DE102017004517A1 - Testsockel und Kontaktierungsvorrichtung zur Kontaktierung eines Hochfrequenzsignals - Google Patents

Testsockel und Kontaktierungsvorrichtung zur Kontaktierung eines Hochfrequenzsignals Download PDF

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Publication number
DE102017004517A1
DE102017004517A1 DE102017004517.8A DE102017004517A DE102017004517A1 DE 102017004517 A1 DE102017004517 A1 DE 102017004517A1 DE 102017004517 A DE102017004517 A DE 102017004517A DE 102017004517 A1 DE102017004517 A1 DE 102017004517A1
Authority
DE
Germany
Prior art keywords
contact
contacting device
frequency cable
contacting
inner conductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102017004517.8A
Other languages
German (de)
English (en)
Inventor
Ludwig Huber
Stefan Reischl
Frank Tatzel
Adalbert Schadhauser
Steffen Thies
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rosenberger Hochfrequenztechnik GmbH and Co KG
Original Assignee
Rosenberger Hochfrequenztechnik GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rosenberger Hochfrequenztechnik GmbH and Co KG filed Critical Rosenberger Hochfrequenztechnik GmbH and Co KG
Priority to PCT/EP2018/053753 priority Critical patent/WO2018166737A1/de
Priority to TW107107218A priority patent/TW201837488A/zh
Publication of DE102017004517A1 publication Critical patent/DE102017004517A1/de
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
DE102017004517.8A 2017-03-14 2017-05-11 Testsockel und Kontaktierungsvorrichtung zur Kontaktierung eines Hochfrequenzsignals Withdrawn DE102017004517A1 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/EP2018/053753 WO2018166737A1 (de) 2017-03-14 2018-02-15 Testsockel und kontaktierungsvorrichtung zur kontaktierung eines hochfrequenzsignals
TW107107218A TW201837488A (zh) 2017-03-14 2018-03-05 用於接觸高頻訊號的測試插座和接觸裝置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102017002479.0 2017-03-14
DE102017002479 2017-03-14

Publications (1)

Publication Number Publication Date
DE102017004517A1 true DE102017004517A1 (de) 2018-09-20

Family

ID=61249631

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102017004517.8A Withdrawn DE102017004517A1 (de) 2017-03-14 2017-05-11 Testsockel und Kontaktierungsvorrichtung zur Kontaktierung eines Hochfrequenzsignals

Country Status (3)

Country Link
DE (1) DE102017004517A1 (zh)
TW (1) TW201837488A (zh)
WO (1) WO2018166737A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111786159B (zh) * 2019-04-03 2022-02-11 高天星 传导装置
KR102626152B1 (ko) * 2021-07-01 2024-01-17 주식회사 아이에스시 전기접속용 커넥터

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5291129A (en) * 1988-10-24 1994-03-01 Nhk Spring Co., Ltd. Contact probe
WO2006062911A1 (en) * 2004-12-08 2006-06-15 K & S Interconnect, Inc. Test socket and method for making
US7173442B2 (en) 2003-08-25 2007-02-06 Delaware Capital Formation, Inc. Integrated printed circuit board and test contactor for high speed semiconductor testing
DE102009008156A1 (de) * 2009-02-09 2010-08-19 Ingun Prüfmittelbau Gmbh Elektrische Prüfstiftvorrichtung

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2306059A (en) * 1995-06-01 1997-04-23 Huber+Suhner Ag Axially adjustable coaxial electrical connecting line with constant impedance
US6270357B1 (en) * 1999-05-06 2001-08-07 Wayne K. Pfaff Mounting for high frequency device packages
JP3768183B2 (ja) * 2002-10-28 2006-04-19 山一電機株式会社 狭ピッチｉｃパッケージ用ｉｃソケット
JP4242199B2 (ja) * 2003-04-25 2009-03-18 株式会社ヨコオ Ｉｃソケット
JP2004325306A (ja) * 2003-04-25 2004-11-18 Yokowo Co Ltd 検査用同軸プローブおよびそれを用いた検査ユニット
US6932618B1 (en) * 2003-05-14 2005-08-23 Xilinx, Inc. Mezzanine integrated circuit interconnect
US7601009B2 (en) * 2006-05-18 2009-10-13 Centipede Systems, Inc. Socket for an electronic device
JP2008070146A (ja) * 2006-09-12 2008-03-27 Yokowo Co Ltd 検査用ソケット
KR100874190B1 (ko) * 2007-03-29 2008-12-15 (주)기가레인 동축접촉장치
CN101939659A (zh) * 2008-02-07 2011-01-05 爱德万测试株式会社 种类更换单元及其制造方法
JP2010175371A (ja) * 2009-01-29 2010-08-12 Yokowo Co Ltd 検査ソケット
DE202010007229U1 (de) * 2010-05-27 2010-10-21 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstift und Hochfrequenz-Prüfanordnung
DE202010013617U1 (de) * 2010-09-27 2010-12-09 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstift
DE202012007216U1 (de) * 2012-07-25 2012-08-20 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Kontaktelement

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5291129A (en) * 1988-10-24 1994-03-01 Nhk Spring Co., Ltd. Contact probe
US7173442B2 (en) 2003-08-25 2007-02-06 Delaware Capital Formation, Inc. Integrated printed circuit board and test contactor for high speed semiconductor testing
WO2006062911A1 (en) * 2004-12-08 2006-06-15 K & S Interconnect, Inc. Test socket and method for making
DE102009008156A1 (de) * 2009-02-09 2010-08-19 Ingun Prüfmittelbau Gmbh Elektrische Prüfstiftvorrichtung

Also Published As

Publication number Publication date
WO2018166737A1 (de) 2018-09-20
TW201837488A (zh) 2018-10-16

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