DE112009003827T5 - Fotometer und damit ausgestattetes analysesystem - Google Patents

Fotometer und damit ausgestattetes analysesystem Download PDF

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Publication number
DE112009003827T5
DE112009003827T5 DE112009003827T DE112009003827T DE112009003827T5 DE 112009003827 T5 DE112009003827 T5 DE 112009003827T5 DE 112009003827 T DE112009003827 T DE 112009003827T DE 112009003827 T DE112009003827 T DE 112009003827T DE 112009003827 T5 DE112009003827 T5 DE 112009003827T5
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DE
Germany
Prior art keywords
light
photometer
holder
reaction vessel
mirror
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE112009003827T
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German (de)
English (en)
Inventor
Kunio Harada
Sakuichiro Adachi
Isao Yamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp, Hitachi High Tech Corp filed Critical Hitachi High Technologies Corp
Publication of DE112009003827T5 publication Critical patent/DE112009003827T5/de
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/0332—Cuvette constructions with temperature control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
DE112009003827T 2008-12-24 2009-12-22 Fotometer und damit ausgestattetes analysesystem Withdrawn DE112009003827T5 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008326796 2008-12-24
JP2008-326796 2008-12-24
PCT/JP2009/007096 WO2010073604A1 (ja) 2008-12-24 2009-12-22 光度計及び光度計を備えた分析システム

Publications (1)

Publication Number Publication Date
DE112009003827T5 true DE112009003827T5 (de) 2012-06-06

Family

ID=42287251

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112009003827T Withdrawn DE112009003827T5 (de) 2008-12-24 2009-12-22 Fotometer und damit ausgestattetes analysesystem

Country Status (5)

Country Link
US (1) US8675187B2 (ja)
JP (2) JP5780761B2 (ja)
CN (1) CN102265140B (ja)
DE (1) DE112009003827T5 (ja)
WO (1) WO2010073604A1 (ja)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT510631B1 (de) * 2010-10-20 2013-01-15 Scan Messtechnik Ges M B H Spektrometer
CN103201632A (zh) * 2010-11-18 2013-07-10 株式会社日立高新技术 自动分析装置
JP5481402B2 (ja) * 2011-01-17 2014-04-23 株式会社日立ハイテクノロジーズ 自動分析装置
WO2012099215A1 (ja) * 2011-01-21 2012-07-26 株式会社日立ハイテクノロジーズ 自動分析装置
CN102590168A (zh) * 2012-02-16 2012-07-18 无锡迈通科学仪器有限公司 基于发光二极管的荧光微生物检测仪
JP5957294B2 (ja) * 2012-05-29 2016-07-27 浜松ホトニクス株式会社 プリズム部材、テラヘルツ波分光計測装置、及びテラヘルツ波分光計測方法
JP5946776B2 (ja) * 2013-01-18 2016-07-06 株式会社日立ハイテクノロジーズ 自動分析装置
JP6130917B2 (ja) * 2013-08-27 2017-05-17 株式会社日立ハイテクノロジーズ 核酸分析装置およびその装置診断方法
JP6492838B2 (ja) * 2015-03-23 2019-04-03 セイコーエプソン株式会社 分光測定装置、画像形成装置、及び分光測定方法
JP6437390B2 (ja) * 2015-06-30 2018-12-12 株式会社日立ハイテクノロジーズ 自動分析装置
JP6659313B2 (ja) * 2015-11-13 2020-03-04 古野電気株式会社 反応測定ユニットおよび分析装置
CN109477775B (zh) * 2016-07-21 2022-05-13 西门子医疗保健诊断公司 用于临床化学仪器上的杯排的对准系统
JP6637407B2 (ja) 2016-12-27 2020-01-29 株式会社日立ハイテクノロジーズ 自動分析装置
EP3564679A1 (en) * 2016-12-28 2019-11-06 Kabushiki Kaisha DNAFORM Analysis device
US11867710B2 (en) 2017-07-14 2024-01-09 Meon Medical Solutions Gmbh & Co Kg Automatic analyzer and method for carrying out chemical, biochemical and/or immunochemical analyses
US11635443B2 (en) 2017-07-14 2023-04-25 Meon Medical Solutions Gmbh & Co Kg Automatic analyzer and method for carrying out chemical, biochemical, and/or immunochemical analyses
CN108152211A (zh) * 2018-01-17 2018-06-12 睿科仪器（厦门）有限公司 一种自动判断样品液体颜色的装置及方法
WO2019204840A1 (de) 2018-04-23 2019-10-31 Meon Medical Solutions Gmbh & Co Kg Optische messeinheit und optisches messverfahren zur gewinnung von messsignalen von flüssigen medien
US20210197188A1 (en) * 2018-04-23 2021-07-01 Meon Medical Solutions Gmbh & Co Kg Automatic analyzer and optical measurement method for obtaining measurement signals from liquid media
JP7194580B2 (ja) * 2018-12-19 2022-12-22 株式会社トプコン 分光計測装置
EP4022320A4 (en) * 2019-08-28 2022-11-02 Siemens Healthcare Diagnostics, Inc. OPTICAL COUPLING OF DOUBLE INCUBATION RING PHOTOMETERS USING A PERISCOPE DESIGN
JP2023069603A (ja) * 2021-11-08 2023-05-18 株式会社日立ハイテク 生体試料測定装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007198935A (ja) 2006-01-27 2007-08-09 Wako Pure Chem Ind Ltd 分析装置
JP2007218883A (ja) 2006-02-20 2007-08-30 Olympus Corp 分析装置
JP2007225339A (ja) 2006-02-21 2007-09-06 Olympus Corp 分析装置

