DE10207329A1 - Verfahren zur Massenbelastung akustischer Dünnfilmvolumenresonatoren (FBARs) zum Erzeugen von Resonatoren mit unterschiedlichen Frequenzen und Vorrichtung, die das Verfahren beinhaltet - Google Patents
Verfahren zur Massenbelastung akustischer Dünnfilmvolumenresonatoren (FBARs) zum Erzeugen von Resonatoren mit unterschiedlichen Frequenzen und Vorrichtung, die das Verfahren beinhaltetInfo
- Publication number
- DE10207329A1 DE10207329A1 DE10207329A DE10207329A DE10207329A1 DE 10207329 A1 DE10207329 A1 DE 10207329A1 DE 10207329 A DE10207329 A DE 10207329A DE 10207329 A DE10207329 A DE 10207329A DE 10207329 A1 DE10207329 A1 DE 10207329A1
- Authority
- DE
- Germany
- Prior art keywords
- electrode
- layer
- resonator
- resonators
- core
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 41
- 238000011068 loading method Methods 0.000 title claims abstract description 39
- 239000010409 thin film Substances 0.000 title abstract description 10
- 239000000758 substrate Substances 0.000 claims abstract description 30
- 239000000463 material Substances 0.000 claims description 43
- 238000004519 manufacturing process Methods 0.000 claims description 18
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 10
- 229910052750 molybdenum Inorganic materials 0.000 claims description 10
- 239000011733 molybdenum Substances 0.000 claims description 10
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 claims description 7
- 239000010410 layer Substances 0.000 description 128
- 239000012792 core layer Substances 0.000 description 19
- 239000004020 conductor Substances 0.000 description 13
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 12
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 12
- 230000003647 oxidation Effects 0.000 description 9
- 238000007254 oxidation reaction Methods 0.000 description 9
- 238000005530 etching Methods 0.000 description 7
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 6
- QPJSUIGXIBEQAC-UHFFFAOYSA-N n-(2,4-dichloro-5-propan-2-yloxyphenyl)acetamide Chemical compound CC(C)OC1=CC(NC(C)=O)=C(Cl)C=C1Cl QPJSUIGXIBEQAC-UHFFFAOYSA-N 0.000 description 6
- 235000012239 silicon dioxide Nutrition 0.000 description 6
- 239000000377 silicon dioxide Substances 0.000 description 6
- 229910004298 SiO 2 Inorganic materials 0.000 description 5
- 238000013461 design Methods 0.000 description 4
- 230000000873 masking effect Effects 0.000 description 4
- 229920002120 photoresistant polymer Polymers 0.000 description 4
- 235000010678 Paulownia tomentosa Nutrition 0.000 description 3
- 240000002834 Paulownia tomentosa Species 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000000992 sputter etching Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 2
- 210000003608 fece Anatomy 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
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- 101100400378 Mus musculus Marveld2 gene Proteins 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052729 chemical element Inorganic materials 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 229910000476 molybdenum oxide Inorganic materials 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- PQQKPALAQIIWST-UHFFFAOYSA-N oxomolybdenum Chemical compound [Mo]=O PQQKPALAQIIWST-UHFFFAOYSA-N 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 108090000623 proteins and genes Proteins 0.000 description 1
- 239000010979 ruby Substances 0.000 description 1
- 229910001750 ruby Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/54—Filters comprising resonators of piezo-electric or electrostrictive material
- H03H9/56—Monolithic crystal filters
- H03H9/564—Monolithic crystal filters implemented with thin-film techniques
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H3/04—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H3/04—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
- H03H2003/0414—Resonance frequency
- H03H2003/0421—Modification of the thickness of an element
- H03H2003/0428—Modification of the thickness of an element of an electrode
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H3/04—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
- H03H2003/0414—Resonance frequency
- H03H2003/0471—Resonance frequency of a plurality of resonators at different frequencies
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/42—Piezoelectric device making
Abstract
Description
Claims (25)
Erzeugen einer unteren Belastungselektrode (113);
Erzeugen einer ersten unteren Kernelektrode (112) und einer zweiten unteren Kernelektrode (122), wobei die er ste untere Kernelektrode über der unteren Belastungs elektrode hergestellt wird und gemeinsam mit der unteren Belastungselektrode (113) eine erste untere Elektrode definiert, und wobei die zweite untere Kernelektrode ei ne zweite untere Elektrode definiert;
Erzeugen einer piezoelektrischen (PZ-)Schicht (104);
Erzeugen einer ersten oberen Elektrode (116) derart, daß ein erster Teil der PZ-Schicht (104) zwischen der ersten oberen Elektrode auf einer Seite und der ersten unteren Elektrode auf der anderen Seite angeordnet ist; und
Erzeugen einer zweiten oberen Elektrode (126) derart, daß ein zweiter Teil der PZ-Schicht zwischen der zweiten oberen Elektrode (122) auf einer Seite und der zweiten unteren Elektrode auf der anderen Seite angeordnet ist.
