DE112021002914T5 - Integrierter Betrachter für Mehrfachmessungen und Programm - Google Patents

Integrierter Betrachter für Mehrfachmessungen und Programm Download PDF

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Publication number
DE112021002914T5
DE112021002914T5 DE112021002914.2T DE112021002914T DE112021002914T5 DE 112021002914 T5 DE112021002914 T5 DE 112021002914T5 DE 112021002914 T DE112021002914 T DE 112021002914T DE 112021002914 T5 DE112021002914 T5 DE 112021002914T5
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DE
Germany
Prior art keywords
display
types
displayed
display area
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE112021002914.2T
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German (de)
English (en)
Inventor
Tomohiro Kawase
Xusheng Zhang
Shiori NAGAI
Satoshi Yamamoto
Hiroaki Yamada
Wakana Ito
Masashi Fukuchi
Yuma Unno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Rubber Industries Ltd
Shimadzu Corp
Original Assignee
Sumitomo Rubber Industries Ltd
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Rubber Industries Ltd, Shimadzu Corp filed Critical Sumitomo Rubber Industries Ltd
Publication of DE112021002914T5 publication Critical patent/DE112021002914T5/de
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/86Signal analysis
    • G01N30/8651Recording, data aquisition, archiving and storage
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • G01N30/7206Mass spectrometers interfaced to gas chromatograph
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/86Signal analysis
    • G01N30/8624Detection of slopes or peaks; baseline correction
    • G01N30/8631Peaks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/88Integrated analysis systems specially adapted therefor, not covered by a single one of the groups G01N30/04 - G01N30/86
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N2030/022Column chromatography characterised by the kind of separation mechanism
    • G01N2030/025Gas chromatography
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N2030/022Column chromatography characterised by the kind of separation mechanism
    • G01N2030/027Liquid chromatography
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/88Integrated analysis systems specially adapted therefor, not covered by a single one of the groups G01N30/04 - G01N30/86
    • G01N2030/8804Integrated analysis systems specially adapted therefor, not covered by a single one of the groups G01N30/04 - G01N30/86 automated systems
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178Special arrangements of analysers
    • G01N2035/00306Housings, cabinets, control panels (details)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N35/00732Identification of carriers, materials or components in automatic analysers
    • G01N2035/00821Identification of carriers, materials or components in automatic analysers nature of coded information
    • G01N2035/00851Identification of carriers, materials or components in automatic analysers nature of coded information process control parameters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N2035/00891Displaying information to the operator
    • G01N2035/0091GUI [graphical user interfaces]

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
DE112021002914.2T 2020-05-22 2021-03-26 Integrierter Betrachter für Mehrfachmessungen und Programm Pending DE112021002914T5 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020089675 2020-05-22
JP2020-089675 2020-05-22
PCT/JP2021/012826 WO2021235090A1 (ja) 2020-05-22 2021-03-26 複合計測統合ビューアおよびプログラム

Publications (1)

Publication Number Publication Date
DE112021002914T5 true DE112021002914T5 (de) 2023-03-02

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ID=78708492

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112021002914.2T Pending DE112021002914T5 (de) 2020-05-22 2021-03-26 Integrierter Betrachter für Mehrfachmessungen und Programm

Country Status (5)

Country Link
US (1) US20230204607A1 (https=)
JP (1) JP7377970B2 (https=)
CN (1) CN115667912B (https=)
DE (1) DE112021002914T5 (https=)
WO (1) WO2021235090A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7779171B2 (ja) * 2022-02-24 2025-12-03 株式会社島津製作所 クロマトグラフ分析装置及びクロマトグラフ分析用プログラム
JP7782309B2 (ja) * 2022-02-25 2025-12-09 株式会社島津製作所 分取液体クロマトグラフ装置及び分取条件決定支援方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017194360A (ja) 2016-04-21 2017-10-26 株式会社島津製作所 試料解析システム

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6480860A (en) * 1987-09-24 1989-03-27 Shimadzu Corp Ion chromatograph apparatus for clinical analysis
JP2829052B2 (ja) * 1989-09-20 1998-11-25 株式会社日立製作所 クロマトグラフイー用データ処理方法
JP4404428B2 (ja) * 2000-02-07 2010-01-27 積水化学工業株式会社 ヘモグロビン類の測定方法
JP4807769B2 (ja) * 2005-03-30 2011-11-02 シスメックス株式会社 分析システム、データ処理装置、及びアプリケーションプログラム
JP4825021B2 (ja) * 2006-02-28 2011-11-30 株式会社日立ハイテクノロジーズ レポートフォーマット設定方法、レポートフォーマット設定装置、及び欠陥レビューシステム
JP5476240B2 (ja) * 2010-07-12 2014-04-23 シスメックス株式会社 検査情報システム、及びコンピュータプログラム
JP5829836B2 (ja) * 2011-05-11 2015-12-09 日本分光株式会社 クロマトグラフ用プログラム
JP5835135B2 (ja) * 2012-07-17 2015-12-24 株式会社島津製作所 分析データ表示処理装置
US9754394B2 (en) * 2014-12-17 2017-09-05 Shimadzu Corporation Analytical data display processing device
JP6629678B2 (ja) * 2016-06-16 2020-01-15 株式会社日立製作所 機械学習装置
JP6903976B2 (ja) * 2017-03-22 2021-07-14 オムロン株式会社 制御システム
JP6954783B2 (ja) * 2017-08-03 2021-10-27 株式会社日立ハイテク 自動分析システム
JP7147444B2 (ja) * 2018-10-03 2022-10-05 株式会社島津製作所 試料注入装置および試料注入システム

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017194360A (ja) 2016-04-21 2017-10-26 株式会社島津製作所 試料解析システム

Also Published As

Publication number Publication date
US20230204607A1 (en) 2023-06-29
JP7377970B2 (ja) 2023-11-10
CN115667912A (zh) 2023-01-31
CN115667912B (zh) 2025-05-13
WO2021235090A1 (ja) 2021-11-25
JPWO2021235090A1 (https=) 2021-11-25

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