via lateral-translation induced phase-stepping interferometry
US6804009B2 (en) * 2000-05-03 2004-10-12 The Regents Of The University Of California Wollaston prism phase-stepping point diffraction interferometer and method
DE10219804A1 (de) * 2002-04-30 2003-11-13 Zeiss Carl Jena Gmbh Anordnung und Verfahren zum polarisationsoptischen Interferenzkontrast
US6942139B2 (en) * 2003-04-29 2005-09-13 Lincoln Global, Inc. Robotic cylinder welding
EP1927881A1 (en) * 2006-11-28 2008-06-04 Agilent Technologies, Inc. Optical block with variable polarizing characteristics and method for generating different states of polarization using said block
WO2019006433A1 (en) * 2017-06-30 2019-01-03 Preza Chrysanthe MULTILAYER LIGHT SHEET STRUCTURED LIGHT EMITTING FLUORESCENCE MICROSCOPY SYSTEM

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2601175A (en) * 1947-08-05 1952-06-17 Smith Francis Hughes Interference microscope
US2700918A (en) * 1949-01-19 1955-02-01 American Optical Corp Microscope with variable means for increasing the visibility of optical images
US2924142A (en) * 1952-05-14 1960-02-09 Centre Nat Rech Scient Interferential polarizing device for study of phase objects
DE1243509B (de) * 1960-12-06 1967-06-29 Zeiss Carl Fa Mischbild-Entfernungsmesser, insbesondere fuer Spiegelreflex-Kameras mit in der Sucherbildebene angeordneten Prismen aus doppelbrechendem Material

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19807649B4 (de) * 1997-02-26 2010-10-14 Instruments S.A. Vorrichtung und Verfahren zur dreidimensionalen Messung und Beobachtung dünner Schichten

Also Published As

Publication number Publication date
CH438780A (de) 1967-06-30
US3495890A (en) 1970-02-17
SE324661B (cg-RX-API-DMAC7.html) 1970-06-08
GB1096995A (en) 1967-12-29

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Legal Events

Date Code Title Description
SH Request for examination between 03.10.1968 and 22.04.1971