DE112013005039B4 - Optischer Sensor - Google Patents
Optischer Sensor Download PDFInfo
- Publication number
- DE112013005039B4 DE112013005039B4 DE112013005039.0T DE112013005039T DE112013005039B4 DE 112013005039 B4 DE112013005039 B4 DE 112013005039B4 DE 112013005039 T DE112013005039 T DE 112013005039T DE 112013005039 B4 DE112013005039 B4 DE 112013005039B4
- Authority
- DE
- Germany
- Prior art keywords
- light
- section
- sensor
- light receiving
- incident
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/06—Restricting the angle of incident light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0204—Compact construction
- G01J1/0209—Monolithic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0271—Housings; Attachments or accessories for photometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0437—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using masks, aperture plates, spatial light modulators, spatial filters, e.g. reflective filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0462—Slit arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01W—METEOROLOGY
- G01W1/00—Meteorology
- G01W1/12—Sunshine duration recorders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01W—METEOROLOGY
- G01W1/00—Meteorology
- G01W1/14—Rainfall or precipitation gauges
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/201—Filters in the form of arrays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/10—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices being sensitive to infrared radiation, visible or ultraviolet radiation, and having no potential barriers, e.g. photoresistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
- H10F30/221—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PN homojunction
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F55/00—Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/30—Coatings
- H10F77/306—Coatings for devices having potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/30—Coatings
- H10F77/306—Coatings for devices having potential barriers
- H10F77/331—Coatings for devices having potential barriers for filtering or shielding light, e.g. multicolour filters for photodetectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/407—Optical elements or arrangements indirectly associated with the devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/413—Optical elements or arrangements directly associated or integrated with the devices, e.g. back reflectors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B60—VEHICLES IN GENERAL
- B60S—SERVICING, CLEANING, REPAIRING, SUPPORTING, LIFTING, OR MANOEUVRING OF VEHICLES, NOT OTHERWISE PROVIDED FOR
- B60S1/00—Cleaning of vehicles
- B60S1/02—Cleaning windscreens, windows or optical devices
- B60S1/04—Wipers or the like, e.g. scrapers
- B60S1/06—Wipers or the like, e.g. scrapers characterised by the drive
- B60S1/08—Wipers or the like, e.g. scrapers characterised by the drive electrically driven
- B60S1/0818—Wipers or the like, e.g. scrapers characterised by the drive electrically driven including control systems responsive to external conditions, e.g. by detection of moisture, dirt or the like
- B60S1/0822—Wipers or the like, e.g. scrapers characterised by the drive electrically driven including control systems responsive to external conditions, e.g. by detection of moisture, dirt or the like characterized by the arrangement or type of detection means
- B60S1/0833—Optical rain sensor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Environmental Sciences (AREA)
- Ecology (AREA)
- Biodiversity & Conservation Biology (AREA)
- Atmospheric Sciences (AREA)
- Engineering & Computer Science (AREA)
- Hydrology & Water Resources (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Pathology (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
- Spectrometry And Color Measurement (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012-197339 | 2012-09-07 | ||
| JP2012197339A JP5907011B2 (ja) | 2012-09-07 | 2012-09-07 | 光センサ |
| PCT/JP2013/005270 WO2014038206A1 (ja) | 2012-09-07 | 2013-09-05 | 光センサ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE112013005039T5 DE112013005039T5 (de) | 2015-07-30 |
| DE112013005039B4 true DE112013005039B4 (de) | 2022-07-21 |
Family
ID=50236835
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE112013005039.0T Expired - Fee Related DE112013005039B4 (de) | 2012-09-07 | 2013-09-05 | Optischer Sensor |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9166081B2 (enExample) |
| JP (1) | JP5907011B2 (enExample) |
| CN (1) | CN104508438B (enExample) |
| DE (1) | DE112013005039B4 (enExample) |