Erzeugen einer unteren Belastungselektrode (113);
Erzeugen einer unteren Kernelektrode (112) über der un teren Belastungselektrode (113);
Erzeugen einer piezoelektrischen (PZ-)Schicht (104); und
Erzeugen einer oberen Elektrode (116) über der PZ- Schicht.
einem ersten Resonator (110), der eine erste untere und eine erste obere Elektrode aufweist, zwischen denen ein erstes piezoelektrisches (PZ-)Material (104) angeordnet ist;
einem zweiten Resonator (120), der eine zweite untere und eine zweite obere Elektrode aufweist, zwischen denen ein zweites PZ-Material angeordnet ist,
wobei die erste untere Elektrode eine untere Belastungs elektrode (113) und eine untere Kernelektrode (112) um faßt.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/799,204 US6469597B2 (en) | 2001-03-05 | 2001-03-05 | Method of mass loading of thin film bulk acoustic resonators (FBAR) for creating resonators of different frequencies and apparatus embodying the method |
US09/799,204 | 2001-03-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE10207329A1 true DE10207329A1 (de) | 2002-09-19 |
DE10207329B4 DE10207329B4 (de) | 2009-04-16 |
Family
ID=25175287
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10207329A Expired - Fee Related DE10207329B4 (de) | 2001-03-05 | 2002-02-21 | Verfahren zur Massenbelastung akustischer Dünnfilmvolumenresonatoren (FBARs) zum Erzeugen von Resonatoren mit unterschiedlichen Frequenzen und Vorrichtung, die das Verfahren beinhaltet |
Country Status (3)
Country | Link |
---|---|
US (1) | US6469597B2 (de) |
JP (1) | JP4451587B2 (de) |
DE (1) | DE10207329B4 (de) |
Families Citing this family (85)
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JP2003229743A (ja) * | 2001-11-29 | 2003-08-15 | Murata Mfg Co Ltd | 圧電フィルタ、通信装置および圧電フィルタの製造方法 |
US6657517B2 (en) * | 2001-12-20 | 2003-12-02 | Agere Systems, Inc. | Multi-frequency thin film resonators |
KR100506729B1 (ko) * | 2002-05-21 | 2005-08-08 | 삼성전기주식회사 | 박막 벌크 어코스틱 공진기(FBARs)소자 및 그제조방법 |
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US8922302B2 (en) | 2011-08-24 | 2014-12-30 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Acoustic resonator formed on a pedestal |
US8910355B2 (en) * | 2011-12-12 | 2014-12-16 | International Business Machines Corporation | Method of manufacturing a film bulk acoustic resonator with a loading element |
US20220069792A1 (en) * | 2020-08-31 | 2022-03-03 | Resonant Inc. | Resonators with different membrane thicknesses on the same die |
EP4004990A4 (de) | 2019-07-31 | 2023-08-30 | Qxonix Inc. | Resonatorstrukturen akustischer volumenwellen (baw), vorrichtungen und systeme |
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US3222622A (en) | 1962-08-14 | 1965-12-07 | Clevite Corp | Wave filter comprising piezoelectric wafer electroded to define a plurality of resonant regions independently operable without significant electro-mechanical interaction |
US4320365A (en) | 1980-11-03 | 1982-03-16 | United Technologies Corporation | Fundamental, longitudinal, thickness mode bulk wave resonator |
US5373268A (en) * | 1993-02-01 | 1994-12-13 | Motorola, Inc. | Thin film resonator having stacked acoustic reflecting impedance matching layers and method |
US5587620A (en) | 1993-12-21 | 1996-12-24 | Hewlett-Packard Company | Tunable thin film acoustic resonators and method for making the same |
US5692279A (en) * | 1995-08-17 | 1997-12-02 | Motorola | Method of making a monolithic thin film resonator lattice filter |
US6051907A (en) * | 1996-10-10 | 2000-04-18 | Nokia Mobile Phones Limited | Method for performing on-wafer tuning of thin film bulk acoustic wave resonators (FBARS) |
US5894647A (en) | 1997-06-30 | 1999-04-20 | Tfr Technologies, Inc. | Method for fabricating piezoelectric resonators and product |
US6249074B1 (en) * | 1997-08-22 | 2001-06-19 | Cts Corporation | Piezoelectric resonator using sacrificial layer and method of tuning same |
US6060818A (en) | 1998-06-02 | 2000-05-09 | Hewlett-Packard Company | SBAR structures and method of fabrication of SBAR.FBAR film processing techniques for the manufacturing of SBAR/BAR filters |
US6107721A (en) * | 1999-07-27 | 2000-08-22 | Tfr Technologies, Inc. | Piezoelectric resonators on a differentially offset reflector |
US6339276B1 (en) * | 1999-11-01 | 2002-01-15 | Agere Systems Guardian Corp. | Incremental tuning process for electrical resonators based on mechanical motion |
US6291931B1 (en) * | 1999-11-23 | 2001-09-18 | Tfr Technologies, Inc. | Piezoelectric resonator with layered electrodes |
-
2001
- 2001-03-05 US US09/799,204 patent/US6469597B2/en not_active Expired - Lifetime
-
2002
- 2002-02-21 DE DE10207329A patent/DE10207329B4/de not_active Expired - Fee Related
- 2002-03-04 JP JP2002057362A patent/JP4451587B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US6469597B2 (en) | 2002-10-22 |
JP2002299980A (ja) | 2002-10-11 |
JP4451587B2 (ja) | 2010-04-14 |
US20020121945A1 (en) | 2002-09-05 |
DE10207329B4 (de) | 2009-04-16 |
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