Family Cites Families (15)

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Publication number Priority date Publication date Assignee Title
JPS60114743A (ja) * 1983-11-26 1985-06-21 Toshiba Corp 液中測光用プリズムを用いた自動化学分析装置
US4935875A (en) * 1987-12-02 1990-06-19 Data Chem, Inc. Chemical analyzer
JPH0875648A (ja) * 1994-06-30 1996-03-22 Opt Kk 流体の光透過量を測定する装置
JP3533502B2 (ja) * 1994-10-14 2004-05-31 株式会社日立製作所 自動化学分析装置
GB9424218D0 (en) * 1994-11-30 1995-01-18 Zynocyte Ltd Apparatus for analysing blood and other samples
JP3749321B2 (ja) 1996-10-28 2006-02-22 株式会社日立製作所 自動分析装置
JP4120050B2 (ja) * 1998-07-16 2008-07-16 株式会社ニコン 光学特性検出装置
JP4168543B2 (ja) * 1998-10-08 2008-10-22 株式会社ニコン 光学特性測定ユニット
JP3964291B2 (ja) 2002-09-06 2007-08-22 富士フイルム株式会社 分析機器
JP4086182B2 (ja) 2002-10-09 2008-05-14 オリンパス株式会社 分光器およびこれを用いた共焦点光学系、走査型光学顕微鏡
JP4753645B2 (ja) * 2005-07-11 2011-08-24 ベックマン コールター， インコーポレイテッド 自動分析装置
JP2007155477A (ja) * 2005-12-05 2007-06-21 Fujikura Ltd 表面プラズモン共鳴センサ
JP2007218633A (ja) * 2006-02-14 2007-08-30 Olympus Corp 自動分析装置
JP2008134128A (ja) * 2006-11-28 2008-06-12 Canon Inc 表面状態検査装置及び表面状態検査方法
JP2007304103A (ja) * 2007-06-18 2007-11-22 Olympus Corp 分光器およびこれを用いた共焦点光学系、走査型光学顕微鏡

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007198935A (ja) 2006-01-27 2007-08-09 Wako Pure Chem Ind Ltd 分析装置
JP2007218883A (ja) 2006-02-20 2007-08-30 Olympus Corp 分析装置
JP2007225339A (ja) 2006-02-21 2007-09-06 Olympus Corp 分析装置

Also Published As

Publication number Publication date
CN102265140B (zh) 2014-09-10
US8675187B2 (en) 2014-03-18
US20110255090A1 (en) 2011-10-20
WO2010073604A1 (ja) 2010-07-01
JP5780761B2 (ja) 2015-09-16
CN102265140A (zh) 2011-11-30
JP6051264B2 (ja) 2016-12-27
JPWO2010073604A1 (ja) 2012-06-07
JP2015143720A (ja) 2015-08-06

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R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee