NL85501C - - Google Patents

Info

Publication number
NL85501C
NL85501C NL85501DA NL85501C NL 85501 C NL85501 C NL 85501C NL 85501D A NL85501D A NL 85501DA NL 85501 C NL85501 C NL 85501C
Authority
NL
Netherlands
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of NL85501C publication Critical patent/NL85501C/xx
Priority to NL316826X priority Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence
NL85501D 1952-11-08 NL85501C (xx)

Priority Applications (1)

Application Number Priority Date Filing Date Title
NL316826X 1952-11-08

Publications (1)

Publication Number Publication Date
NL85501C true NL85501C (xx)

Family

ID=19783831

Family Applications (2)

Application Number Title Priority Date Filing Date
NL85501D NL85501C (xx) 1952-11-08
NLAANVRAGE7412171,A NL173668B (nl) 1952-11-08 Hekwerk.

Family Applications After (1)

Application Number Title Priority Date Filing Date
NLAANVRAGE7412171,A NL173668B (nl) 1952-11-08 Hekwerk.

Country Status (7)

Country Link
US (1) US2783385A (xx)
BE (1) BE524089A (xx)
CH (1) CH316826A (xx)
DE (1) DE1027903B (xx)
FR (1) FR1090233A (xx)
GB (1) GB741854A (xx)
NL (2) NL173668B (xx)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2835820A (en) * 1955-03-07 1958-05-20 Jr La Verne S Birks Curved crystal fluorescent x-ray spectrograph
US3031571A (en) * 1956-05-21 1962-04-24 Well Completions Inc Apparatus and method for conditioning and analyzing earth components
US2898469A (en) * 1956-09-11 1959-08-04 Gen Electric X-ray diffraction apparatus
US3073952A (en) * 1956-09-11 1963-01-15 Gen Electric X-ray diffraction apparatus
GB847265A (en) * 1957-09-11 1960-09-07 Ass Elect Ind Improvements relating to mechanical linkages
US2957079A (en) * 1957-12-27 1960-10-18 Gen Electric Penetrating ray emission coding
US3012443A (en) * 1960-01-11 1961-12-12 Patent Man Inc Mechanical movement for translating rotary motion to linear motion
US4199678A (en) * 1979-01-31 1980-04-22 U.S. Philips Corporation Asymmetric texture sensitive X-ray powder diffractometer
DE3125803A1 (de) * 1981-06-30 1983-01-13 Siemens Ag Kristall-roentgen-sequenzspektrometer
JP3531098B2 (ja) * 1998-12-28 2004-05-24 理学電機工業株式会社 蛍光x線分析装置
JP6324060B2 (ja) * 2013-12-24 2018-05-16 株式会社日立ハイテクサイエンス X線分析装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL152924B (nl) * 1949-04-19 Engelhard Ind Werkwijze voor het reformeren van naftenen en paraffinen bevattende aardoliekoolwaterstoffen in een in serie geplaatste nafteendehydrogeneringszone en een paraffinedehydrocycleringszone.
US2532810A (en) * 1950-01-13 1950-12-05 Gen Electric X-ray diffraction apparatus for use with radioactive materials
US2578722A (en) * 1950-05-18 1951-12-18 United States Steel Corp Apparatus for determining coating thickness

Also Published As

Publication number Publication date
BE524089A (xx)
DE1027903B (de) 1958-04-10
CH316826A (de) 1956-10-31
FR1090233A (fr) 1955-03-29
GB741854A (en) 1955-12-14
NL173668B (nl)
US2783385A (en) 1957-02-26

Similar Documents

Publication Publication Date Title
DE113599C (xx)
FR1094628A (xx)
FR2059639B1 (xx)
NL113929C (xx)
DE1069116B (xx)
IT507342A (xx)
JPS30479B1 (xx)
FR1085933A (xx)
DE1071898B (xx)
DE1071005B (xx)
BE519488A (xx)
DE1048746B (xx)
IT505586A (xx)
FR1094617A (xx)
DE1071715B (xx)
FR1081677A (xx)
FR65634E (xx)
DE1068442B (xx)
JPS326403B1 (xx)
DE957951C (xx)
FR999336A (xx)
DE1066535B (xx)
DE957632C (xx)
FR999175A (xx)
FR999408A (xx)