DE1027903B - Geraet fuer Roentgenspektrometrie - Google Patents

Geraet fuer Roentgenspektrometrie

Info

Publication number
DE1027903B
DE1027903B DEN7979A DEN0007979A DE1027903B DE 1027903 B DE1027903 B DE 1027903B DE N7979 A DEN7979 A DE N7979A DE N0007979 A DEN0007979 A DE N0007979A DE 1027903 B DE1027903 B DE 1027903B
Authority
DE
Germany
Prior art keywords
crystal
axis
rays
centered
opposite
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DEN7979A
Other languages
German (de)
English (en)
Inventor
Sjoerd Wytzes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of DE1027903B publication Critical patent/DE1027903B/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
DEN7979A 1952-11-08 1953-11-05 Geraet fuer Roentgenspektrometrie Pending DE1027903B (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL316826X 1952-11-08

Publications (1)

Publication Number Publication Date
DE1027903B true DE1027903B (de) 1958-04-10

Family

ID=19783831

Family Applications (1)

Application Number Title Priority Date Filing Date
DEN7979A Pending DE1027903B (de) 1952-11-08 1953-11-05 Geraet fuer Roentgenspektrometrie

Country Status (7)

Country Link
US (1) US2783385A (xx)
BE (1) BE524089A (xx)
CH (1) CH316826A (xx)
DE (1) DE1027903B (xx)
FR (1) FR1090233A (xx)
GB (1) GB741854A (xx)
NL (2) NL85501C (xx)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3125803A1 (de) * 1981-06-30 1983-01-13 Siemens AG, 1000 Berlin und 8000 München Kristall-roentgen-sequenzspektrometer
DE19962503B4 (de) * 1998-12-28 2007-07-26 Rigaku Industrial Corp., Takatsuki Röntgenfluoreszenzanalysator mit Wegumschaltvorrichtung

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2835820A (en) * 1955-03-07 1958-05-20 Jr La Verne S Birks Curved crystal fluorescent x-ray spectrograph
US3031571A (en) * 1956-05-21 1962-04-24 Well Completions Inc Apparatus and method for conditioning and analyzing earth components
US3073952A (en) * 1956-09-11 1963-01-15 Gen Electric X-ray diffraction apparatus
US2898469A (en) * 1956-09-11 1959-08-04 Gen Electric X-ray diffraction apparatus
GB847265A (en) * 1957-09-11 1960-09-07 Ass Elect Ind Improvements relating to mechanical linkages
US2957079A (en) * 1957-12-27 1960-10-18 Gen Electric Penetrating ray emission coding
US3012443A (en) * 1960-01-11 1961-12-12 Patent Man Inc Mechanical movement for translating rotary motion to linear motion
US4199678A (en) * 1979-01-31 1980-04-22 U.S. Philips Corporation Asymmetric texture sensitive X-ray powder diffractometer
JP6324060B2 (ja) * 2013-12-24 2018-05-16 株式会社日立ハイテクサイエンス Ｘ線分析装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE852769C (de) * 1949-04-19 1952-10-20 Gen Electric Roentgenstrahlen-Spektrometer

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2532810A (en) * 1950-01-13 1950-12-05 Gen Electric X-ray diffraction apparatus for use with radioactive materials
US2578722A (en) * 1950-05-18 1951-12-18 United States Steel Corp Apparatus for determining coating thickness

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE852769C (de) * 1949-04-19 1952-10-20 Gen Electric Roentgenstrahlen-Spektrometer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3125803A1 (de) * 1981-06-30 1983-01-13 Siemens AG, 1000 Berlin und 8000 München Kristall-roentgen-sequenzspektrometer
DE19962503B4 (de) * 1998-12-28 2007-07-26 Rigaku Industrial Corp., Takatsuki Röntgenfluoreszenzanalysator mit Wegumschaltvorrichtung

Also Published As

Publication number Publication date
US2783385A (en) 1957-02-26
GB741854A (en) 1955-12-14
FR1090233A (fr) 1955-03-29
CH316826A (de) 1956-10-31
BE524089A (xx)
NL173668B (nl)
NL85501C (xx)

Similar Documents

Publication Publication Date Title
DE852769C (de) Roentgenstrahlen-Spektrometer
DE2559658A1 (de) Radiographisches geraet
DE1027903B (de) Geraet fuer Roentgenspektrometrie
DE2831311C2 (de) Vorrichtung zur Ermittlung innerer Körperstrukturen mittels Streustrahlung
DE102008048917B4 (de) Röntgendiffraktionsmessapparat mit einem optischen Debye-Scherrer-System und Röntgendiffraktionsmessverfahren für diesen Apparat
DE2912010A1 (de) Geraet zur messung der absorptionsverteilung
DE967578C (de) Lichtelektrische Schranke
DE1598924B2 (de) Roentgenspektrometer
DE1131428B (de) Fuehrungsgestaenge fuer ein Roentgenspektrometer
CH403341A (de) Röntgengerät zur Feinstrukturuntersuchung von Materialien nach der Rückstrahlmethode
DE3442061C2 (xx)
DE670322C (de) Vorrichtung zur Aufnahme von Roentgen- und Kathodenstrahldiagrammen von Einkristallen
DE1226802B (de) Infrarot-Probentraeger-Anordnung, die nach dem Prinzip der verminderten Totalreflexion arbeitet
DE1048046B (de) Roentgenbeugungsgeraet
DE1901666A1 (de) Verfahren fuer Kristalltopographie und Vorrichtung zur Durchfuehrung dieses Verfahrens
DE2003753A1 (de) Blendenanordnung zur Begrenzung eines Roentgenstrahlenbuendels
DE102018216805B3 (de) Streustrahlenraster für eine medizinische Röntgen-Bildgebungsanlage
DE4114582C2 (de) Vorrichtung zur Aufnahme eines Prüflings in einem stationären Diffraktometer
DE3740614C1 (de) Verfahren und Vorrichtung zur beruehrungsfreien Messung mechanischer Spannungen an schnell bewegten Objekten mit kristalliner Struktur
CH437627A (de) Strahlenblende für durchdringende Strahlen
DE758513C (de) Verfahren zur roentgenographischen Feinstrukturuntersuchung
DE102013219652A1 (de) CT-Verfahren und CT-Prüfeinrichtung zur Prüfung eines Prüfobjekts
DE2254764C3 (de) Vorrichtung für die schnelle Messung der Streulichtwinkelabhängigkeit kleiner Partikel
DE1255949B (de) Anordnung zur Messung der Totalreflexions-Verminderung
DE2019962A1 (de) Vorrichtung zur roentgenorgaphischen Untersuchung von Kristallen