GB741854A - Improvements in apparatus for x-ray spectrometry - Google Patents

Improvements in apparatus for x-ray spectrometry

Info

Publication number
GB741854A
GB741854A GB30616/53A GB3061653A GB741854A GB 741854 A GB741854 A GB 741854A GB 30616/53 A GB30616/53 A GB 30616/53A GB 3061653 A GB3061653 A GB 3061653A GB 741854 A GB741854 A GB 741854A
Authority
GB
United Kingdom
Prior art keywords
shaft
arms
crystal
gear
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB30616/53A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electrical Industries Ltd
Original Assignee
Philips Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electrical Industries Ltd filed Critical Philips Electrical Industries Ltd
Publication of GB741854A publication Critical patent/GB741854A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Abstract

741,854. X-ray apparatus. PHILIPS ELECTRICAL INDUSTRIES, Ltd. Nov. 5, 1953 [Nov. 8, 1952], No. 30616/53. Class 98 (1). Apparatus for X-ray spectrometry of the kind in which material the composition of which is to be estimated is irradiated with primary X-rays, and part of the secondary radiation emitted by the material impinges on a thin plate of crystalline material having a cylindrical surface and rotatable about an axis which coincides with a generatrix of the surface, a convergent beam of secondary radiation reflected by the plate being measured by means of a detector which is located in the neighbourhood of the minimum cross-section of the beam, is characterized in that the shaft 17 which carries the plate 7 of crystalline material is integral with a crank 16, a link 15 the free end of which positions the detector 10, is pivoted on the end of crank 16 remote from shaft 17, and means are provided for rotating the link 15 about its pivot at twice the angular speed of the crystal 7. As shown in Fig. 3, the material 1 is irradiated by means of an X-ray tube 3, and the secondary rays fall, in part, on the curved crystal plate 7, the lattice planes of which are perpendicular to its surface. The shaft 17 is driven by a worm 21 and worm-wheel 22. Arms 15, pivoted to arms 16 fixed to shaft 17, are fast with a gearwheel 19 meshing with a gear-wheel 20 of twice its diameter fast with shaft 17, so that arms 15 move about their pivot with twice the angular speed of arms 16. A shaft 28, journalled in arms 15, carries the radiation detector 10 and beam-limiting diaphragms 23, 24. A slotted strip 27 engaging shaft 17 keeps the detector directed towards the crystal 7. The gears 19, 20 may be replaced by pulleys connected by a belt drive. To increase the accuracy of the positioning of crystal 7, the diameter of gear 19 may be reduced with respect to gear 20; in this case gear 20 is rotated in a direction opposite to the direction of rotation of the crystal. U.S.A. Specification 2,540,821 is referred to.
GB30616/53A 1952-11-08 1953-11-05 Improvements in apparatus for x-ray spectrometry Expired GB741854A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL316826X 1952-11-08

Publications (1)

Publication Number Publication Date
GB741854A true GB741854A (en) 1955-12-14

Family

ID=19783831

Family Applications (1)

Application Number Title Priority Date Filing Date
GB30616/53A Expired GB741854A (en) 1952-11-08 1953-11-05 Improvements in apparatus for x-ray spectrometry

Country Status (7)

Country Link
US (1) US2783385A (en)
BE (1) BE524089A (en)
CH (1) CH316826A (en)
DE (1) DE1027903B (en)
FR (1) FR1090233A (en)
GB (1) GB741854A (en)
NL (2) NL85501C (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2835820A (en) * 1955-03-07 1958-05-20 Jr La Verne S Birks Curved crystal fluorescent x-ray spectrograph
US3031571A (en) * 1956-05-21 1962-04-24 Well Completions Inc Apparatus and method for conditioning and analyzing earth components
US3073952A (en) * 1956-09-11 1963-01-15 Gen Electric X-ray diffraction apparatus
US2898469A (en) * 1956-09-11 1959-08-04 Gen Electric X-ray diffraction apparatus
GB847265A (en) * 1957-09-11 1960-09-07 Ass Elect Ind Improvements relating to mechanical linkages
US2957079A (en) * 1957-12-27 1960-10-18 Gen Electric Penetrating ray emission coding
US3012443A (en) * 1960-01-11 1961-12-12 Patent Man Inc Mechanical movement for translating rotary motion to linear motion
US4199678A (en) * 1979-01-31 1980-04-22 U.S. Philips Corporation Asymmetric texture sensitive X-ray powder diffractometer
DE3125803A1 (en) * 1981-06-30 1983-01-13 Siemens AG, 1000 Berlin und 8000 München CRYSTAL ROENTGEN SEQUENCE SPECTROMETER
JP3531098B2 (en) * 1998-12-28 2004-05-24 理学電機工業株式会社 X-ray fluorescence analyzer
JP6324060B2 (en) * 2013-12-24 2018-05-16 株式会社日立ハイテクサイエンス X-ray analyzer

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE495202A (en) * 1949-04-19
US2532810A (en) * 1950-01-13 1950-12-05 Gen Electric X-ray diffraction apparatus for use with radioactive materials
US2578722A (en) * 1950-05-18 1951-12-18 United States Steel Corp Apparatus for determining coating thickness

Also Published As

Publication number Publication date
US2783385A (en) 1957-02-26
FR1090233A (en) 1955-03-29
DE1027903B (en) 1958-04-10
CH316826A (en) 1956-10-31
BE524089A (en)
NL173668B (en)
NL85501C (en)

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