| WO (1) | WO2014038206A1 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3211453A1 (en) * | 2016-02-26 | 2017-08-30 | ams AG | Optical proximity sensor arrangement and method for producing an optical proximity sensor arrangement |
| US10718603B2 (en) * | 2016-10-13 | 2020-07-21 | Six Degrees Space Ltd | Method and apparatus for indoor positioning |
| CN106686215B (zh) * | 2016-12-06 | 2022-03-25 | Oppo广东移动通信有限公司 | 传感器组件以及移动终端 |
| TWI637502B (zh) * | 2017-12-05 | 2018-10-01 | 義明科技股份有限公司 | 光學感測裝置以及光學感測模組 |
| JP2024124181A (ja) * | 2023-03-02 | 2024-09-12 | ローム株式会社 | 光検出装置および光検出システム |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102006040790A1 (de) | 2006-08-31 | 2008-03-27 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Reflexkoppler mit integriertem organischen Lichtemitter |
| JP2011203247A (ja) | 2010-03-05 | 2011-10-13 | Seiko Epson Corp | 光学センサー及び電子機器 |
| WO2012032753A1 (ja) | 2010-09-10 | 2012-03-15 | 株式会社デンソー | 光センサ |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06177416A (ja) * | 1992-12-07 | 1994-06-24 | Nippondenso Co Ltd | 光センサー |
| DE4406398A1 (de) | 1994-02-26 | 1995-08-31 | Bosch Gmbh Robert | Regensensor |
| US5428215A (en) * | 1994-05-27 | 1995-06-27 | Her Majesty The Queen In Right Of Canada, As Represented By Minister Of National Defence Of Her Majesty's Canadian Government | Digital high angular resolution laser irradiation detector (HARLID) |
| DE19933642A1 (de) * | 1999-07-17 | 2001-03-08 | Bosch Gmbh Robert | Lichtempfindliche Sensoreinheit, insbesondere zum automatischen Schalten von Beleuchtungseinrichtungen |
| JP2004198214A (ja) * | 2002-12-18 | 2004-07-15 | Denso Corp | 雨滴および光検出装置 |
| JP2005233728A (ja) * | 2004-02-18 | 2005-09-02 | Denso Corp | 光センサ装置 |
| JP4772585B2 (ja) | 2006-05-10 | 2011-09-14 | 浜松ホトニクス株式会社 | 光検出器 |
| JP5300344B2 (ja) * | 2007-07-06 | 2013-09-25 | キヤノン株式会社 | 光検出素子及び撮像素子、光検出方法及び撮像方法 |
| JP4621270B2 (ja) | 2007-07-13 | 2011-01-26 | キヤノン株式会社 | 光学フィルタ |
| KR20100098658A (ko) * | 2007-12-25 | 2010-09-08 | 세이코 인스트루 가부시키가이샤 | 광 검출 장치, 및 화상 표시 장치 |
| KR101776955B1 (ko) * | 2009-02-10 | 2017-09-08 | 소니 주식회사 | 고체 촬상 장치와 그 제조 방법, 및 전자 기기 |
| JP4973692B2 (ja) * | 2009-05-27 | 2012-07-11 | 株式会社デンソー | 移動体用光センサ装置 |
| JP5077780B2 (ja) * | 2009-07-06 | 2012-11-21 | 株式会社デンソー | 光検出装置 |
| JP2011061133A (ja) * | 2009-09-14 | 2011-03-24 | Zycube:Kk | 半導体イメージセンサとその製造法 |
| US8492699B2 (en) * | 2009-09-22 | 2013-07-23 | Intersil Americas Inc. | Photodetectors useful as ambient light sensors having an optical filter rejecting a portion of infrared light |
| JP5118715B2 (ja) * | 2010-03-11 | 2013-01-16 | 株式会社東芝 | 固体撮像装置 |
| EP2400559A1 (de) * | 2010-06-22 | 2011-12-28 | SMA Solar Technology AG | Einstrahlungssensor für solare Lichtintensität |
| JP5375840B2 (ja) * | 2011-01-06 | 2013-12-25 | 株式会社デンソー | 光センサ |
| CN201804019U (zh) * | 2010-09-24 | 2011-04-20 | 浙江美佳机电科技有限公司 | 太阳能风光雨传感器 |
| JP2012222742A (ja) * | 2011-04-13 | 2012-11-12 | Sony Corp | 撮像素子および撮像装置 |
| JP5760811B2 (ja) * | 2011-07-28 | 2015-08-12 | ソニー株式会社 | 固体撮像素子および撮像システム |
| JP6029266B2 (ja) * | 2011-08-09 | 2016-11-24 | キヤノン株式会社 | 撮像装置、撮像システムおよび撮像装置の製造方法 |
-
2012
- 2012-09-07 JP JP2012197339A patent/JP5907011B2/ja not_active Expired - Fee Related
-
2013
- 2013-09-05 US US14/406,541 patent/US9166081B2/en not_active Expired - Fee Related
- 2013-09-05 WO PCT/JP2013/005270 patent/WO2014038206A1/ja not_active Ceased
- 2013-09-05 CN CN201380039851.0A patent/CN104508438B/zh not_active Expired - Fee Related
- 2013-09-05 DE DE112013005039.0T patent/DE112013005039B4/de not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102006040790A1 (de) | 2006-08-31 | 2008-03-27 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Reflexkoppler mit integriertem organischen Lichtemitter |
| JP2011203247A (ja) | 2010-03-05 | 2011-10-13 | Seiko Epson Corp | 光学センサー及び電子機器 |
| WO2012032753A1 (ja) | 2010-09-10 | 2012-03-15 | 株式会社デンソー | 光センサ |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104508438A (zh) | 2015-04-08 |
| DE112013005039T5 (de) | 2015-07-30 |
| US9166081B2 (en) | 2015-10-20 |
| JP5907011B2 (ja) | 2016-04-20 |
| WO2014038206A1 (ja) | 2014-03-13 |
| JP2014052302A (ja) | 2014-03-20 |
| CN104508438B (zh) | 2016-07-13 |
| US20150179830A1 (en) | 2015-06-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R409 | Internal rectification of the legal status completed | ||
| R409 | Internal rectification of the legal status completed | ||
| R012 | Request for examination validly filed | ||
| R016 | Response to examination communication | ||
| R079 | Amendment of ipc main class |
Free format text: PREVIOUS MAIN CLASS: G01J0001060000 Ipc: G01J0001040000 |
|
| R018 | Grant decision by examination section/examining division | ||
| R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |